Patents for G01R 31 - Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere (152,264) |
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09/20/1994 | US5349162 Cooking appliance |
09/20/1994 | US5348813 Battery charge indicator |
09/20/1994 | US5348164 Method and apparatus for testing integrated circuits |
09/20/1994 | CA2013888C Programmable timer power switch unit |
09/15/1994 | WO1994020909A1 Mask-programmed integrated circuits having timing and logic compatibility to user-configured logic arrays |
09/15/1994 | WO1994020827A1 Method and apparatus for positioning and biasing an electro-optic modulator of an electro-optic imaging system |
09/15/1994 | WO1994013909A3 Chamber arrangement for an inflatable structure |
09/15/1994 | DE4304448A1 Guard test device |
09/14/1994 | EP0615267A1 Circuit for testing switch- or relay contacts |
09/14/1994 | EP0615253A2 Semiconductor memory with built-in burn-in test |
09/14/1994 | EP0615252A2 Semiconductor memory with built-in parallel bit test mode |
09/14/1994 | EP0615249A2 Semiconductor dynamic random access memory |
09/14/1994 | EP0615203A1 Method and apparatus for fitting circuit parameter |
09/14/1994 | EP0615133A1 State of charge indicator for a battery |
09/14/1994 | EP0615132A1 Method of electrical testing equipotential lines |
09/14/1994 | EP0570389B1 Method and device for contactless measurement of the voltage in an object with an insulating surface |
09/14/1994 | EP0516633B1 Process and device for monitoring the functioning of an electrical consumer |
09/14/1994 | CN2177318Y Multifunction switch for electric heating blanket |
09/14/1994 | CN2177247Y Transistor testor |
09/14/1994 | CN2177246Y Circuit type insulation monitoring device |
09/14/1994 | CN2177245Y Electric net fault memory alarm |
09/14/1994 | CN2177244Y Anti-theft, shock-proof alarm |
09/14/1994 | CN1092176A Method for extending testing distance of cable fault |
09/13/1994 | US5347540 Dynamic storage allocation in a logic analyzer |
09/13/1994 | US5347523 Data processing system having serial self address decoding and method of operation |
09/13/1994 | US5347520 Boundary-scan enable cell with non-critical enable path |
09/13/1994 | US5347519 Preprogramming testing in a field programmable gate array |
09/13/1994 | US5347492 Semiconductor integrated circuit device |
09/13/1994 | US5347418 Fuse blowout detector circuit |
09/13/1994 | US5347362 Bonding wire inspection method |
09/13/1994 | US5347214 Method and device for setting the short circuit moment in electric motors, particularly in servomotors |
09/13/1994 | US5347212 System and method of use for conducting a neutral corrosion survey |
09/13/1994 | US5347176 Analog ramp generator with digital correction |
09/13/1994 | US5347174 Circuit arrangement for converting a voltage drop tapped from a test object from a predetermined input voltage range to a desired output voltage range |
09/13/1994 | US5347145 Pad arrangement for a semiconductor device |
09/13/1994 | CA2117161A1 Equipotential line electric test method |
09/13/1994 | CA2116910A1 State of charge indicator for deep-cycle applications |
09/13/1994 | CA2019589C Auto electric tester |
09/08/1994 | DE4406674A1 Method for testing an electrode plate to be tested |
09/08/1994 | DE4403375A1 Device and method for controlling an inductive load |
09/07/1994 | EP0614276A1 Simulator for a predominantly magnetic field and its application for testing equipments |
09/07/1994 | EP0614193A2 Method and apparatus for detecting retention faults in memories |
09/07/1994 | EP0614145A2 Test control device |
09/07/1994 | EP0614144A2 Semiconductor integrated circuit device equipped with answer system for teaching optional functions to diagnostic system |
09/07/1994 | EP0614090A2 A method of determining contact quality and line integrity in a TFT/LCD array tester |
09/07/1994 | EP0614089A2 Method and apparatus for in-situ testing of integrated circuit chips |
09/07/1994 | EP0613593A1 Battery management system |
09/07/1994 | EP0502884B1 Method and device for semiconductor fabrication fault analasys |
09/07/1994 | CN2176550Y Load signalling sensor of mine electric motor |
09/07/1994 | CN1091870A Generator voltage regulator circuit with breakdown prediction |
09/07/1994 | CN1091835A Lightning arrester leakance detecting and action recorder |
09/07/1994 | CN1025891C Multifunction test pencil with simulated pointer liquid crystal display |
09/06/1994 | US5345510 Integrated speaker supervision and alarm system |
09/06/1994 | US5345450 Method of compressing and decompressing simulation data for generating a test program for testing a logic device |
09/06/1994 | US5345401 Logic circuit simulator for verifying circuit operations having MOS transistors |
09/06/1994 | US5345393 Logic circuit generator |
09/06/1994 | US5345392 Battery charge monitor for a personal computer |
09/06/1994 | US5345384 Method of and apparatus for interrogating vehicle control device data |
09/06/1994 | US5345364 Edge-connecting printed circuit board |
09/06/1994 | US5345186 Retriggered oscillator for jitter-free phase locked loop frequency synthesis |
09/06/1994 | US5345181 Circuit for a detecting state of conduction of current through a solenoid |
09/06/1994 | US5345180 Method and arrangement for detecting short-circuits in circuit branches of electrical power system networks |
09/06/1994 | US5345170 Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
09/06/1994 | US5345163 Battery monitoring system |
09/06/1994 | US5345158 Electrical distribution equipment with torque estimating capability |
09/06/1994 | US5344238 Ball bearing assembly |
09/02/1994 | CA2113863A1 Method and apparatus for detecting retention faults in memories |
09/01/1994 | WO1994019745A1 Auto-test process for non-regular cmos circuit structures with high fault detection |
09/01/1994 | WO1994019703A1 Method and apparatus for testing electric motor rotors |
09/01/1994 | DE4412202A1 Method for the contactless determination of the electrical conduction type of semiconductor materials and measuring instrument for carrying out the method |
09/01/1994 | DE4305442A1 Device for testing an electronic device |
08/31/1994 | EP0613335A1 Socket apparatus for IC package testing |
08/31/1994 | EP0613203A1 Device for displaying remaining charge of secondary cell |
08/31/1994 | EP0613018A1 Device for monitoring and measuring the insulation of an electrical network |
08/31/1994 | EP0613016A1 Voltage detection apparatus |
08/31/1994 | EP0613013A1 Self leveling membrane test probe |
08/30/1994 | US5343479 Semiconductor integrated circuit having therein circuit for detecting abnormality of logical levels outputted from input buffers |
08/30/1994 | US5343478 Computer system configuration via test bus |
08/30/1994 | US5343434 Nonvolatile semiconductor memory device and manufacturing method and testing method thereof |
08/30/1994 | US5343430 Method and circuitry for screening a dynamic memory device for defective circuits |
08/30/1994 | US5343188 Slide rheostat type linear characteristic sensor |
08/30/1994 | US5343144 Electronic device |
08/30/1994 | US5343135 Voltage limiting and indicating device |
08/30/1994 | US5343096 System and method for tolerating dynamic circuit decay |
08/30/1994 | US5343083 Analog/digital hybrid masterslice IC |
08/30/1994 | US5342807 Soft bond for semiconductor dies |
08/30/1994 | US5342206 Socket for direct electrical connection to an integrated circuit chip |
08/30/1994 | US5341685 Method and apparatus for non-destructive testing of inner lead tab bonds and semiconductor chips |
08/26/1994 | CA2116405A1 Electronic interlock for electromagnetic contactor |
08/25/1994 | DE4412238A1 Optical measuring arrangement for fast, contactless and non-destructive of characteristic semiconductor parameters |
08/25/1994 | DE4305672A1 Method and device for testing networks for short circuits and/or interruptions |
08/25/1994 | DE4305526A1 Method for operating an integrated circuit |
08/24/1994 | EP0612134A2 Programmable battery controllers |
08/24/1994 | EP0611968A1 Apparatus for testing modules |
08/24/1994 | EP0611944A1 Testing circuit |
08/24/1994 | EP0611452A1 Device and process for testing the charge of a nickel-cadmium battery. |
08/24/1994 | CN2175424Y Isolation type high voltage microammeter |
08/24/1994 | CN1025761C Method for measuring inductance of d.c. motor rotor loop or plane-wave reactor |
08/24/1994 | CN1025758C Automatic measuring system for dielectric constant of rock |
08/23/1994 | US5341503 Battery operated computer having improved battery gauge and system for measuring battery charge |