Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
07/2001
07/03/2001US6255726 Vertical interconnect process for silicon segments with dielectric isolation
07/03/2001US6255716 Bipolar junction transistors having base electrode extensions
07/03/2001US6255710 3-D smart power IC
07/03/2001US6255706 Thin film transistor and method of manufacturing same
07/03/2001US6255705 Producing devices having both active matrix display circuits and peripheral circuits on a same substrate
07/03/2001US6255704 Semiconductor device and method for fabricating the same
07/03/2001US6255703 Device with lower LDD resistance
07/03/2001US6255696 Retrograde ESD protection apparatus
07/03/2001US6255695 TFT CMOS logic circuit having source/drain electrodes of differing spacing from the gate electrode for decreasing wiring capacitance and power consumption
07/03/2001US6255694 Multi-function semiconductor structure and method
07/03/2001US6255693 Ion implantation with programmable energy, angle, and beam current
07/03/2001US6255692 Trench-gate semiconductor device
07/03/2001US6255691 Nonvolatile semiconductor memory device and manufacturing process thereof
07/03/2001US6255690 Non-volatile semiconductor memory device
07/03/2001US6255689 Flash memory structure and method of manufacture
07/03/2001US6255683 Dynamic random access memory
07/03/2001US6255679 Field effect transistor which can operate stably in millimeter wave band
07/03/2001US6255674 Silicon-germanium heterobipolar transistor with a step-wise graded base
07/03/2001US6255673 Hetero-junction field effect transistor
07/03/2001US6255668 Thin film transistor with inclined eletrode side surfaces
07/03/2001US6255447 Oligomers or polymers which demonstrate fluorescence, high glass transition temperatures or liquid-crystalline properties; facilitate preparation of films having high heat resistance and solvent resistance
07/03/2001US6255227 Etching process of CoSi2 layers
07/03/2001US6255219 Method for fabricating high-performance submicron MOSFET with lateral asymmetric channel
07/03/2001US6255206 Method of forming gate electrode with titanium polycide structure
07/03/2001US6255204 Method for forming a semiconductor device
07/03/2001US6255203 Technique for low-temperature formation of excellent silicided α-Si gate structures
07/03/2001US6255202 Damascene T-gate using a spacer flow
07/03/2001US6255201 Method and device for activating semiconductor impurities
07/03/2001US6255199 Method of producing polycrystalline silicon
07/03/2001US6255198 Methods of fabricating gallium nitride microelectronic layers on silicon layers and gallium nitride microelectronic structures formed thereby
07/03/2001US6255196 Method for sawing wafers employing multiple indexing techniques for multiple die dimensions
07/03/2001US6255195 Method for forming a bonded substrate containing a planar intrinsic gettering zone and substrate formed by said method
07/03/2001US6255190 Method for dielectrically isolated deep pn-junctions in silicon substrates using deep trench sidewall predeposition technology
07/03/2001US6255187 Method of fabricating self-aligning stacked capacitor using electroplating method
07/03/2001US6255184 Fabrication process for a three dimensional trench emitter bipolar transistor
07/03/2001US6255183 Manufacture of a semiconductor device with a MOS transistor having an LDD structure using SiGe spacers
07/03/2001US6255181 Method for fabricating MOS semiconductor device having salicide region and LDD structure
07/03/2001US6255178 Method for forming transistors with raised source and drains and device formed thereby
07/03/2001US6255175 Fabrication of a field effect transistor with minimized parasitic Miller capacitance
07/03/2001US6255174 Mos transistor with dual pocket implant
07/03/2001US6255171 Method of making dense SOI flash memory array structure
07/03/2001US6255166 Nonvolatile memory cell, method of programming the same and nonvolatile memory array
07/03/2001US6255165 Nitride plug to reduce gate edge lifting
07/03/2001US6255154 Semiconductor device and method of manufacturing the same
07/03/2001US6255150 Use of crystalline SiOx barriers for Si-based resonant tunneling diodes
07/03/2001US6255149 Process for restricting interdiffusion in a semiconductor device with composite Si/SiGe gate
07/03/2001US6255148 Polycrystal thin film forming method and forming system
07/03/2001US6255146 Thin film transistor and a method of manufacturing thereof
07/03/2001US6255145 Process for manufacturing patterned silicon-on-insulator layers with self-aligned trenches and resulting product
07/03/2001US6255131 Liquid crystal display device
07/03/2001US6255130 Thin film transistor array panel and a method for manufacturing the same
07/03/2001US6255121 Method for fabricating ferroelectric field effect transistor having an interface insulator layer formed by a liquid precursor
07/03/2001US6254827 Placing chip adjacent to substrate; forming electrically conductive interconnects, interconnecting electrically conductive traces on first surface of chip with traces on substrate; light exposure; applying wickable sealent; curing
07/03/2001US6254676 Method for manufacturing metal oxide semiconductor transistor having raised source/drain
06/2001
06/28/2001WO2001047045A1 Solution processing
06/28/2001WO2001047044A2 Forming interconnects
06/28/2001WO2001047043A1 Solution processed devices
06/28/2001WO2001047030A1 Depletion type mos transistor
06/28/2001WO2001047029A1 Horizontal junction field-effect transistor
06/28/2001WO2001047028A1 Production of single-pole components
06/28/2001WO2001047027A1 Semiconductor device
06/28/2001WO2001047026A1 Silicon carbide lmosfet with gate break-down protection
06/28/2001WO2001047025A1 Silicon carbide lateral mosfet and method of making the same
06/28/2001WO2001047024A1 Silicon carbide n-channel power lmosfet
06/28/2001WO2001047023A1 High voltage semiconductor
06/28/2001WO2001047012A1 Non-volatile memory cells and periphery
06/28/2001WO2001047006A1 Tunnel nitride for improved polysilicon emitter
06/28/2001WO2001046989A2 Decoupling capacitors for thin gate oxides
06/28/2001WO2001046987A2 Inkjet-fabricated integrated circuits
06/28/2001WO2001046664A2 Method for producing micromechanical structures
06/28/2001WO2001045864A1 Low temperature process for high density thin film integrated capacitors, and amorphously frustrated ferroelectric materials therefor
06/28/2001WO2001045501A2 GROWTH OF ULTRATHIN NITRIDE ON Si(100) BY RAPID THERMAL N2 TREATMENT
06/28/2001WO2001004949A9 Nand type flash memory device
06/28/2001WO2000079570A3 Silicon carbide epitaxial layers grown on substrates offcut towards <1100>
06/28/2001US20010005622 Method for manufacturing gate electrode with vertical side profile
06/28/2001US20010005620 Process for manufacturing semiconductor device
06/28/2001US20010005618 Using epitaxial growth technique to construct lines of required fineness
06/28/2001US20010005616 Method for fabricating semiconductor device
06/28/2001US20010005613 Semiconductor device and method of fabricating the same
06/28/2001US20010005610 Semiconductor device having metal silicide film and manufacturing method thereof
06/28/2001US20010005608 Method for semiconductor manufacturing
06/28/2001US20010005606 Laser irradiation apparatus and method of fabricating a semiconductor device
06/28/2001US20010005605 High-temperature heat treatment of the oxidized film to drive out contamination acquired from the doped layer beneath to improve the quality of the oxidized film such as durability against a high voltage
06/28/2001US20010005598 Method of manufacturing an active matrix device
06/28/2001US20010005596 Method for manufacturing thin film transistor liquid crystal display
06/28/2001US20010005333 Non-volatile memory structure and corresponding manufacturing process
06/28/2001US20010005332 Non- volatile semiconductor memory device and method of forming the same
06/28/2001US20010005330 Nand-type flash memory device and method of operating the same
06/28/2001US20010005328 Non-volatile semiconductor memory device
06/28/2001US20010005302 Clipping device with a negative resistance
06/28/2001US20010005245 Color liquid crystal display and method of manufacturing color liquid crystal display
06/28/2001US20010005227 Solid-state imaging device
06/28/2001US20010005194 Semiconductor device and driving method thereof
06/28/2001US20010005036 Power semiconductor component for high reverse voltages
06/28/2001US20010005035 Bipolar transistor having lightly doped epitaxial collector region constant in dopant impurity and process of fabrication thereof
06/28/2001US20010005032 Method for producing a filled recess in a material layer, and an integrated circuit configuration produced by the method
06/28/2001US20010005031 Power semiconductor device
06/28/2001US20010005030 Semiconductor device and fabrication method
06/28/2001US20010005029 Semiconductor device lacking steeply rising structures and fabrication method of the same
06/28/2001US20010005026 Conductive thin film, a capacitor using the same and a method of manufacturing.