Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
06/1994
06/21/1994US5323116 Test device for testing compact fluorescent lights and ballasts
06/21/1994US5323108 Method for generating functional tests for printed circuit boards based on pattern matching of models
06/21/1994US5323107 Active probe card
06/21/1994US5323106 Device for testing semiconductor devices
06/21/1994US5323105 Test template for monitoring the pins of a multi-pin chip cirucit package
06/21/1994US5323035 Interconnection structure for integrated circuits and method for making same
06/21/1994US5323014 Optocoupler built-in self test for applications requiring isolation
06/21/1994US5322446 For use with IC devices
06/21/1994CA2017865C Multi-layer tolerance checker
06/21/1994CA1330360C Circuit testers
06/16/1994DE4309842C1 IC circuit board testing system - uses comparison impedances obtained across test pins for fault-free circuit board during learning phase
06/16/1994DE4242322A1 Testing appts. for continuity testing of electrical connection cable - has three test connectors, battery and indication elements for testing e.g. telephone cables
06/16/1994DE4242224A1 Industrial plant safety monitoring of armatures with electrical position drives - measuring operating efficiency of motor with armature loaded to specification
06/16/1994DE4241523A1 Battery monitoring circuit for multiple cell batteries - includes measuring circuit contg one or more microprocessors supplied with voltage derived from battery cell voltages
06/16/1994DE4240497A1 Communication cable wire testing equipment - contains constant current test signal generator and voltage meter switched between two loop voltage measurement connections for test and comparison wires
06/15/1994EP0601900A1 Device for the manual testing of a printed circuit board equipped with surface mount components
06/15/1994CN2169161Y Programing and testing meter for universal integrated circuits
06/15/1994CN2169141Y Automatic alarm for electric circuit faults of vehicle
06/15/1994CN2169140Y Voltage distribution tester for insulator string
06/15/1994CN1025103C Control and test system of apparatus using contactor
06/15/1994CN1025097C Apparatus and method for controlling positions of CRT measuring camera
06/15/1994CN1025077C Method for multi-bit parallel test in semiconductor memory device
06/15/1994CN1025076C Optical fiber laying structure for electric power cable line trouble occurrence location detecting system
06/15/1994CA2111187A1 Microwave monolithic integrated circuit testing
06/14/1994US5321702 High speed timing generator
06/14/1994US5321701 Method and apparatus for a minimal memory in-circuit digital tester
06/14/1994US5321700 High speed timing generator
06/14/1994US5321653 Circuit for generating an internal source voltage
06/14/1994US5321641 Pseudo random pattern generation circuit
06/14/1994US5321632 Method and apparatus for measuring the length of a transmission line in accordance with a reflected waveform
06/14/1994US5321627 Battery monitor and method for providing operating parameters
06/14/1994US5321626 Battery performance monitoring and forecasting system
06/14/1994US5321392 Infusion pump with battery back-up
06/14/1994US5321365 Reduced noise sensitivity in inverse scattering through filtering
06/14/1994US5321363 Two-terminal circuit element measuring apparatus for performing contact checks
06/14/1994US5321362 Digital filtering of EL CID data
06/14/1994US5321354 Method for inspecting semiconductor devices
06/14/1994US5321352 Probe apparatus and method of alignment for the same
06/14/1994US5321351 Test fixture alignment system
06/14/1994US5321277 Multi-chip module testing
06/14/1994US5320551 For receiving an electrical part
06/14/1994CA2010876C Microprocessor controlled ground system monitor
06/09/1994WO1994012887A1 Die carrier and test socket for leadless semiconductor die
06/09/1994DE4240877A1 Insulation testing of high voltage systems - involves applying high voltage for milliseconds via large capacitance, isolating object and measuring voltage-time characteristic
06/08/1994EP0600815A2 A high resolution programmable pulse generator
06/08/1994EP0600655A2 Integrated circuit test arrangement and method
06/08/1994EP0600604A1 Apparatus and process for bare chip test and burn-in
06/08/1994EP0600594A1 Scan testing integrated circuits
06/08/1994EP0600527A1 Stress mode circuit for an integrated circuit with on-chip voltage down converter
06/08/1994EP0600234A2 System for displaying residual capacity of a battery
06/08/1994CN2168262Y Hand-held suspension procelain-bottle testing device
06/08/1994CN2168261Y Numeral line-testing instrument
06/08/1994CN2168260Y High-voltage on-line detecting instrument
06/08/1994CN2168259Y Synthetic tester for electrical components of automobile
06/07/1994US5319792 Modem having first and second registers enabling both to concurrently receive identical information in one context and disabling one to retain the information in a next context
06/07/1994US5319789 Electromechanical apparatus having first and second registers enabling both to concurrently receive identical information in one context and disabling one to retain the information in a next context
06/07/1994US5319647 Method and apparatus for performing automatic test pattern generation
06/07/1994US5319646 Boundary-scan output cell with non-critical enable path
06/07/1994US5319614 Time interval measuring apparatus
06/07/1994US5319570 Control of large scale topography on silicon wafers
06/07/1994US5319353 Alarm display system for automatic test handler
06/07/1994US5319312 Apparatus for locating inoperative miniature bulbs in a string of bulbs
06/07/1994US5319311 Cable fault location method with discharge delay compensation using multiple pulses with different rates of voltage increase
06/07/1994US5319254 Transparent latch
06/07/1994US5318456 Socket
06/07/1994US5318449 Method and apparatus for computer-aided diagnosis of engines
06/05/1994CA2109042A1 High resolution programmable pulse generator
06/01/1994EP0599763A1 Dual channel D.C. low noise measurement system and test methodology
06/01/1994EP0599629A2 Charge/discharge control circuit
06/01/1994EP0599544A1 Capacitive electrode system for detecting open solder joints in printed circuit assemblies
06/01/1994EP0599488A2 Method and apparatus for testing an interface board
06/01/1994EP0599046A2 Method and apparatus for stressing, burning in and reducing leakage current of electronic devices using microwave radiation
06/01/1994EP0598835A1 Circuit and method for testing inverter drive logic switching patterns
06/01/1994DE4239741A1 Electrical equipment stray radio field strength measuring method - measuring field strengths at critical frequencies previously determined by power measurements
06/01/1994CN2167450Y Power-supply socket with sound and light alarm for electricity leakage
06/01/1994CN2167382Y Discharging bar for testing cable
06/01/1994CN2167381Y Detecting device for separating wires of cable core
06/01/1994CN2167380Y Bias magnetic type electricity leakage detecting device
06/01/1994CN2167379Y Portable displaying device for detecting circuit flaw with no wire
06/01/1994CN2167378Y Automatic monitoring and displaying device for automobile lamp circuit
06/01/1994CN1087430A Anti-interference high sensitive impact relay
05/1994
05/31/1994US5317573 Apparatus and method for real time data error capture and compression redundancy analysis
05/31/1994US5317520 Computerized remote resistance measurement system with fault detection
05/31/1994US5317362 Control circuit for camera having auxiliary light source
05/31/1994US5317257 Burn-in apparatus and burn-in board removing method using movable cooling enclosure
05/31/1994US5317256 High-speed, high-impedance external photoconductive-type sampling probe/pulser
05/31/1994US5317255 Electric inspection unit using anisotropically electroconductive sheet
05/31/1994US5317205 Semiconductor integrated circuit and associated test method
05/31/1994US5317188 Means for and methods of testing automated tape bonded semiconductor devices
05/26/1994WO1994011747A1 Auto-self test of ac motor system
05/26/1994WO1994011745A1 Method and apparatus for measuring film thickness
05/26/1994WO1994011743A1 Printed circuit board testing device with foil adapter
05/26/1994WO1994007211A3 Latent defect handling in eeprom devices
05/26/1994DE4239053A1 Testing system for matching specified pattern of plug pins at plug block - detects reflection from radiated pin tops of group of pins using image receiver to determine faulty equipped blocks
05/26/1994CA2123095A1 Auto self test of ac motor system
05/25/1994EP0597926A1 Process for testing integrated circuits with at least one logic circuit and testable integrated circuit
05/25/1994EP0548108B1 Circuit arrangement for testing a semiconductor store by means of parallel tests with different test bit patterns
05/25/1994CN2166463Y Integral tester for failure of communication cable
05/25/1994CN1087179A Method for measuring electric properties of battery unit
05/25/1994CN1087178A Method and apparatus for automatically measuring distance of fault in power cable