| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/10/2008 | WO2008041678A1 Board testing apparatus and board testing method |
| 04/10/2008 | WO2008041537A1 Generation device, generation method, program and recording medium |
| 04/10/2008 | WO2008041334A1 Electronic component testing apparatus |
| 04/10/2008 | WO2008040798A1 Parametric scan register, digital circuit and method for testing a digital circuit using such register |
| 04/10/2008 | WO2008040744A1 Method for testing an electronic unit |
| 04/10/2008 | WO2008011027A3 Combophone with qos on cable access |
| 04/10/2008 | WO2007102998A3 Stacked guard structures |
| 04/10/2008 | WO2007089543A3 Active probe contact array management |
| 04/10/2008 | WO2007089515A3 System and method for guided tdr/tdt computed tomography |
| 04/10/2008 | WO2007084970A3 Method and apparatus for nondestructively evaluating light-emitting materials |
| 04/10/2008 | US20080086781 Method and system for glitch protection in a secure system |
| 04/10/2008 | US20080086668 Model-based testing method and system using embedded models |
| 04/10/2008 | US20080086667 Chip testing device and system |
| 04/10/2008 | US20080086665 Semiconductor integrated circuit and testing method |
| 04/10/2008 | US20080086664 Tester input/output sharing |
| 04/10/2008 | US20080086649 Power Supply Device |
| 04/10/2008 | US20080086246 Portable vehicle powering and testing systems |
| 04/10/2008 | US20080084229 System and method for look ahead detection of electrical problems at a motor of a vehicle |
| 04/10/2008 | US20080084228 Body bias compensation for aged transistors |
| 04/10/2008 | US20080084227 Die design with integrated assembly aid |
| 04/10/2008 | US20080084226 Operation voltage supply apparatus and operation voltage supply method for semiconductor device |
| 04/10/2008 | US20080084225 Methods and apparatuses for testing circuit boards |
| 04/10/2008 | US20080084224 Photoionization probe with injection of ionizing vapor |
| 04/10/2008 | US20080084223 Test pattern and method of monitoring defects using the same |
| 04/10/2008 | US20080084222 Light source current sensing circuit and driving circuit in a display device |
| 04/10/2008 | US20080084216 Method, apparatus, and system for detecting hot socket deterioration in an electrical meter connection |
| 04/10/2008 | US20080084215 Circuit arrangement and method for Insulation monitoring for inverter applications |
| 04/10/2008 | US20080084213 Device and Method for Testing an Electrical Power Branch Circuit |
| 04/10/2008 | US20080083996 Semiconductor device and an information management system therefor |
| 04/10/2008 | US20080083211 Method and device for monitoring an exhaust gas probe |
| 04/10/2008 | DE19948384B4 Anordnung zum Bestimmen der komplexen Übertragungsfunktion eines Messgerätes Arrangement for determining the complex transfer function of a measuring instrument |
| 04/10/2008 | DE19782246B4 IC-Testgerät IC tester |
| 04/10/2008 | DE112005003338T5 Niederdruck-Entfernung von Photoresist und Ätzresten A low-pressure removal of photoresist and etching residues |
| 04/10/2008 | DE10360696B4 Testvorrichtung für elektrische und optische Messungen eines optischen Sensors einer integrierten Schaltung Test device for electrical and optical measurements of an optical sensor of an integrated circuit |
| 04/10/2008 | DE10334061B4 Schaltungsanordnung und Verfahren zur Diagnose einer Antennenschaltung Circuit arrangement and method for diagnosing an antenna circuit |
| 04/10/2008 | DE102007048181A1 Function plate for semiconductor testing device, has sockets fastened to back surface of substrate and to tested devices, and adiabatic covering part fastened to back surface of region of substrate, in which sockets are fastened |
| 04/10/2008 | DE102007046042A1 Elektrische Prüfsonde und elektrische Prüfsondenanordnung Electrical test probe and electrical Prüfsondenanordnung |
| 04/10/2008 | DE102006047262A1 Verfahren zum Testen einer Elektronikeinheit A method of testing an electronic unit |
| 04/10/2008 | DE102006047069A1 Manufacturing method for rod-shaped test electrode with electrically shielding shroud involves cutting semi-finished material along length from front surface of test electrode to form electrode surface |
| 04/10/2008 | DE102006046137A1 Batteriesensoreinheit Battery sensor unit |
| 04/10/2008 | DE102005024030B4 Verfahren zum Testen von Halbleiterstrukturen A method for the testing of semiconductor structures |
| 04/10/2008 | DE102005013900B4 Vorrichtung und Verfahren zum Testen von Halbleitervorrichtungen Apparatus and method for testing semiconductor devices |
| 04/10/2008 | DE102005011152B4 Kontaktierungseinrichtung mit kontrollierter Impedanz Contacting with controlled impedance |
| 04/10/2008 | DE102004063956B4 Batteriesystem, Verfahren zum Überwachen der Batterie und Vorrichtung hierfür Battery system, method and apparatus for monitoring the battery for this purpose |
| 04/10/2008 | DE102004043461B4 Signalaufbereitungsanordnung und Verfahren zum Aufbereiten eines Signals Signal processing arrangement and method for processing a signal |
| 04/10/2008 | DE102004009328B4 Batteriesystem, Verfahren zum Überwachen der Batterie und Vorrichtung hierfür Battery system, method and apparatus for monitoring the battery for this purpose |
| 04/10/2008 | CA2664925A1 Method for testing an electronics unit |
| 04/09/2008 | EP1909369A2 Switching assembly and method for insulation monitoring for converter applications in operation |
| 04/09/2008 | EP1909368A2 Switching assembly and method for insulation monitoring for converter applications |
| 04/09/2008 | EP1909318A2 Process management system |
| 04/09/2008 | EP1909109A1 Testing apparatus |
| 04/09/2008 | EP1908205A2 Emulation and debug interfaces for testing an integrated circuit with an asynchronous microcontroller |
| 04/09/2008 | EP1907871A1 Control electronics for li-ion batteries |
| 04/09/2008 | EP1907868A2 Integrated circuit test socket |
| 04/09/2008 | EP1815259B1 Method for operating a control device for a motor vehicle, particularly for a safety device of a motor vehicle |
| 04/09/2008 | EP1738187B1 Radiation information management device and communication device |
| 04/09/2008 | EP1720024B1 A method for realizing the pseudo wire emulation edge-to-edge protocol |
| 04/09/2008 | EP1692634A4 Method and apparatus for use with a portable power source |
| 04/09/2008 | EP1623240B1 Measuring device, and method for locating a partial discharge |
| 04/09/2008 | EP1595154B1 Integrated circuit testing methods using well bias modification |
| 04/09/2008 | EP1461628B1 Cooling assembly with direct cooling of active electronic components |
| 04/09/2008 | EP1367403B1 A method for detecting faults in electronic devices, based on quiescent current measurements |
| 04/09/2008 | EP0807259B1 Testable circuit and method of testing |
| 04/09/2008 | CN201045627Y Intelligent power line fault indicator |
| 04/09/2008 | CN201045626Y Full electronic source type mutual inductor rapid testing apparatus |
| 04/09/2008 | CN101160694A Anisotropic conductive sheet, production method thereof, connection method and inspection method |
| 04/09/2008 | CN101160654A Semiconductor integrated circuit device and regulator using the same |
| 04/09/2008 | CN101160533A Contactless wafer level burn-in |
| 04/09/2008 | CN101160532A Conductive contact holder and conductive contact unit |
| 04/09/2008 | CN101159820A Multifunctional development design device for linear array CCD |
| 04/09/2008 | CN101159428A Method of fabricating network filter sheet |
| 04/09/2008 | CN101159376A Low current neutral grounding malfunction detection and positioning device and method |
| 04/09/2008 | CN101159342A Method and apparatus for reminding the completion of charging |
| 04/09/2008 | CN101158713A Compact type energy conserving lamp magnetic characteristic curve definitions and measurement method thereof |
| 04/09/2008 | CN101158711A Life test method of fuel battery accelerate starting and stopping |
| 04/09/2008 | CN101158710A Monitoring battery cell voltage |
| 04/09/2008 | CN101158709A Accumulator cell real time on-line nondestructive accurate measurement method |
| 04/09/2008 | CN101158708A Multiple chips automatic test method based on programmable logic device |
| 04/09/2008 | CN101158707A Semiconductor integrated circuit and testing method |
| 04/09/2008 | CN101158706A Large scale integrated circuit test data and method for testing power consumption cooperate optimization |
| 04/09/2008 | CN101158705A Method for acquiring single particle phenomenon intersecting surface and heavy ion linear energy transfer relationship |
| 04/09/2008 | CN101158704A Vehicle electric quantity balancing indoor jack horse tester and test methods thereof |
| 04/09/2008 | CN101158703A Test method of MOV temperature protecting equipment and MOV temperature protecting equipment tester |
| 04/09/2008 | CN101158702A Dielectric materials high-temperature complex dielectric constant measurement method based on terminal short circuit method |
| 04/09/2008 | CN101158700A Detecting probe card |
| 04/09/2008 | CN101158618A Optical pickup device force moment machine tester and optical pickup device force moment machine characteristic testing method |
| 04/09/2008 | CN101158607A Fuel battery inside temperature measurement method |
| 04/09/2008 | CN100380807C Scanning path circuit and semiconductor IC containing said scanning path circuit |
| 04/09/2008 | CN100380622C Semiconductor inspection apparatus and manufacturing method of semiconductor device |
| 04/09/2008 | CN100380620C Method of measuring duty cycle |
| 04/09/2008 | CN100380619C Method and apparatus for monitoring a semiconductor wafer during a spin drying operation |
| 04/09/2008 | CN100380186C Apparatus and method for checking liquid crystal display array substrate |
| 04/09/2008 | CN100380132C Automatic teaching method for printed circuit board inspection system |
| 04/09/2008 | CN100380131C Contactor assembly for testing ceramic surface mount devices and other electronic components assembled by said contactor |
| 04/09/2008 | CN100380114C CAM reference for inspection of multi-color and contour images |
| 04/08/2008 | US7356800 System and method for product yield prediction |
| 04/08/2008 | US7356789 Metastability effects simulation for a circuit description |
| 04/08/2008 | US7356786 Method and user interface for debugging an electronic system |
| 04/08/2008 | US7356785 Optimizing IC clock structures by minimizing clock uncertainty |
| 04/08/2008 | US7356747 Decision selection and associated learning for computing all solutions in automatic test pattern generation (ATPG) and satisfiability |