Patents
Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264)
08/1994
08/23/1994US5341383 Circuit arrangement suitable for testing cells arranged in rows and columns, semiconductor integrated circuit device having the same, and method for arranging circuit blocks on chip
08/23/1994US5341380 Large-scale integrated circuit device
08/23/1994US5341336 Method for stress testing decoders and periphery circuits
08/23/1994US5341315 Test pattern generation device
08/23/1994US5341314 Method for generating a test to detect differences between integrated circuits
08/23/1994US5341282 Circuit for detecting short-circuiting of inductive load drive devices
08/23/1994US5341096 Semiconductor integrated circuit having a scan circuit provided with a self-contained signal generator circuit
08/23/1994US5341095 Dynamoelectric machine stator test device
08/23/1994US5341094 method of grouping of variable capacitance diodes having uniform characteristics
08/23/1994US5341092 Testability architecture and techniques for programmable interconnect architecture
08/23/1994US5341091 Apparatus and method for generating synchronized control signals in a system for testing electronic parts
08/23/1994US5341084 Method and device for determining and indicating a residual capacity of a battery
08/23/1994US5340964 Method and apparatus for monitoring electrical loads
08/23/1994CA2020784C Fault locating system capable of quickly locating a fault in a hierarchical communication network
08/19/1994CA2115960A1 Testing circuit
08/18/1994WO1994018637A1 Method of manufacturing utilizing master test result feedback to slave test stations
08/18/1994WO1994018574A1 System and method for testing electrical generators
08/18/1994DE4404445A1 Integrated semiconductor circuit and method for testing the same
08/18/1994DE4304105A1 Test card system for testing integrated circuits with interchangeable pin wheel and optional interchangeable wiring/electronics
08/18/1994DE4302451A1 Method for reducing determined faults
08/17/1994EP0611106A1 Method and apparatus for differentiating battery types
08/17/1994EP0611036A1 Method for automatic open-circuit detection
08/17/1994EP0610886A2 Microcomputer for IC card
08/17/1994EP0596909A4 Electrosurgical apparatus for laparoscopic and like procedures.
08/16/1994US5339343 Counter circuit with or gates interconnecting stages to provide alternate testing of odd and even stages during test mode
08/16/1994US5339320 Architecture of circuitry for generating test mode signals
08/16/1994US5339038 Assembly for detecting and locating cable pinching
08/16/1994US5339028 Test circuit for screening parts
08/16/1994US5339027 Rigid-flex circuits with raised features as IC test probes
08/16/1994US5339024 Battery with electrochemical tester
08/16/1994US5339017 Battery charge monitor
08/16/1994US5338630 Observing optical characteristics of exposed undeveloped photoresist without removing wafer from stepper
08/16/1994US5338223 Hybrid wafer probe
08/16/1994US5338208 High density electronic connector and method of assembly
08/11/1994DE4302803A1 Method for testing an electric line
08/11/1994DE4217300A1 Signal-processing method for logic analyser and circuit and device for carrying out the method
08/10/1994EP0609874A2 Memory circuit having a plurality of input signals
08/10/1994EP0609662A1 Method for determining the thermal rigidity of safety switches by consideration of the harmonic waves of the phase currents and device for realization of this method
08/10/1994EP0609564A2 Method and device for charging an accumulator unit
08/10/1994EP0609402A1 Improved unitized test system with bidirectional transport feature
08/10/1994EP0609334A1 SELF DIAGNOSTIC pH SENSOR
08/10/1994CN2173959Y Digital indicating multirange electrometer
08/10/1994CN1090704A Protective tube of high voltage heating apparatus and electric method for testing of high voltage heating apparatus
08/09/1994US5337321 Scan path circuit with clock signal feedback, for skew avoidance
08/09/1994US5337318 Memory IC testing apparatus with redundancy circuit
08/09/1994US5337316 Transceiver self-diagnostic testing apparatus and method
08/09/1994US5337261 Designing and evaluating filters for suppressing undesired signals
08/09/1994US5337250 Apparatus for testing a microprocessor based register
08/09/1994US5337045 Pattern generator
08/09/1994US5337013 Method and apparatus for monitoring the operation of electrical loads in an automotive vehicle
08/09/1994US5337004 System for inspecting electrically conductive patterns such as antenna patterns on window glass
08/09/1994US5336993 Assembly for testing rectifiers and regulators of automotive alternators
08/09/1994US5336989 AC mains test apparatus and method
08/09/1994US5336944 Detector circuit for detecting state changes of a binary signal
08/09/1994US5336649 Removable adhesives for attachment of semiconductor dies
08/09/1994US5335413 Connector terminal inspection device and inspection method
08/09/1994CA2016755C Structure and method for producing mask-programmed integrated circuits which are pin compatible substitutes for memory-configured logic arrays
08/04/1994WO1994017592A1 Retriggered oscillator for jitter-free phase locked loop frequency synthesis
08/04/1994WO1994017496A1 Process for monitoring and/or detecting changes under load of the operating state of an electrical power machine
08/04/1994WO1994017425A1 Battery capacity meter
08/04/1994WO1994017424A1 Current surge indicator
08/04/1994DE4343303A1 Chamber system for lightweight inflatable structure
08/04/1994DE4302482A1 Testing of electronic control unit esp. vehicle control unit
08/03/1994EP0608442A1 Rotor winding short circuit detector
08/03/1994CN2173473Y Multi-output device
08/03/1994CN2173410Y Testing instrument for covered wire
08/03/1994CN2173409Y Short circuit detector for automobile
08/03/1994CN2173408Y Zero value insulator ground tester
08/03/1994CA2088657A1 Digital compensating calibrator
08/02/1994US5335230 Apparatus and method for automatic digitizer fault detection
08/02/1994US5335133 Dual output battery with fault detect
08/02/1994US5334912 Ground fault detector and associated logic for an electronic ballast
08/02/1994US5334857 Semiconductor device with test-only contacts and method for making the same
08/02/1994US5334540 OBIC observation method and apparatus therefor
08/02/1994US5333376 Cable harness connector termination and testing apparatus
07/1994
07/28/1994DE4314324C1 Collision-free test operation of analog and pref. digital circuits
07/28/1994DE4302832A1 Locating moisture entry point in electrical or optical cable
07/28/1994DE4301653A1 Circuit board testing method for board carrying at least one electronic component
07/28/1994DE4223881C2 Bidirektionale digitale Treiberstufe mit zur Implementierung einer taktgesteuerten Schieberegisterprüfarchitektur (Boundary Scan) dienenden Schieberegisterzellen Bidirectional digital driver stage with the implementation of a clock-controlled shift register test (Boundary Scan) serving shift register cells
07/27/1994EP0607693A2 Method and apparatus for diagnosing AMP to Speaker Connections
07/27/1994EP0607481A1 Apparatus and method for electromagnetical field susceptibility testing
07/27/1994EP0607410A1 Slide actuated holding clamp
07/27/1994EP0541537B1 Method and apparatus for high precision weighted random pattern generation
07/27/1994CN2172875Y Transistor on-line detector
07/27/1994CN1090053A System and method for accelerated degradation testing of semiconductor devices
07/27/1994CN1090052A In -circuit test apparatus
07/26/1994US5333176 Cellular hand held portable speakerphone system having an interface adapter
07/26/1994US5333154 Digital data generation system including programmable dominance latch
07/26/1994US5333139 Method of determining the number of individual integrated circuit computer chips or the like in a boundary scan test chain and the length of the chain
07/26/1994US5332996 Method and apparatus for all code testing
07/26/1994US5332973 Built-in fault testing of integrated circuits
07/26/1994US5332970 Method for measuring the impedance of an electrodeless arc discharge lamp
07/26/1994CA2054512C Ground integrity monitor
07/26/1994CA2034959C Fault determination test method for systems including an electronic expansion valve and electronic controller
07/21/1994WO1994016337A1 Non-contact current injection apparatus and method for use with linear bipolar circuits
07/21/1994DE4221748C2 Bypass-Abtastpfad und integrierte Schaltkreiseinrichtung mit mindestens einem solchen Bypass-Abtastpfad Bypass scan path and integrated circuit device having at least one such bypass scan
07/21/1994DE3801223C2 Gerät zum automatischen Prüfen von elektronischen Schaltungen und zum Durchführen von Zeitmessungen The apparatus for automatically testing electronic circuits, and for performing time measurements
07/20/1994EP0606809A1 Safety control system
07/20/1994EP0606805A1 Test method for integrated circuit devices and related integrated device
07/20/1994EP0606515A2 Parts supply system applied to a versatile production line