Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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05/25/1994 | CN1024720C Electronic measurer with same time base of sampling pulse and measuring signal |
05/24/1994 | US5315598 Method to reduce burn-in time and inducing infant failure |
05/24/1994 | US5315257 System for evaluating the performance of an electrical filter |
05/24/1994 | US5315253 Method and apparatus for measuring the voltage and charge of a battery |
05/24/1994 | US5315252 Automotive test system with input protection |
05/24/1994 | US5315242 Method for measuring AC specifications of microprocessor |
05/24/1994 | US5315241 Method for testing integrated circuits |
05/24/1994 | US5315240 Thermal control system for a semi-conductor burn-in |
05/24/1994 | US5315228 Battery charge monitor and fuel gauge |
05/24/1994 | US5315177 One time programmable fully-testable programmable logic device with zero power and anti-fuse cell architecture |
05/24/1994 | US5315167 Voltage burn-in scheme for BICMOS circuits |
05/24/1994 | US5313741 Method of and an apparatus for slicing a single crystal ingot using an ID saw slicing machine therein |
05/24/1994 | US5313701 Assembly and testing of electronic power components insulation |
05/18/1994 | EP0597746A1 Test device for electrical socket with earth contact and differential protection |
05/18/1994 | EP0597717A2 Apparatus for measuring a resistance of a high tension resistance electrical cable |
05/18/1994 | EP0596909A1 Electrosurgical apparatus for laparoscopic and like procedures |
05/18/1994 | EP0596879A1 Process and arrangement for recognizing defects in power converters. |
05/18/1994 | EP0500706B1 Method for measuring mechanical torque |
05/18/1994 | CN2165457Y Apparatus for testing dc electric machine neutral point |
05/18/1994 | CN2165456Y Cable core connection testing apparatus |
05/18/1994 | CN2165455Y Working mode display for small electrical heater |
05/18/1994 | CN2165454Y Frequency converter alarm |
05/17/1994 | US5313648 Signal processing apparatus having first and second registers enabling both to concurrently receive identical information in one context and disabling one to retain the information in a next context |
05/17/1994 | US5313623 Method and apparatus for performing diagnosis scanning of a memory unit regardless of the state of the system clock and without affecting the store data |
05/17/1994 | US5313470 Boundary-scan input cell for a clock pin |
05/17/1994 | US5313469 Self-testable digital integrator |
05/17/1994 | US5313165 Temperature-compensated apparatus for monitoring current having controlled sensitivity to supply voltage |
05/17/1994 | US5313158 Test system integrated on a substrate and a method for using such a test system |
05/17/1994 | US5313156 Apparatus for automatic handling |
05/17/1994 | US5313152 Network for minimizing current imbalances in a faradaic battery |
05/17/1994 | US5313151 Induction type electric motor drive actuator system |
05/17/1994 | US5312536 Method and apparatus to evaluate effectiveness of cleaning systems for high density electronics |
05/17/1994 | US5312401 Electrosurgical apparatus for laparoscopic and like procedures |
05/11/1994 | WO1994010825A1 A method and a device to measure electromagnetic radiation from or reception of from outside coming electromagnetic radiation in a circuit card |
05/11/1994 | WO1994010580A1 Fault and splice finding system and method |
05/11/1994 | WO1994010579A1 Method and apparatus for measuring partial discharges in cables |
05/11/1994 | WO1994010578A1 Relay tester |
05/11/1994 | EP0596789A1 Method and device for measuring the charge of an accumulator battery |
05/11/1994 | EP0596773A1 Appliance for in-situ broadband hyperfrequency tests |
05/11/1994 | EP0596584A2 Disturbance registration arrangement |
05/11/1994 | EP0596473A1 Circuit for monitoring the drain current of a MOSFET |
05/11/1994 | EP0596435A1 Automatic test clock selection apparatus |
05/11/1994 | EP0431034B1 Circuit testing |
05/11/1994 | DE4237591A1 Leiterplatten-Prüfeinrichtung mit Folienadapter PCB tester with transparency adapters |
05/11/1994 | CN1024480C Monitoring instrument for dynamic contact failure of contactors |
05/11/1994 | CA2147888A1 Relay tester |
05/11/1994 | CA2146991A1 Method and apparatus for measuring partial discharges in cables |
05/10/1994 | US5311486 Timing generation in an automatic electrical test system |
05/10/1994 | US5311476 Semiconductor memory, components and layout arrangements thereof, and method of testing the memory |
05/10/1994 | US5311448 Programmable load board with programmable simulation of thermal dissipation characteristics |
05/10/1994 | US5311139 Fuse checker for testing integrity of a miniature, plug-in fuse while the fuse is installed in an electrical circuit |
05/10/1994 | US5311138 Device for monitoring the functon of an electric load, its drive and the associated connections |
05/10/1994 | US5311137 Liquid crystal electric field tester for circuit boards |
05/10/1994 | US5311122 RF test equipment and wire bond interface circuit |
05/10/1994 | US5311121 Apparatus for measuring the electrical time constant of the quadrature-axis damper of a synchronous machine |
05/10/1994 | US5311119 Probe contact through small amplitude vibration for bed of nails testing |
05/10/1994 | US5311116 Multi-channel electromagnetically transparent voltage waveform monitor link |
05/10/1994 | US5310039 Apparatus for efficient transfer of electronic devices |
05/05/1994 | WO1994010718A1 Battery pack |
05/05/1994 | DE4336884A1 Semiconductor device with predetermined test mode - applies potential at pre-specified internal node to external contact in test mode in response to control signals |
05/05/1994 | DE4336883A1 Integrated circuit output driver for suppressing noise generation, e.g. in DRAM - has current increase rate controller responding to voltage at predefined node in semiconductor substrate |
05/05/1994 | DE4314301C1 Surface scanning sensor - has a sensor point of a photo-structurable glass |
05/05/1994 | DE4221435C2 Elektronischer Baustein mit einer taktgesteuerten Schieberegisterprüfarchitektur (Boundary-Scan) Electronic component with a clock-controlled shift register test (Boundary-Scan) |
05/04/1994 | EP0595548A1 An apparatus for measuring electromagnetic field distribution using a focused electron beam |
05/04/1994 | EP0595466A1 Capacity indicator for lead-acid batteries |
05/04/1994 | EP0595379A2 A method and apparatus for analog test signal usage in a digital environment |
05/04/1994 | EP0594830A1 System for monitoring circuit breaker operations and alerting need of preventative maintenance |
05/04/1994 | CN2164054Y Vehicle circuit fault detecting tool |
05/03/1994 | US5309556 Method for using interactive computer graphics to control electronic instruments |
05/03/1994 | US5309499 Communications line testing |
05/03/1994 | US5309447 Space compression technique for pseudo-exhaustive self-testing of digital electronic circuits |
05/03/1994 | US5309446 Test validation method for a semiconductor memory device |
05/03/1994 | US5309444 Integrated circuit including a test cell for efficiently testing the accuracy of communication signals between a standard cell and an application cell |
05/03/1994 | US5309352 Method and system for optimizing termination in systems of programmable devices |
05/03/1994 | US5309223 Laser-based semiconductor lead measurement system |
05/03/1994 | US5309109 Forcible grounding generation equipment and grounding occurrence detection equipment using the same |
05/03/1994 | US5309092 Token ring test simulation method and device |
05/03/1994 | US5309091 Testability architecture and techniques for programmable interconnect architecture |
05/03/1994 | US5309090 Apparatus for heating and controlling temperature in an integrated circuit chip |
05/03/1994 | US5309089 Method of measuring unsaturated inductances of an equivalent circuit of a synchronous machine |
05/03/1994 | US5309088 Measurement of semiconductor parameters at cryogenic temperatures using a spring contact probe |
05/03/1994 | US5309035 Method and apparatus for clock skew reduction through absolute delay regulation |
05/03/1994 | US5308443 Microprobe provided circuit substrate and method for producing the same |
05/03/1994 | US5308256 Socket |
05/03/1994 | US5307561 Method for making 3-D electrical circuitry |
05/03/1994 | CA1329251C Optical fibre measuring device, gyrometer, central navigation and stabilizing system |
04/28/1994 | WO1994009527A1 Battery pack |
04/28/1994 | WO1994009513A1 Interconnection structure for integrated circuits and method for making same |
04/28/1994 | WO1994009378A1 System and method for accelerated degradation testing of semiconductor devices |
04/28/1994 | WO1994009377A1 A method and a device for determining the distance from a measuring station to a fault on a transmission line |
04/27/1994 | EP0594488A1 Passive test element simulating the noise characteristics of a transistor |
04/27/1994 | EP0594478A1 ASIC with a microprocessor and with test facilities |
04/27/1994 | EP0594146A2 System and method for automatic optical inspection |
04/27/1994 | EP0594006A1 Battery-powered data processor |
04/27/1994 | EP0593966A1 Three dimensional high performance interconnection package |
04/27/1994 | EP0593869A1 Accumulator |
04/27/1994 | EP0504233B1 Process and device for verifying the cut-off torque of an actuator |
04/27/1994 | CN2163386Y Gravity boosting electric A.C/D.C straight line stringed insulators detector |
04/26/1994 | US5307313 Flag circuit for memory |
04/26/1994 | US5307290 System for the automatic testing, preferably on a bench, of electronic control systems which are intended to be fitted in vehicles |