Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 1 - Details of instruments or arrangements of the types covered by groups  or
Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups  or (27,269)
12/2010
12/22/2010CN101923140A Withstand test device of sleeve of looped network cabinet equipment
12/22/2010CN101923126A Digital protecting tester, automatic closed loop test system and method
12/22/2010CN101923106A Four-way sinusoidal signal generator
12/22/2010CN101923105A Probe card used for testing image sense chip
12/22/2010CN101923104A General adapter of electron and circuit board detection device
12/22/2010CN101923103A Cantilever type probe card used for high-frequency test of image sensor chip
12/22/2010CN101464490B General-purpose test board and its use method
12/22/2010CN101398453B Single light path quantum efficiency test system
12/22/2010CN101308164B Probe assembly and inspection device
12/22/2010CN101271147B Probe unit and detection apparatus
12/22/2010CN101211808B Picker for use in a handler and method for enabling the picker to place packaged chips
12/21/2010US7855548 Low labor enclosure assembly
12/21/2010US7855544 AC low current probe card
12/21/2010US7855341 Methods and apparatus for a flexible circuit interposer
12/16/2010US20100318306 Capacitive voltage sensor
12/16/2010US20100315112 Socket adapter for testing singulated ics with wafer level probe card
12/16/2010US20100315110 Hermeticity testing
12/16/2010US20100315109 Burn-in system for electronic devices
12/16/2010US20100315066 Current sensor
12/16/2010US20100315065 Wideband high impendance bridging module
12/16/2010US20100315064 Methods of and apparatus for measuring and controlling wafer potential in pulsed RF bias processing
12/16/2010CA2704103A1 Wideband high impedance bridging module
12/15/2010EP1721365B1 Cable terminal with air-enhanced contact pins
12/15/2010CN201673208U Test instrument for internal resistance and voltage of high-accuracy lithium ion battery
12/15/2010CN201673194U Special fixture for residual action current testing system
12/15/2010CN201673179U Special testing probe for AV port
12/15/2010CN201673178U Thin film resistance testing fixture
12/15/2010CN201673177U Three-dimensional fine-tuning sensor cradle head
12/15/2010CN201673176U Sensor fixing device
12/15/2010CN201673175U Improved structure of wiring terminal for testing electrical appliance
12/15/2010CN201673174U Sample holder special for enamelled lenticular wire dielectric loss tester
12/15/2010CN201673173U Lifting and steering mechanism for test rotary table used in TEM cell
12/15/2010CN201673172U Novel port for ammeter
12/15/2010CN201673171U Electrostatic eliminator of solar cell module attenuation testing device
12/15/2010CN101918851A Voltage source measurement unit with minimized common mode errors
12/15/2010CN101915860A Integrated output terminal structure of capacitive voltage divider
12/15/2010CN101915859A Draw plate light shading device of EL (Electroluminescent) tester
12/15/2010CN101915626A Method for detecting temperature of wafer in real time and method for measuring temperature characteristic of device
12/15/2010CN101447481B Calibration technique for measuring gate resistance of power MOS gate device at wafer level
12/15/2010CN101266281B Automatic processing machine
12/09/2010WO2010140642A1 Probe card
12/09/2010WO2010140184A1 Probe and probe device
12/09/2010WO2010139020A1 Power monitoring system
12/09/2010WO2010096171A3 Test access component for automatic testing of circuit assemblies
12/09/2010US20100308798 System for operating differential probe
12/09/2010DE202010013617U1 Hochfrequenz-Prüfstift High frequency test pin
12/09/2010DE102008046335B4 Einziehbarer Kontaktstabschutz und Verfahren Retractable contact rod protection and procedures
12/09/2010CA2761564A1 Power monitoring system
12/08/2010EP2259297A1 Probe wafer, probe device, and testing system
12/08/2010EP2257823A1 Current measurement apparatus with shunt resistor and heat sink
12/08/2010EP1307751B1 Test probe for wireless-communications devices
12/08/2010CN201667474U Sampler used for realizing communicating junction of terminal and check table body
12/08/2010CN201667264U Digital coding high-power variable resistor
12/08/2010CN201666945U Power module parallel circuit in battery test equipment
12/08/2010CN201666930U Special probe electrode for live working insulation testing
12/08/2010CN201666908U Power measurement display instrument
12/08/2010CN201666902U High-voltage line parameter testing and protecting device
12/08/2010CN201666901U Narrow-band analog front end of electric energy meter
12/08/2010CN201666900U Shielding ring for high-voltage test
12/08/2010CN201666899U Device for prolonging service life of probe on probe clamp
12/08/2010CN101911273A The proble pin composed in one body and the method of making it
12/08/2010CN101910847A Method for manufacturing probe supporting plate, computer storage medium and probe supporting plate
12/08/2010CN101907679A Insulated detection and intelligent safety protection device of electric equipment
12/08/2010CN101907644A Electronic probe control system
12/08/2010CN101907643A Mobile assembled multifunctional integrated test stand
12/08/2010CN101907642A Inspection fixture and inspection probe
12/08/2010CN101907641A Probe test circuit and design method thereof
12/08/2010CN101373193B Battery emulation apparatus
12/08/2010CN101359799B Connecting method of electric connector and general battery interface
12/08/2010CN101354404B Metal-silicon compound cantilever beam type microelectronic mechanical system probe card and manufacture method thereof
12/08/2010CN101060208B Anisotropic conductive sheet and method of manufacturing the same
12/07/2010US7847439 Dry-type high-voltage load system apparatus and method of preventing chain breaking and arc discharge for use therewith
12/07/2010US7847388 Method of manufacturing a semiconductor device
12/02/2010WO2010137690A1 Silver alloy that is appropriately usable in probe pins having excellent contact resistance and excellent anti-stain properties
12/02/2010WO2010137440A1 Ceramic member, probe holder, and method for producing ceramic member
12/02/2010US20100305897 Method of applying the analysis of scrub mark morphology and location to the evaluation and correction of semiconductor testing, analysis, and manufacture
12/02/2010US20100305876 Non-destructive inspection system having self-aligning probe assembly
12/02/2010US20100304510 Fabrication method of semiconductor integrated circuit device
12/02/2010US20100301890 Probing apparatus with multiaxial stages for testing semiconductor devices
12/02/2010US20100301838 Method for Monitoring the Output of an Electromechanical Actuator of the Rotary-Linear Type
12/01/2010EP1762001B1 Circuit arrangement and method for adjusting the power input of a load which can be operated on a direct current supply network
12/01/2010CN201663710U High-precision semiconductor chip testing heater plate
12/01/2010CN201663024U Sampling resistor in PWM controller
12/01/2010CN201662608U Electromagnetic interference resistant pacemaker test jig
12/01/2010CN201662607U Mainboard testing device of fiscal cash register
12/01/2010CN201662588U Hook type electric meter providing light source
12/01/2010CN201662584U Portable large current generator
12/01/2010CN201662583U Ultrahigh-frequency pulse generator
12/01/2010CN201662582U Reactive controllable chip testing socket
12/01/2010CN201662581U CIS circuit test probe card
12/01/2010CN101902876A Kelvin contact module for a microcircuit test system
12/01/2010CN101900750A Electric contact and inspection jig with the same
12/01/2010CN101900749A Support for testing BGA packaged chips
12/01/2010CN101900748A Inspection fixture
12/01/2010CN101900747A Package chip acceptance device, test disk containing the packaging chip acceptance device and test grader using the packaging chip acceptance device
12/01/2010CN101571564B Testing tool of radio frequency (RF) coaxial connector
12/01/2010CN101509938B Low voltage high-current harmonic generator based on resonance manner
12/01/2010CN101344536B IC picking device with uniformly-spaced movement
11/2010
11/30/2010US7843203 Support member assembly having reinforcement member for conductive contact members
11/30/2010US7843188 Remote sensor network powered inductively from data lines
1 ... 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100 101 102 103 104 105 ... 273