Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
02/1998
02/04/1998EP0822571A2 Method and apparatus for ion beam neutralization
02/04/1998EP0822569A1 Method and apparatus for forming patterns in a photosensitive resin layer by continuous laser exposure, use for the fabrication of electron sources comprising emissive cathodes with microtips and flat display screens
02/04/1998EP0822476A2 Internal voltage generating circuit
02/04/1998EP0822455A2 Process for positioning a mask relative to a workpiece and device for executing the process
02/04/1998EP0822452A2 Optical proximity correction method and apparatus
02/04/1998EP0822447A1 Photopolymerizable composition
02/04/1998EP0822397A1 Method for packaging semiconductor devices
02/04/1998EP0822390A1 Surface roughness measuring apparatus and method
02/04/1998EP0822274A2 Method for manufacturing epitaxial wafer
02/04/1998EP0822268A1 Process for depositing adherent diamond thin films
02/04/1998EP0822164A2 Process for producing crystalline ceric oxide particles, abrasive and polishing method
02/04/1998EP0821987A1 Method of controlling crystallization of organic compounds and solid-state component for controlling crystallization in said method
02/04/1998EP0821812A1 Method of determining the radiation dose in a lithographic apparatus, and test mask and apparatus for performing the method
02/04/1998EP0660886B1 Growing a nitrogen doped epitaxial ii-vi compound layer on a single crystal substrate
02/04/1998EP0620953B1 Electrostatic wafer clamp
02/04/1998CN1172551A Method of producing ohmic contact and semiconductor device
02/04/1998CN1172443A Process and device for lacquering or coating substrate
02/04/1998CN1172350A Semiconductor equipment and its manufacturing method
02/04/1998CN1172348A Package for mounting semiconductor package
02/04/1998CN1172347A Method for manufaturing semiconductor device having capacitor on metal structure
02/04/1998CN1172346A Carrier for semiconductor wafer and use of carrier
02/04/1998CN1172345A Crack-resistant semiconductor package and fabrication method thereof and fabrication apparatus thereof
02/04/1998CN1172344A Method for forming interlayer insulating film of semiconductor device
02/04/1998CN1172343A Method for forming gate having polyside structure
02/04/1998CN1037301C Electrode for semiconductor element
02/03/1998US5715211 Synchronous dynamic random access memory
02/03/1998US5715196 Method for driving a non-volatile semiconductor memory
02/03/1998US5715190 Semiconductor memory device
02/03/1998US5715181 Isogrammetric analysis method for high-yield processes
02/03/1998US5715168 Auto-handler system preventing delivery of integrated circuits to defective sockets
02/03/1998US5715143 Carrier system for integrated circuit carrier assemblies
02/03/1998US5715132 Method and structure for improving gas breakdown resistance and reducing the potential of arcing in an electrostatic chuck
02/03/1998US5715121 Magnetoresistance element, magnetoresistive head and magnetoresistive memory
02/03/1998US5715089 Exposure method and apparatus therefor
02/03/1998US5715084 Imaging optical system
02/03/1998US5715064 Step and repeat apparatus having enhanced accuracy and increased throughput
02/03/1998US5715063 Projection exposure method
02/03/1998US5715052 Method of detecting the position and the content of fine foreign matter on substrates and analyzers used therefor
02/03/1998US5715050 Optical inspection apparatus including a telecentric optical system, an aperture stop and a screen
02/03/1998US5715040 In a photolithography system
02/03/1998US5715039 Projection exposure apparatus and method which uses multiple diffraction gratings in order to produce a solid state device with fine patterns
02/03/1998US5715037 Scanning exposure apparatus
02/03/1998US5715026 Method of fabricating active matrix display devices with prefabricated discrete non-linear devices
02/03/1998US5714905 Method for operating a bipolar transistor
02/03/1998US5714900 Electrical overstress protection device
02/03/1998US5714860 Stage device capable of applying a damping force to a movable member
02/03/1998US5714804 Semiconductor contact structure in integrated semiconductor devices
02/03/1998US5714799 Resin-sealed type semiconductor device having an unoccupied second die pad
02/03/1998US5714798 Selective deposition process
02/03/1998US5714796 Integrated circuit device fabricated on semiconductor substrate blocking power supply lines from noise
02/03/1998US5714795 Capable of high-speed writing and reading and having extreemly high reliability
02/03/1998US5714793 Complementary vertical bipolar junction transistors formed in silicon-on-saphire
02/03/1998US5714790 High image quality liquid crystal displays
02/03/1998US5714788 Dual ion implantation process for gate oxide improvement
02/03/1998US5714787 Semiconductor device with a reduced element isolation region
02/03/1998US5714786 Transistors having controlled conductive spacers, uses of such transistors and methods of making such transistors
02/03/1998US5714784 Formed on a substrate
02/03/1998US5714783 Field-effect transistor
02/03/1998US5714782 Composite integrated circuit device
02/03/1998US5714781 Semiconductor device having a gate electrode in a grove and a diffused region under the grove
02/03/1998US5714780 Semiconductor memory and method of fabricating the same
02/03/1998US5714779 Semiconductor memory device having a transistor, a bit line, a word line and a stacked capacitor
02/03/1998US5714778 Semiconductor device including memory cell having a capacitance element added to a node of the cell
02/03/1998US5714777 Si/SiGe vertical junction field effect transistor
02/03/1998US5714771 Projection type color display device, liquid crystal device, active matrix assembly and electric view finder
02/03/1998US5714768 Second-layer phase change memory array on top of a logic device
02/03/1998US5714766 Nano-structure memory device
02/03/1998US5714765 Method of fabricating a compositional semiconductor device
02/03/1998US5714752 Image pickup device in which the light receiving element, the drive circuit for illuminating means, and the drive circuit for the light receiving element are on the same chip
02/03/1998US5714620 Polyhydric phenol compound and positive resist composition comprising the same
02/03/1998US5714559 Copolymer of hydroxystyrene and hydroxyvinyl cylcohexane derivatives wherein a portion of hydroxy group are protected; used as posotive resists
02/03/1998US5714444 Comprising two different lithium soaps thickener; dustless, nonscattering, noiseless; durability
02/03/1998US5714418 Diffusion barrier for electrical interconnects in an integrated circuit
02/03/1998US5714417 Planarization process using artificial gravity
02/03/1998US5714416 Semiconductor memory device and write-once, read-only semiconductor memory array using amorphous-silicon and method therefor
02/03/1998US5714415 Method of forming thin semiconductor film
02/03/1998US5714414 Semiconductor processing method of forming field isolation oxide relative to a semiconductor substrate
02/03/1998US5714413 Method of making a transistor having a deposited dual-layer spacer structure
02/03/1998US5714412 Using an erasable programmable read only memory with tunnel oxide process
02/03/1998US5714411 Process for forming a semiconductor device including a capacitor
02/03/1998US5714410 Method for fabricating CMOS analog semiconductor
02/03/1998US5714407 Etching solution of hydrofluoric acid and halooxoacid compound
02/03/1998US5714406 Method for forming film on semiconductor substrate by thermal CVD method
02/03/1998US5714402 Method for fabricating a capacitor of a semiconductor device and the structure of the same
02/03/1998US5714401 Semiconductor device capacitor manufactured by forming stack with multiple material layers without conductive layer therebetween
02/03/1998US5714400 Method for forming a memory device by utilizing variations in resistance value
02/03/1998US5714399 Silicon oxide film containing chlorine
02/03/1998US5714398 Using silicon, germenium and boron layer to deposit on polysilicon film, then through high temperature annealing boron diffuses into polysilicon gate to form p-type gate
02/03/1998US5714397 Process for producing lateral bipolar transistor
02/03/1998US5714396 Method of making a high voltage planar edge termination structure
02/03/1998US5714395 Doping surface of wafer, creating cleavage layer, heat treating to cause separation of surface layer
02/03/1998US5714394 Method of making an ultra high density NAND gate using a stacked transistor arrangement
02/03/1998US5714392 Rapid thermal anneal system and method including improved temperature sensing and monitoring
02/03/1998US5714306 Processing method and apparatus
02/03/1998US5714285 Using (LaNiO3)X (TiO2)1-x oxide absorption composite for attenuating phase shifting blanks and masks
02/03/1998US5714267 Seed crystal of silicon single crystal
02/03/1998US5714252 Highly reliable flip-chip connections
02/03/1998US5714238 Conductive adhesive and circuit using the same
02/03/1998US5714203 Cleaning and drying a wafer surface by dipping in a liquid bath, passing ozone over the surface thereby lowering the surface tension and removing the substrate
02/03/1998US5714194 Chemical vapor deposition of lead titanate and mixed oxide of lead, zirconium and titanium dielectrics on a substrate