Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
05/2008
05/28/2008CN201066958Y Printed circuit board
05/28/2008CN201066796Y Portal large-capacity power device
05/28/2008CN201066708Y A three-electrode device for simulation battery
05/28/2008CN201066381Y Charging indictor
05/28/2008CN201066380Y A battery voltage tester
05/28/2008CN201066379Y Keyboard tester
05/28/2008CN201066378Y Online monitoring device for power line insulation
05/28/2008CN201066377Y Cable tester
05/28/2008CN201066376Y Testing tool for flexible circuit board of empty board
05/28/2008CN201066375Y Testing tools for card reading interface
05/28/2008CN201066374Y Automatic fall testing device for production line of mobile phone
05/28/2008CN201066369Y Polarity tester for current mutual inductor
05/28/2008CN201066361Y A battery detection clamper
05/28/2008CN201066360Y A point marking device and touch screen testing device using this device
05/28/2008CN101189530A Module for testing electromagnetic compatibility of a high-speed Ethernet interface onboard an aircraft
05/28/2008CN101189529A Pyrimidine derivatives
05/28/2008CN101189528A Compensating for loss in a transmission path
05/28/2008CN101189527A In-tray inspection apparatus and method of semiconductor package
05/28/2008CN101189526A Battery power management in over-discharge situation
05/28/2008CN101189500A Method for the model-based diagnosis of a mechatronic system
05/28/2008CN101188355A Method for converting the end electric screen current of mutual inductor into line voltage and insulation line monitoring device
05/28/2008CN101188316A Sensing and control device and battery management system driving method using the device
05/28/2008CN101188145A Mainboard fixing device
05/28/2008CN101187697A Method and device for determining state of battery, and battery power supply system
05/28/2008CN101187696A Power cell source test method
05/28/2008CN101187695A Automatic electricity-testing machine of battery
05/28/2008CN101187694A Digitalized motor experiment station
05/28/2008CN101187693A Motor performance automatic test system based on dummy instrument and its working method
05/28/2008CN101187692A Semiconductor integrated circuit
05/28/2008CN101187691A Connection unit
05/28/2008CN101187690A DC converter valve restoration period transient forward voltage test method
05/28/2008CN101187689A Temperature control base for measuring semiconductor light-emitting device
05/28/2008CN101187688A Cable main insulator water tree phenomena initiation point test method
05/28/2008CN101187687A High resistance earthing fault detection method based on transient traveling wave
05/28/2008CN101187686A Tube bus corona inception voltage and extinction voltage test judging method
05/28/2008CN101187685A Touch panel test device and method
05/28/2008CN101187684A Main board light-emitting diode detection device and method
05/28/2008CN101187683A Low consumption dielectric material high temperature complex dielectric constant test device and method
05/28/2008CN101187679A Current measuring circuit for two phase electromotor
05/28/2008CN101187676A Selection circuit of multi-path input and double-path output
05/28/2008CN101187675A Probe capable of transmitting high frequency signal
05/28/2008CN101187541A Concealed contracting brake clearance detector
05/28/2008CN100390995C 半导体器件 Semiconductor devices
05/28/2008CN100390994C Semiconductor device
05/28/2008CN100390645C Semiconductor device and its testing method
05/28/2008CN100390560C Breakage-proof transplanting suction cup for monomer solar cell on-line test
05/28/2008CN100390559C Apparatus for testing electronic instrument
05/28/2008CN100390558C Input/output circuit and test apparatus
05/28/2008CN100390557C Integrated circuit with embedded identification code
05/28/2008CN100390556C Device and method for application specific integrated circuit verification utilizing simulated source data
05/28/2008CN100390555C Set for automatic generating signal of push button key
05/28/2008CN100390554C Reduced chip testing scheme at wafer level
05/28/2008CN100390553C Probe card covering system and method
05/28/2008CN100390552C Automatic tuning and small current grounding failure wire selection system of 8421 parallel reactor composite extinction coil
05/28/2008CN100390551C Detector of two-D display and its operation method
05/28/2008CN100390550C Interpretation system for interpreting reflectometry information
05/28/2008CN100390548C Method for measuring contact impedance of joint point of liquid crystal display panel and the liquid crystal display panel
05/28/2008CN100390545C Diaphragm-holding device for test
05/27/2008US7380191 ABIST data compression and serialization for memory built-in self test of SRAM with redundancy
05/27/2008US7380190 RFID tag with bist circuits
05/27/2008US7380189 Circuit for PLL-based at-speed scan testing
05/27/2008US7380187 Boundary scan tester for logic devices
05/27/2008US7380186 Boundary scan circuit with integrated sensor for sensing physical operating parameters
05/27/2008US7380185 Reduced pin count scan chain implementation
05/27/2008US7380184 Sequential scan technique providing enhanced fault coverage in an integrated circuit
05/27/2008US7380183 Semiconductor circuit apparatus and scan test method for semiconductor circuit
05/27/2008US7380182 Method and apparatus for checking output signals of an integrated circuit
05/27/2008US7380181 Test circuit and method for hierarchical core
05/27/2008US7380179 High reliability memory module with a fault tolerant address and command bus
05/27/2008US7380176 Method for testing displays
05/27/2008US7379861 Dynamic programming of trigger conditions in hardware emulation systems
05/27/2008US7379837 Method and system for testing integrated circuits
05/27/2008US7379836 Method of using automated test equipment to screen for leakage inducing defects after calibration to intrinsic leakage
05/27/2008US7379833 Offset correction apparatus and offset correction method for automotive voltage sensor
05/27/2008US7379580 Method for detecting defects
05/27/2008US7379423 Filtering subscriber traffic to prevent denial-of-service attacks
05/27/2008US7379421 System and method for forwarding messages
05/27/2008US7379419 Apparatus and method for performing an online software upgrade of resource servers
05/27/2008US7379418 Method for ensuring system serialization (quiesce) in a multi-processor environment
05/27/2008US7379349 Simultaneous and selective memory macro testing
05/27/2008US7379040 Display device and method for testing the same
05/27/2008US7378864 Test apparatus having multiple test sites at one handler and its test method
05/27/2008US7378863 Synchronous semiconductor device, and inspection system and method for the same
05/27/2008US7378862 Method and apparatus for eliminating automated testing equipment index time
05/27/2008US7378861 Optical alignment loops for the wafer-level testing of optical and optoelectronic chips
05/27/2008US7378860 Wafer test head architecture and method of use
05/27/2008US7378859 System and method for estimation of integrated circuit signal characteristics using optical measurements
05/27/2008US7378855 Bi-directional three-Dimensional microwave scanning and volumetric mapping of a whole roll or pallet of paper
05/27/2008US7378853 System and method for detecting cable faults for high-speed transmission link
05/27/2008US7378836 Automated loading/unloading of devices for burn-in testing
05/27/2008US7378835 Interleaved differential multiplexer
05/27/2008US7378834 Electronic assembly tester and method for optoelectronic device
05/27/2008US7378832 Probing high-frequency signals
05/27/2008US7378735 High performance sub-system design and assembly
05/27/2008US7378290 Isolation circuit
05/27/2008US7377788 Electrical connecting apparatus and contact
05/27/2008US7377038 Method for assembling a catalyic converter
05/22/2008WO2008060781A2 Device and method for testing an electrical power branch circuit
05/22/2008WO2008059766A1 Measuring circuit and test device
05/22/2008WO2008059638A1 Semiconductor device