Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
07/2008
07/03/2008US20080157780 Location of high resistance ground faults on buried power-cables
07/03/2008US20080157779 Prismatic battery short circuit inspection method, prismatic battery manufacturing method and current collector shape adjusting device
07/03/2008US20080157778 Estmation method, device, and electronic system utilizing the same
07/03/2008US20080157777 Electromotive force computing device and state of charge estimating device
07/03/2008US20080157776 Measurement of analog coil voltage and coil current
07/03/2008US20080157775 Relay device and corresponding method
07/03/2008US20080157774 Method For Testing An Electronic Circuit For Driving A Dc-Motor
07/03/2008US20080157077 Integrated Circuit and Methods of Measurement And Preparation of Measurement Structure
07/03/2008US20080156352 Contact mechanism cleaning
07/03/2008DE202007017469U1 Not-Aus-Taste oder Not-Ruf-Taste mit Fernübertragung zur Funktionskontrolle Emergency stop button or emergency call button with remote transmission to the control function
07/03/2008DE112006002395T5 Prüfvorrichtung und Prüfverfahren Tester and test methods
07/03/2008DE112005000640T5 Testgerät und Testverfahren Test apparatus and test procedure
07/03/2008DE102007061130A1 Verfahren und Vorrichtung zur Überwachung einer elektrischen Energiespeichereinrichtung Method and device for monitoring an electric energy storage device
07/03/2008DE102007061122A1 Verfahren und System zur Überwachung einer elektrischen Energiespeichereinrichtung Method and system for monitoring an electric energy storage device
07/03/2008DE102006061557A1 Electrical consumer i.e. mass control valve, operating device e.g. control device, has diagnostic modules that trigger error reaction with introduction of error in response to deviation of monitored potential from e.g. expected potential
07/03/2008DE102006060114A1 Electric on-board supply system's component testing method, involves scanning value of supply current detected by current measurement using measuring resistor in central current line that is conveyed from one station to another
07/03/2008DE102006058966A1 Detecting potential differences in e.g. fuel cell stacks, batteries or series electrolysis circuits, employs automatically-controlled measurement position selection switch
07/03/2008DE102004007904B4 Verfahren zur Bestimmung mindestens einer Kenngröße für den Zustand einer elektrochemischen Speicherbatterie und Überwachungseinrichtung A method for determining at least one characteristic variable for the state of an electrochemical storage battery monitoring device and
07/02/2008EP1940213A2 Cooling assembly with direct cooling of active electronic components
07/02/2008EP1939748A1 Circuit state scan-chain, data collection system and emulation method
07/02/2008EP1939642A2 Relay device and correspondig method
07/02/2008EP1939641A1 "Improved scan chain architecture for increased diagnostic capability in digital electronic devices"
07/02/2008EP1939640A2 Inspection method, inspection apparatus and computer-readable storage medium storing program
07/02/2008EP1939639A2 System and method for locating fault in multi-ended power transmission line
07/02/2008EP1939638A1 System and method for determining location of phase-to-earth fault
07/02/2008EP1939516A2 Testing machine and insulated pipe system for a thermal medium
07/02/2008EP1939029A1 Battery control apparatus
07/02/2008EP1938268A1 Measurement and display for video peak jitter with expected probability
07/02/2008EP1938241A1 Device for recognising the direction of data transmission between communication parameters
07/02/2008EP1938118A2 System and method for validating radio frequency identification tags
07/02/2008EP1938117A1 Test head device
07/02/2008EP1938116A1 Device for measuring the loss factor
07/02/2008EP1875255A4 High-speed level sensitive scan design test scheme with pipelined test clocks
07/02/2008EP1671142B8 Device and method for measuring individual cell voltages in a cell stack of an energy accumulator
07/02/2008CN201081767Y Real-time anti-electrostatic wrist ring monitor
07/02/2008CN101213520A Parallel input/output self-test circuit and method
07/02/2008CN101213465A Method for analyzing an integrated circuit, apparatus and integrated circuit
07/02/2008CN101213464A Connector-to-pad PCB translator for a tester and method of fabrication
07/02/2008CN101213463A Probe card assembly with an interchangeable probe insert
07/02/2008CN101213462A Electric field/magnetic field sensor and method for fabricating them
07/02/2008CN101212896A Method of inspecting printed wiring board and printed wiring board
07/02/2008CN101212857A Printed circuit board with identifiable production information
07/02/2008CN101212125A Method for quality testing and analysis of tube core of GaAs-based semiconductor quantum dot laser
07/02/2008CN101212073A Portable player, power management apparatus, and power management method
07/02/2008CN101212071A Method for estimating charge state of power cell
07/02/2008CN101211808A Picker for use in a handler and method for enabling the picker to place packaged chips
07/02/2008CN101211806A Wafer grade test module o image sensing wafer and test method
07/02/2008CN101211528A Apparatus and method for measuring response time of gray scale to gray scale conversion
07/02/2008CN101211502A Device and method for automatically testing distant control function
07/02/2008CN101211497A Control circuit for checking loop state
07/02/2008CN101211303A Method for electronic system detection display apparatus and related detection device
07/02/2008CN101211302A Display interface test device
07/02/2008CN101211301A System heat test device
07/02/2008CN101211299A Press key test method
07/02/2008CN101211297A Method for automatically allocating test machine station each IP address and the machine station
07/02/2008CN101211285A EMS memory error emulation devices and method
07/02/2008CN101211073A Substrate circuit connected structure and its detection method
07/02/2008CN101210958A Wireless navigation test method
07/02/2008CN101210956A Electronic load device and its emulation method
07/02/2008CN101210955A Battery monitoring device and batteries
07/02/2008CN101210954A 继电器装置和相应的方法 The relay apparatus and a corresponding method
07/02/2008CN101210953A Semiconductor device
07/02/2008CN101210952A Multi-test point semiconductor test machine station automated setting method
07/02/2008CN101210951A Built-in illuminating source photo-sensor detection device and test bench possessing same
07/02/2008CN101210950A Electronic components voltage-resisting test apparatus and method
07/02/2008CN101210949A Thyristor AC-AC frequency converter complete shut-down detection circuit
07/02/2008CN101210948A Methods and systems for detecting series arcs in electrical systems
07/02/2008CN101210947A Electrical grade sheet electro-magnetism performance measurement method
07/02/2008CN101210946A Test equipment and chip contact-debugging method
07/02/2008CN101210945A Electrical source switching device
07/02/2008CN101210941A Large power converter subsequent lockout overcurrent, subsequent power loss and overcurrent test method
07/02/2008CN101210939A PCBConnection method for implementing common use of single and double density in PCB test
07/02/2008CN101210938A PCBConnection method for implementing common use of four-density grid and eight-density grid in PCB test
07/02/2008CN101210932A Method for promoting defect detection reliability
07/02/2008CN101210889A Holographic type automatic optical detection system and method
07/02/2008CN101210853A Electric engine oil seal detection device
07/02/2008CN101210651A Testing machine and pipe system for testing machine internal thermostat
07/02/2008CN100399861C Array speaker detector, array speaker device and its distributing line judging method
07/02/2008CN100399621C Remanent electric quantity closed-loop controlling method for vehicle-carried auxiliary power accumulator set
07/02/2008CN100399619C Real-time tracking alarm secondary cell partial volume method
07/02/2008CN100399498C Manufacturing method for semiconductor device
07/02/2008CN100399430C Method for detecting CD machine and apparatus
07/02/2008CN100399396C Electro-optical device, method of checking the same, and electronic apparatus
07/02/2008CN100399342C Method and system for metrology diffraction signal adaptation for tool-to-tool matching
07/02/2008CN100399039C 印刷电路板检查装置 A printed circuit board inspection apparatus
07/02/2008CN100399038C Integrated circuit transfer device
07/02/2008CN100399037C Screening method for commercial plastic packaging device space application
07/02/2008CN100399036C Transformer cannula test device and its test method
07/02/2008CN100398986C Characteristic value calculation for welding detection
07/01/2008US7395518 Back end of line clone test vehicle
07/01/2008US7395479 Over-voltage test for automatic test equipment
07/01/2008US7395478 Method of generating test patterns to efficiently screen inline resistance delay defects in complex asics
07/01/2008US7395477 Switch control apparatus, semiconductor device test apparatus and sequence pattern generating program
07/01/2008US7395476 System, method and storage medium for providing a high speed test interface to a memory subsystem
07/01/2008US7395475 Circuit and method for fuse disposing in a semiconductor memory device
07/01/2008US7395474 Lab-on-chip system and method and apparatus for manufacturing and operating same
07/01/2008US7395473 Removing the effects of unknown test values from compacted test responses
07/01/2008US7395472 Method and a unit for programming a memory
07/01/2008US7395471 Connection of auxiliary circuitry to tap and instruction register controls
07/01/2008US7395470 Method, apparatus, and computer program product for diagnosing a scan chain failure employing fuses coupled to the scan chain