| Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671) |
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| 09/18/2008 | US20080227462 Methods and Apparatus for Locating Access Device |
| 09/18/2008 | US20080226027 Estimating strengths of wooden supports |
| 09/18/2008 | US20080224358 Nano-Molding Process |
| 09/18/2008 | US20080224036 Method and device to quantify active carrier profiles in ultra-shallow semiconductor structures |
| 09/17/2008 | EP1969357A1 Measurement of ash composition using scanning high voltage x-ray sensor |
| 09/11/2008 | US20080219412 Methods and Devices for Quantitative Analysis of X-Ray Images |
| 09/11/2008 | US20080219409 Inspection method for thin film stack |
| 09/11/2008 | US20080216741 Dynamic film thickness control system/method and its utilization |
| 09/04/2008 | US20080215274 Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication |
| 09/03/2008 | CN100416222C Film thickness measuring method and microwave measuring apparatus |
| 09/02/2008 | US7421109 Pattern inspection apparatus |
| 09/02/2008 | US7420379 Semiconductor device test method and semiconductor device tester |
| 08/28/2008 | US20080205596 Method for Inspecting Ceramic Structures |
| 08/28/2008 | US20080205595 Method of Measuring Thickness of Thin Film Using Microwave |
| 08/28/2008 | US20080203302 Sample transfer unit and sample transferring method |
| 08/28/2008 | DE102007009094A1 Aktor mit Positionsmessvorrichtung Actuator with position measuring device |
| 08/26/2008 | US7418363 Micropattern measuring method, micropattern measuring apparatus, and computer-readable recording medium on which a micropattern measuring program is recorded |
| 08/26/2008 | US7417750 Consecutive measurement of structures formed on a semiconductor wafer using an angle-resolved spectroscopic scatterometer |
| 08/22/2008 | CA2589541A1 Fiber optic cable with integral radio frequency identification system |
| 08/21/2008 | US20080198467 Standard Component For Length Measurement, Method For Producing The Same, and Electron Beam Metrology System Using The Same |
| 08/21/2008 | US20080197541 Crosslinked Polyethylene Article |
| 08/21/2008 | US20080197280 Method and apparatus for measuring pattern dimensions |
| 08/19/2008 | US7415613 System and method for detecting alteration of objects |
| 08/19/2008 | US7415149 Pattern inspection apparatus |
| 08/19/2008 | US7414732 Method and device for determining the 3D profile of an object |
| 08/13/2008 | CN101243329A Method for determining the layer thickness of a tbc coating of at least one blade of a non-positive-displacement machine, a corresponding tbc layer thickness measuring device for carrying out the meth |
| 08/13/2008 | CN101241088A High speed X light strong conveyer band detection system |
| 08/12/2008 | US7412022 Non-invasive stationary system for three-dimensional imaging of density fields using periodic flux modulation of compton-scattered gammas |
| 08/12/2008 | US7411190 Inspection system, inspection method, and process management method |
| 08/07/2008 | DE102004004597B4 Verfahren zur Vermessung einer Struktur auf einem Halbleiterwafer mit einem Rasterelektronenmikroskop A method for measurement of a structure on a semiconductor wafer with a scanning electron microscope |
| 08/06/2008 | CN101238351A Imaging geometry |
| 08/06/2008 | CN101238349A Method and apparatus for checking wall thickness |
| 08/06/2008 | CN100409002C X-ray coating thickness device |
| 08/05/2008 | US7409313 Method and apparatus for nondestructive evaluation of insulative coating |
| 08/05/2008 | US7409309 Method of deciding the quality of the measurement value by the edge width |
| 08/05/2008 | CA2511345C Apparatus and method for displaying numeric values corresponding to the volume of segments of an irregularly shaped item |
| 07/31/2008 | DE102007003389A1 Aktor mit Positionsmessvorrichtung Actuator with position measuring device |
| 07/30/2008 | EP1950527A1 X-ray inspection device |
| 07/30/2008 | CN201094009Y Full-automatic reciprocating wide breadth X ray thin membrane thickness measuring instrument |
| 07/30/2008 | CN101231160A Method for representing nondestructive film |
| 07/23/2008 | CN101226921A Substrate capable of detecting connection point thickness and detecting method thereof |
| 07/22/2008 | CA2370151C Position detector with auxiliary means for detecting the direction of the gravity vector |
| 07/17/2008 | US20080170659 Calibration Devices and Methods of use Thereof |
| 07/16/2008 | CN101223413A Apparatus for electromagnetically measuring a wall thickness |
| 07/16/2008 | CN100402977C System and method for counting the number of layers of a multilayer object by means of electromagnetic waves |
| 07/15/2008 | US7400702 Tire inspection method |
| 07/15/2008 | US7399964 Electron microscope, measuring method using the same, electron microscope system, and method for controlling the system |
| 07/10/2008 | WO2008027569A3 In-line inspection system for vertically profiling plastic containers using multiple wavelength discrete spectral light sources |
| 07/10/2008 | US20080166054 Pattern inspection apparatus |
| 07/10/2008 | DE112007000009T5 Musterdimensionsmessgerät und Musterflächenmessverfahren Pattern dimension measuring instrument and sample surface measurement method |
| 07/10/2008 | DE102006052791B3 Position measuring device for e.g. fluid valve, has heating mechanism provided for heating dielectric body within diffusion area of microwave, where heating mechanism has heating conductors that are arranged in or on dielectric body |
| 07/10/2008 | DE102006052789B3 Verfahren und Positionsmessvorrichtung zur Bestimmung einer Position eines Messobjekts A position measuring device and method for determining a position of a measurement object |
| 07/10/2008 | CA2617410A1 Apparatus and method for monitoring snow water equivalent and soil moisture content using natural gamma radiation |
| 07/08/2008 | US7398178 Method of determining the irregularities of a hole |
| 07/08/2008 | US7397892 Security entrance system |
| 07/08/2008 | US7396158 Mobile flat X-ray detector having a carry grip |
| 07/08/2008 | CA2498190C Actuator and object detecting apparatus that uses actuator |
| 07/08/2008 | CA2355621C Latex coat thickness measuring and control apparatus |
| 07/03/2008 | WO2008039070A3 Arrangement and method for non destructive measurement of wall thickness and surface shapes of objects with an inner surface |
| 07/03/2008 | US20080159480 High Voltage X-Ray Generator and Related Oil Well Formation Analysis Apparatus and Method |
| 07/02/2008 | CN100398987C Reaming measuring instrument |
| 07/01/2008 | US7394067 Systems and methods for reducing alteration of a specimen during analysis for charged particle based and other measurement systems |
| 06/26/2008 | DE102006059415A1 Thickness measurement device determines material thickness between first and second main surface using first and second measured distances and first material thickness measured from x-ray attenuation |
| 06/25/2008 | CN101206112A Method for measuring nano-scale multilayer film structure |
| 06/25/2008 | CN100397095C Distance measuring device, distance measuring equipment and distance measuring method |
| 06/19/2008 | WO2008071337A1 Method and device for thickness measurement |
| 06/19/2008 | US20080141778 Method of non-destructively testing a work piece and non-destructive testing arrangement |
| 06/19/2008 | CA2672679A1 Method and apparatus for thickness measurement |
| 06/17/2008 | US7388677 Optical metrology optimization for repetitive structures |
| 06/10/2008 | US7386090 Processes and a device for determining the actual position of a structure of an object to be examined |
| 06/10/2008 | US7385196 Method and scanning electron microscope for measuring width of material on sample |
| 06/10/2008 | US7385195 Semiconductor device tester |
| 06/05/2008 | WO2008017075A3 Method and apparatus for sorting materials according to relative composition |
| 06/05/2008 | US20080130982 Pattern inspection apparatus and method |
| 05/29/2008 | DE10133676B4 Röntgenfluoreszenz-Dickenprüfer X-ray fluorescence thickness tester |
| 05/28/2008 | CN101187550A Method for checking train integrity based on GPS and dummy satellite combined positioning |
| 05/28/2008 | CN100390922C Evaluation of chamber components having textured coatings |
| 05/28/2008 | CN100390499C Method and system for representing nondestructivity of film layer |
| 05/27/2008 | US7379529 Methods and devices for quantitative analysis of x-ray images |
| 05/20/2008 | US7375327 Method and device for measuring quantity of wear |
| 05/15/2008 | US20080114561 Method of determining micro- and nano- sizes in scanning electron microscope |
| 05/15/2008 | US20080112536 Density measurement with gamma backscattering |
| 05/15/2008 | DE102006052790A1 Positionsmessvorrichtung zur Bestimmung einer Position eines Messobjekts A position measuring device for determining a position of a measurement object |
| 05/08/2008 | WO2008053524A1 Semiconductor inspecting apparatus and semiconductor inspecting method |
| 05/08/2008 | US20080109755 Scanning electron microscope with measurement function |
| 05/06/2008 | US7369703 Method and apparatus for circuit pattern inspection |
| 04/30/2008 | EP1915639A1 Method for determining the layer thickness of a tbc coating of at least one blade of a non-positive-displacement machine, a corresponding tbc layer thickness measuring device for carrying out the method and use of the method and the tbc layer thickness measuring device |
| 04/29/2008 | US7366620 Evaluation method of fine pattern feature, its equipment, and method of semiconductor device fabrication |
| 04/29/2008 | US7365325 Method and apparatus for observing a specimen |
| 04/29/2008 | US7365306 Standard member for length measurement, method for producing the same, and electron beam length measuring device using the same |
| 04/24/2008 | DE102006032423B4 Verfahren und Vorrichtung zur Bestimmung des Fettgehaltes einer Gesamtheit von Fleischstücken Method and device for determining the fat content of a set of pieces of meat |
| 04/17/2008 | WO2008046079A2 System and method for facillitating automated dental measurements and diagnostics |
| 04/17/2008 | WO2008044315A1 Reverse x-ray photoelectron holography device and its measuring method |
| 04/16/2008 | EP1910774A1 Method and apparatus for checking wall thickness |
| 04/16/2008 | CN100382272C Semiconductor device tester |
| 04/15/2008 | US7358495 Standard reference for metrology and calibration method of electron-beam metrology system using the same |
| 04/10/2008 | WO2008040601A1 Device for determining the distance between a rotor blade and a wall of a turbine engine, surrounding said rotor blade |
| 04/10/2008 | WO2008040600A1 Device for determining the distance between a rotor blade and a wall of a turbine engine, surrounding said rotor blade |
| 04/10/2008 | DE102005061687B4 Verfahren und Vorrichtung zur Abstandsmessung sowie Verwendung des Verfahrens und der Vorrichtung zur Topographiebestimmung Method and apparatus for distance measurement and use of the method and apparatus for determining the topography |
| 04/10/2008 | CA2664830A1 Device for determining the distance between a rotor blade and a wall, surrounding said rotor blade, of a turbine engine |