Patents for C30B 33 - After-treatment of single crystals or homogeneous polycrystalline material with defined structure (6,009)
10/1999
10/05/1999CA2182342C Method for radiofrequency wave etching
10/05/1999CA2148629C Hydrogenation of photoresponsive semiconductor devices
09/1999
09/30/1999WO1999001593A3 Elimination of defects in epitaxial films
09/30/1999DE19833257C1 Semiconductor wafer production process especially to produce a silicon wafer for fabricating sub-micron line width electronic devices
09/29/1999EP0945530A1 A production method for a discrete structure substrate
09/29/1999EP0944916A1 Very long and highly stable atomic wires, method for making these wires, application in nano-electronics
09/23/1999DE19811965A1 Three-dimensional crystalline silicon structures are produced e.g. for micromechanical sensors, actuators and light guide components
09/22/1999EP0943703A2 Silicon single crystal and method for producing the same
09/22/1999CN1229445A Single crystal SiC and process for preparing the same
09/15/1999EP0942078A1 Method for producing silicon single crystal wafer and silicon single crystal wafer
09/15/1999EP0942077A1 A method for producing a silicon single crystal wafer and a silicon single crystal wafer
09/10/1999WO1999045180A2 Abo3 perovskite with a step
09/09/1999DE19808778A1 Verfahren zur Herstellung eines ABO¶3¶-Substrates mit einer Stufe A method for producing a substrate with a step-ABO¶3¶
09/07/1999US5948163 Apparatus for manufacturing crystals according to the Czochralski method, and crystals manufactured by the manufacturing method
09/07/1999US5947102 Method for cutting wafers from a crystal
09/01/1999EP0939147A2 A manufacturing method for calcium fluoride and calcium fluoride for photolithography
08/1999
08/31/1999US5945737 Thin film or solder ball including a metal and an oxide, nitride, or carbide precipitate of an expandable or contractible element
08/31/1999US5944891 Method for the heat treatment of ZnSe crystal
08/26/1999DE19900091A1 Semiconductor silicon wafers with oxidation annealing to eliminate surface and internal defects
08/24/1999US5942445 Method of manufacturing semiconductor wafers
08/24/1999US5942137 Method and apparatus for laser scribing grooves on hard crystals
08/24/1999US5942100 Crystal etch monitor
08/19/1999WO1999041779A1 Crystal ion-slicing of single-crystal films
08/17/1999US5940722 Method of manufacturing a semiconductor comprising an oxygen-containing silicon wafer
08/17/1999US5938842 Method for producing a single crystal using czochralski technique
08/11/1999CN1225501A Heat treatment apparatus, heat treatment process employing the same, and process for producing semiconductor article
08/10/1999US5935320 Process for producing silicon semiconductor wafers with low defect density
08/10/1999CA2175787C Method of synthetic diamond ablation with an oxygen plasma and synthetic diamonds etched accordingly
08/03/1999US5933707 Crystal substrate processing
07/1999
07/13/1999US5922213 Mirror finishes
07/07/1999CN1221813A Apparatus for heating or cooling wafers
07/06/1999US5919305 Thick film semiconductor
07/06/1999US5919302 Low defect density vacancy dominated silicon
06/1999
06/30/1999EP0926718A2 Heat treatment method for monocrystalline silicon wafers
06/30/1999EP0926714A1 Silicon wafer storage water and silicon wafer storage method
06/30/1999EP0926707A2 Heat treatment apparatus, heat treatment process employing the same, and process for producing semiconductor article
06/30/1999EP0926271A1 SINGLE CRYSTAL SiC AND PROCESS FOR PREPARING THE SAME
06/29/1999US5916456 Diamond treatment for passivating stress surface defects
06/23/1999EP0923438A1 Method for obtaining a wafer in semiconducting material of large dimensions and use of the resulting wafer for producing substrates of the semiconductor on insulator type
06/16/1999EP0922793A2 A method of processing a substrate made of a ferroelectric crystalline material
06/16/1999EP0922792A1 SINGLE CRYSTAL SiC AND PROCESS FOR PREPARING THE SAME
06/15/1999US5913103 Method of detecting metal contaminants in a wet chemical using enhanced semiconductor growth phenomena
06/15/1999US5911823 Method for pulling a single-crystal semiconductor
06/09/1999EP0921215A1 Electromagnetic radiation absorbant crystals of lithium niobate and lithium tantalate and methods of preparing the same
06/09/1999EP0921214A1 Single crystal silicon carbide and process for preparing the same
06/03/1999WO1999027584A1 Single electron devices
05/1999
05/20/1999DE19749127A1 Crystal rod, especially a polycrystalline silicon rod for producing raw material for single crystal growth
05/19/1999EP0916749A1 Single crystal SiC and a method of producing the same
05/18/1999US5904912 Heat treatment of single crystal
05/12/1999EP0915502A2 Method for heat treatment of silicon wafer and silicon wafer heat-treated by the method
05/12/1999EP0914501A1 Forging cylindrical ingots of alkali halides
05/11/1999US5902687 Alloy or metal lamination has suitable crystalline orientation against the direction of the stress, therefore the materials are improved in mechanical strength and anti-corrosion properties
05/11/1999US5902640 Method of improving field emission characteristics of diamond thin films
05/11/1999US5902519 Process for oxidizing iron-doped lithium niobate
05/11/1999US5902135 Method for removing crystal defects in silicon wafers
05/06/1999WO1999022049A1 Method of polishing cvd diamond films by oxygen plasma
05/04/1999US5900166 Method of making deformation test samples of solid single crystals
05/04/1999US5899743 Method for fabricating semiconductor wafers
05/04/1999US5899731 Method of fabricating a semiconductor wafer
04/1999
04/28/1999EP0911431A1 Single crystal silicon wafer with increased mechanical resistance
04/28/1999CN1215225A Raise of anti-mechanical force single crystal wafer
04/27/1999US5897743 Jig for peeling a bonded wafer
04/27/1999US5897705 Process for the production of an epitaxially coated semiconductor wafer
04/22/1999DE19744618A1 Gravimetric method for determining material removal from semiconductor wafers
04/21/1999CN1214378A Vacuum heat treatment process of molecular beam epitaxial TeCdHg material
04/20/1999US5895583 Reduces polishing time to a matter of hours.
04/13/1999US5893982 Forming a protective oxide layer by annealing in the presence of oxygen prior to edge polishing
04/08/1999WO1999017345A1 Method for thermal curing of implantation-doped silicon carbide semiconductors
04/07/1999CN1213436A Method and arrangement for poling of optical crystals
04/06/1999USRE36185 Citrate buffer, hydrogen peroxide
04/06/1999US5891243 Production of heavy doped ZnSe crystal
04/06/1999US5891242 Apparatus and method for determining an epitaxial layer thickness and transition width
04/06/1999US5891240 Radio frequency automatic identification system
03/1999
03/30/1999US5888918 Method for enhancing the color of minerals useful as gemstones
03/30/1999US5888846 Method for microfabricating diamond
03/30/1999US5888297 Method of fabricating SOI substrate
03/24/1999EP0903427A1 Apparatus and method for producing crystals by the czochralski method and crystals produced by this method
03/24/1999EP0853600A4 A method of biaxially aligning crystalline material
03/23/1999US5885905 Semiconductor substrate and method of processing the same
03/18/1999WO1999013139A1 SINGLE CRYSTAL SiC AND PROCESS FOR PREPARING THE SAME
03/18/1999DE19740904A1 Oxygen impurities are removed from a crucible-grown silicon wafer
03/18/1999CA2269709A1 Single crystal sic and process for preparing the same
03/16/1999US5882401 Method for manufacturing silicon single crystal substrate for use of epitaxial layer growth
03/04/1999DE19740905C1 Oxygen impurity removal from crucible-grown silicon@ wafer
03/03/1999EP0898800A1 ROOM TEMPERATURE STABLE COLOR CENTER LASER, LiF:F 2??+ ** MATERIAL, AND METHOD OF LASING
03/02/1999US5876819 Crystal orientation detectable semiconductor substrate, and methods of manufacturing and using the same
02/1999
02/24/1999CN1209034A Device and method for reducing size of semiconductor material
02/23/1999US5874130 Wafer and method of producing a wafer
02/23/1999CA2119774C Radio frequency automatic identification system
02/17/1999EP0897021A1 Process and device for marking gems and product obtained
02/16/1999US5871812 Apparatus and method for depositing molecular impurities on a semiconductor wafer
02/16/1999US5871578 Methods for holding and pulling single crystal
02/09/1999US5869387 Process for producing semiconductor substrate by heating to flatten an unpolished surface
01/1999
01/27/1999EP0893515A1 Preconditioned crystals of lithium niobate and lithium tantalate and methods of preparing the same
01/20/1999EP0557415B1 Process for achieving controlled precipitation profiles in silicon wafers
01/19/1999US5861102 Method for the flattening treatment of silicon single crystal surface
01/14/1999WO1999001594A1 Thermal mismatch compensation to produce free standing substrates by epitaxial deposition
01/14/1999WO1999001593A2 Elimination of defects in epitaxial films
01/14/1999DE19755705A1 Double sided lapping method for large sized wafer
01/12/1999US5859408 Apparatus for uniformly heating a substrate
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