B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation

Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827)
12/2006
12/06/2006	EP1628802B1 Floor sanding machine
12/06/2006	EP1177069B1 Grinding of cutting tools with wavy cutting edges
12/06/2006	CN1874874A Pad assembly for electrochemical mechanical processing
12/05/2006	US7144305 Polishing apparatus
12/05/2006	US7144301 Method and system for planarizing integrated circuit material
12/05/2006	US7144298 Method for manufacturing semiconductor device and apparatus for manufacturing thereof
12/05/2006	US7144297 Method and apparatus to enable accurate wafer prediction
11/2006
11/30/2006	WO2006125528A1 Method and device for grinding the outer peripheral surface of an undulated and/or roller-shaped workpiece
11/30/2006	US20060270323 Polishing apparatus
11/30/2006	US20060270322 Smart conditioner rinse station
11/30/2006	US20060270237 Apparatus and method for pre-conditioning CMP polishing pad
11/29/2006	EP1725384A1 Nozzle assembly for a saw for semiconductors
11/29/2006	EP1725376A2 Tire uniformity machine grinding assembly
11/29/2006	CN1871504A Polishing endpoint detection system and method using friction sensor
11/28/2006	US7142942 Method of producing a design on a terracotta container having a glazed surface portion
11/28/2006	US7140948 Machine for machining elongate workpieces provided with cutting teeth, in particular for grinding bandsaw blades
11/28/2006	US7140947 Barrel polishing method and barrel polishing apparatus
11/23/2006	US20060264155 Method and apparatus using a sensor for finish-machining teeth
11/23/2006	US20060264154 Eyeglass lens processing apparatus
11/23/2006	US20060264153 Method for selective removal of materials present in one or more layers on an object, and apparatus for implementation of this method
11/23/2006	US20060260745 Polishing pad surface shape measuring instrument, method of using polishing pad surface shape measuring instrument, method of measuring apex angle of cone of polishing pad, method of measuring depth of groove of polishing pad, CMP polisher, and method of manufacturing semiconductor device
11/22/2006	EP1724055A1 Method for auto-calibration of tool(s) in a single point turning machine used for manufacturing in particular ophthalmic lenses
11/22/2006	EP1722950A2 Saw for a semiconductor device
11/21/2006	US7137874 Semiconductor wafer, polishing apparatus and method
11/21/2006	US7137870 Apparatus adapted to sense broken platen belt
11/21/2006	US7137868 Pad assembly for electrochemical mechanical processing
11/21/2006	US7137867 Thickness control method and double side polisher
11/21/2006	US7137865 Method and device for cutting single crystals, in addition to an adjusting device and a test method for determining a crystal orientation
11/16/2006	WO2006119518A1 Floor sanding machine
11/16/2006	US20060258265 Rotary Grinding Apparatus For Blending Defects on Turbine Blades and Associated Method of Use
11/16/2006	US20060258263 Chemical mechanical polishing end point detection apparatus and method
11/15/2006	EP1720683A1 Device for production of a pre-formed shape on a workpiece by grinding and corresponding method
11/14/2006	US7134937 Food product slicer with knife sharpener and associated knife guard
11/14/2006	US7134936 Grinding head for a grinding machine for glass slabs, and machine equipped with such head
11/14/2006	US7134935 Lubricated razor blade edge sanitizer and sharpener
11/14/2006	US7134934 Methods and apparatus for electrically detecting characteristics of a microelectronic substrate and/or polishing medium
11/14/2006	US7134933 Wafer thickness control during backside grind
11/09/2006	US20060253220 Method for auto-calibration of a tool in a single point turning machine used for manufacturing in particular ophthalmic lenses
11/09/2006	US20060252352 Method of monitoring surface status and life of pad by detecting temperature of polishing interface during chemical mechanical process
11/09/2006	US20060252351 Wafer carrier checker and method of using same
11/09/2006	US20060249397 Position microelectronic substrate between electrodes; polishing; removing electroconducive materials by moving between electrodes; detecting signal
11/09/2006	DE102004058133B4 Verfahren zum Überwachen eines CMP-Polierverfahrens und Anordnung zur Durchführung eines CMP-Polierverfahrens A method for monitoring a CMP polishing method and arrangement for performing a CMP polishing method
11/08/2006	EP1719586A1 Presser device.
11/08/2006	EP1719584A1 Method for auto-calibration of tool(s) in a single point turning machine used for manufacturing in particular ophtalmic lenses
11/08/2006	EP1719579A1 Detection signal transmitting apparatus
11/08/2006	EP1718435A1 Machine tool for machining workpieces
11/08/2006	CN1859998A Method and system for controlling the chemical mechanical polishing by using a sensor signal of a pad conditioner
11/08/2006	CN1857863A Automatic locating and grinding method for general cylindrical grinding machine
11/08/2006	CN1857861A Method for auto-calibration of tool(s) in a single point turning machine used for manufacturing in particular ophtalmic lenses
11/07/2006	US7132035 Methods, apparatuses, and substrate assembly structures for fabricating microelectronic components using mechanical and chemical-mechanical planarization processes
11/07/2006	US7132033 Method of forming a layered polishing pad
11/07/2006	US7131891 Systems and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces
11/07/2006	US7131890 In situ finishing control
11/02/2006	US20060246822 System and method for in-line metal profile measurement
11/02/2006	EP1716971A1 Eyeglass lens processing apparatus
11/02/2006	EP1715983A1 Electric hand tool comprising an optimised working region
11/01/2006	CN1856386A Grinding machine with a concentricity correction system
10/2006
10/31/2006	US7130038 Method and apparatus for optical film measurements in a controlled environment
10/31/2006	US7128638 System and method for ophthalmic lens manufacture
10/26/2006	WO2006112531A1 Device for and method of polishing peripheral edge of semiconductor wafer
10/26/2006	WO2006111790A1 Chemical-mechanical polishing method and apparatus
10/26/2006	US20060240747 Eyeglass lens processing apparatus
10/26/2006	US20060240744 Method for calibrating a grinding machine
10/26/2006	US20060237330 Algorithm for real-time process control of electro-polishing
10/25/2006	EP1714741A1 Method and apparatus for providing a residual stress distribution on the surface of a part
10/25/2006	EP1478490B1 Method for re-grinding and polishing free-form surfaces, especially rotationally symmetrical aspherical optical lenses
10/25/2006	CN1850448A Two-end-point detecting crossbeam parallelism automatic compensating-adjusting technical method
10/25/2006	CN1850447A Vibration-sensing automatic grinding detecting system and method
10/25/2006	CN1850446A Steel rail welding line numerical coutrol fine grinding machine and application method
10/25/2006	CN1850441A Technical method for determining electromagnetic core-free clamp workpiece eccentricity
10/24/2006	US7125325 Portable sharpening system for a dual-knife cutting machine
10/24/2006	US7125317 Multi-port sandblasting manifold and method
10/24/2006	US7125315 Method for deciding a bevel curve, method for determining the locus of a bevel, method for processing a lens and apparatus for processing a lens
10/24/2006	US7125314 Eyeglass lens processing apparatus
10/24/2006	US7125313 Apparatus and method for abrading a workpiece
10/24/2006	US7125312 Rotor-grinding machine comprising a rotary head with two grinding wheels
10/18/2006	EP1712491A2 Rigid, hinged-lip package for tobacco articles
10/18/2006	EP1711961A2 Method and apparatus for maintaining parallelism of layers and/or achieving desired thicknesses of layers during the electrochemical fabrication of structures
10/18/2006	EP1590126B1 Method for calibrating a grinding machine
10/18/2006	CN1849198A Polished state monitoring apparatus and polishing apparatus using the same
10/17/2006	US7121922 Method and apparatus for polishing a workpiece surface
10/17/2006	US7121920 Rock saw
10/17/2006	US7121919 Chemical mechanical polishing system and process
10/12/2006	WO2006106790A1 Polishing apparatus, semiconductor device manufacturing method using such polishing apparatus and semiconductor device manufactured by such semiconductor device manufacturing method
10/12/2006	WO2006106710A1 Bonded wafer manufacturing method, bonded wafer, and plane polishing apparatus
10/12/2006	US20060228998 Sensors with modular architecture
10/12/2006	US20060228995 Systems and methods for monitoring characteristics of a polishing pad used in polishing micro-device workpieces
10/12/2006	US20060228994 Hand held electric polisher
10/12/2006	US20060228993 Mechanical grinding apparatus for blending defects on turbine blades and associated method of use
10/12/2006	US20060228992 Process control in electrochemically assisted planarization
10/12/2006	US20060228991 Polishing method and apparatus
10/11/2006	EP1710048A1 Polishing pad surface shape measuring instrument, method of using polishing pad surface shape measuring instrument, method of measuring apex angle of cone of polishing pad, method of measuring depth of groove of polishing pad, cmp polisher, and method of manufacturing semiconductor device
10/11/2006	EP1710047A2 Apparatus and methods for aligning a surface of an active retainer ring with a wafer surface during chemical mechanical polishing
10/11/2006	EP1708848A2 Chemical mechanical planarization process control utilizing in-situ conditioning process
10/11/2006	CN1843695A Constant-current abrasive band grinding mechanism and grinding method
10/10/2006	US7119908 Method and apparatus for measuring thickness of thin film and device manufacturing method using same
10/10/2006	US7118457 Method of forming a polishing pad for endpoint detection
10/10/2006	US7118455 Semiconductor workpiece processing methods
10/10/2006	US7118453 Workpiece grinding method
10/10/2006	US7118452 Pneumatically actuated flexible coupling end effectors for lapping/polishing

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