Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
01/2002
01/31/2002US20020011613 Semiconductor device and method for manufacturing the same
01/31/2002US20020011612 Semiconductor device and method for manufacturing the same
01/31/2002US20020011609 Transistor
01/31/2002US20020011608 Self aligned method of forming a semiconductor memory array of floating gate memory cells, and a memory array made thereby
01/31/2002US20020011606 Semiconductor integrated circuit and designing method thereof
01/31/2002US20020011605 Heterojunction bipolar transferred electron tetrode
01/31/2002US20020011604 Semiconductor device for milliwave band oscillation, fabricating method therefor and oscillator therewith
01/31/2002US20020011603 Semiconductor device and method of manufacturing the same
01/31/2002US20020011598 Semiconductor device using a semiconductor film having substantially no grain boundary
01/31/2002US20020011597 Light emitting device
01/31/2002US20020011553 Active matrix display device and method of manufacturing the same
01/31/2002US20020011461 Method of structuring a metal-containing layer
01/31/2002US20020011114 Capacitive vacuum sensor
01/31/2002DE10037533C1 Induktivitätsarme Schaltungsanordnung Inductance circuit
01/31/2002DE10034942A1 Verfahren zur Erzeugung eines dotierten Halbleitersubstrats A method for producing a doped semiconductor substrate
01/30/2002EP1176643A2 MOS power semiconductor device having a trench gate and method of making the same
01/30/2002EP1176640A2 Contact structure of an integrated power circuit
01/30/2002EP1176636A2 System for manufacturing a thin-film transistor, method of manufacturing a thin-film transistor, method of evaluationg polysilicon, and apparatus for inspecting polysilicon
01/30/2002EP1176633A2 Surface treatment solution for polysilicon film and method of treating the surface of polysilicon film using the same
01/30/2002EP1176602A1 Flash EPROM integrated circuit architecture
01/30/2002EP1176029A2 Ink jet recording element and printing method
01/30/2002EP1175700A1 Semiconductor component
01/30/2002EP1175680A1 Ramped or stepped gate channel erase for flash memory application
01/30/2002EP1175628A1 Accelerometer transducer used for seismic recording
01/30/2002EP0829012B1 Method of producing a semiconductor transducer
01/30/2002EP0616334B1 Non-volatile semiconductor memory device having floating gate
01/30/2002CN1333926A Semiconducting polymer field effect transistor
01/30/2002CN1333923A Field effect-controlled transistor and method for producing the same
01/30/2002CN1333922A Method and system for emitter partitioning for SiGe RF power transistors
01/30/2002CN1333570A Optical element and making method thereof electronic device
01/30/2002CN1333568A Semiconductor device and making method thereof
01/30/2002CN1333565A Semiconductor device and making method thereof
01/30/2002CN1333555A Method for making soft recovery quick power diode and the power diode by same
01/30/2002CN1333526A Photoelectric device, its making method and electronic equipment
01/30/2002CN1333524A Electric level converter and active matrix type indicator using same
01/30/2002CN1333475A LCD and making method thereof
01/30/2002CN1333389A Electroplating device
01/30/2002CN1333147A Acceleration tester
01/30/2002CN1078743C Method for fabricating semiconductor device with planarization step using CMP
01/29/2002US6342717 Semiconductor device and method for producing same
01/29/2002US6342716 Semiconductor device having dot elements as floating gate
01/29/2002US6342713 Method of operating a magnetoelectronic device
01/29/2002US6342709 Insulated gate semiconductor device
01/29/2002US6342440 Method for forming low-leakage impurity regions by sequence of high-and low-temperature treatments
01/29/2002US6342437 Transistor and method of making the same
01/29/2002US6342430 Trench isolation for micromechanical devices
01/29/2002US6342423 MOS-type transistor processing utilizing UV-nitride removable spacer and HF etch
01/29/2002US6342422 Method for forming MOSFET with an elevated source/drain
01/29/2002US6342421 Semiconductor device and manufacturing method thereof
01/29/2002US6342418 Semiconductor device and manufacturing method thereof
01/29/2002US6342414 Damascene NiSi metal gate high-k transistor
01/29/2002US6342412 Having a dram (dynamic random access memory), having a capacity as high as 16 mbits; improve the alpha-ray soft error withstand voltage; misfet
01/29/2002US6342411 Electronic component and method for manufacture
01/29/2002US6342410 Fabrication of a field effect transistor with three sided gate structure on semiconductor on insulator
01/29/2002US6342409 Polysilicon thin film transistor and method of manufacturing the same
01/29/2002US6342408 Method of manufacturing semiconductor memory device
01/29/2002US6342313 Oxide films and process for preparing same
01/29/2002US6341527 Capacitive pressure sensor
01/29/2002CA2091332C Semiconductor non-volatile memory with tunnel oxide
01/24/2002WO2002007312A2 Power semiconductor switching devices, power converters, integrated circuit assemblies, integrated circuitry, power current switching methods, methods of forming a power semiconductor switching device, power conversion methods, power semiconductor switching device packaging methods, and methods of forming a power transistor
01/24/2002WO2002007225A1 Insulated-gate semicondcutor device for rectifier
01/24/2002WO2002007223A1 A power mos transistor comprising a plurality of transistor segments with different threshold voltages
01/24/2002WO2002007222A2 Receiver comprising a variable capacitance diode
01/24/2002WO2002007219A1 Semiconductor device and its manufacturing method
01/24/2002WO2002007215A1 Nonvolatile memory device and method for manufacturing the same
01/24/2002WO2002007207A1 Thin film transistors and their manufacture
01/24/2002WO2002007201A2 Method for etching trenches for the fabrication of semiconductor devices
01/24/2002WO2001082333A3 Homogeneous gate oxide thickness for vertical transistor structures
01/24/2002WO2001043197A3 Source/drain-on-insulator (s/doi) field effect transistors and method of fabrication
01/24/2002US20020010565 Method to support the setup of input parameters
01/24/2002US20020010564 Semiconductor device simulation method
01/24/2002US20020009900 Growth of ultrathin nitride on Si (100) by rapid thermal N2 treatment
01/24/2002US20020009899 Forming silica barrier; process control
01/24/2002US20020009898 Method for fabricating semiconductor integrated circuit device
01/24/2002US20020009897 Flowable germanium doped silicate glass for use as a spacer oxide
01/24/2002US20020009890 Manufacturing method of active matrix substrate
01/24/2002US20020009881 Conductor member formation and pattern formation methods
01/24/2002US20020009867 Method of fabricating semiconductor device
01/24/2002US20020009859 Method for making SOI MOSFET
01/24/2002US20020009856 Method of fabricating a semiconductor device with self- aligned silicide areas formed using a supplemental silicon overlayer
01/24/2002US20020009854 Trench MOSFET with double-diffused body profile
01/24/2002US20020009852 Method of manufacturing semiconductor device
01/24/2002US20020009851 Method for manufacturing semiconductor integrated circuit device having floating gate and deposited film
01/24/2002US20020009846 Semiconductor device and method of manufacturing the same
01/24/2002US20020009838 Thin-film transistor and method of making same
01/24/2002US20020009837 Forming a semiconductor film comprising silicon over a substrate comprising a glass; crystallizing film by heat treatment; patterning; doping n-type impurities; masking doping p-type impurities; thermal annealing
01/24/2002US20020009836 Fabrication method and fabrication apparatus for thin film transistor
01/24/2002US20020009835 Process for forming polycrystalline thin film transistor liquid crystal display
01/24/2002US20020009833 Thin film transistor with sub-gates and schottky source/drain and a manufacturing method of the same
01/24/2002US20020009832 Method of fabricating high voltage power mosfet having low on-resistance
01/24/2002US20020009819 Thin film transistors and their manufacture
01/24/2002US20020009818 Method of manufacturing a semiconductor device
01/24/2002US20020009624 Reduction and oxidation reactions in positive and negative liquid electrolytes, without gas evolution at the electrodes; batteries
01/24/2002US20020009116 Complex coupling MQW semiconductor laser
01/24/2002US20020008999 Semiconductor integrated circuit device operating with low power consumption
01/24/2002US20020008995 Semiconductor storage device and production method thereof
01/24/2002US20020008992 Semiconductor non-volatile storage
01/24/2002US20020008830 Active matrix liquid crystal display device
01/24/2002US20020008819 Liquid crystal display apparatus and method for manufacturing liquid crystal display apparatus
01/24/2002US20020008818 Transmission liquid crystal display and method of forming the same