Patents
Patents for H01L 29 - Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having at least one potential-jump barrier or surface barrier; Capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. pn-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof (218,143)
04/2003
04/22/2003US6551879 Method for forming an oxide layer on a nitride layer
04/22/2003US6551873 Method for forming a tantalum oxide capacitor
04/22/2003US6551869 Lateral PNP and method of manufacture
04/22/2003US6551868 Vertical power component manufacturing method
04/22/2003US6551865 Silicon carbide semiconductor device and method of fabricating the same
04/22/2003US6551853 Sensor having membrane structure and method for manufacturing the same
04/22/2003US6551852 Method of forming a recessed magnetic storage element
04/22/2003US6551717 Process for fabricating organic circuits
04/22/2003US6550339 Pressure sensor for detecting differential pressure between two spaces
04/17/2003WO2003032401A1 Semiconductor device and its manufacturing method
04/17/2003WO2003032400A1 Semiconductor device formed with disposable spacer and liner using high-k material and method of fabrication
04/17/2003WO2003032399A1 Semiconductor device fabricated on surface of silicon having <110> direction of crystal plane and its production method
04/17/2003WO2003032398A2 Field effect transistor having periodically doped channel
04/17/2003WO2003032397A2 INSULTING GATE AlGaN/GaN HEMT
04/17/2003WO2003032393A2 Double densed core gates in sonos flash memory
04/17/2003WO2003032378A1 Method for production of a gate structure for a mos transistor
04/17/2003WO2003032367A2 Fabrication of an electrically conductive silicon carbide article
04/17/2003WO2003031926A1 Micromechanical component (on pressure sensor membrane) comprising a bellows-type structure for temperature shifts
04/17/2003WO2003031687A2 Corrosion-proof pressure transducer
04/17/2003WO2003031679A2 Method for depositing metal layers employing sequential deposition techniques
04/17/2003WO2003031322A1 Method for preparing cobalt-protein complex
04/17/2003WO2003031317A2 Micromechanical sensor having a self-test function and optimization method
04/17/2003WO2003031158A1 Fabrication method at micrometer- and nanometer- scales for generation and control of anisotropy of structural, electrical, optical and optoelectronic properties of thin films of conjugated materials
04/17/2003WO2003021640A3 Method for semiconductor gate doping
04/17/2003WO2003007383A3 Algan/gan hemts having a gate contact on a gan based cap segment and methods of fabricating same
04/17/2003WO2002097173A3 Semi-insulating silicon carbide without vanadium domination
04/17/2003WO2002058159A9 Mos-gated power device with doped polysilicon body and process for forming same
04/17/2003US20030074641 Latch-up verifying method and latch-up verifying apparatus capable of varying over-sized region
04/17/2003US20030073313 Low leakage power transistor and method of forming
04/17/2003US20030073290 Method for growing ultra thin nitrided oxide
04/17/2003US20030073289 Trench-gate semiconductor devices and their manufacture
04/17/2003US20030073288 Method of forming nitridated tunnel oxide barriers for flash memory technology circuitry and STI and LOCOS isolation
04/17/2003US20030073287 Semiconductor structure with improved smaller forward voltage loss and higher blocking capability
04/17/2003US20030073285 Even nucleation between silicon and oxide surfaces for thin silicon nitride film growth
04/17/2003US20030073284 Even nucleation between silicon and oxide surfaces for thin silicon nitride film growth
04/17/2003US20030073276 Method for manufacturing a self-aligned split-gate flash memory cell
04/17/2003US20030073275 Self aligned method of forming a semiconductor memory array of floating gate memory cells with buried bitline and vertical word line transistor, and a memory array made thereby
04/17/2003US20030073274 Compound semiconductor device and method for manufacturing the same
04/17/2003US20030073273 Semiconductor device and method of manufacturing the same
04/17/2003US20030073270 Method of fabricating SiC semiconductor device
04/17/2003US20030073269 Low voltage high performance semiconductor devices and methods
04/17/2003US20030073267 Method for manufacturing a thin film transistor array panel for a liquid crystal display
04/17/2003US20030073259 Process of and apparatus for heat-treating II-VI compound semiconductors and semiconductor heat-treated by the process
04/17/2003US20030073258 Semiconductor device and method of manufacturing the same
04/17/2003US20030073256 Semiconductor device, method of manufacturing semiconductor device, and system for evaluating electrical characteristics of semiconductor device
04/17/2003US20030073122 Detection of single nucleic acid polymorphisms; obtain target nucleotide sequences, code sequence electronically in presence of oligonucleotides, incubate and hybridize to probe, detect signal from probe
04/17/2003US20030073104 Nanoscaling ordering of hybrid materials using genetically engineered mesoscale virus
04/17/2003US20030072975 Incorporation of nitrogen into high k dielectric film
04/17/2003US20030072192 Programming of nonvolatile memory cells
04/17/2003US20030072191 Non-volatile semiconductor memory device
04/17/2003US20030072173 Pattern layout of transfer transistors employed in row decoder
04/17/2003US20030072127 Micro-electromechanical sensor
04/17/2003US20030072126 Decoupling capacitor for high frequency noise immunity
04/17/2003US20030072123 High-q, variable capacitance capacitor
04/17/2003US20030071930 Active matrix type display
04/17/2003US20030071803 Thin-film transistor circuit and a semiconductor display using the same
04/17/2003US20030071564 Light-emitting device and a display apparatus having a light-emitting device
04/17/2003US20030071363 Semiconductor device
04/17/2003US20030071339 Semiconductor device with integrated circuit elements of group iii-v comprising means for preventing pollution by hyfrogen.
04/17/2003US20030071327 Method and apparatus utilizing monocrystalline insulator
04/17/2003US20030071320 Lateral device with improved conductivity and blocking control
04/17/2003US20030071317 Semiconductor device and manufactruing method therefor
04/17/2003US20030071316 Method to chemically remove metal impurities from polycide gate sidewalls
04/17/2003US20030071315 Reprogrammable non-volatile memory using a breakdown phenomena in an ultra-thin dielectric
04/17/2003US20030071314 MOS transistor and fabrication method thereof
04/17/2003US20030071313 Metal layers embedded into the contact holes of various kinds in shape are used as the lines for controlling the substrate bias
04/17/2003US20030071312 Thin film semiconductor device having a gate electrode insulator formed through high-heat oxidization
04/17/2003US20030071310 Shallow buried region of higher resistivity than the first resistivity, extending between the isolation trenches and created by a compensated doping; electrostatic discharging (esd) and metal oxide semiconductor (mos)
04/17/2003US20030071309 Electro-optical apparatus, driving substrate for an electro-optical apparatus and method of manufacturing them
04/17/2003US20030071308 Semiconductor device and method of fabricating the same
04/17/2003US20030071307 High performance poly-SiGe thin film transistor and a method of fabricating such a thin film transistor
04/17/2003US20030071306 Field oxide is grown across the integrated circuit patterned and etched to form an opening with vertical sidewalls exposing a portion of an upper surface of a substrate underlying the field oxide
04/17/2003US20030071305 Insulated gate semiconductor device
04/17/2003US20030071304 Method of forming flash memory having pre-interpoly dielectric treatment layer
04/17/2003US20030071303 Designing method for a semiconductor display device, manufacturing method for the semiconductor display device, semiconductor display device, and order receiving system for the semiconductor display device using the designing method
04/17/2003US20030071302 Multi-level type nonvolatile semiconductor memory device
04/17/2003US20030071298 Non-volatile semiconductor memory device
04/17/2003US20030071297 Nonvolatile semiconductor memory device having a capacitive element for use in a charge pump
04/17/2003US20030071296 Reprogrammable non-volatile memory using a breakdown phenomena in an ultra-thin dielectric
04/17/2003US20030071292 Method of making a self-aligned ferroelectric memory transistor
04/17/2003US20030071291 Integrated circuit with a MOS structure having reduced parasitic bipolar transistor action
04/17/2003US20030071290 Liner composed of a high dielectric (high-K) material having a relative permittivity of > 10 is formed adjacent the sidewalls of a gate
04/17/2003US20030071289 Multiple layer phase-change memory
04/17/2003US20030071288 Two-bit split-gate non-volatile memory transistor
04/17/2003US20030071281 Silicon-germanium hetero bipolar transistor withT-shaped implantation layer between emitter and emitter contact area
04/17/2003US20030071279 Semiconductor device including a plurality of kinds of MOS transistors and method of manufacturing the same
04/17/2003US20030071278 Silicon germanium hetero bipolar transistor
04/17/2003US20030071277 Silicon germanium hetero bipolar transistor having a germanium concentration profile in the base layer
04/17/2003US20030071276 Epitaxial growth of nitride semiconductor device
04/17/2003US20030071273 Diode having breakdown voltage adjustable to arbitrary value without increase of parasitic capacitance and process for fabrication thereof
04/17/2003US20030071272 Topside active optical device apparatus and method
04/17/2003US20030071265 Quantum well intermixing in InGaAsP structures induced by low temperature grown InP
04/17/2003US20030071263 Semiconductor device having dummy patterns for metal CMP
04/17/2003US20030071259 Polythiophene with a side chain polysilane exhibiting refractive index anisotropy and a conjugated system electrical conductivity is bonded to a main chain portion exhibiting pi conjugated system electrical conductivity
04/17/2003US20030071239 Twisted helix complementary with a fractal-shaped material; ferromagnetism
04/17/2003US20030071236 Method of deforming a pattern and semiconductor device formed by utilizing deformed pattern
04/17/2003US20030070607 Method for producing group III nitride compound semiconductor
04/17/2003US20030070489 Corrosion-proof pressure transducer
04/17/2003US20030070484 Capacitive type physical quantity detecting sensor for detecting physical quantity along plural axes
04/17/2003US20030070479 Wind tunnel and collector configuration therefor