Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
07/2001
07/31/2001US6268632 Field effect transistor and power amplifier including the same
07/31/2001US6268631 Glass substrate assembly, semiconductor device and method of heat-treating glass substrate
07/31/2001US6268630 Silicon-on-insulator field effect transistor with improved body ties for rad-hard applications
07/31/2001US6268629 Field effect transistor with reduced narrow channel effect
07/31/2001US6268628 Depletion type MOS semiconductor device and MOS power IC
07/31/2001US6268626 DMOS field effect transistor with improved electrical characteristics and method for manufacturing the same
07/31/2001US6268625 Trench-type thin film transistor
07/31/2001US6268622 Non-volatile memory device and fabrication method thereof
07/31/2001US6268621 Vertical channel field effect transistor
07/31/2001US6268619 Integrated circuits
07/31/2001US6268560 Pre-equilibrium chemical reaction energy converter
07/31/2001US6268295 Method of manufacturing semiconductor device
07/31/2001US6268286 Method of fabricating MOSFET with lateral resistor with ballasting
07/31/2001US6268282 Semiconductor processing methods of forming and utilizing antireflective material layers, and methods of forming transistor gate stacks
07/31/2001US6268273 Fabrication method of single electron tunneling device
07/31/2001US6268272 Method of forming gate electrode with titanium polycide
07/31/2001US6268256 Method for reducing short channel effect
07/31/2001US6268254 Method and device for improved salicide resistance on polysilicon gates
07/31/2001US6268253 Forming a removable spacer of uniform width on sidewalls of a gate of a field effect transistor during a differential rapid thermal anneal process
07/31/2001US6268232 Method for fabricating a micromechanical component
07/27/2001CA2332739A1 Process for formation of cap layer for semiconductor
07/26/2001WO2001054204A1 A semiconductor device
07/26/2001WO2001054202A1 Strained-silicon metal oxide semiconductor field effect transistors
07/26/2001WO2001054201A1 Method for reducing junction capacitance using a halo implant photomask
07/26/2001WO2001054200A1 Lanthanum oxide-based gate dielectrics for integrated circuit field effect transistors and methods of fabricating same
07/26/2001WO2001054199A1 Semiconductor device and manufacture thereof
07/26/2001WO2001054197A1 Distributed reverse surge guard
07/26/2001WO2001054177A1 Tungsten gate electrode method and device
07/26/2001WO2001054174A1 Silicon on insulator circuit structure with buried semiconductor interconnect structure and method for forming same
07/26/2001WO2001054171A1 A chemical sensor using chemically induced electron-hole production at a schottky barrier
07/26/2001WO2001054168A2 Semiconductor component and corresponding testing method
07/26/2001WO2001054167A2 Silicon/germanium bipolar transistor with an optimized germanium profile
07/26/2001WO2001053887A2 An active matrix electro-optic display
07/26/2001WO2001053565A1 Process for preparing metal nitride thin film employing amine-adduct single-source precursor
07/26/2001WO2000060670A3 Integrated semiconductor device with one lateral power gate
07/26/2001WO2000057481A3 Mos-transistor structure with a trench-gate electrode and a reduced specific closing resistor and methods for producing an mos transistor structure
07/26/2001US20010010043 Assistance method and apparatus
07/26/2001US20010009813 Method for fabricating semiconductor integrated circuit device
07/26/2001US20010009801 Method of making insulator for electrical structures
07/26/2001US20010009800 Manufacture of trench-gate semiconductor devices
07/26/2001US20010009799 Converting amorphous silicon layer into a hemispherical grained silicon film
07/26/2001US20010009794 Method and system for emitter partitioning for SiGe RF power transistors
07/26/2001US20010009793 Bipolar transistor formed by epitaxial growth or ion implantation that has an epitaxial silicon collector layer, a base region under an emitter defined as an intrinsic base and a peripheral region defined as an outer base region
07/26/2001US20010009791 Forming a line of undoped semiconductive material, providing conductivity-enhancing impurity into the line and source/drain regions, rendering the undoped material of the line conductive
07/26/2001US20010009790 Self-aligned lateral DMOS with spacer drift region
07/26/2001US20010009789 Semiconductor device and manufacturing method thereof
07/26/2001US20010009788 Layers of silicon carbide, silicon dioxide an insulating material, and a gate contact
07/26/2001US20010009785 Forming n-type drain region in n-type silicon region, forming n-type source region in n-type silicon region, forming dielectric layer on n-type silicon region, forming a p-type polysilicon gate on dielectric layer
07/26/2001US20010009784 Preparing substrate, isolating active region, depositing gate oxide, depositing first and second selective etchable layers over gate oxide layer, etching to undercut first etchable layer, implanting ions, etching, depositing oxide, metallizing
07/26/2001US20010009783 Semiconductor device and fabrication method thereof
07/26/2001US20010009775 Semiconductor substrate, gate insulating film formed on surface of semiconductor substrate, tunnel insulating film obtained by forming portion of gate insulating film into thin layer, floating gate formed on gate insulating film
07/26/2001US20010009527 Semiconductor memory device
07/26/2001US20010009447 Liquid crystal display device
07/26/2001US20010009292 Semiconductor device and method of manufacturing the same
07/26/2001US20010009291 Semiconductor structure having reduced silicide resistance between closely spaced gates and method of fabrication
07/26/2001US20010009289 Flash memory device and fabrication method thereof
07/26/2001US20010009288 Semiconductor device and method of fabricating the same
07/26/2001US20010009287 High breakdown voltage MOS type semiconductor apparatus
07/26/2001US20010009279 Semiconductor device and manufacturing method of the same
07/26/2001US20010009278 Sparse-carrier devices and method of fabrication
07/26/2001US20010009112 Microsystem with a flexible membrane for a pressure sensor and manufacturing process
07/26/2001US20010009059 Method and device for manufacturing pressure detecting apparatus
07/26/2001DE10102355A1 Pressure detection unit has a housing section of injection molded plastics with glass fibers fitted to a second housing section to form a pressure detection chamber with a sensor and a sealed fit for the O-ring seal
07/26/2001DE10100695A1 Halbleitervorrichtung Semiconductor device
07/26/2001DE10064002A1 Vielschicht-Dünnschichtstruktur, ferroelektrisches Dünnschichtelement und Verfahren zur Herstellung derselben Multilayer thin film structure, the ferroelectric thin-film element and process for producing same
07/26/2001DE10039166A1 Semiconductor device used as a MOSFET comprises a semiconductor substrate, a gate insulating layer formed on the substrate, and a gate electrode formed on the substrate with the gate insulating layer in between
07/26/2001DE10002754A1 Semiconductor structural component for applying to a pre-structured semiconductor substrate applies a mask to a substrate with a distinctly reduced width at a definite point allowing epitaxial growth through MBE and MOVPE.
07/26/2001DE10001869A1 Controllable semiconducting component that can block in both directions achieves higher blocking voltage between first and second conducting zones - has first conducting zone with strongly doped zone for connecting connection electrode and more weakly doped zone enclosing strongly doped zone
07/25/2001EP1119055A1 Distributed reverse surge guard
07/25/2001EP1119054A1 Electrostatic induction transistor
07/25/2001EP1119053A2 Semiconductor, semiconductor device, and method for fabricating the same
07/25/2001EP1119052A2 Vertical DMOS transistor device having a low on-resistance
07/25/2001EP1119051A1 BiCDMOS process technology and structures
07/25/2001EP1119050A1 BiCDMOS process technology and structures
07/25/2001EP1119044A1 BiCDMOS process technology and structures
07/25/2001EP1119043A2 BiCDMOS process technology and structures
07/25/2001EP1119036A1 BiCDMOS process technology and structures
07/25/2001EP1118125A1 Lateral thin-film silicon-on-insulator (soi) device having a gate electrode and a field plate electrode
07/25/2001EP1118124A1 Bipolar transistor and method for producing same
07/25/2001EP1118109A1 Silicon carbide deposition method and use as a barrier layer and passivation layer
07/25/2001EP1118107A1 In situ deposition of low k si carbide barrier layer, etch stop, and anti-reflective coating for damascene applications
07/25/2001EP1118025A2 Silicon carbide for use as a low dielectric constant anti-reflective coating and its deposition method
07/25/2001EP0904588B1 A device and method for multi-level charge/storage and reading out
07/25/2001CN1305636A Planar electron emitter (PEE)
07/25/2001CN1305593A Scintillator panel, radiation image sensor, and method for manufacturing the same
07/25/2001CN1305232A MOSFET memory with composite nm-grain Ge/Si float grid structure
07/25/2001CN1305231A Metallic oxide semiconductor field effect tube semiconductor device
07/25/2001CN1305230A Tunnel transistor suitable for nonvolatile storage
07/25/2001CN1305227A Actire matrix display device
07/25/2001CN1305223A Method of manufacturing thin film transistor
07/25/2001CN1305222A Method of manufacturing thin film transistor
07/24/2001US6266800 System and method for eliminating effects of parasitic bipolar transistor action in dynamic logic using setup time determination
07/24/2001US6266279 Nonvolatile semiconductor memory device, method for reading data from the nonvolatile semiconductor memory device, and method for writing data into the nonvolatile semiconductor memory device
07/24/2001US6266276 Non-volatile semiconductor memory device and internal operation method for said non-volatile semiconductor memory device
07/24/2001US6266275 Dual source side polysilicon select gate structure and programming method utilizing single tunnel oxide for nand array flash memory
07/24/2001US6265777 Semiconductor device with a low resistance wiring layer composed of a polysilicon and a refractory metal
07/24/2001US6265755 Semiconductor integrated circuit comprising MIS capacitors
07/24/2001US6265754 Covered slit isolation between integrated circuit devices
07/24/2001US6265752 Method of forming a HVNMOS with an N+ buried layer combined with N well and a structure of the same
07/24/2001US6265749 Metal silicide transistor gate spaced from a semiconductor substrate by a ceramic gate dielectric having a high dielectric constant