Patents for G01B 15 - Measuring arrangements characterised by the use of wave or particle radiation (3,671)
03/2009
03/26/2009US20090082993 Automated process control of a fabrication tool using a dispersion function relating process parameter to dispersion
03/26/2009US20090081535 X-ray sensitive battery separator and a method for detecting the position of a separator in a battery
03/25/2009CN101393019A Non-contact oil layer thickness detecting method
03/25/2009CN101393018A X-ray sensitive battery separator and a method for detecting the position of a separator in a battery
03/25/2009CN101391713A Sheet overlap detection apparatus and sheet overlap detection method
03/18/2009EP2037213A1 Method and sensor setup for determination of deflection and/or strain for failure detection
03/18/2009EP2037212A1 Method and sensor setup for determination of deflection and/or strain
03/18/2009EP1867949B1 Method of measuring film thickness of surface oxide film of zinc-based plated steel sheet
03/18/2009CN101389951A Measurement of ash composition using scanning high voltage x-ray sensor
03/18/2009CN101387505A Method and sensor setup for determination of deflection and/or strain
03/17/2009US7505153 Model and parameter selection for optical metrology
03/11/2009CN101382505A X ray imaging arrangement and method
03/11/2009CN101382423A Microwave position detector
03/11/2009CN100468200C Lithographic apparatus and device manufacturing method
03/05/2009DE102007042955A1 Mikrowellen-Näherungssensor und Verfahren zur Bestimmung des Abstands zwischen einem Zielobjekt und einem Messkopf eines Mikrowellen-Näherungssensors Microwave proximity sensor and method for determining the distance between a target object and a probe of a microwave proximity sensor
03/04/2009CN201203585Y Integral ray detection device
03/03/2009US7499523 Systems and methods for identifying a substance
02/2009
02/26/2009WO2009025771A2 Parameterized optical system and method
02/26/2009WO2009024669A2 Device for providing a high energy x-ray beam
02/26/2009US20090050804 Method of measuring dimension of film constituting element and apparatus therefor
02/25/2009CN201199157Y On-line measurement apparatus for glass fiber quality thickness
02/25/2009CN100464155C Method for measuring complex foundation sedimentation and deformation by geological radar
02/24/2009US7496172 Method for examining defect in steel bar and apparatus therefor
02/24/2009US7494575 Method for manufacturing a split probe
02/19/2009WO2008155645A3 Device for measuring the thickness of a layer of material
02/19/2009US20090046303 Parameterized optical system and method
02/19/2009US20090044765 Device with fluid distributor and measured value recording and method for operation of a boiler with a throughflow of flue gas
02/18/2009EP2024734A1 A method of determining the feasibility of a proposed structure analysis process
02/18/2009CN101367115A Casting blank liquid core length measuring method
02/17/2009US7492859 Buildup-robust density, level and interface measurement with γ-backscattering
02/12/2009US20090039242 Method of Determining Petro-Physical Information with High Energy Gamma Rays
02/11/2009CN101363806A Tyre expanding mechanism for X-ray tyre detecting machine
02/05/2009WO2009016271A1 Photography housing and system, particularly for controlling the quality of a weld bead
02/05/2009US20090034680 Cts and inspecting method thereof
02/04/2009CN100458424C Method and device for measuring grammage
02/03/2009US7486773 Megavoltage scatter radiation measurement using beam stop array
01/2009
01/29/2009US20090028294 Systems and methods for identifying a substance
01/28/2009CN101354363A Method for measuring substrate surface coating
01/27/2009US7483560 Method for measuring three dimensional shape of a fine pattern
01/21/2009CN101349753A Deformation telemetry technology of large-scale buildings
01/20/2009US7480363 Converting a digital radiograph to an absolute thickness map
01/15/2009WO2009006989A1 Sensing apparatus and method for detecting a three-dimensional physical shape of a body
01/15/2009DE102007060892A1 Measured data set evaluating method for measured object i.e. cooling element, involves determining variations of dimensions and/or surface coordinates of object by comparing target data set with measured data set
01/13/2009US7476856 Sample dimension-measuring method and charged particle beam apparatus
01/08/2009US20090010385 Method and Device for Monitoring Wall Thickness
01/07/2009CN201177501Y X fluorescent thickness-measuring spectrometer
01/07/2009CN101339117A Rice parameter automatic measuring equipment and method
01/06/2009US7474734 Method and apparatus for void content measurement and method and apparatus for particle content measurement
12/2008
12/30/2008CA2296634C Method and apparatus for measuring thickness of coating layers on substrates using backscattering of x-rays and gamma rays
12/30/2008CA2203110C X-ray computed tomography (ct) system for detecting thin objects
12/24/2008WO2008155645A2 Device for measuring the thickness of a layer of material
12/24/2008WO2007127053A3 Non-intrusive pressure gage
12/24/2008DE4408057B4 Vorrichtung zur Röntgenfluoreszenzspektroskopie und deren Verwendung An apparatus for X-ray fluorescence spectroscopy, and their use
12/24/2008CN101328916A Device for measuring detection parameter in fluid tank using microwave coupling probe
12/23/2008US7469033 Density measurement with gamma backscattering
12/18/2008DE102004032473B4 Auswerteverfahren und Auswertevorrichtung für ein System zur Sitzbelegungserkennung Evaluation and evaluation of a system for seat occupancy detection
12/17/2008EP2002035A2 A mobile apparatus capable of surface measurements
12/11/2008WO2008149461A1 Charged particle beam inspection apparatus and method for inspecting charged particle beam
12/11/2008DE10331070B4 Verfahren zur Charakterisierung von Werkstücken aus elektrisch leitfähigen Materialien A method for characterizing workpieces consisting of electrically conductive materials
12/10/2008CN101322009A X-ray inspection device
12/10/2008CN101319886A Method for measuring film thickness of silicon substrate thin film
12/09/2008US7463996 Method and apparatus for scanning
12/03/2008CN101315270A Method and systems for measuring blade deformation in turbines
12/02/2008US7459712 Method and apparatus of measuring pattern dimension and controlling semiconductor device process having an error revising unit
11/2008
11/20/2008US20080285710 Processes and a device for determining the actual position of a structure of an object to be examined
11/19/2008CN101308102A Computer tomography scanned imagery apparatus and method
11/18/2008US7453560 Method of evaluating optical element
11/18/2008US7451684 Actuator device with a microwave position detecting device
11/11/2008US7450232 Generic interface for an optical metrology system
11/11/2008US7449691 Detecting apparatus and device manufacturing method
11/06/2008US20080273665 Adjustable Radiographic Marker and Calibration Aid
11/06/2008DE102008020838A1 Inclination angle determining device for e.g. tractor-trailer, has antennas arranged at vehicle members, respectively and controller determining distance and/or angle between antennas from radio signals of one antenna
10/2008
10/30/2008US20080267353 Energy Discriminating Scatter Imaging System
10/30/2008DE102007020046A1 Abstandsmessvorrichtung und Verfahren zur Bestimmung eines Abstands und ein geeigneter Reflexionskörper The distance measuring apparatus and method for determining a distance and a suitable reflection body
10/30/2008DE102007020043A1 Messeinrichtung für eine Luftfeder Measuring device for an air spring
10/29/2008EP1985998A1 Method for inspecting pipes, and radiographic non-destructive inspection apparatus
10/29/2008CN101297175A Methods, systems, and computer program products for measuring the density of material
10/28/2008US7443951 Exempt source for an x-ray fluorescence device
10/23/2008DE102007021809A1 Verfahren und Vorrichtung zum dimensionellen Messen mit Koordinatenmessgeräten Method and apparatus for dimensional measurement with coordinate measuring machines
10/22/2008CN101290250A Non-contact type temperature measurement devices and method
10/22/2008CN100427883C A system and method for determining a cross sectional feature of a structural element using a reference structural element
10/22/2008CN100427882C Gas ionization type middle-low-energy X.gamma-ray detector
10/16/2008US20080255799 Determination of the Gap Size of a Radial Gap
10/16/2008DE19801770B4 Probenanalyseverfahren Sample analysis method
10/15/2008EP1980817A2 Beam scanning imaging method and apparatus
10/15/2008CN101286467A Method for decreasing error measurement in on-line scanning electronic microscope
10/15/2008CN100425362C Cooling system of apparatus for measuring thickness / convexity
10/15/2008CN100425361C Convexity measuring device using X-ray
10/14/2008US7435300 Dynamic film thickness control system/method and its utilization
10/09/2008US20080247509 Radiation image obtaining system
10/08/2008CN201130014Y Neutron thickness measuring probe apparatus
10/07/2008US7433573 Distance measuring device and method for determining a distance
10/07/2008US7433542 Method for measuring line and space pattern using scanning electron microscope
10/07/2008US7433032 Method and apparatus for inspecting defects in multiple regions with different parameters
10/02/2008US20080237456 Method And Apparatus For Observing A Specimen
10/01/2008EP1974181A1 Method and device for measuring the thickness of a layer of material
09/2008
09/30/2008US7430275 Method and apparatus for measuring the diameter of a steel reinforcement rod in concrete
09/25/2008US20080234972 Optical image measurement device and image processing device
09/25/2008US20080231865 determination of surface properties
09/18/2008WO2008111365A1 Scanning electron microscope having length measuring function and sample dimension length measuring method
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