Patents for C30B 31 - Diffusion or doping processes for single crystals or homogeneous polycrystalline material with defined structure; Apparatus therefor (2,201)
03/2003
03/11/2003US6530994 Platform for supporting a semiconductor substrate and method of supporting a substrate during rapid high temperature processing
03/06/2003WO2003019622A2 System and method of fast ambient switching for rapid thermal processing
03/05/2003EP0931187B1 A METHOD FOR PRODUCING A REGION DOPED WITH BORON IN A SiC-LAYER
03/05/2003CN1400337A Cooling system of reactor with replaceable inner wall
03/04/2003US6527854 Method for contact diffusion of impurities into diamond and other crystalline structures and products
02/2003
02/27/2003US20030038128 Heating device of the light irradiation type
02/27/2003US20030038127 Annealing, diffusion, oxidation, doping,and vapor deposition; semiconductors
02/20/2003US20030036268 Low temperature load and bake
02/18/2003US6521504 Semiconductor device and method of fabricating the same
02/05/2003EP1281196A1 Method of doping silicon with phosphorus and growing oxide on silicon in the presence of steam
01/2003
01/30/2003WO2002095804A8 Method and device for the thermal treatment of substrates
01/23/2003WO2003007336A2 Wafer boat with arcuate wafer support arms
01/16/2003US20030010275 Method for fabricating ultra thin single-crystal metal oxide wave retarder plates and waveguide polarization mode converter using the same
01/15/2003EP0645072B1 High performance horizontal diffusion furnace system
01/14/2003US6506994 Low profile thick film heaters in multi-slot bake chamber
01/14/2003US6506291 Substrate support with multilevel heat transfer mechanism
01/07/2003US6503321 To form a damage layer at an implantation depth below a top surface of said crystal structure, and chemically etching the damage layer to detach a single crystal film from the crystal structure; optoelectronic devices
01/02/2003US20030000936 Heating chamber and method of heating a wafer
01/02/2003US20030000458 Quartz member for semiconductor manufacturing equipment and method for metal analysis in quartz member
01/02/2003EP1268884A1 Method and device for making substrates
12/2002
12/27/2002WO2002103781A1 Wafer supporter
12/27/2002WO2002103761A1 Substrate support with multilevel heat transfer mechanism
12/26/2002US20020195437 Heat treating apparatus and method
12/24/2002US6497767 Thermal processing unit for single substrate
12/19/2002US20020190051 Low profile thick film heaters in multi-slot bake chamber
12/19/2002US20020189940 Substrate support with multilevel heat transfer mechanism
12/18/2002EP1027482A4 Apparatus and method for the in-situ generation of dopants
12/12/2002US20020187023 Vertical type wafer supporting jig
12/10/2002US6491757 Wafer support system
12/10/2002US6491518 Apparatus for high-temperature and high-pressure treatment
12/05/2002WO2002097864A2 Low temperature load and bake
12/04/2002EP1261761A1 Quartz member for semiconductor manufacturing equipment and method for metal analysis in quartz member
12/04/2002EP0848223B1 Vertical heat treatment device
12/03/2002US6488497 Wafer boat with arcuate wafer support arms
11/2002
11/28/2002WO2002095804A1 Method and device for the thermal treatment of substrates
11/28/2002WO2002095803A1 Method and device for thermally treating substrates
11/21/2002WO2002093621A1 Method and device for doping, diffusion and oxidation of silicon wafers under reduced pressure
11/21/2002US20020172908 Auxiliary heat-insulating jig, method of manufacturing the same, wafer boat provided with plate insulator, vertical heat treatment apparatus, method of modifying vertical heat treatment apparatus and method of fabricating semiconductor device
11/19/2002US6481368 Device and a method for heat treatment of an object in a susceptor
11/13/2002EP1256975A2 Vertical type wafer supporting jig
11/13/2002EP1256973A1 Heating system and method for heating an atmospheric reactor
11/13/2002CN1379127A Process for preparing chemical-specific Mg-doped lithium niobate crystal with periodic polarizing microstructure
11/05/2002US6474987 Wafer holder
10/2002
10/29/2002US6472639 Heat treatment method and heat treatment apparatus
10/24/2002WO2002084711A1 Heating system and method for heating an atmospheric reactor
10/22/2002US6468884 Method of forming silicon-contained crystal thin film
10/08/2002US6461428 Method and apparatus for controlling rise and fall of temperature in semiconductor substrates
09/2002
09/26/2002US20020137311 Within atomic layer or chemical vapor deposition reactors , delivering a purge gas in a sleeve surrounding a conductor associated with an electric heating assembly for a wafer so that the purge gas envelopes the electrical conductor in the sleeve and escapes from an unsealed end into an exhaust system
09/25/2002EP0840811B1 System and method for thermal processing of a semiconductor substrate
09/25/2002CN1371434A Slicing of single-crystal films using ion implantation
09/24/2002US6454866 Wafer support system
09/24/2002US6454852 High efficiency silicon wafer optimized for advanced semiconductor devices
09/24/2002US6454563 Wafer treatment chamber having thermal reflector
09/19/2002WO2002050875A3 Heating configuration for use in thermal processing chambers
09/12/2002US20020125240 Heating device, method for producing same and film forming apparatus
09/12/2002US20020124800 Apparatus for producing thin films
09/10/2002US6449428 Gas driven rotating susceptor for rapid thermal processing (RTP) system
09/04/2002EP1235953A1 Mini batch furnace
08/2002
08/27/2002US6441350 Temperature control system for a thermal reactor
08/20/2002US6437290 Heat treatment apparatus having a thin light-transmitting window
08/20/2002US6435865 Apparatus and method for positioning gas injectors in a vertical furnace
08/15/2002WO2002063076A1 Method for reducing oxygen component and carbon component in fluoride
08/15/2002US20020110769 Heat treatment method and heat treatment apparatus
08/13/2002US6434327 Rapid thermal heating apparatus and method including an infrared camera to measure substrate temperature
08/01/2002WO2002059953A1 Conductor treating single-wafer type treating device and method for semi-conductor treating
08/01/2002US20020102510 Semiconductor manufacturing apparatus
08/01/2002US20020102098 Heat-treating methods and systems
07/2002
07/31/2002EP1015831A4 Semiconductor processing furnace heating subassembly
07/25/2002US20020096507 Heat treatment method and heat treatment apparatus
07/23/2002US6423400 Electrostatic chucks formed by lamination of aluminum nitride with high melting metals and an adhesive layer, for coating silicon wafers; corrosion resistance
07/18/2002US20020092815 Semiconductor wafer boat having stackable independently replaceable boat parts and vertical heat-treating apparatus comprising the same
07/17/2002EP0963459B1 Wafer support apparatus
07/11/2002US20020090802 Safe arsenic gas phase doping
07/03/2002EP1220569A2 Heating device assembly and method
07/02/2002US6414280 Heat treatment method and heat treatment apparatus
07/02/2002US6413884 Substrate to rotates around a center axis in accompany with a first gas spouting toward the substrate and colliding with a second gas
07/02/2002US6413844 Heating; exposure to arsenic doping gases; termination; cooling
07/02/2002US6413081 Method for purging a furnace and furnace assembly
07/02/2002US6412821 Device for the vacuum-tight connecting of two bodies of different materials
06/2002
06/27/2002WO2002050875A2 Heating configuration for use in thermal processing chambers
06/25/2002US6409503 Heat treatment method and heat treatment apparatus
06/20/2002WO2002006568A3 Slicing of single-crystal films using ion implantation
06/20/2002WO2002005323A3 Thermally processing a substrate
06/20/2002US20020076559 Quartz reacted with solution of metal compound or metal element to form silicon oxide body doped with metal elements, which when reacted with plasma gas such a fluorine, form compounds with higher boiling points than silicon fluoride
06/20/2002US20020074324 Heat treatment apparatus and controller for heat treatment apparatus and control method for heat treatment apparatus
06/18/2002US6407368 System for maintaining a flat zone temperature profile in LP vertical furnace
06/18/2002US6407367 Heat treatment apparatus, heat treatment process employing the same, and process for producing semiconductor article
06/13/2002WO2002047143A1 Heat-treating methods and systems
06/13/2002WO2002047123A1 Heat-treating methods and systems
06/12/2002CN1353445A Method and equipment for radiating ion beam, related method and its equipment
06/11/2002US6403926 Thermal processing apparatus having a coolant passage
06/11/2002US6403925 System and method for thermal processing of a semiconductor substrate
06/06/2002WO2002027059A3 System and method for controlling movement of a workpiece in a thermal processing system
06/06/2002WO2002023594A3 Apparatus and method for reducing contamination on thermally processed semiconductor substrates
06/06/2002US20020067918 Heat-treating methods and systems
06/04/2002US6399921 System and method for thermal processing of a semiconductor substrate
05/2002
05/30/2002US20020062792 Wafer support device and reactor system for epitaxial layer growth
05/29/2002EP1209251A2 Temperature control system for wafer
05/28/2002US6395085 Purity silicon wafer for use in advanced semiconductor devices
05/21/2002US6391116 Semiconductor device manufacturing apparatus and semiconductor device manufacturing method
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