| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 05/22/2008 | WO2008059533A2 Method to stream compressed digital audio over circuit switched, voice networks |
| 05/22/2008 | WO2008059306A1 Method and apparatus for staged approach transient rf detection and sensor power saving |
| 05/22/2008 | WO2008058949A2 Sensor element, device and method for inspecting a printed conductor structure, production method for sensor element |
| 05/22/2008 | WO2008033547A3 Method and apparatus for differentiated communication channel robustness in a multi-tone transceiver |
| 05/22/2008 | WO2008017305A3 Apparatus and method for investigating the current flow distribution in solar cells and solar modules |
| 05/22/2008 | WO2007117745A3 Apparatus and method for adjusting an operating parameter of an integrated circuit |
| 05/22/2008 | US20080120525 Method and Apparatus for Detecting and Correcting Soft-Error Upsets in Latches |
| 05/22/2008 | US20080120059 Test apparatus and test method |
| 05/22/2008 | US20080120058 Multi-cpu mobile terminal and multi-cpu test system and method |
| 05/22/2008 | US20080120050 Method and device for determining state of battery, and battery power supply system therewith |
| 05/22/2008 | US20080120049 Battery control device, battery control method, battery pack, electronic apparatus and control circuit |
| 05/22/2008 | US20080117835 Method and apparatus for time-aligning transmissions from multiple base stations in a cdma communication system |
| 05/22/2008 | US20080117827 Method and system for verifying connectivity of logical link |
| 05/22/2008 | US20080117809 Overload control method for access media gateway and corresponding access media gateway |
| 05/22/2008 | US20080117613 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080117612 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080117611 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080117144 Inspection device and inspection method for active matrix panel, and manufacturing method for active matrix organic light emitting diode panel |
| 05/22/2008 | US20080116929 Register circuit, scanning register circuit utilizing register circuits and scanning method thereof |
| 05/22/2008 | US20080116928 Electro-Optic Modulator Assembly For Contactless Test Of Flat Panel Display, Method For Contactless Test Of Flat Panel Display Using The Same, Method For Manufacturing Flat Panel Display Using The Method For Contactless Test Of Flat Panel Display, And Related Technologies |
| 05/22/2008 | US20080116927 Contact tip structure for microelectronic interconnection elements and methods of making same |
| 05/22/2008 | US20080116926 Semiconductor probe having resistive tip and method of fabricating the same |
| 05/22/2008 | US20080116925 Probe device |
| 05/22/2008 | US20080116924 Device under test pogo pin type contact element |
| 05/22/2008 | US20080116923 Ultra-Fine Pitch Probe Card Structure |
| 05/22/2008 | US20080116922 Testing system contactor |
| 05/22/2008 | US20080116921 Liquid Recovery, Collection Method And Apparatus In A Non-Recirculating Test And Burn-In Application |
| 05/22/2008 | US20080116920 Coordinate Transformation Device For Electrical Signal Connection |
| 05/22/2008 | US20080116919 Fpga and method and system for configuring and debugging a fpga |
| 05/22/2008 | US20080116918 Probe station to testing semiconductor substrates and comprising emi shielding |
| 05/22/2008 | US20080116917 Probe support and process for the examination of test substrates under use of probe supports |
| 05/22/2008 | US20080116913 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080116910 Apparatus for mass die testing |
| 05/22/2008 | US20080116909 Method for determining a minority carrier diffusion length using surface photo voltage measurements |
| 05/22/2008 | US20080116901 Consumption Current Balance Circuit, Compensation Current Amount Adjusting Method, Timing Generator, and Semiconductor Testing Apparatus |
| 05/22/2008 | US20080116900 Broken Lead Detection |
| 05/22/2008 | US20080116899 Test apparatus and test module |
| 05/22/2008 | US20080116898 DC motor phase detection method |
| 05/22/2008 | US20080116896 Universal voltage monitoring and switching device |
| 05/22/2008 | US20080116876 Plasma processing chamber with ground member integrity indicator and method for using the same |
| 05/22/2008 | US20080116853 Method for predicting remaining capacity of a battery |
| 05/22/2008 | US20080116455 Technique for aging induced performance drift compensation in an integrated circuit |
| 05/22/2008 | US20080115354 Probe unit and its manufacturing method |
| 05/21/2008 | EP1923711A2 Battery capacity measuring and remaining capacity calculating system |
| 05/21/2008 | EP1923710A2 Battery capacity measuring and remaining capacity calculating system |
| 05/21/2008 | EP1922555A2 Selectable jtag or trace access with data store and output |
| 05/21/2008 | EP1922554A1 Current measurement circuit and method of diagnosing faults in same |
| 05/21/2008 | EP1922539A1 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures |
| 05/21/2008 | EP1618398B1 Method and device for predicting the starting capacity of a vehicle |
| 05/21/2008 | EP1019743B1 Battery capacity measurement circuit |
| 05/21/2008 | EP1016337B1 Temperature control system for an electronic device |
| 05/21/2008 | DE10333101B4 Kalibrierungseinrichtung für die Kalibrierung eines Testerkanals einer Testereinrichtung, Testersystem und Verfahren zum Kalibrieren eines Testerkanals Calibration means for calibration of a tester channel of a tester device tester system and method for calibrating a tester channel |
| 05/21/2008 | DE102007050587A1 Verfahren und Vorrichtung zum Steuern von Ladungsvorgängen für eine Batterie Method and device for controlling operations for a battery charge |
| 05/21/2008 | DE102006054877A1 Verfahren und Vorrichtung zur Überwachung einer Schaltereinheit A method and apparatus for monitoring a switch unit |
| 05/21/2008 | DE102006054673A1 Sondenaufnahme zur Halterung einer Sonde zur Prüfung von Halbleiterbauelementen, Sondenhalterarm und Prüfvorrichtung Probe receptacle for holding a probe for testing semiconductor devices, and Sondenhalterarm Tester |
| 05/21/2008 | DE102006054088A1 Messvorrichtung und Messverfahren zum Inspizieren einer Oberfläche eines Substrates Measuring device and measuring method for inspecting a surface of a substrate |
| 05/21/2008 | DE102005059202B4 Spaltmessvorrichtung Gap measuring device |
| 05/21/2008 | CN201063352Y Lead acid accumulator maintenance instrument special for electric vehicle |
| 05/21/2008 | CN201063055Y Circuit for monitoring three-phase four-wire power failure |
| 05/21/2008 | CN201063053Y Detecting instrument for portable plumbic acid accumulator |
| 05/21/2008 | CN201063052Y Artificial load device for testing electric ballast of xenon electric discharge lamp |
| 05/21/2008 | CN201063051Y Device for testing high-frequency electronic tuner |
| 05/21/2008 | CN201063050Y Apparatus for measuring wiping of charged friction pair |
| 05/21/2008 | CN101185005A Method and apparatus of detecting voltage for battery pack |
| 05/21/2008 | CN101185004A Method and circuit for detecting a line break |
| 05/21/2008 | CN101185003A Supply voltage monitoring |
| 05/21/2008 | CN101184175A High dynamic range image sensor and method and medium for measuring charges in pixel |
| 05/21/2008 | CN101183831A DC-DC converter, liquid crystal display device, aging test apparatus of liquid crystal display device, and method thereof |
| 05/21/2008 | CN101183795A Battery state monitoring circuitry with low power consumption during a stand-by-state of a battery pack |
| 05/21/2008 | CN101183785A Device for high voltage fast pulse signal real-time turnoff protection |
| 05/21/2008 | CN101183654A Method for measuring triplet state exciton diffusion length and energy transfer length |
| 05/21/2008 | CN101183399A Method for analyzing and increasing yield of semi-conductor production line |
| 05/21/2008 | CN101183144A Single-phase power-supply wiring judgement method and single-phase power supply phase testing circuit |
| 05/21/2008 | CN101183143A High energy battery energy capacity displayer |
| 05/21/2008 | CN101183142A On-line measurement method of accumulator cell essential resistance, electrical current work module and accumulator cell essential resistance on-line measurement instrument |
| 05/21/2008 | CN101183141A Straight line motor multifunctional dynamic test-bed |
| 05/21/2008 | CN101183140A Test circuit of on-chip multicore processor and design method of testability |
| 05/21/2008 | CN101183139A Board based on JTAG interface and design method thereof |
| 05/21/2008 | CN101183138A Batch detector methods and apparatus of power amplifier |
| 05/21/2008 | CN101183137A Fixation method of detecting probe type circuit board testing making apparatus |
| 05/21/2008 | CN101183136A High power semiconductor laser device reliability detection method |
| 05/21/2008 | CN101183135A Method for measuring semiconductor device inside chip thermocontact area |
| 05/21/2008 | CN101183134A Charge pump electrical current testing method |
| 05/21/2008 | CN101183133A Phase amount and zero sequence amount combined realization powerline both-end distance measuring method |
| 05/21/2008 | CN101183132A Wave record method supporting electrical power system transient data interchange general format |
| 05/21/2008 | CN101183131A Built-in testing realization method of circuit board interconnect fault under boundary scanning environment |
| 05/21/2008 | CN101183130A Busch lemniscate yarn cutting testing apparatus and control method |
| 05/21/2008 | CN101183129A Fault detection system of quench type superconductivity fault current-limiting device and detection method thereof |
| 05/21/2008 | CN101183128A Testing method and apparatus of duplex device power capacity |
| 05/21/2008 | CN101183126A Prognostic for loss of high-voltage isolation |
| 05/21/2008 | CN101183125A Device for determining example dielectric characteristic, measuring method and applications thereof |
| 05/21/2008 | CN101183119A Manufacturing method of wafer level testing circuit board and structure thereof |
| 05/21/2008 | CN101183018A High energy battery detector |
| 05/21/2008 | CN100389534C Method of diagnosing inverter trouble |
| 05/21/2008 | CN100389519C Group battery and abnormal detecting method for group battery |
| 05/21/2008 | CN100389489C Low energy dosage monitoring using wafer impregnating machine |
| 05/21/2008 | CN100389451C Pixel structure, overhauling method and manufacturing method thereof |
| 05/21/2008 | CN100389308C Chip temperature measurement device and method |
| 05/20/2008 | US7376920 Method to monitor critical dimension of IC interconnect |
| 05/20/2008 | US7376876 Test program set generation tool |