| Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827) |
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| 10/20/2005 | US20050229419 Head and apparatus for the linear dimension checking of mechanical pieces |
| 10/20/2005 | US20050229369 Systems including differential pressure application apparatus |
| 10/19/2005 | CN1683112A Polishing apparatus |
| 10/18/2005 | US6955987 Comparison of chemical-mechanical polishing processes |
| 10/18/2005 | US6955584 Grinding machine comprising a measuring system and control for providing a master blade and method for providing a bar blade |
| 10/18/2005 | US6955583 Apparatus for the diameter checking of eccentric portions of a mechanical piece in the course of the machining in a grinding machine |
| 10/13/2005 | US20050227596 Polishing apparatus |
| 10/13/2005 | US20050227592 Polishing apparatus |
| 10/13/2005 | US20050227587 In-line wafer surface mapping |
| 10/13/2005 | US20050223805 System and Method for the Identification of Chemical Mechanical Planarization Defects |
| 10/12/2005 | EP1478494B1 Method and system for controlling the chemical mechanical polishing of substrates by calculating an overpolishing time and/or a polishing time of a final polishing step |
| 10/12/2005 | EP1268133B1 Polishing head for wafer, and method for polishing |
| 10/12/2005 | CN1681622A Polishing pad for endpoint detection and related methods |
| 10/11/2005 | USRE38826 Apparatus for and method for polishing workpiece |
| 10/11/2005 | US6953750 Methods and systems for controlling belt surface temperature and slurry temperature in linear chemical mechanical planarization |
| 10/11/2005 | US6953515 Apparatus and method for providing a signal port in a polishing pad for optical endpoint detection |
| 10/11/2005 | US6953383 Method of determining current position data of a machining tool and apparatus therefor |
| 10/11/2005 | US6953382 Methods and apparatuses for conditioning polishing surfaces utilized during CMP processing |
| 10/11/2005 | US6953381 System and method for ophthalmic lens manufacture |
| 10/11/2005 | US6952884 Apparatus for checking dimensional and geometrical features of pins |
| 10/06/2005 | WO2005092569A1 Automatic roll data acquisition system |
| 10/06/2005 | US20050221736 Wafer polishing control system for chemical mechanical planarization machines |
| 10/06/2005 | US20050221733 Polishing apparatus |
| 10/06/2005 | US20050221721 Method and apparatus for grinding and polishing free-form ophthalmic surfaces |
| 10/06/2005 | US20050221720 Polishing apparatus |
| 10/06/2005 | US20050217130 Apparatus for checking the dimensional and geometric features of pins |
| 10/06/2005 | DE202005011429U1 Machine tool in particular for grinding and polishing natural stone, comprising tool working with computer adjusted pressure |
| 10/06/2005 | DE102004045418A1 Verfahren und Vorrichtung zum Schleifen einer Walze Method and apparatus for grinding a roll |
| 10/05/2005 | EP1582293A2 Polishing apparatus |
| 10/05/2005 | EP1581366A2 Apparatus and method for manufacturing or working optical elements and/or optical forming elements, and such element |
| 10/05/2005 | CN1676276A Sliding-vane detecting method for chemical-mechanical grinder platform |
| 10/04/2005 | US6951508 Optical fiber polishing device |
| 10/04/2005 | US6951507 Substrate polishing apparatus |
| 10/04/2005 | US6951506 Polish pad with non-uniform groove depth to improve wafer polish rate uniformity |
| 10/04/2005 | US6951503 System and method for in-situ measuring and monitoring CMP polishing pad thickness |
| 10/04/2005 | US6951502 Method of determining a flatness of an electronic device substrate, method of producing the substrate, method of producing a mask blank, method of producing a transfer mask, polishing method, electronic device substrate, mask blank, transfer mask, and polishing apparatus |
| 09/29/2005 | US20050215178 Semiconductor wafer chemical-mechanical planarization process monitoring and end-point detection method and apparatus |
| 09/29/2005 | US20050215176 Numeric controller |
| 09/29/2005 | US20050215175 Method for re-grinding and polishing free-form surfaces, especially rotationally symmetrical aspherical optical lenses |
| 09/29/2005 | US20050210986 Acoustic sensor for monitoring machining processes in machining tools |
| 09/29/2005 | DE102004019356B3 Machining process for through aperture involves first setting counter pressure same as grinding pressure and then setting pressure difference |
| 09/29/2005 | DE102004011996A1 Vorrichtung zum simultanen beidseitigen Schleifen von scheibenförmigen Werkstücken Apparatus for simultaneous double-side grinding of disk-shaped workpieces |
| 09/28/2005 | EP1578562A1 Grinding wheel monitoring |
| 09/28/2005 | EP1053075B2 Method fro marking or drilling holes in glass lenses and device for realising the same |
| 09/28/2005 | CN1675601A Numerical control apparatus |
| 09/28/2005 | CN1674234A Chemical mechanical polishing method, chemical mechanical polishing system, and manufacturing method of semiconductor device |
| 09/28/2005 | CN1672871A Digital profile grinder |
| 09/27/2005 | US6950289 Embedded lapping guide for a magnetic head cluster |
| 09/27/2005 | US6950179 Shape measuring apparatus, shape measuring method, and aligning method |
| 09/27/2005 | US6949009 Rotating kiln tire refinishing machine |
| 09/27/2005 | US6949007 System and method for multi-stage process control in film removal |
| 09/27/2005 | US6949005 Grinding assembly, grinding apparatus, weld joint defect repair system, and methods |
| 09/22/2005 | US20050208880 Substrate holding apparatus |
| 09/22/2005 | US20050208879 Control of chemical mechanical polishing pad conditioner directional velocity to improve pad life |
| 09/22/2005 | US20050208878 Method of and machine for grinding a roll |
| 09/22/2005 | US20050208876 CMP process control method |
| 09/22/2005 | US20050206877 Shape measuring apparatus, shape measuring method, and aligning method |
| 09/22/2005 | US20050205523 Methods and systems for planarizing microelectronic devices with Ge-Se-Ag layers |
| 09/22/2005 | US20050205520 Method for end point detection for chemical mechanical polishing of integrated circuit devices |
| 09/21/2005 | EP1577058A1 Fillet rolling machine for vehicle crankshafts |
| 09/21/2005 | EP1577056A1 Method and device for grinding a rotating roller |
| 09/21/2005 | EP1575738A1 Method for measuring with a machining machine-tool, tool adapted therefor and software product managing same |
| 09/21/2005 | CN1670925A CMP process control method |
| 09/21/2005 | CN1670924A Apparatus for polishing a substrate |
| 09/21/2005 | CN1670923A Chemico-mechanical polishing end-point detection method for integrated circuit device |
| 09/21/2005 | CN1219629C Method and appts. for end point triggering with integrated steering |
| 09/20/2005 | US6945845 Chemical mechanical polishing apparatus with non-conductive elements |
| 09/20/2005 | CA2225962C Method and apparatus for grinding composite workpieces |
| 09/15/2005 | WO2005084886A1 Device for production of a pre-formed shape on a workpiece by grinding and corresponding method |
| 09/15/2005 | WO2005084261A2 Tire uniformity machine grinding assembly |
| 09/15/2005 | US20050202757 Device for the simultaneous double-side grinding of a workpiece in wafer form |
| 09/15/2005 | US20050202756 Methods and systems for planarizing workpieces, e.g., microelectronic workpieces |
| 09/15/2005 | US20050202755 Multi-port sandblasting manifold and method |
| 09/15/2005 | DE102004009352A1 Process and assembly to grind complex curved metal shape e.g. automotive crankshaft to final dimensions has sensor linked to control unit |
| 09/14/2005 | EP1574830A1 Precision sensor assembly for rotating members in a machine tool |
| 09/14/2005 | CN2724922Y 预热装置 Preheating device |
| 09/14/2005 | CN1667799A Device for two-sided lapping wafer type workpiece simultaneously |
| 09/13/2005 | US6942546 Endpoint detection for non-transparent polishing member |
| 09/13/2005 | US6942544 Method of achieving very high crown-to-camber ratios on magnetic sliders |
| 09/13/2005 | US6942543 equipped with a film-thickness monitor for monitoring a film thickness of a thin film on a substrate to be polished; high accuracy and reliability |
| 09/09/2005 | WO2005082588A2 Saw for a semiconductor device |
| 09/08/2005 | US20050197049 Grinding machine |
| 09/08/2005 | US20050197048 Method for manufacturing a workpiece and torque transducer module |
| 09/08/2005 | US20050197046 Chemical mechanical polishing method, chemical mechanical polishing system, and manufacturing method of semiconductor device |
| 09/08/2005 | US20050197044 Automatic roll data acquisition system |
| 09/08/2005 | US20050193819 Precision sensor assembly for rotating members in a machine tool |
| 09/08/2005 | DE10228441B4 Verfahren und Vorrichtung zum automatischen Beladen einer Doppelseiten-Poliermaschine mit Halbleiterscheiben Method and apparatus for automatically loading a double-side polishing machine with semiconductor wafers |
| 09/08/2005 | DE102004009393A1 Verfahren und Vorrichtung zum Einzentrieren von Zahnlücken eines verzahnten Werkstücks Method and apparatus for Einzentrieren of tooth spaces of a toothed workpiece |
| 09/07/2005 | EP1570952A2 Truing method and apparatus |
| 09/07/2005 | CN1665642A Method and apparatus for heating polishing pad |
| 09/07/2005 | CN1217766C Grinding method and grinding apparatus |
| 09/06/2005 | US6939209 Method and apparatus for global die thinning and polishing of flip-chip packaged integrated circuits |
| 09/06/2005 | US6939207 Method and apparatus for controlling CMP pad surface finish |
| 09/06/2005 | US6939202 Substrate retainer wear detection method and apparatus |
| 09/06/2005 | US6939201 Grinding tool, and method and apparatus for inspection conditions of grinding surface of the same |
| 09/06/2005 | US6939200 Method of predicting plate lapping properties to improve slider fabrication yield |
| 09/06/2005 | US6939199 Method and apparatus for cutting semiconductor wafers |
| 09/06/2005 | US6939198 Polishing system with in-line and in-situ metrology |
| 09/01/2005 | WO2005080059A1 Nozzle assembly for a saw for semiconductors |
| 09/01/2005 | WO2005080048A1 Machine tool for machining workpieces |