| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 07/09/2008 | CN100401078C Earth fault detection circuit for battery, and system without electric interruption |
| 07/09/2008 | CN100401072C Inspection jig for radio frequency device, and contact probe imcorporated in the jig |
| 07/08/2008 | US7398445 Method and system for debug and test using replicated logic |
| 07/08/2008 | US7398444 Loop-back method for measuring the interface timing of semiconductor devices with the aid of signatures and/or parity methods |
| 07/08/2008 | US7398443 Automatic fault-testing of logic blocks using internal at-speed logic-BIST |
| 07/08/2008 | US7398442 Electronic circuit with asynchronously operating components |
| 07/08/2008 | US7398441 System and method for providing secure boundary scan interface access |
| 07/08/2008 | US7398440 Tap multiplexer |
| 07/08/2008 | US7398438 Method and apparatus for improved routing in connectionless networks |
| 07/08/2008 | US7398437 Method and system for multi-user channel allocation for a multi-channel analyzer |
| 07/08/2008 | US7398176 Battery testers with secondary functionality |
| 07/08/2008 | US7398175 Method and apparatus providing multiple channel multiple instrument triggering |
| 07/08/2008 | US7398174 Acquiring test data from an electronic circuit |
| 07/08/2008 | US7397847 Testing device for testing electronic device and testing method thereof |
| 07/08/2008 | US7397801 Method and apparatus to determine whether a network is quality of service enabled |
| 07/08/2008 | US7397778 Method and apparatus for predicting the quality of packet data communications |
| 07/08/2008 | US7397766 High-speed traffic measurement and analysis methodologies and protocols |
| 07/08/2008 | US7397764 Flow control between fiber channel and wide area networks |
| 07/08/2008 | US7397761 Routing restorable service-level-guaranteed connections using maximum 2-route flows |
| 07/08/2008 | US7397760 Transmission apparatus |
| 07/08/2008 | US7397556 Method, apparatus, and computer program product for optimizing inspection recipes using programmed defects |
| 07/08/2008 | US7397359 Remote control for battery electrical system tester apparatus and method |
| 07/08/2008 | US7397289 Skew adjusting method, skew adjusting apparatus, and test apparatus |
| 07/08/2008 | US7397274 In-system programming of a non-compliant device using multiple interfaces of a PLD |
| 07/08/2008 | US7397269 Disconnection and short detecting circuit that can detect disconnection and short of a signal line transmitting a differential clock signal |
| 07/08/2008 | US7397267 Voltage detecting circuit |
| 07/08/2008 | US7397266 System and method for testing the electromagnetic susceptibility of an electronic display unit |
| 07/08/2008 | US7397265 MOS transistor characteristic detection apparatus and CMOS circuit characteristic automatic adjustment apparatus |
| 07/08/2008 | US7397264 Method for testing power MOSFET devices |
| 07/08/2008 | US7397263 Sensor differentiated fault isolation |
| 07/08/2008 | US7397262 Burn-in system power stage |
| 07/08/2008 | US7397261 Monitoring system for detecting and characterizing classes of leakage in CMOS devices |
| 07/08/2008 | US7397260 Structure and method for monitoring stress-induced degradation of conductive interconnects |
| 07/08/2008 | US7397259 Method and apparatus for statistical CMOS device characterization |
| 07/08/2008 | US7397258 Burn-in system with heating blocks accommodated in cooling blocks |
| 07/08/2008 | US7397257 Detection method/device of probe's tip location using a transparent film attached to a substate having plurality of electrodes, and a storage medium for implementing the method |
| 07/08/2008 | US7397256 Automatic design method for semiconductor device |
| 07/08/2008 | US7397255 Micro Kelvin probes and micro Kelvin probe methodology |
| 07/08/2008 | US7397254 Methods for imperfect insulating film electrical thickness/capacitance measurement |
| 07/08/2008 | US7397251 Device for testing connectivity of a connector including spring contact pins |
| 07/08/2008 | US7397235 Pin electronic for automatic testing of integrated circuits |
| 07/08/2008 | US7397233 Voltage measuring device |
| 07/08/2008 | US7397222 On-line testable solid state reversing DC motor starter |
| 07/08/2008 | US7397031 Method of inspecting a circuit pattern and inspecting instrument |
| 07/08/2008 | US7396743 Low temperature epitaxial growth of silicon-containing films using UV radiation |
| 07/08/2008 | CA2465026C Method and apparatus for detecting shorted rectifying control elements of an engine driven power source for a welding-type system |
| 07/03/2008 | WO2008079307A1 Probe card analysis system and method |
| 07/03/2008 | WO2008078529A1 Test equipment and test method |
| 07/03/2008 | WO2008078405A1 Probe inspecting device, displacement correcting method, information processor, information processing method, and program |
| 07/03/2008 | WO2008078229A1 Bist integrated circuit testing |
| 07/03/2008 | WO2008077429A1 Tester, method for testing a device under test and computer program |
| 07/03/2008 | WO2008020009A3 Method for picking and placing semiconductor chips and pick-and-place robot |
| 07/03/2008 | WO2006099464A3 Systems and methods to detect collisions in channel sense multiple access communications |
| 07/03/2008 | US20080163020 Variable Clocked Scan Test Improvements |
| 07/03/2008 | US20080163019 Scanning Latches Using Selecting Array |
| 07/03/2008 | US20080163017 Dynamic frequency scaling for jtag communication |
| 07/03/2008 | US20080163016 System and method of providing error detection and correction capability in an integrated circuit using redundant logic cells of an embedded fpga |
| 07/03/2008 | US20080163015 Framework for automated testing of enterprise computer systems |
| 07/03/2008 | US20080163012 Apparatus for Configuring a USB PHY to Loopback Mode |
| 07/03/2008 | US20080163011 Method and Testing Arrangement for Testing a Device Using 8B/10B Encoding and an 8B/10B Encoder and Decoder |
| 07/03/2008 | US20080162096 Signal waveform analyzing device |
| 07/03/2008 | US20080162071 Communication of a diagnostic signal and a functional signal by an integrated circuit |
| 07/03/2008 | US20080162059 Secondary Battery Charge/Discharge Electricity Amount Estimation Method and Device, Secondary Battery Polarization Voltage Estimation Method and Device and Secondary Battery Remaining Capacity Estimation Method and Device |
| 07/03/2008 | US20080160656 Addressable hierarchical metal wire test methodology |
| 07/03/2008 | US20080160646 Method, system, and computer program product for predicting thin film integrity, manufacturability, reliability, and performance in electronic designs |
| 07/03/2008 | US20080159297 Method and apparatus for hierarchial scheduling of virtual paths with underutilized bandwidth |
| 07/03/2008 | US20080159172 Apparatus and method for preventing disruption of fibre channel fabrics caused by reconfigure fabric (rcf) messages |
| 07/03/2008 | US20080159155 Method and apparatus for providing trouble isolation for a permanent virtual circuit |
| 07/03/2008 | US20080159153 Method and apparatus for automatic trouble isolation for digital subscriber line access multiplexer |
| 07/03/2008 | US20080159151 Data-path dynamic link maintenance in mobile ad hoc networks |
| 07/03/2008 | US20080159146 Network monitoring |
| 07/03/2008 | US20080159141 Load balancing for multicast stream processors |
| 07/03/2008 | US20080159133 Method of providing wireless signal strength and congestion data of an access point |
| 07/03/2008 | US20080159131 Method and apparatus for allocating bandwidth for a network |
| 07/03/2008 | US20080159126 Multiring control method, node using the method, and control program |
| 07/03/2008 | US20080159124 Method for redundant linking lines and wide area network node device |
| 07/03/2008 | US20080158750 Relay device and corresponding method |
| 07/03/2008 | US20080157810 Method for Testing Liquid Crystal Display Panels |
| 07/03/2008 | US20080157809 Display panel and short circuit detection device thereof |
| 07/03/2008 | US20080157808 Wafer-level burn-in and test |
| 07/03/2008 | US20080157807 Picker for use in a handler and method for enabling the picker to place packaged chips |
| 07/03/2008 | US20080157806 Test socket for semiconductor |
| 07/03/2008 | US20080157805 Carrier module for adapting non-standard instrument cards to test systems |
| 07/03/2008 | US20080157804 Carrier module for adapting non-standard instrument cards to test systems |
| 07/03/2008 | US20080157803 Die testing using top surface test pads |
| 07/03/2008 | US20080157802 Direct detect sensor for flat panel displays |
| 07/03/2008 | US20080157801 Characterization of micromirror devices using reset drivers |
| 07/03/2008 | US20080157800 TEG pattern and method for testing semiconductor device using the same |
| 07/03/2008 | US20080157799 Resilient contact element and methods of fabrication |
| 07/03/2008 | US20080157798 On-die heating circuit and control loop for rapid heating of the die |
| 07/03/2008 | US20080157796 Chuck with integrated wafer support |
| 07/03/2008 | US20080157793 Vertical Microprobes for Contacting Electronic Components and Method for Making Such Probes |
| 07/03/2008 | US20080157792 Probe Card and Method of Manufacturing the Same |
| 07/03/2008 | US20080157790 Stiffener assembly for use with testing devices |
| 07/03/2008 | US20080157789 Rotating contact element and methods of fabrication |
| 07/03/2008 | US20080157785 Method For Determining the State of a Spatially Extended Body |
| 07/03/2008 | US20080157784 Detection of the supply state of a load supplied by a variable voltage |
| 07/03/2008 | US20080157783 Apparatus and method for monitoring high voltage capacitors |
| 07/03/2008 | US20080157782 Analog boundary scanning based on stray capacitance |
| 07/03/2008 | US20080157781 Methods and systems for detecting series arcs in electrical systems |