| Patents for G01B 11 - Measuring arrangements characterised by the use of optical means (73,862) |
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| 03/17/2004 | EP1397640A1 Scanning interferometer for aspheric surfaces and wavefronts |
| 03/17/2004 | EP1397639A1 Sample positioning method for surface optical diagnostics using video imaging |
| 03/17/2004 | EP1397638A2 Apparatus and method for measuring aspherical optical surfaces and wavefronts |
| 03/17/2004 | EP1295090B1 A position detector for a scanning device |
| 03/17/2004 | EP1170987B1 Method and apparatus for recognising and determining a position and robot including such an apparatus |
| 03/17/2004 | EP1131230B1 Device for detecting whether a vehicle seat is occupied by means of a stereoscopic image recording sensor |
| 03/17/2004 | EP1112473B1 Apparatus for surface image sensing and surface inspection of three-dimensional structures |
| 03/17/2004 | EP1071535B1 A method and apparatus for determining the position of an elongated object relative the surface of an obstructing body by means of electromagnetic radiation |
| 03/17/2004 | EP1034413B1 Ellipsometer measuring instrument |
| 03/17/2004 | EP1033556B1 Three-dimensional measuring method and surveying instrument using the same |
| 03/17/2004 | CN1482433A Method and apparatus for calibration of laser three-dimensional measuring appliance |
| 03/17/2004 | CN1142411C Scale for sensing moving object, and apparatus for sensing moving object using same |
| 03/17/2004 | CN1142407C Method for making auxiliary measurement by using back light to irradiate line array CCD |
| 03/17/2004 | CN1142406C Microdisplacement measuring charge coupling method |
| 03/17/2004 | CN1142405C Fast mold figure measuring method |
| 03/16/2004 | US6708122 Apparatus and method for detecting twist in articles |
| 03/16/2004 | US6707559 Method of detecting posture of object and apparatus using the same |
| 03/16/2004 | US6707533 Detection apparatus and exposure apparatus using the same |
| 03/16/2004 | US6707056 Stage rotation system to improve edge measurements |
| 03/16/2004 | US6707054 Scannerless range imaging system having high dynamic range |
| 03/16/2004 | US6707053 Tilt detector |
| 03/16/2004 | US6707027 Method of measuring the movement of an input device |
| 03/16/2004 | US6706541 Method and apparatus for controlling wafer uniformity using spatially resolved sensors |
| 03/16/2004 | US6705767 Method and apparatus for analyzing the end face of a multifiber ferrule |
| 03/16/2004 | CA2264179C 3d ultrasound recording device |
| 03/11/2004 | WO2004021760A1 Electronic cicuit part mounting machine and mounting position accuracy inspection method for the mounting machine |
| 03/11/2004 | WO2004021759A1 Multiple source alignment sensor with improved optics |
| 03/11/2004 | WO2004021712A1 Pointed position detection device and pointed position deection method |
| 03/11/2004 | WO2004020938A1 A method and a system for automatic measurement and tracking of logs, industrial wood and boards |
| 03/11/2004 | WO2004020937A1 Phase measuring method and apparatus for multi-frequency interferometry |
| 03/11/2004 | WO2003103886A3 Laser machining apparatus with automatic focusing |
| 03/11/2004 | WO2003032129A3 Method and system for visualizing surface errors |
| 03/11/2004 | WO2001057471B1 Visual displacement sensor |
| 03/11/2004 | US20040048399 Method for monitoring the shape of the processed surfaces of semiconductor devices and equipment for manufacturing the semiconductor devices |
| 03/11/2004 | US20040047517 Shadow-free 3D and 2D measurement system and method |
| 03/11/2004 | US20040047501 Visual inspection apparatus and method |
| 03/11/2004 | US20040046969 System and method for monitoring thin film deposition on optical substrates |
| 03/11/2004 | US20040046968 Critical dimension analysis with simultaneous multiple angle of incidence measurements |
| 03/11/2004 | US20040046966 Lattice pattern projector using liquid crystal lattice |
| 03/11/2004 | US20040046965 Interferometric stage metrology system |
| 03/11/2004 | US20040046960 Lens blank alignment and blocking device and method |
| 03/11/2004 | US20040046959 System and method for simultaneously measuring thin film layer thickness, reflectivity, roughness, surface profile and magnetic pattern on thin film magnetic disks and silicon wafers |
| 03/11/2004 | US20040046958 Optical measurement system and method |
| 03/11/2004 | US20040046953 Laser range finder |
| 03/11/2004 | DE10239765A1 Profiltiefenmeßvorrichtung Profiltiefenmeßvorrichtung |
| 03/11/2004 | DE10238991A1 Fiber optic sensor for measuring component deformation, has a monomode light source connected to a transmission optical fiber with the light detected by receiving fibers in a sensor head and measured using photo-diodes |
| 03/10/2004 | EP1396182A1 Optical sensor device |
| 03/10/2004 | EP1395852A1 Method for preparing image information |
| 03/10/2004 | EP1395806A2 Sample level detection system |
| 03/10/2004 | EP1116170B1 Programmable lens assemblies and optical systems incorporating them |
| 03/10/2004 | EP1040393A4 Method for calibration of a robot inspection system |
| 03/10/2004 | EP0975441B1 Device and process for measuring the rigidity of flat mail |
| 03/10/2004 | CN2606332Y Individual interference stripe subdivider |
| 03/10/2004 | CN1480709A Laser rangefinder |
| 03/10/2004 | CN1480707A Optical position detector |
| 03/10/2004 | CN1141737C Non-destructive method and device for measuring depth of buried interface |
| 03/10/2004 | CN1141599C System for determining spatial position of target |
| 03/09/2004 | US6704661 Real time analysis of periodic structures on semiconductors |
| 03/09/2004 | US6704441 Inspection system |
| 03/09/2004 | US6704115 Laser target assembly for sheaves and height gages |
| 03/09/2004 | US6704114 Device for detecting whether a vehicle seat is occupied by means of a stereoscopic image recording sensor |
| 03/09/2004 | US6704113 Non-destructive surface inspection and profiling |
| 03/09/2004 | US6704112 Application of the phase shifting diffraction interferometer for measuring convex mirrors and negative lenses |
| 03/09/2004 | US6704103 Coatings for sensitivity enhancement of signal from glass disks |
| 03/09/2004 | US6704102 Calibration artifact and method of using the same |
| 03/09/2004 | US6704099 Range finder device and camera |
| 03/09/2004 | US6704093 Scanning exposure apparatus, scanning exposure method, and device manufacturing method |
| 03/09/2004 | US6703634 3D-shape measurement apparatus |
| 03/09/2004 | US6702441 Ophthalmic measuring device |
| 03/09/2004 | US6701633 Apparatus and method for measuring a shape using multiple probes |
| 03/04/2004 | WO2004019459A2 Multi-dimensional measuring system |
| 03/04/2004 | WO2004019389A1 Mark position detection device, mark position detection method, superimposing measurement device, and superimposing measurement method |
| 03/04/2004 | WO2004019382A2 Tft sensor having improved imaging surface |
| 03/04/2004 | WO2004019263A1 Device for determining the age of a person by measuring pupil size |
| 03/04/2004 | WO2004019108A1 Device and method for inspecting an object |
| 03/04/2004 | WO2004019106A1 Systems and methods for automated material processing |
| 03/04/2004 | WO2004018967A1 Optical alignment detection system |
| 03/04/2004 | WO2004018966A1 Apparatuses and methods for monitoring stress in steel catenary risers |
| 03/04/2004 | WO2004018965A1 Compressed symbology strain gauge |
| 03/04/2004 | WO2004018964A1 Interferometer optical element alignment |
| 03/04/2004 | WO2004017707A2 Apparatus and method of processing materials |
| 03/04/2004 | WO2003098527A3 Apparatus comprising an optical input device and at least one further optical device having a common radiation source |
| 03/04/2004 | WO2003096391A3 System and method for controlling wafer temperature |
| 03/04/2004 | WO2003078925A3 Surface profiling apparatus |
| 03/04/2004 | WO2003073078A3 Method for evaluation of the light-reflecting properties of a surface and device for carrying out the same |
| 03/04/2004 | WO2003069263A9 System for detecting anomalies and/or features of a surface |
| 03/04/2004 | US20040044496 Calibration pattern unit |
| 03/04/2004 | US20040042703 Method and apparatus for sensing an environmental parameter in a wellbore |
| 03/04/2004 | US20040042649 Calibration pattern unit |
| 03/04/2004 | US20040042017 Thin films measurement method and system |
| 03/04/2004 | US20040042010 Light barrier and light barrier grid |
| 03/04/2004 | US20040042009 Broadband spectroscopic rotating compensator ellipsometer |
| 03/04/2004 | US20040041997 Range finder, three-dimensional measuring method and light source apparatus |
| 03/04/2004 | US20040041912 Method and apparatus for video metrology |
| 03/04/2004 | US20040041907 Image processing device and method |
| 03/04/2004 | US20040041806 Image processing apparatus, image processing method, computer readable medium, and computer program thereof |
| 03/04/2004 | US20040041786 Pointed position detection device and pointed position detection method |
| 03/04/2004 | US20040041028 Three dimensional vision device and method, and structured light bar-code patterns for use in the same |
| 03/04/2004 | US20040040772 Method and device for detecting an object in a vehicle in particular for occupant protection systems |
| 03/04/2004 | US20040040166 Portable coordinate measurement machine |