| Patents for G01R 1 - Details of instruments or arrangements of the types covered by groups or (27,269) |
|---|
| 01/12/2011 | CN201707357U PCB test clamp |
| 01/12/2011 | CN201707356U Power meter subrack |
| 01/12/2011 | CN201707355U Aging testing rack |
| 01/12/2011 | CN201707354U Testing jig |
| 01/12/2011 | CN201707353U Electric power instrument |
| 01/12/2011 | CN201707352U Multi-input channel electric energy feedback type electronic load based on bus framework |
| 01/12/2011 | CN1873425B Semiconductor testing apparatus and interface board |
| 01/12/2011 | CN101946313A Probe wafer, probe device, and testing system |
| 01/12/2011 | CN101946183A Wiring board and probe card |
| 01/12/2011 | CN101946182A Improved probe card for testing integrated circuits |
| 01/12/2011 | CN101943741A Apparatus for testing integrated circuit |
| 01/12/2011 | CN101943710A Test probe of laminated semiconductor chip |
| 01/12/2011 | CN101943709A Probe card, test method and test equipment |
| 01/12/2011 | CN101943708A Automatic tester |
| 01/12/2011 | CN101650230B Multifunctional probe for plasma diagnosis |
| 01/12/2011 | CN101577393B Wafer socket and method for detecting horizontal positioning of wafer |
| 01/12/2011 | CN101345470B Current transformer |
| 01/11/2011 | US7868642 Socket for connecting ball-grid-array integrated circuit device to test circuit |
| 01/11/2011 | US7868635 Probe |
| 01/11/2011 | US7868632 Composite motion probing |
| 01/06/2011 | WO2011002125A1 Probe device for testing |
| 01/06/2011 | WO2011000101A1 Channel, system and method for monitoring voltages |
| 01/06/2011 | WO2010104303A3 Probe unit for testing panel |
| 01/06/2011 | WO2010104289A3 Probe unit for testing panel |
| 01/06/2011 | US20110002746 Method of Assessing a Multilayer Strata for Rock Bolt Installation |
| 01/06/2011 | US20110001469 Unbiased non-polarized direct current voltage divider float circuit |
| 01/05/2011 | EP2270519A2 Multimeter |
| 01/05/2011 | EP1365479B1 Anisotropic conductive connector, its manufacture method and probe member |
| 01/05/2011 | DE102009031408A1 Elektronisches Bauelement und entsprechendes Herstellungsverfahren The electronic component and corresponding production method |
| 01/05/2011 | CN201699191U Double-probe mobile phone test connector |
| 01/05/2011 | CN201698182U Clock device for service life test of electric actuating mechanism |
| 01/05/2011 | CN201697946U Intelligent electric energy checking and reading device capable of displaying power consumption outside electrical well and inside house |
| 01/05/2011 | CN201697945U 方波注入装置 Square wave injection device |
| 01/05/2011 | CN201697944U Switch card probe device for high-density printed circuit board testing machine |
| 01/05/2011 | CN201697943U Canding wire connector of solar cell lamination part |
| 01/05/2011 | CN201697942U Testing electricity generation ground installation platform of windmill generators |
| 01/05/2011 | CN201697941U Electricity meter shell using wire frame |
| 01/05/2011 | CN201697940U Testing turntable used for transverse electromagnetic wave cell |
| 01/05/2011 | CN201697939U Variable squirrel cage current leading device in extra-high voltage alternating current and direct current environmental testing field |
| 01/05/2011 | CN101938125A Network for dynamically suppressing power frequency interference of power transmission line |
| 01/05/2011 | CN101937050A Portable multifunctional insulated instrument test rack |
| 01/05/2011 | CN101937009A Core package short circuit detecting clamp for piercing and rolling combined machine |
| 01/05/2011 | CN101430354B Test method and apparatus for pin element |
| 01/05/2011 | CN101271145B Inspection apparatus and method |
| 01/05/2011 | CN101266261B Carrying bench |
| 01/04/2011 | US7863915 Probe card cooling assembly with direct cooling of active electronic components |
| 01/04/2011 | US7863888 Efficient switching architecture with reduced stub lengths |
| 01/04/2011 | CA2522239C Anisotropic conductive film and manufacturing method thereof |
| 12/30/2010 | US20100328061 Crimes and disasters preventing system |
| 12/30/2010 | US20100327897 Wiring substrate and probe card |
| 12/30/2010 | US20100327895 Module for a parallel tester for the testing of circuit boards |
| 12/30/2010 | US20100327894 Dual Tip Test Probe Assembly |
| 12/30/2010 | US20100327851 Contact mechanism, card detecting apparatus, and card detecting method |
| 12/30/2010 | DE202010013616U1 Hochfrequenz-Prüfstift High frequency test pin |
| 12/29/2010 | WO2010150659A1 Probe card, probe card laminated body, and probe card using the probe card laminated body |
| 12/29/2010 | EP1601980B1 Wrist joint for positioning a test head |
| 12/29/2010 | EP1410048B1 Test head docking system and method |
| 12/29/2010 | CN201690093U Pluggable wire clip |
| 12/29/2010 | CN201689135U Pressure-controllable impedance testing system for film buttons |
| 12/29/2010 | CN201689117U Novel reverse testing fixture |
| 12/29/2010 | CN201689116U Probe bed fixture |
| 12/29/2010 | CN201689115U Telescopic spring type test wire |
| 12/29/2010 | CN201689114U Digital installation instrument with high safety |
| 12/29/2010 | CN201689113U Digital installation instrument with firm installation and convenient disassembly |
| 12/29/2010 | CN201689112U Digital mounting instrument with rear panel patch |
| 12/29/2010 | CN201689111U Digital installation instrument with multiple wiring windows |
| 12/29/2010 | CN201689110U Rotary type cable test connector |
| 12/29/2010 | CN201689109U Multifunctional universal power detecting pincers |
| 12/29/2010 | CN101932941A Probe unit |
| 12/29/2010 | CN101930029A Measuring device for detecting resistors in air-condition circuits automatically |
| 12/29/2010 | CN101930016A Replaceable probe device and probe card using same |
| 12/29/2010 | CN101458264B Signal shielded box with multilayer movable cover |
| 12/29/2010 | CN101452011B Probe card and circuit board |
| 12/29/2010 | CN101256199B Clamper |
| 12/29/2010 | CN101122613B Carrier tray for use with prober |
| 12/29/2010 | CN101093244B Semiconductor device, semiconductor device testing method, and probe card |
| 12/28/2010 | US7859278 Probe holder for a probe for testing semiconductor components |
| 12/23/2010 | WO2010146773A1 Microcontact prober |
| 12/23/2010 | WO2010104337A3 Probe card for testing film package |
| 12/23/2010 | US20100323551 Sharpened, oriented contact tip structures |
| 12/23/2010 | US20100321057 Probe pin and method of manufacturing the same |
| 12/23/2010 | US20100321056 System and method of measuring probe float |
| 12/23/2010 | US20100321053 Semiconductor inspection apparatus, semiconductor wafer positioning method, and semiconductor wafer inspection method |
| 12/23/2010 | US20100321018 High-Resolution NMR Probe |
| 12/23/2010 | US20100321004 Diagnostic devices incorporating fluidics and methods of manufacture |
| 12/23/2010 | US20100321002 Integrated sensor with capacitive coupling rejection to the mechanical ground |
| 12/23/2010 | US20100320996 Device and method for determining at least one value associated with the electromagnetic radiation of an object being tested |
| 12/23/2010 | DE202010008908U1 Umhüllung für Sonde eines Meßstabs Wrapper for probe of a dipstick |
| 12/23/2010 | CA2708746A1 Meter collar |
| 12/22/2010 | EP2264472A2 Device for measuring the loss factor |
| 12/22/2010 | EP2263094A2 Test contact arrangement |
| 12/22/2010 | CN201682179U Intelligent control device of switchgear |
| 12/22/2010 | CN201681417U Needle inserting frequency counting device of probe card and probe card |
| 12/22/2010 | CN201681140U Bias allocation interface and reliability test board with the same |
| 12/22/2010 | CN201681098U High-voltage high-power power consumption device |
| 12/22/2010 | CN201681097U Shielding case |
| 12/22/2010 | CN201681096U Finger-type contact and integrated circuit wafer tester employing the same |
| 12/22/2010 | CN201681095U Bound product testing clamp with heat seal paper |
| 12/22/2010 | CN201681094U Adjustable sheet-type capacitor aging jig |
| 12/22/2010 | CN101925824A Module for parallel tester for testing of circuit boards |