Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
01/2002
01/24/2002US20020008814 Liquid crystal display device and liquid crystal projector apparatus
01/24/2002US20020008801 Glass substrate assembly, semiconductor device and method of heat-treating glass substrate
01/24/2002US20020008798 Thin film transistor array substrate for liquid crystal display and method for fabricating the same
01/24/2002US20020008793 Display device and method of manufacturing the same
01/24/2002US20020008724 Semiconductor device, ink tank provided with such semiconductor device, ink jet cartridge, ink jet recording apparatus, method for manufacturing such semiconductor device, and communication system, method for controlling pressure, memory element, security system of ink jet recording apparatus
01/24/2002US20020008695 Display device and circuit therefor
01/24/2002US20020008464 Woven or ink jet printed arrays for extreme UV and X-ray source and detector
01/24/2002US20020008304 Scanning probe microscope (SPM) probe having field effect transistor channel and method of fabricating the same
01/24/2002US20020008303 Semiconductor device
01/24/2002US20020008297 Gate structure and method for manufacture thereof
01/24/2002US20020008295 Metal oxide semiconductor field effect transistor for reducing resistance between source and drain and method for fabricating the same
01/24/2002US20020008294 Semiconductor device and method for manufacturing same
01/24/2002US20020008293 Semiconductor device including inversely tapered gate electrode and manufacturing method thereof
01/24/2002US20020008292 Conductor layer nitridation
01/24/2002US20020008291 Mis transistor and method of fabricating the same
01/24/2002US20020008290 Method for producing an integrated circuit capacitor
01/24/2002US20020008289 Mosfet with strained channel layer
01/24/2002US20020008286 Thin film transistors and semiconductor device
01/24/2002US20020008285 Semiconductor apparatus and process for manufacturing the same
01/24/2002US20020008284 Power mosfet and method for forming same using a self-aligned body implant
01/24/2002US20020008282 Semiconductor device and a method of fabricating the same
01/24/2002US20020008281 Devices and methods for addressing optical edge effects in connection with etched trenches
01/24/2002US20020008278 Semiconductor memory integrated circuit and its manufacturing method
01/24/2002US20020008277 Flash memory cell with contactless bit line, and process of fabrication
01/24/2002US20020008276 Non-volatile semiconductor memory device and manufacturing method thereof
01/24/2002US20020008275 Nonvolatile semiconductor memory device and its manufacture
01/24/2002US20020008274 Nonvolatile semiconductor memory and process for fabricating the same
01/24/2002US20020008273 Semiconductor device and a method of manufacturing the same
01/24/2002US20020008268 RF voltage controlled capacitor on thick-film SOI
01/24/2002US20020008267 Deep trench semiconductor capacitors having reverse bias diodes for implantable medical devices
01/24/2002US20020008262 Semiconductor integrated circuit
01/24/2002US20020008261 Transistor, semiconductor device and manufacturing method of semiconductor device
01/24/2002US20020008260 Insulated gate semiconductor device and method of manufacturing the same
01/24/2002US20020008259 Method of fabricating a semiconductor device with an open drain input/output terminal
01/24/2002US20020008258 Semiconductor device and manufacturing method thereof
01/24/2002US20020008257 Mosfet gate electrodes having performance tuned work functions and methods of making same
01/24/2002US20020008253 Semiconductor memory device and method for fabricating the same
01/24/2002US20020008252 Method of estimating lifetime of semiconductor device, and method of reliability simulation
01/24/2002US20020008249 Compound semiconductor device
01/24/2002US20020008248 Compound semiconductor device and method of manufacturing the same
01/24/2002US20020008246 Fast recovery diode and method for its manufacture
01/24/2002US20020008240 Electro-optical device, method for making the same, and electronic apparatus
01/24/2002US20020008239 Substrate device, method of manufacturing the same, and electro-optical device
01/24/2002US20020008237 Schottky diode having increased forward current with improved reverse bias characteristics and method of fabrication
01/24/2002US20020008232 Slotted quantum well sensor
01/24/2002US20020008083 Dry etching method
01/24/2002US20020008019 Method of manufacturing semiconductor device
01/24/2002DE10133543A1 Bi-directional semiconducting component has semiconducting chip with layer of alternating conductivity types between two main surfaces with drift zones and separating zones
01/24/2002DE10130237A1 Kapazitiver Sensor für dynamische Größen mit Verschiebungsabschnitt, hergestellt durch Drahtbonden Capacitive sensor for dynamic variables with shift section made by wire bonding
01/24/2002DE10123616A1 Superjunction-Halbleiterbauteil sowie Verfahren zu seiner Herstellung Superjunction semiconductor device and process for its preparation
01/24/2002DE10034003A1 Grabenkondensator mit Isolationskragen und entsprechendes Herstellungsverfahren Grave capacitor insulation collar and manufacturing method thereof
01/24/2002DE10033112A1 Verfahren zur Herstellung und Strukturierung organischer-Feldeffekt-Transistoren (OFET) Process for the preparation and patterning of organic field effect transistors (OFET)
01/24/2002DE10032579A1 Verfahren zur Herstellung eines Halbleiterbauelements sowie ein nach dem Verfahren hergestelltes Halbleiterbauelement A process for producing a semiconductor device as well as a product produced by the process semiconductor device
01/24/2002DE10032412A1 Electronic storage element used in CMOS technology comprises carbon nanotubes arranged skew to each other or crossing each other so that an electrical coupling is produced between the tubes
01/23/2002EP1174929A2 Power semiconductor device and method of manufacturing the same
01/23/2002EP1174928A1 Semiconductor device and semiconductor substrate
01/23/2002EP1174913A2 Process for etching heterojunction interfaces and corresponding layer structures
01/23/2002EP1173896A1 Electrostatically controlled tunneling transistor
01/23/2002EP1173892A1 Field effect transistor with non-floating body and method for forming same on a bulk silicon wafer
01/23/2002EP1173891A1 Semiconductor device providing overvoltage and overcurrent protection for a line
01/23/2002EP1173890A1 Semiconductor device with junctions having dielectric pockets and method for making same
01/23/2002EP1173888A1 Web process interconnect in electronic assemblies
01/23/2002EP1173887A1 Nonvolatile memory
01/23/2002EP0720418B1 Manufacturing method for ternary compound films
01/23/2002CN1332889A Ferroelectric transistor and method for the production thereof
01/23/2002CN1332479A Active matrix substrate, display device and method of making active matrix substrate
01/23/2002CN1332476A Semiconductor device and its manufacture
01/23/2002CN1332473A Laser circuit forming method and formed laser circuit
01/23/2002CN1078387C Semiconductor device and its manufacture
01/23/2002CN1078386C Method of manufacturing semiconductor device
01/22/2002US6341087 Semiconductor device
01/22/2002US6340998 Thin film transistor liquid crystal display including at least three transistors associated with an unit pixel
01/22/2002US6340836 Semiconductor device for rectifying
01/22/2002US6340831 Photodiode and photodiode module
01/22/2002US6340830 Semiconductor device and method for forming the same
01/22/2002US6340829 Semiconductor device and method for manufacturing the same
01/22/2002US6340828 Process for manufacturing nonvolatile memory cells with dimensional control of the floating gate regions
01/22/2002US6340825 Method of designing semiconductor integrated circuit device and semiconductor integrated circuit device
01/22/2002US6340629 Method for forming gate electrodes of semiconductor device using a separated WN layer
01/22/2002US6340627 Method of making a doped silicon diffusion barrier region
01/22/2002US6340623 Method of fabricating semiconductor device
01/22/2002US6340619 Capacitor and method of fabricating the same
01/22/2002US6340618 RF power transistor
01/22/2002US6340617 Manufacture of semiconductor device
01/22/2002US6340610 Thin-film transistor and method of making same
01/22/2002US6340609 Method of forming thin film transistor
01/17/2002WO2002005360A1 Method for the production and configuration of organic field-effect transistors (ofet)
01/17/2002WO2002005353A1 Semiconductor non-volatile memory device
01/17/2002WO2002005341A1 Method of manufacturing power silicon transistor
01/17/2002WO2002005336A1 Method for producing a gate for a cmos transistor structure having a channel of reduced length
01/17/2002WO2002005335A1 Single crystal wafer and solar battery cell
01/17/2002WO2002005328A2 Pod load interface equipment adapted for implementation in a fims system
01/17/2002WO2002005317A2 Method of etching tungsten or tungsten nitride electrode gates in semiconductor structures
01/17/2002WO2002005300A2 Feedback control of strip time to reduce post strip critical dimension variation in a transistor gate electrode
01/17/2002WO2001099190A8 Matrix array display devices with light sensing elements
01/17/2002WO2001057939A3 A hybrid organic-inorganic semiconductor device and a method of its fabrication
01/17/2002US20020007258 Semi-physical modeling of HEMT high frequency small signal equivalent circuit models
01/17/2002US20020006715 Method for forming an extended metal gate using a damascene process
01/17/2002US20020006712 Semiconductor device and method of fabricating same
01/17/2002US20020006711 Method of manufacturing a semiconductor device