Patents
Patents for B24B 49 - Measuring or gauging equipment for controlling the feed movement of the grinding tool or work; Arrangements of indicating or measuring equipment, e.g. for indicating the start of the grinding operation (8,827)
02/2006
02/16/2006US20060034021 Methods of manufacturing magnetic heads with reference and monitoring devices
02/15/2006EP1626392A1 Method of manufacturing magnetic heads with reference and monitoring lapping guides
02/15/2006EP1625613A1 Substrate holding apparatus and polishing apparatus
02/15/2006CN1735480A Apparatus and methods for detecting transitions of wafer surface properties in chemical mechanical polishing for process status and control
02/15/2006CN1735478A Method and apparatus of eddy current monitoring for chemical mechanical polishing
02/15/2006CN1242460C Method for determinating endpoint and semiconductor wafer
02/14/2006US6998013 CMP apparatus polishing head with concentric pressure zones
02/14/2006US6997779 Device for the simultaneous double-side grinding of a workpiece in wafer form
02/14/2006US6997778 Polishing apparatus
02/14/2006US6997777 Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region
02/14/2006US6997776 Process for producing a semiconductor wafer
02/09/2006US20060030244 Substrate polishing apparatus
02/09/2006US20060030154 Polishing inhibiting layer forming additive, slurry and cmp method
02/09/2006US20060027045 Automated drill bit re-sharpening and verification system
02/09/2006DE102004031584A1 Knife grinding tool has grinding disc on swivel mount presented to the knife edge at a chamfer angle
02/09/2006DE102004031583A1 Sharpening machine for sharpening blades comprises a blade holder having holding elements for holding flat a blade to be sharpened along positions spaced from each other
02/08/2006EP1622743A2 Whole-substrate spectral imaging system for cmp
02/08/2006CN1732068A Substrate holding mechanism, substrate polishing apparatus and substrate polishing method
02/08/2006CN1732066A Device for detecting eccentric part diameter of machine element in course of gold processing on grinding machine
02/07/2006US6995850 Monitoring apparatus for polishing pad and method thereof
02/07/2006US6995091 Process for chemically mechanically polishing wafers
02/07/2006US6994608 Methods of manufacturing sliders
02/07/2006US6994607 Polishing pad with window
02/02/2006US20060025052 Method and apparatus of eddy current monitoring for chemical mechanical polishing
02/02/2006US20060025051 Wire sawing apparatus
02/02/2006US20060025050 Gear grinding machine
02/02/2006US20060025048 Abrasive article detection system and method
02/02/2006US20060025047 Grading system and method for abrasive article
02/02/2006US20060025046 Abrasive article splicing system and methods
02/02/2006US20060025045 System and method for detecting abrasive article orientation
02/01/2006CN2754810Y Planar gate automatic polisher with digital display and stone material
02/01/2006CN1727118A Thicknesser and grinding appts.
02/01/2006CN1239962C Photosensitive object regenerative method and device, photosensitive object, image forming device
01/2006
01/31/2006US6991521 Edge finishing process for glass or ceramic disks used in disk drive data storage devices
01/31/2006US6991520 Abrasive machine and method of abrading work piece
01/31/2006US6991518 Automated system for precision grinding of feedstock
01/31/2006US6991517 Linear polishing sheet with window
01/31/2006US6991515 Ultra fine particle film forming method and apparatus
01/31/2006US6991514 Optical closed-loop control system for a CMP apparatus and method of manufacture thereof
01/31/2006US6991513 Magnetic head grinding device and method
01/26/2006WO2006009304A1 Polishing apparatus and substrate processing method
01/26/2006WO2006009222A1 Plate glass crack detection method and detector, and plate glass polishing method and device
01/26/2006US20060019578 Machining device
01/26/2006US20060016856 Apparatus and method for sealing a container
01/26/2006DE19845284B4 Konizitätskorrektur-Vorrichtung für eine Schleifmaschine Konizitätskorrektur device for a grinding machine
01/26/2006DE19648972B4 Linear-Schwingantrieb Linear vibratory drive
01/25/2006EP1618991A1 In-situ endpoint detection and process monitoring method and apparatus for chemical mechanical polishing
01/25/2006EP1294534B2 In-situ endpoint detection and process monitoring method and apparatus for chemical mechanical polishing
01/25/2006CN1726116A Polishing state monitoring apparatus and polishing apparatus and method
01/25/2006CN1724217A On line testing method for precisely curve grinding based on pattern recognition
01/25/2006CN1238161C Abrasive article having window system for polishing wafers, and using methods
01/25/2006CN1238159C Liquid crystal display for defining indicator of grinding amount and detection method
01/24/2006US6988933 Truing method and apparatus
01/24/2006US6988434 Multi-axis tool positioner and related methods
01/19/2006WO2005082588A3 Saw for a semiconductor device
01/19/2006US20060014476 Method of fabricating a window in a polishing pad
01/19/2006US20060014475 Grindstone tool
01/19/2006US20060014474 Gear grinding machine
01/19/2006US20060014473 Many-headed grinding machine and grinding method using many-headed grinding machine
01/19/2006US20060012740 Apparatus and method for rubbing lcd substrate
01/19/2006US20060011585 Method for controlling ph during planarization and cleaning of microelectronic substrates
01/19/2006DE102004009352B4 Vorrichtung zum Herstellen einer Fertigkontur eines Werkstücks durch Schleifen und Verfahren dazu An apparatus for manufacturing a finished contour of a workpiece by grinding and method thereof
01/18/2006EP1616662A1 Both side grinding method and both side grinder of thin disc-like work
01/18/2006EP1615747A1 Device for cleaning and/or deburring workpieces
01/18/2006EP1294534B1 In-situ endpoint detection and process monitoring method and apparatus for chemical mechanical polishing
01/18/2006EP1261530A4 Package with multiple chambers and valves
01/18/2006CN1237582C Abrasive cloth, polishing device and method for manufacturing semiconductor device
01/18/2006CN1236895C Chemical machinery flattening system, chemical machinery polishing system and adjustable plate
01/17/2006US6986701 Polishing pad with built-in optical sensor
01/17/2006US6986700 Apparatuses for in-situ optical endpointing on web-format planarizing machines in mechanical or chemical-mechanical planarization of microelectronic-device substrate assemblies
01/17/2006US6986699 Method and apparatus for determining polishing endpoint with multiple light sources
01/17/2006US6986698 Wafer refining
01/12/2006US20060009132 Chemical mechanical polishing apparatus with non-conductive elements
01/12/2006US20060009131 Data processing for monitoring chemical mechanical polishing
01/12/2006US20060009129 Feedforward and feedback control for conditioning of chemical mechanical polishing pad
01/12/2006US20060009128 Eddy current sensing of metal removal for chemical mechanical polishing
01/12/2006US20060009127 Method for estimating polishing profile or polishing amount, polishing method and polishing apparatus
01/12/2006US20060009126 Method and apparatus for producing optical glasses
01/12/2006US20060009125 Both side grinding method and both side grinder of thin disc-like work
01/12/2006DE10134803B4 Doppelschleifscheibe Double grinding wheel
01/11/2006EP1614505A1 Polishing device and method
01/11/2006EP1613794A2 Algorithm for real-time process control of electro-polishing
01/11/2006CN1718370A 磨削装置 Grinding equipment
01/10/2006US6985791 Grinding wheel system
01/10/2006US6984164 Polishing apparatus
01/10/2006US6984163 Polishing pad with high optical transmission window
01/10/2006US6984162 Apparatus methods for controlling wafer temperature in chemical mechanical polishing
01/05/2006US20060003673 Apparatus and method for conditioning and monitoring media used for chemical-mechanical planarization
01/05/2006US20060003671 CMP apparatus and method
01/05/2006DE102004058797A1 Method for processing functional elements with curved surfaces comprises adjusting the geometry of a tool contour depending on the pivoting angle and rotary angle of the tool during rotation of a polishing tool about its own axis
01/05/2006DE102004027846A1 Schleifwerkzeug mit integrierten mikromagnetischen Sensoren Grinding tool with integrated micro-magnetic sensors
01/04/2006EP1610929A1 Chip customized polish pads for chemical mechanical planarization (cmp)
01/03/2006US6981909 Method for conditioning superabrasive tools
01/03/2006US6981908 Ferrule polishing control machine, ferrule polishing method, and ferrule polishing computer program
12/2005
12/29/2005WO2005123337A1 Real time polishing process monitoring
12/29/2005WO2005123335A1 Polishing apparatus and polishing method
12/29/2005WO2005018878A3 Cnc abrasive fluid-jet m illing
12/29/2005US20050287929 Integrated endpoint detection system with optical and eddy current monitoring
12/29/2005US20050287928 Method and apparatus for post-CMP cleaning of a semiconductor work piece
12/29/2005US20050287927 Method to monitor pad wear in CMP processing
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