| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 06/18/2008 | CN101201390A Method for rapidly and accurately detecting armature overtravel of electromagnetic relay and device thereof |
| 06/18/2008 | CN101201389A System and method for testing scanning chain in device using analog signal |
| 06/18/2008 | CN101201388A Method of on-chip current measurement and semiconductor ic |
| 06/18/2008 | CN101201387A Compensation for voltage drop in automatic test equi0pment |
| 06/18/2008 | CN101201386A Method for locating parameter type fault of analogue integrated circuit |
| 06/18/2008 | CN101201385A Method and assembly for testing circuit board |
| 06/18/2008 | CN101201384A System plate and method for testing chip with high pressure |
| 06/18/2008 | CN101201383A Combined device and method for asynchronization chip |
| 06/18/2008 | CN101201382A Method for generating device testing pattern |
| 06/18/2008 | CN101201381A Method for revising relative air density of DC equipment corona-starting voltage |
| 06/18/2008 | CN101201380A Method for faulty orientation and subsection of power system low current grounding |
| 06/18/2008 | CN101201379A Method for faulty indication and subsection of power system low current grounding |
| 06/18/2008 | CN101201378A Intermittent disconnection testing system for electric contact piece |
| 06/18/2008 | CN101201377A Device and method for testing remote controller |
| 06/18/2008 | CN101201376A Method for automatically recognizing digital signal polarity |
| 06/18/2008 | CN101201375A Method for identifying protection distance between extra-high voltage AC line and short wave radio direction-finding station |
| 06/18/2008 | CN101201374A Direct-current source simulating device for simulating source status in bad industry environment |
| 06/18/2008 | CN101201373A Apparatus circuit for testing hardware of transducer drive plate |
| 06/18/2008 | CN101201372A Testing tool for circuit board |
| 06/18/2008 | CN101201371A Method and device for detecting printed circuit |
| 06/18/2008 | CN101201370A Fault diagnosis system adopting circuit information amalgamation and implementing method thereof |
| 06/18/2008 | CN101201367A Intelligentized test system for electric coupler |
| 06/18/2008 | CN101201364A High pressure measurement device and antitheft electric method for high-low pressure electric quantity measurement contrast |
| 06/18/2008 | CN101201363A Current conversion transformer induction pressure test supply apparatus and method for measurement of partial discharge thereof |
| 06/18/2008 | CN101201362A Tester table |
| 06/18/2008 | CN101201328A On-line detecting method for silicon slice pattern defect |
| 06/18/2008 | CN101201290A Method and system for identifying test frequency in conductor vibration test |
| 06/18/2008 | CN100395929C Method and mechanism for producing elliptic motion trace by air wire |
| 06/18/2008 | CN100395879C Multiplex test method for semiconductor wafer and multiplex test probe station therefor |
| 06/18/2008 | CN100395877C Probe apparatus with optical length-measuring unit and probe testing method |
| 06/18/2008 | CN100395792C Checking marker and electronic machine |
| 06/18/2008 | CN100395781C System and method for testing LCD unit |
| 06/18/2008 | CN100395560C Circuit and method for measuring signal reflow density |
| 06/18/2008 | CN100395559C Secondary battery replacement method |
| 06/18/2008 | CN100395558C Substrate inspector of DC brushless electric motor |
| 06/18/2008 | CN100395557C Scan based self-testing structure and method adopting weighted scanning strobe signal |
| 06/18/2008 | CN100395556C System for burn-in testing of electronic devices |
| 06/18/2008 | CN100395555C Latching effect detecting method for CMOS circuit |
| 06/18/2008 | CN100395554C Tester and testing method, and testing unit |
| 06/18/2008 | CN100395540C Optical inspection system having integrated component learning |
| 06/17/2008 | US7389461 Data capture in automatic test equipment |
| 06/17/2008 | US7389460 Runtime-competitive fault handling for reconfigurable logic devices |
| 06/17/2008 | US7389459 Provision of debug via a separate ring bus in a data processing apparatus |
| 06/17/2008 | US7389458 Method and apparatus for the memory self-test of embedded memories in semiconductor chips |
| 06/17/2008 | US7389457 Shift registers free of timing race boundary scan registers with two-phase clock control |
| 06/17/2008 | US7389456 IC with linking module in series with TAP circuitry |
| 06/17/2008 | US7389455 Register file initialization to prevent unknown outputs during test |
| 06/17/2008 | US7389454 Error detection in user input device using general purpose input-output |
| 06/17/2008 | US7389453 Queuing methods for distributing programs for producing test data |
| 06/17/2008 | US7389452 Methods and apparatus for monitoring internal signals in an integrated circuit |
| 06/17/2008 | US7389450 Bit error rate measurement |
| 06/17/2008 | US7389278 Detection of pump cavitation/blockage and seal failure via current signature analysis |
| 06/17/2008 | US7389195 Uniform power density across processor cores at burn-in |
| 06/17/2008 | US7389190 Testing apparatus for testing a device under test and comparator circuit and calibration apparatus for the testing apparatus |
| 06/17/2008 | US7388977 Test system and method for portable electronic apparatus |
| 06/17/2008 | US7388936 Digital data receiver for edge cellular standard with DC offset correction, channel impulse response estimation, I/Q phase imbalance compensation, interference estimation, and selective equalization |
| 06/17/2008 | US7388869 System and method for routing among private addressing domains |
| 06/17/2008 | US7388843 Method and apparatus for testing loop pathway integrity in a fibre channel arbitrated loop |
| 06/17/2008 | US7388841 Selecting multiple paths in overlay networks for streaming data |
| 06/17/2008 | US7388840 Methods and apparatuses for route management on a networking control plane |
| 06/17/2008 | US7388837 Multi-flow multi-level leaky bucket policer |
| 06/17/2008 | US7388424 Apparatus for providing a high frequency loop back with a DC path for a parametric test |
| 06/17/2008 | US7388397 Testing method for array substrate |
| 06/17/2008 | US7388396 Strip test method |
| 06/17/2008 | US7388395 Test semiconductor device and method for determining Joule heating effects in such a device |
| 06/17/2008 | US7388394 Multiple layer printed circuit board having misregistration testing pattern |
| 06/17/2008 | US7388393 Semiconductor test apparatus |
| 06/17/2008 | US7388392 Die design with integrated assembly aid |
| 06/17/2008 | US7388391 Method for evaluating at least one electrical conducting structure of an electronic component |
| 06/17/2008 | US7388390 Method for testing electronic components |
| 06/17/2008 | US7388389 Electronic probe apparatus |
| 06/17/2008 | US7388388 Thin film with MEMS probe circuits and MEMS thin film probe head using the same |
| 06/17/2008 | US7388384 Method and system for monitoring partial discharge in gas-insulated apparatus |
| 06/17/2008 | US7388383 Detecting method and detecting apparatus for detecting internal of rechargeable battery, rechargeable battery pack having said detecting apparatus therein, apparatus having said detecting apparatus therein, program in which said detecting method is incorporated, and medium in which said program is stored |
| 06/17/2008 | US7388366 Test system connection system with triaxial cables |
| 06/17/2008 | US7388362 Bi-modal voltage limit control to maximize ultra-capacitor performance |
| 06/17/2008 | US7388279 Tapered dielectric and conductor structures and applications thereof |
| 06/17/2008 | US7388160 Radio frequency isolation container |
| 06/12/2008 | WO2008070706A1 Quantized data-dependent jitter injection using discrete samples |
| 06/12/2008 | WO2008070590A2 Probing apparatus with guarded signal traces |
| 06/12/2008 | WO2008070466A2 Sharing resources in a system for testing semiconductor devices |
| 06/12/2008 | WO2008070025A1 Methods for monitoring ion implant process in bond and cleave, silicon-on-insulator (soi) wafer manufacturing |
| 06/12/2008 | WO2008069988A2 Method and apparatus for detecting high impedance fault |
| 06/12/2008 | WO2008069853A1 A system and method for soak profiling |
| 06/12/2008 | WO2008069249A1 Leakage current determining apparatus and leakage current determining method |
| 06/12/2008 | WO2008069113A1 Pattern controlled, full speed ate compare capability for deterministic and non-deterministic ic data |
| 06/12/2008 | WO2008069046A1 Electronic device, battery, and battery remaining capacity display method |
| 06/12/2008 | WO2008069025A1 Semiconductor device |
| 06/12/2008 | WO2008068994A1 Testing apparatus and device interface |
| 06/12/2008 | WO2008068869A1 Electronic component testing equipment |
| 06/12/2008 | WO2008068845A1 Pallet conveyance device and substrate inspection device |
| 06/12/2008 | WO2008068799A1 Electronic component testing method and electronic component testing equipment |
| 06/12/2008 | WO2008068798A1 Electronic component handling device, electronic component handling system and electronic component testing method |
| 06/12/2008 | WO2008068567A2 Integrated circuit probe card analyzer |
| 06/12/2008 | WO2008068446A1 Battery management system |
| 06/12/2008 | WO2008068356A1 On-line acoustic detector of partial discharges for accessories of medium and high voltage cables |
| 06/12/2008 | WO2008017072A3 Automated test and characterization data analysis methods and arrangement |
| 06/12/2008 | WO2007048116A3 Identifying new semiconductor detector materials by d.c. ionization conductivity |
| 06/12/2008 | WO2006065807A3 Impingement/ convection/ microwave oven and method |
| 06/12/2008 | WO2005114808A3 Intelligent battery charging system |