Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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08/23/1994 | US5341383 Circuit arrangement suitable for testing cells arranged in rows and columns, semiconductor integrated circuit device having the same, and method for arranging circuit blocks on chip |
08/23/1994 | US5341380 Large-scale integrated circuit device |
08/23/1994 | US5341336 Method for stress testing decoders and periphery circuits |
08/23/1994 | US5341315 Test pattern generation device |
08/23/1994 | US5341314 Method for generating a test to detect differences between integrated circuits |
08/23/1994 | US5341282 Circuit for detecting short-circuiting of inductive load drive devices |
08/23/1994 | US5341096 Semiconductor integrated circuit having a scan circuit provided with a self-contained signal generator circuit |
08/23/1994 | US5341095 Dynamoelectric machine stator test device |
08/23/1994 | US5341094 method of grouping of variable capacitance diodes having uniform characteristics |
08/23/1994 | US5341092 Testability architecture and techniques for programmable interconnect architecture |
08/23/1994 | US5341091 Apparatus and method for generating synchronized control signals in a system for testing electronic parts |
08/23/1994 | US5341084 Method and device for determining and indicating a residual capacity of a battery |
08/23/1994 | US5340964 Method and apparatus for monitoring electrical loads |
08/23/1994 | CA2020784C Fault locating system capable of quickly locating a fault in a hierarchical communication network |
08/19/1994 | CA2115960A1 Testing circuit |
08/18/1994 | WO1994018637A1 Method of manufacturing utilizing master test result feedback to slave test stations |
08/18/1994 | WO1994018574A1 System and method for testing electrical generators |
08/18/1994 | DE4404445A1 Integrated semiconductor circuit and method for testing the same |
08/18/1994 | DE4304105A1 Test card system for testing integrated circuits with interchangeable pin wheel and optional interchangeable wiring/electronics |
08/18/1994 | DE4302451A1 Method for reducing determined faults |
08/17/1994 | EP0611106A1 Method and apparatus for differentiating battery types |
08/17/1994 | EP0611036A1 Method for automatic open-circuit detection |
08/17/1994 | EP0610886A2 Microcomputer for IC card |
08/17/1994 | EP0596909A4 Electrosurgical apparatus for laparoscopic and like procedures. |
08/16/1994 | US5339343 Counter circuit with or gates interconnecting stages to provide alternate testing of odd and even stages during test mode |
08/16/1994 | US5339320 Architecture of circuitry for generating test mode signals |
08/16/1994 | US5339038 Assembly for detecting and locating cable pinching |
08/16/1994 | US5339028 Test circuit for screening parts |
08/16/1994 | US5339027 Rigid-flex circuits with raised features as IC test probes |
08/16/1994 | US5339024 Battery with electrochemical tester |
08/16/1994 | US5339017 Battery charge monitor |
08/16/1994 | US5338630 Observing optical characteristics of exposed undeveloped photoresist without removing wafer from stepper |
08/16/1994 | US5338223 Hybrid wafer probe |
08/16/1994 | US5338208 High density electronic connector and method of assembly |
08/11/1994 | DE4302803A1 Method for testing an electric line |
08/11/1994 | DE4217300A1 Signal-processing method for logic analyser and circuit and device for carrying out the method |
08/10/1994 | EP0609874A2 Memory circuit having a plurality of input signals |
08/10/1994 | EP0609662A1 Method for determining the thermal rigidity of safety switches by consideration of the harmonic waves of the phase currents and device for realization of this method |
08/10/1994 | EP0609564A2 Method and device for charging an accumulator unit |
08/10/1994 | EP0609402A1 Improved unitized test system with bidirectional transport feature |
08/10/1994 | EP0609334A1 SELF DIAGNOSTIC pH SENSOR |
08/10/1994 | CN2173959Y Digital indicating multirange electrometer |
08/10/1994 | CN1090704A Protective tube of high voltage heating apparatus and electric method for testing of high voltage heating apparatus |
08/09/1994 | US5337321 Scan path circuit with clock signal feedback, for skew avoidance |
08/09/1994 | US5337318 Memory IC testing apparatus with redundancy circuit |
08/09/1994 | US5337316 Transceiver self-diagnostic testing apparatus and method |
08/09/1994 | US5337261 Designing and evaluating filters for suppressing undesired signals |
08/09/1994 | US5337250 Apparatus for testing a microprocessor based register |
08/09/1994 | US5337045 Pattern generator |
08/09/1994 | US5337013 Method and apparatus for monitoring the operation of electrical loads in an automotive vehicle |
08/09/1994 | US5337004 System for inspecting electrically conductive patterns such as antenna patterns on window glass |
08/09/1994 | US5336993 Assembly for testing rectifiers and regulators of automotive alternators |
08/09/1994 | US5336989 AC mains test apparatus and method |
08/09/1994 | US5336944 Detector circuit for detecting state changes of a binary signal |
08/09/1994 | US5336649 Removable adhesives for attachment of semiconductor dies |
08/09/1994 | US5335413 Connector terminal inspection device and inspection method |
08/09/1994 | CA2016755C Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays |
08/04/1994 | WO1994017592A1 Retriggered oscillator for jitter-free phase locked loop frequency synthesis |
08/04/1994 | WO1994017496A1 Process for monitoring and/or detecting changes under load of the operating state of an electrical power machine |
08/04/1994 | WO1994017425A1 Battery capacity meter |
08/04/1994 | WO1994017424A1 Current surge indicator |
08/04/1994 | DE4343303A1 Chamber system for lightweight inflatable structure |
08/04/1994 | DE4302482A1 Testing of electronic control unit esp. vehicle control unit |
08/03/1994 | EP0608442A1 Rotor winding short circuit detector |
08/03/1994 | CN2173473Y Multi-output device |
08/03/1994 | CN2173410Y Testing instrument for covered wire |
08/03/1994 | CN2173409Y Short circuit detector for automobile |
08/03/1994 | CN2173408Y Zero value insulator ground tester |
08/03/1994 | CA2088657A1 Digital compensating calibrator |
08/02/1994 | US5335230 Apparatus and method for automatic digitizer fault detection |
08/02/1994 | US5335133 Dual output battery with fault detect |
08/02/1994 | US5334912 Ground fault detector and associated logic for an electronic ballast |
08/02/1994 | US5334857 Semiconductor device with test-only contacts and method for making the same |
08/02/1994 | US5334540 OBIC observation method and apparatus therefor |
08/02/1994 | US5333376 Cable harness connector termination and testing apparatus |
07/28/1994 | DE4314324C1 Collision-free test operation of analog and pref. digital circuits |
07/28/1994 | DE4302832A1 Locating moisture entry point in electrical or optical cable |
07/28/1994 | DE4301653A1 Circuit board testing method for board carrying at least one electronic component |
07/28/1994 | DE4223881C2 Bidirektionale digitale Treiberstufe mit zur Implementierung einer taktgesteuerten Schieberegisterprüfarchitektur (Boundary Scan) dienenden Schieberegisterzellen Bidirectional digital driver stage with the implementation of a clock-controlled shift register test (Boundary Scan) serving shift register cells |
07/27/1994 | EP0607693A2 Method and apparatus for diagnosing AMP to Speaker Connections |
07/27/1994 | EP0607481A1 Apparatus and method for electromagnetical field susceptibility testing |
07/27/1994 | EP0607410A1 Slide actuated holding clamp |
07/27/1994 | EP0541537B1 Method and apparatus for high precision weighted random pattern generation |
07/27/1994 | CN2172875Y Transistor on-line detector |
07/27/1994 | CN1090053A System and method for accelerated degradation testing of semiconductor devices |
07/27/1994 | CN1090052A In -circuit test apparatus |
07/26/1994 | US5333176 Cellular hand held portable speakerphone system having an interface adapter |
07/26/1994 | US5333154 Digital data generation system including programmable dominance latch |
07/26/1994 | US5333139 Method of determining the number of individual integrated circuit computer chips or the like in a boundary scan test chain and the length of the chain |
07/26/1994 | US5332996 Method and apparatus for all code testing |
07/26/1994 | US5332973 Built-in fault testing of integrated circuits |
07/26/1994 | US5332970 Method for measuring the impedance of an electrodeless arc discharge lamp |
07/26/1994 | CA2054512C Ground integrity monitor |
07/26/1994 | CA2034959C Fault determination test method for systems including an electronic expansion valve and electronic controller |
07/21/1994 | WO1994016337A1 Non-contact current injection apparatus and method for use with linear bipolar circuits |
07/21/1994 | DE4221748C2 Bypass-Abtastpfad und integrierte Schaltkreiseinrichtung mit mindestens einem solchen Bypass-Abtastpfad Bypass scan path and integrated circuit device having at least one such bypass scan |
07/21/1994 | DE3801223C2 Gerät zum automatischen Prüfen von elektronischen Schaltungen und zum Durchführen von Zeitmessungen The apparatus for automatically testing electronic circuits, and for performing time measurements |
07/20/1994 | EP0606809A1 Safety control system |
07/20/1994 | EP0606805A1 Test method for integrated circuit devices and related integrated device |
07/20/1994 | EP0606515A2 Parts supply system applied to a versatile production line |