| Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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| 04/26/1994 | US5307286 Method for optimizing automatic place and route layout for full scan circuits |
| 04/26/1994 | US5307018 Apparatus and method to detect an impending failure of a cirucit caused by deposits of aerosol |
| 04/26/1994 | US5307017 Sparking voltage detecting device for internal combustion engines |
| 04/26/1994 | US5307011 Loader and unloader for test handler |
| 04/26/1994 | US5307010 Wafer burn-in and test system |
| 04/26/1994 | US5306167 IC socket |
| 04/23/1994 | CA2108824A1 Microprocesseur custom integrated circuit |
| 04/21/1994 | DE4334952A1 Test circuit for signal input stages with thresholds - contains short circuit device with switch for each input stage, e.g. operational amplifier |
| 04/21/1994 | DE4325320A1 Laser diode reliability determn. method - measuring noise current in region of threshold current for several frequencies to determine inverse frequency noise |
| 04/21/1994 | DE4310203C1 Automatic capacitor polarity identification device - compares obtained integrals for application of positive and negative measuring voltages to capacitor electrode |
| 04/21/1994 | DE4241975C1 Schaltungsanordnung zur Anzeige des Ladezustands einer Batterie Circuitry to manage charging status of a battery |
| 04/21/1994 | DE4224393A1 Rapid particle beam potential measurement on large format substrate - involves moving substrate during potential measurements, e.g. for IC testing |
| 04/20/1994 | EP0593385A2 A method for testing integrated circuit devices |
| 04/20/1994 | EP0593198A2 Apparatus and method for displaying remaining energy of a battery |
| 04/20/1994 | EP0592971A2 Detection of electron-beam scanning of a substrate |
| 04/20/1994 | EP0592965A2 Battery monitoring system and battery pack |
| 04/20/1994 | EP0592715A1 Checking design for testability rules with a VHDL simulator |
| 04/20/1994 | EP0500551B1 Procedure for testing generators |
| 04/20/1994 | EP0360519B1 Timing measurement for jitter display |
| 04/20/1994 | EP0280848B1 On-chip on-line ac and dc clock tree error detection system |
| 04/20/1994 | EP0262330B1 High performance clock system error detection and fault isolation |
| 04/20/1994 | CN2162658Y Detecting device of dry cell capacity |
| 04/20/1994 | CN2162657Y Test apparatus for cable broken circuit trouble point |
| 04/20/1994 | CN2162656Y Monitoring pen for vehicle electric circuit |
| 04/20/1994 | CN1085664A Testing device for insulation defect of electrical conductor |
| 04/19/1994 | US5305331 Data logging apparatus with memory and pattern testing device |
| 04/19/1994 | US5305329 Delay data setting circuit and method |
| 04/19/1994 | US5305328 Method of test sequence generation |
| 04/19/1994 | US5305327 Testing random access memories |
| 04/19/1994 | US5305267 Semiconductor memory device adapted for preventing a test mode operation from undesirably occurring |
| 04/19/1994 | US5305235 Monitoring diagnosis device for electrical appliance |
| 04/19/1994 | US5304987 Board removal detection circuit |
| 04/19/1994 | US5304986 Battery voltage alarm apparatus |
| 04/19/1994 | US5304935 Load driver and system with fault detection apparatus for providing a sequence of fault detection logic states |
| 04/19/1994 | US5304925 Semiconductor device |
| 04/19/1994 | US5304923 Integrated circuit device having signal discrimination circuit and method of testing the same |
| 04/19/1994 | US5304921 Enhanced grounding system for short-wire lengthed fixture |
| 04/19/1994 | US5304915 Overcharge preventing device and overdischarge preventing device for a secondary battery |
| 04/19/1994 | US5304779 Semiconductor preheater with inclined rotary feed |
| 04/19/1994 | US5304433 Capacity indicator for lead-acid batteries |
| 04/14/1994 | WO1994008380A1 Sensor for registration of leak current |
| 04/14/1994 | WO1994008248A1 A contactless test method and system for testing printed circuit boards |
| 04/14/1994 | DE4234121A1 Faulty solder joint test method - using laser beam to generate ultrasonic signals which are sensor monitored |
| 04/14/1994 | DE4201516C2 Schaltungsanordnung zum Bewirken eines Streßtests bei einer Halbleiterspeichervorrichtung A circuit arrangement for effecting a stress test in a semiconductor memory device |
| 04/13/1994 | EP0592339A1 Printed circuit testing appliance |
| 04/13/1994 | EP0591871A1 A method and apparatus for the diagnostic testing of electrical equipment of a vehicle |
| 04/13/1994 | EP0591562A1 Programm controlled optimization of a processor controlled circuit for producing an algorithmically generatable data output sequence |
| 04/13/1994 | EP0591149A1 Communications line testing. |
| 04/13/1994 | EP0527866B1 Integrated semiconductor store with parallel test facility and redundancy process |
| 04/13/1994 | EP0506832B1 Method and device for storing intermittent functional faults of a physical system and of context variables of these faults |
| 04/13/1994 | CN2161932Y Double anode plug for testing power on/off |
| 04/13/1994 | CN1085320A Power frequency test voltage measurer |
| 04/12/1994 | US5303246 Process for diagnosing boundary scan test observed data |
| 04/12/1994 | US5303202 Method for detecting breaks in geophone cables for seismic data acquisition system |
| 04/12/1994 | US5303193 Semiconductor device |
| 04/12/1994 | US5303164 Insulation monitor with improved precision |
| 04/12/1994 | US5302960 Multi-element susceptibility room |
| 04/12/1994 | US5302945 Electric appliance fault monitor and indicator |
| 04/12/1994 | US5302904 Method of detecting insulation faults and spark tester for implementing the method |
| 04/12/1994 | US5302902 Abnormal battery cell voltage detection circuitry |
| 04/12/1994 | US5302892 Semiconductor integrated circuit |
| 04/12/1994 | US5302891 For testing a semiconductor device in die form |
| 04/12/1994 | CA1328481C Test head with improved shielding |
| 04/07/1994 | DE4332555A1 Overcurrent protection switch for electric motor-driven systems - computes estimate of output torque from measurements supplied by three=phase current and voltage transformers and potential dividers. |
| 04/07/1994 | DE4242990C1 Comparator for verifying characteristics of IC monoliths - compares all IC devices with those of reference IC either manually or to PC programme with output to plotter |
| 04/07/1994 | DE4233399A1 Force microscope with cantilevered point and deflection photodetector - is based on measurement of astigmatism in compact sensor head revolvable into path of optical microscope |
| 04/06/1994 | EP0591011A1 Device for detecting faults on an electric energy distributing underground network |
| 04/06/1994 | EP0590982A2 Stress test for memory arrays in integrated circuits |
| 04/06/1994 | EP0590812A1 EMC and ESD test arrangement and apparatus |
| 04/06/1994 | EP0590575A1 Test control circuit for scan path |
| 04/06/1994 | EP0590524A1 Defect detection and defect removal apparatus of thin film electronic device |
| 04/06/1994 | EP0590221A1 Current measuring structure for testing integrated circuits |
| 04/06/1994 | EP0590180A1 Measure device for testing the earth connections of a control circuit, for example control circuit of an airbag system of a vehicle |
| 04/06/1994 | EP0589974A1 A method and a system for testing capacitive acoustic transducers |
| 04/06/1994 | EP0589935A1 Inspection of a dynamo-electric machine in a gap between stator and rotor. |
| 04/06/1994 | CN2160918Y Wide-band drop off type isolator fault indicator |
| 04/06/1994 | CN2160917Y High-voltage network insulation monitor |
| 04/06/1994 | CN1084976A High voltage megger for accurate measuring capicitive sample property |
| 04/06/1994 | CN1084975A High voltage megger with anti strong interference function |
| 04/05/1994 | US5301336 Graphical method for programming a virtual instrument |
| 04/05/1994 | US5301248 Method for pattern inspection and apparatus therefor |
| 04/05/1994 | US5301199 Built-in self test circuit |
| 04/05/1994 | US5301156 Configurable self-test for embedded RAMs |
| 04/05/1994 | US5301140 Microcomputer that detects whether the output of an analog to digital convertor is increasing or decreasing overtime |
| 04/05/1994 | US5301006 Emission microscope |
| 04/05/1994 | US5301002 Apparatus for inspecting a semiconductor device |
| 04/05/1994 | US5300881 For testing of printed circuit boards |
| 04/05/1994 | US5300880 Method of measuring a voltage with an electron beam apparatus |
| 04/05/1994 | US5300768 Including a processing means for driving designated photoelectric detectors for the checking thereof |
| 04/05/1994 | CA2000120C Guide path short detector |
| 03/31/1994 | WO1994007278A1 Method for inspecting battery and apparatus therefor |
| 03/31/1994 | WO1994007211A2 Latent defect handling in eeprom devices |
| 03/31/1994 | WO1994007153A1 Apparatus for monitoring the voltage of a dc supply |
| 03/31/1994 | WO1994007152A1 Decoupling of a high-frequency error signal from a high-frequency electromagnetic field in a large electric machine |
| 03/31/1994 | WO1994007151A1 Decoupling of a high-frequency error signal in a liquid-cooled electric heavy electric machine |
| 03/31/1994 | DE4332618A1 Burn-in test circuit for semiconductor memory - has internal voltage generator switched to firing test mode by output signal of firing sensor |
| 03/31/1994 | DE4303018C1 Determining thermal resistance of safety switches taking account of phase current harmonics - using analogue measurement, computerised digital processing of phase currents and rapid Fourier transformation |
| 03/31/1994 | DE4232070A1 Module for laying and testing line plugs, esp. for vehicle - has contact movable between two test positions against compression spring force |
| 03/30/1994 | EP0589797A1 Self testable switching system |
| 03/30/1994 | EP0589553A1 Register to enable and disable built-in testing logic |