Patents
Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827)
02/2007
02/07/2007CN1910011A Chemical mechanical planarization process control utilizing in-situ conditioning process
02/06/2007US7172497 Fabrication of semiconductor interconnect structures
02/06/2007US7172495 Method and apparatus using a sensor for finish-machining teeth
02/06/2007US7172492 Polishing method and polishing system
02/06/2007US7172491 Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
02/06/2007US7172490 Method for calibrating a grinding machine
02/01/2007US20070026768 Sharpening-trimming assembly
02/01/2007DE102005035581A1 Vorrichtung zum Schleifen von Spinnzylindern Apparatus for grinding spinning cylinders
01/2007
01/31/2007EP1747848A1 Apparatus for grinding of spinning cylinders
01/31/2007CN1905995A Electric hand tool comprising an optimised working region
01/31/2007CN1905959A On-line grinding method for work roll
01/30/2007US7169028 Flexible finishing shoe
01/30/2007US7169018 Wafer carrier checker and method of using same
01/30/2007US7169017 Polishing pad having a window with reduced surface roughness
01/30/2007US7169016 Chemical mechanical polishing end point detection apparatus and method
01/30/2007US7169015 Apparatus for optical inspection of wafers during processing
01/30/2007US7169014 Apparatuses for controlling the temperature of polishing pads used in planarizing micro-device workpieces
01/30/2007US7169013 Eyeglass lens processing apparatus
01/25/2007US20070021263 Methods and systems for planarizing workpieces, e.g., microelectronic workpieces
01/25/2007US20070021038 Cmp apparatus and process sequence method
01/25/2007US20070021037 Polishing Assembly With A Window
01/24/2007CN2860735Y Adjusting and cleaning device of round rod sander
01/24/2007CN1296179C Grinding machine parameter testing and analytical system
01/23/2007US7166014 Chemical mechanical planarization process control utilizing in-situ conditioning process
01/23/2007US7165894 Polishing fixture
01/23/2007US7165317 Electrode extension sheet for use in a lapping apparatus
01/18/2007US20070015443 Semiconductor processor systems, systems configured to provide a semiconductor workpiece process fluid, semiconductor workpiece processing methods, methods of preparing semiconductor workpiece process fluid, and methods of delivering semiconductor workpiece process fluid to a semiconductor processor
01/18/2007US20070015442 Method and apparatus for measuring abrasion amount and pad friction force of polishing pad using thickness change of slurry film
01/18/2007US20070015441 Apparatus and Method for In-Situ Endpoint Detection for Chemical Mechanical Polishing Operations
01/18/2007DE19882111B4 Verwendung einer Vorrichtung zur Herstellung eines reproduzierbaren Oberflächenfinish einer Testoberfläche Use of a device for producing a reproducible surface finishing of a test surface
01/17/2007EP1743738A1 Adjustment of the working pressure for a machine tool
01/16/2007USRE39471 Apparatus for and method for polishing workpiece
01/16/2007US7163445 Apparatus and method for fabricating liquid crystal display panel
01/16/2007US7163440 Apparatus and method for polishing a fiber optic connector
01/16/2007US7163439 Methods and systems for conditioning planarizing pads used in planarizing substrates
01/16/2007US7163435 Real time monitoring of CMP pad conditioning process
01/16/2007US7163434 Method and apparatus for generating complex shapes on cylindrical surfaces
01/11/2007WO2007004211A2 A system and a method for vehicular operation intervention in case of substance abuse
01/11/2007US20070010170 Methods and systems for conditioning planarizing pads used in planarizing substrates
01/11/2007US20070010169 Polishing pad with window for planarization
01/11/2007US20070010168 Methods and systems for planarizing workpieces, e.g., microelectronic workpieces
01/11/2007US20070010167 Method and apparatus for reconditioning digital discs
01/10/2007EP1128932A4 Method and apparatus for conditioning a polishing pad used in chemical mechanical planarization
01/10/2007CN2855636Y Grinding machine with micro-feeding and quick drawing-back device
01/10/2007CN1294629C Silicon semiconductor crystal wafers and manufacturing method for multiple semiconductor crystal wafers
01/09/2007US7160739 Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
01/09/2007US7160177 Method and device for the high-precision machining of the surface of an object, especially for polishing and lapping semiconductor substrates
01/09/2007US7160174 Method for processing and measuring rotationally symmetric workpieces as well as grinding and polishing tool
01/09/2007US7160173 Abrasive articles and methods for the manufacture and use of same
01/04/2007WO2007001699A1 Tranparent microporous materials for cmp
01/04/2007US20070005177 Detection-signal transmitting apparatus
01/04/2007US20070004321 Systems and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces
01/04/2007US20070004319 Tire uniformity machine grinding assembly
01/03/2007CN1890055A Chemical mechanical polishing method for reducing slurry reflux
01/02/2007US7156975 Polishing method and electropolishing apparatus
01/02/2007US7156720 Substrate holding apparatus
01/02/2007US7156719 Polishing apparatus
01/02/2007US7156717 situ finishing aid control
12/2006
12/27/2006EP1736816A1 Device for installing suction jig for eyeglass lens and method for determining suction jig installation position
12/27/2006EP1736278A1 Grinding method and apparatus
12/27/2006CN2850809Y Borer grinding machine with detector
12/27/2006CN1292464C Feedback control of a chemical mechanical polishing device providing manipulation of removal rate profiles
12/26/2006US7153410 Alternating current, direct current power sources; switches
12/26/2006US7153198 Fixture for slider lapping, lapping device and lapping method
12/26/2006US7153195 Methods and apparatus for selectively removing conductive material from a microelectronic substrate
12/26/2006US7153194 Workpiece grinding method which achieves a constant stock removal rate
12/26/2006US7153191 Polishing liquids for activating and/or conditioning fixed abrasive polishing pads, and associated systems and methods
12/26/2006US7153190 Grinding wheel monitoring
12/26/2006US7153189 Coolant supply method and apparatus for grinding machine
12/26/2006US7153188 Temperature control in a chemical mechanical polishing system
12/26/2006US7153185 Substrate edge detection
12/26/2006US7153184 Method and apparatus for producing optical glasses
12/26/2006US7153182 System and method for in situ characterization and maintenance of polishing pad smoothness in chemical mechanical polishing
12/21/2006WO2006134234A2 Method for grinding a variable crown roll
12/21/2006US20060287756 Grinding method and apparatus
12/21/2006US20060286905 Jet device for mixing fluid
12/21/2006US20060286904 Polishing System With In-Line and In-Situ Metrology
12/21/2006US20060286903 Eyeglass lens processing apparatus
12/20/2006EP1732731A1 Method and device for grinding assembled camshafts with a high concentricity accuracy
12/19/2006US7151977 Method for measuring with a machining machine-tool, tool adapted therefor and software product managing same
12/19/2006US7151056 Method and apparatus for forming a planarizing pad having a film and texture elements for planarization of microelectronic substrates
12/19/2006US7150676 Dual motion polishing tool
12/19/2006US7150675 Method and system for controlling the chemical mechanical polishing by using a sensor signal of a pad conditioner
12/19/2006US7150674 Both-side grinding method and both-side grinding machine for thin disc work
12/19/2006US7150673 Method for estimating polishing profile or polishing amount, polishing method and polishing apparatus
12/14/2006US20060281392 Lens edger
12/13/2006EP1628803B1 Method and device for machining spectacle lenses
12/13/2006EP1307909B1 Method and apparatus for controlling wafer uniformity in a chemical mechanical polishing tool using carrier head signatures
12/13/2006CN2846016Y Corrector for digital grinder measuring rule
12/12/2006US7147543 Carrier assemblies, planarizing apparatuses including carrier assemblies, and methods for planarizing micro-device workpieces
12/12/2006US7147542 Centerless grinder
12/12/2006US7147541 Thickness control method and double side polisher
12/12/2006US7147540 Magnetic head slider and method of manufacturing the same
12/12/2006US7147539 Head performance based nano-machining process control for stripe forming of advanced sliders
12/07/2006WO2004053942A3 Measuring alignment between a wafer chuck and polishing/plating receptacle
12/07/2006US20060276113 Polishing cloth, polishing apparatus and method of manufacturing semiconductor devices
12/07/2006US20060276107 Method for processing and measuring rotationally symmetric workpieces as well as grinding and polishing tool
12/07/2006US20060276106 Method for supplying lens of eyeglasses
12/07/2006US20060274326 Method and apparatus for measuring a polishing condition
12/06/2006EP1728589A1 Eyeglass lens processing apparatus
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