| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
|---|
| 07/20/1994 | EP0438491B1 Testing electrical circuits |
| 07/20/1994 | CN2172482Y Circuit overload safety alarm |
| 07/20/1994 | CN2172481Y Circuit safety test pencil |
| 07/20/1994 | CN2172480Y Electronic circuit breaker regulating table |
| 07/20/1994 | CN1089726A Tester for transformer |
| 07/19/1994 | US5331644 Decoder checking circuits suitable for semiconductor memories |
| 07/19/1994 | US5331643 Self-testing logic with embedded arrays |
| 07/19/1994 | US5331596 Address multiplexed dynamic RAM having a test mode capability |
| 07/19/1994 | US5331581 Artificial random-number pattern generating circuit |
| 07/19/1994 | US5331570 Method for generating test access procedures |
| 07/19/1994 | US5331515 Module with leads from multiple chips shorted together only at edge contact locations |
| 07/19/1994 | US5331458 Compact specimen inspection station |
| 07/19/1994 | US5331406 Multi-beam laser sensor for semiconductor lead measurements |
| 07/19/1994 | US5331275 Probing device and system for testing an integrated circuit |
| 07/19/1994 | US5331274 Method and apparatus for testing edge connector inputs and outputs for circuit boards employing boundary scan |
| 07/19/1994 | US5331211 Releasing circuit for actuating vehicular safety device |
| 07/19/1994 | US5330043 Transfer apparatus and method for testing facility |
| 07/14/1994 | DE4342654A1 Ausrichtsystem für eine Prüfvorrichtung Alignment system for a test device |
| 07/14/1994 | DE4300620C1 Electric switch current monitoring method |
| 07/14/1994 | DE4225204C2 Schieberegisterzelle einer Prüfschaltung zur Implementierung einer taktgesteuerten Schieberegisterprüfarchitektur(Boundary-Scan) Shift register cell of a test circuit for implementing a clock-controlled shift register test (Boundary-Scan) |
| 07/13/1994 | EP0605997A1 Method and apparatus for detecting leakage resistance in an electric vehicle |
| 07/13/1994 | EP0605818A1 Method and apparatus of testing printed circuit board |
| 07/13/1994 | EP0605812A1 Microwave monolithic integrated circuit testing |
| 07/13/1994 | EP0605604A1 Automatic motor testing method and apparatus |
| 07/13/1994 | EP0605599A1 Battery with electrochemical tester |
| 07/13/1994 | EP0605438A1 Battery-operated device. |
| 07/13/1994 | EP0605419A1 Battery voltage measurement system |
| 07/13/1994 | EP0362406B1 System for detecting defective point on power transmission line by utilizing satellite |
| 07/13/1994 | CN2171873Y Detecting device for storage battery |
| 07/13/1994 | CN2171872Y Multifunction high-voltage leakage current direct tester |
| 07/13/1994 | CN2171871Y Parameter test instrument of contacter |
| 07/12/1994 | US5329533 Partial-scan built-in self-test technique |
| 07/12/1994 | US5329532 Logic circuit with additional circuit for carrying out delay test |
| 07/12/1994 | US5329471 Emulation devices, systems and methods utilizing state machines |
| 07/12/1994 | US5329240 Apparatus for measuring clock pulse delay in one or more circuits |
| 07/12/1994 | US5329238 Arrangement for fault monitoring an electric consumer in a motor vehicle to detect short circuits and interruptions in the region of the consumer |
| 07/12/1994 | US5329228 Test chip for semiconductor fault analysis |
| 07/12/1994 | US5329226 Probe card for testing integrated circuit chips |
| 07/12/1994 | US5329188 Clock pulse measuring and deskewing system and process |
| 07/12/1994 | US5329167 Test flip-flop with an auxillary latch enabling two (2) bits of storage |
| 07/12/1994 | US5329139 Semiconductor integrated circuit device analyzable by using laser beam inducing current |
| 07/12/1994 | US5329133 Method of automatically determining flaws of an object of examination |
| 07/12/1994 | US5329093 Burn-in apparatus for semiconductor integrated device |
| 07/07/1994 | WO1994015318A1 System for checking the validity of a data carrier |
| 07/07/1994 | WO1994015222A1 Method and apparatus for determining the charge condition of an electrochemical cell |
| 07/07/1994 | WO1994015221A1 Process and device for finding the real output of an electric drive |
| 07/06/1994 | EP0604721A2 Magneto-optic probe |
| 07/06/1994 | EP0604516A1 Advanced method and cable fault locator |
| 07/06/1994 | EP0604470A1 Process for detecting mechanical parameters of an electric switching device. |
| 07/06/1994 | EP0604444A1 Circuit arrangement to detect a voltage. |
| 07/06/1994 | EP0553080B1 High speed tester and method of providing successive loops of data signals at a predetermined clock rate |
| 07/06/1994 | CN2171118Y Low voltage DC short-circuit detector |
| 07/06/1994 | CN2171117Y Automatic alarm for line fault |
| 07/05/1994 | US5327437 Method for testing electronic assemblies in the presence of noise |
| 07/05/1994 | US5327382 Method of testing redundant memory cells |
| 07/05/1994 | US5327363 Pattern memory circuit for integrated circuit testing apparatus |
| 07/05/1994 | US5327343 Universally and bidirectionally operable device for signal path control in a motor vehicle diagnostic system |
| 07/05/1994 | US5327091 For a device under test positioned in a reverberation chamber |
| 07/05/1994 | US5327076 Glitchless test signal generator |
| 07/05/1994 | US5327075 Burn-in apparatus and method for semiconductor devices |
| 07/05/1994 | US5327074 Integrated circuit device |
| 07/05/1994 | US5327016 Load control circuit including automatic AC/DC discernment |
| 07/05/1994 | US5326428 Method for testing semiconductor circuitry for operability and method of forming apparatus for testing semiconductor circuitry for operability |
| 07/05/1994 | CA1330578C System for detecting fault location in substation |
| 06/30/1994 | DE4343747A1 Temp. sensor function control system |
| 06/29/1994 | EP0604233A2 Method and apparatus for measuring high-frequency C-V characteristics of a MIS device |
| 06/29/1994 | EP0604037A1 Busbar protection method |
| 06/29/1994 | EP0604032A2 Scan testing of integrated circuits |
| 06/29/1994 | EP0603614A1 Method for testing gate arrays on printed circuit boards |
| 06/29/1994 | EP0448610B1 Process and installation for the control of electro-mechanical converters |
| 06/29/1994 | EP0301084B1 Apparatus and method for testing contact interruptions of circuit interconnection devices |
| 06/29/1994 | CN2170531Y Essence safety relay |
| 06/29/1994 | CN2170529Y Isolator string low-zero magnetic bottle detector |
| 06/29/1994 | CN2170527Y Multifunctional low-voltage distributing line tester |
| 06/29/1994 | CN1088686A 集成的漏电警告系统 The integrated leakage warning system |
| 06/29/1994 | CN1025261C Semiconductor integrated circuit chip having identification circuit therein |
| 06/28/1994 | US5325369 Semiconductor device with an error detecting and displaying circuit |
| 06/28/1994 | US5325368 Module for use in a computer system |
| 06/28/1994 | US5325309 Method and apparatus for integrated circuit diagnosis |
| 06/28/1994 | US5325068 Test system for measurements of insulation resistance |
| 06/28/1994 | US5325054 Method and system for screening reliability of semiconductor circuits |
| 06/28/1994 | US5325053 Apparatus for testing timing parameters of high speed integrated circuit devices |
| 06/28/1994 | US5325041 Automatic rechargeable battery monitoring system |
| 06/28/1994 | US5325027 Method and apparatus for measuring the degree of fullness of a mill with lifting beams by monitoring variation in power consumption |
| 06/23/1994 | WO1994014079A1 Charge-status indicator |
| 06/23/1994 | WO1994014078A1 Method and apparatus for determining characteristic electrical properties of semi-conducting materials |
| 06/23/1994 | WO1994014077A1 Circuit arrangement for monitoring a plurality of coils |
| 06/23/1994 | WO1994013909A2 Chamber arrangement for an inflatable structure |
| 06/23/1994 | DE4341826A1 Vehicle battery charge evaluation procedure |
| 06/23/1994 | CA2152044A1 Chamber arrangement for an inflatable structure |
| 06/22/1994 | EP0602973A2 Mixed signal integrated circuit architecture and test methodology |
| 06/22/1994 | EP0602432A2 Method and apparatus for measuring residual capacity of an electric-car battery |
| 06/22/1994 | EP0602271A1 Wafer testing process of a semiconductor device having a redundancy circuit |
| 06/22/1994 | CN2169861Y Electric positioner for transformer local discharging |
| 06/22/1994 | CN2169860Y Terminal detector for single phase three hole power source socket |
| 06/22/1994 | CN2169856Y Multi-purpose electronic power measuring tool |
| 06/22/1994 | CN2169855Y Multi-state electronic power measuring tool |
| 06/21/1994 | US5323401 Optimization of test stimulus verification |
| 06/21/1994 | US5323400 Scan cell for weighted random pattern generation and method for its operation |
| 06/21/1994 | US5323117 Method for detecting partial discharge in an insulation of an electric power apparatus |