Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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06/21/1994 | US5323116 Test device for testing compact fluorescent lights and ballasts |
06/21/1994 | US5323108 Method for generating functional tests for printed circuit boards based on pattern matching of models |
06/21/1994 | US5323107 Active probe card |
06/21/1994 | US5323106 Device for testing semiconductor devices |
06/21/1994 | US5323105 Test template for monitoring the pins of a multi-pin chip cirucit package |
06/21/1994 | US5323035 Interconnection structure for integrated circuits and method for making same |
06/21/1994 | US5323014 Optocoupler built-in self test for applications requiring isolation |
06/21/1994 | US5322446 For use with IC devices |
06/21/1994 | CA2017865C Multi-layer tolerance checker |
06/21/1994 | CA1330360C Circuit testers |
06/16/1994 | DE4309842C1 IC circuit board testing system - uses comparison impedances obtained across test pins for fault-free circuit board during learning phase |
06/16/1994 | DE4242322A1 Testing appts. for continuity testing of electrical connection cable - has three test connectors, battery and indication elements for testing e.g. telephone cables |
06/16/1994 | DE4242224A1 Industrial plant safety monitoring of armatures with electrical position drives - measuring operating efficiency of motor with armature loaded to specification |
06/16/1994 | DE4241523A1 Battery monitoring circuit for multiple cell batteries - includes measuring circuit contg one or more microprocessors supplied with voltage derived from battery cell voltages |
06/16/1994 | DE4240497A1 Communication cable wire testing equipment - contains constant current test signal generator and voltage meter switched between two loop voltage measurement connections for test and comparison wires |
06/15/1994 | EP0601900A1 Device for the manual testing of a printed circuit board equipped with surface mount components |
06/15/1994 | CN2169161Y Programing and testing meter for universal integrated circuits |
06/15/1994 | CN2169141Y Automatic alarm for electric circuit faults of vehicle |
06/15/1994 | CN2169140Y Voltage distribution tester for insulator string |
06/15/1994 | CN1025103C Control and test system of apparatus using contactor |
06/15/1994 | CN1025097C Apparatus and method for controlling positions of CRT measuring camera |
06/15/1994 | CN1025077C Method for multi-bit parallel test in semiconductor memory device |
06/15/1994 | CN1025076C Optical fiber laying structure for electric power cable line trouble occurrence location detecting system |
06/15/1994 | CA2111187A1 Microwave monolithic integrated circuit testing |
06/14/1994 | US5321702 High speed timing generator |
06/14/1994 | US5321701 Method and apparatus for a minimal memory in-circuit digital tester |
06/14/1994 | US5321700 High speed timing generator |
06/14/1994 | US5321653 Circuit for generating an internal source voltage |
06/14/1994 | US5321641 Pseudo random pattern generation circuit |
06/14/1994 | US5321632 Method and apparatus for measuring the length of a transmission line in accordance with a reflected waveform |
06/14/1994 | US5321627 Battery monitor and method for providing operating parameters |
06/14/1994 | US5321626 Battery performance monitoring and forecasting system |
06/14/1994 | US5321392 Infusion pump with battery back-up |
06/14/1994 | US5321365 Reduced noise sensitivity in inverse scattering through filtering |
06/14/1994 | US5321363 Two-terminal circuit element measuring apparatus for performing contact checks |
06/14/1994 | US5321362 Digital filtering of EL CID data |
06/14/1994 | US5321354 Method for inspecting semiconductor devices |
06/14/1994 | US5321352 Probe apparatus and method of alignment for the same |
06/14/1994 | US5321351 Test fixture alignment system |
06/14/1994 | US5321277 Multi-chip module testing |
06/14/1994 | US5320551 For receiving an electrical part |
06/14/1994 | CA2010876C Microprocessor controlled ground system monitor |
06/09/1994 | WO1994012887A1 Die carrier and test socket for leadless semiconductor die |
06/09/1994 | DE4240877A1 Insulation testing of high voltage systems - involves applying high voltage for milliseconds via large capacitance, isolating object and measuring voltage-time characteristic |
06/08/1994 | EP0600815A2 A high resolution programmable pulse generator |
06/08/1994 | EP0600655A2 Integrated circuit test arrangement and method |
06/08/1994 | EP0600604A1 Apparatus and process for bare chip test and burn-in |
06/08/1994 | EP0600594A1 Scan testing integrated circuits |
06/08/1994 | EP0600527A1 Stress mode circuit for an integrated circuit with on-chip voltage down converter |
06/08/1994 | EP0600234A2 System for displaying residual capacity of a battery |
06/08/1994 | CN2168262Y Hand-held suspension procelain-bottle testing device |
06/08/1994 | CN2168261Y Numeral line-testing instrument |
06/08/1994 | CN2168260Y High-voltage on-line detecting instrument |
06/08/1994 | CN2168259Y Synthetic tester for electrical components of automobile |
06/07/1994 | US5319792 Modem having first and second registers enabling both to concurrently receive identical information in one context and disabling one to retain the information in a next context |
06/07/1994 | US5319789 Electromechanical apparatus having first and second registers enabling both to concurrently receive identical information in one context and disabling one to retain the information in a next context |
06/07/1994 | US5319647 Method and apparatus for performing automatic test pattern generation |
06/07/1994 | US5319646 Boundary-scan output cell with non-critical enable path |
06/07/1994 | US5319614 Time interval measuring apparatus |
06/07/1994 | US5319570 Control of large scale topography on silicon wafers |
06/07/1994 | US5319353 Alarm display system for automatic test handler |
06/07/1994 | US5319312 Apparatus for locating inoperative miniature bulbs in a string of bulbs |
06/07/1994 | US5319311 Cable fault location method with discharge delay compensation using multiple pulses with different rates of voltage increase |
06/07/1994 | US5319254 Transparent latch |
06/07/1994 | US5318456 Socket |
06/07/1994 | US5318449 Method and apparatus for computer-aided diagnosis of engines |
06/05/1994 | CA2109042A1 High resolution programmable pulse generator |
06/01/1994 | EP0599763A1 Dual channel D.C. low noise measurement system and test methodology |
06/01/1994 | EP0599629A2 Charge/discharge control circuit |
06/01/1994 | EP0599544A1 Capacitive electrode system for detecting open solder joints in printed circuit assemblies |
06/01/1994 | EP0599488A2 Method and apparatus for testing an interface board |
06/01/1994 | EP0599046A2 Method and apparatus for stressing, burning in and reducing leakage current of electronic devices using microwave radiation |
06/01/1994 | EP0598835A1 Circuit and method for testing inverter drive logic switching patterns |
06/01/1994 | DE4239741A1 Electrical equipment stray radio field strength measuring method - measuring field strengths at critical frequencies previously determined by power measurements |
06/01/1994 | CN2167450Y Power-supply socket with sound and light alarm for electricity leakage |
06/01/1994 | CN2167382Y Discharging bar for testing cable |
06/01/1994 | CN2167381Y Detecting device for separating wires of cable core |
06/01/1994 | CN2167380Y Bias magnetic type electricity leakage detecting device |
06/01/1994 | CN2167379Y Portable displaying device for detecting circuit flaw with no wire |
06/01/1994 | CN2167378Y Automatic monitoring and displaying device for automobile lamp circuit |
06/01/1994 | CN1087430A Anti-interference high sensitive impact relay |
05/31/1994 | US5317573 Apparatus and method for real time data error capture and compression redundancy analysis |
05/31/1994 | US5317520 Computerized remote resistance measurement system with fault detection |
05/31/1994 | US5317362 Control circuit for camera having auxiliary light source |
05/31/1994 | US5317257 Burn-in apparatus and burn-in board removing method using movable cooling enclosure |
05/31/1994 | US5317256 High-speed, high-impedance external photoconductive-type sampling probe/pulser |
05/31/1994 | US5317255 Electric inspection unit using anisotropically electroconductive sheet |
05/31/1994 | US5317205 Semiconductor integrated circuit and associated test method |
05/31/1994 | US5317188 Means for and methods of testing automated tape bonded semiconductor devices |
05/26/1994 | WO1994011747A1 Auto-self test of ac motor system |
05/26/1994 | WO1994011745A1 Method and apparatus for measuring film thickness |
05/26/1994 | WO1994011743A1 Printed circuit board testing device with foil adapter |
05/26/1994 | WO1994007211A3 Latent defect handling in eeprom devices |
05/26/1994 | DE4239053A1 Testing system for matching specified pattern of plug pins at plug block - detects reflection from radiated pin tops of group of pins using image receiver to determine faulty equipped blocks |
05/26/1994 | CA2123095A1 Auto self test of ac motor system |
05/25/1994 | EP0597926A1 Process for testing integrated circuits with at least one logic circuit and testable integrated circuit |
05/25/1994 | EP0548108B1 Circuit arrangement for testing a semiconductor store by means of parallel tests with different test bit patterns |
05/25/1994 | CN2166463Y Integral tester for failure of communication cable |
05/25/1994 | CN1087179A Method for measuring electric properties of battery unit |
05/25/1994 | CN1087178A Method and apparatus for automatically measuring distance of fault in power cable |