| Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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| 05/24/2000 | EP1003026A2 Scanning depletion microscopy for carrier profiling |
| 05/24/2000 | EP1002844A2 Electroconductive, thermoplastic and heat-activatable adhesive film |
| 05/24/2000 | EP1002830A2 Nanoporous polymers films |
| 05/24/2000 | EP1002626A2 A linear CMP tool design using in-situ slurry distribution and concurrent pad conditionning |
| 05/24/2000 | EP1002625A1 Cleaning device for surface plate correcting dresser |
| 05/24/2000 | EP1002611A1 Solder ball connections and assembly process |
| 05/24/2000 | EP1002610A1 Solder ball connections and assembly process |
| 05/24/2000 | EP1002452A1 Contact arrangement linking two substrates and method for the production of said contact arrangement |
| 05/24/2000 | EP1002339A1 Contact arrangement for a planar, integrable semiconductor arrangement and method for producing said contact arrangement |
| 05/24/2000 | EP1002338A1 Wafer marking |
| 05/24/2000 | EP1002336A4 N2o nitrided-oxide trench sidewalls to prevent boron outdiffusion and decrease stress |
| 05/24/2000 | EP1002336A1 N2o nitrided-oxide trench sidewalls to prevent boron outdiffusion and decrease stress |
| 05/24/2000 | EP1002335A4 Ideal oxygen precipitating silicon wafers and oxygen out-diffusion-less process therefor |
| 05/24/2000 | EP1002335A1 Ideal oxygen precipitating silicon wafers and oxygen out-diffusion-less process therefor |
| 05/24/2000 | EP1002334A1 Method for configuring semiconductors with high precision, good homogeneity and reproducibility |
| 05/24/2000 | EP1002333A1 Two-piece slit valve door with molded-in-place seal for a vacuum processing system |
| 05/24/2000 | EP1002332A1 Two-piece slit valve insert for vacuum processing system |
| 05/24/2000 | EP1002331A1 Plasma vapor deposition with coil sputtering |
| 05/24/2000 | EP1002330A1 Method for monitoring the performance of an ion implanter using reusable wafers |
| 05/24/2000 | EP1002329A1 Semiconductor process compensation utilizing non-uniform ion implantation methodology |
| 05/24/2000 | EP1002319A2 A ferroelectric data processing device |
| 05/24/2000 | EP1002242A2 Stepper or scanner having two energy monitors for a laser |
| 05/24/2000 | EP1002228A1 Method for applying or removing material |
| 05/24/2000 | EP1002211A2 Method and apparatus for drying substrates |
| 05/24/2000 | EP1002142A1 Method and apparatus for reducing deposition of contaminants |
| 05/24/2000 | EP1001865A1 Method and apparatus for endpoint detection for chemical mechanical polishing |
| 05/24/2000 | EP1001864A1 A carrier head with local pressure control for a chemical mechanical polishing apparatus |
| 05/24/2000 | EP1001852A1 Polymerizable fluxing agents and fluxing adhesive compositions therefrom |
| 05/24/2000 | EP0879303B1 Device and process for coating substrates |
| 05/24/2000 | EP0832407A4 Passive gas substrate thermal conditioning apparatus and method |
| 05/24/2000 | EP0742847B1 A method of depositing tungsten nitride using a source gas comprising silicon |
| 05/24/2000 | EP0739499B1 Method of forming polyimide patterns on substrates |
| 05/24/2000 | CN2379914Y Apparatus for assembling chip and having chip turning-over function |
| 05/24/2000 | CN1254442A Silicon carbide field controlled bipolar switch |
| 05/24/2000 | CN1254441A Method of planarizing upper surface of semiconductor wafer |
| 05/24/2000 | CN1254440A Method for etching silicon wafer |
| 05/24/2000 | CN1254188A Ferro-electric storage read-write memory |
| 05/24/2000 | CN1254187A Semiconductor device |
| 05/24/2000 | CN1254186A Electric fuse with close space length and its production method in semiconductor |
| 05/24/2000 | CN1254185A Packaging device for small semiconductor |
| 05/24/2000 | CN1254184A Dynamic random access memory capacitor manufacture method |
| 05/24/2000 | CN1254183A Self-alignment process capable of making subcritical contact with wire |
| 05/24/2000 | CN1254182A Method for making element by using reworkable gap packing sealant |
| 05/24/2000 | CN1254181A Method for preparing electronic instrument component by simultaneously adopoting soldifying adhesive and sealant |
| 05/24/2000 | CN1254180A Method for correcting photo-adjacency effect in course of production of semiconductor device |
| 05/24/2000 | CN1254108A Method for making self-alignment component |
| 05/24/2000 | CN1052817C Insulated-gate device (IG device) having narrowbandgap-source structure and method of manufacturing the same |
| 05/24/2000 | CN1052815C 薄膜半导体集成电路 Thin-film semiconductor integrated circuit |
| 05/24/2000 | CN1052814C Unit of semiconductor IC |
| 05/23/2000 | US6067633 Design and methodology for manufacturing data processing systems having multiple processors |
| 05/23/2000 | US6067507 Method in an integrated circuit (IC) manufacturing process for identifying and redirecting IC's mis-processd during their manufacture |
| 05/23/2000 | US6067375 Correction method and correction apparatus of mask pattern |
| 05/23/2000 | US6067253 Nonvolatile semiconductor memory device capable of suppressing a variation of the bit line potential |
| 05/23/2000 | US6067251 Non-volatile semiconductor memory device |
| 05/23/2000 | US6067249 Layout of flash memory and formation method of the same |
| 05/23/2000 | US6067248 Nonvolatile semiconductor memory with single-bit and multi-bit modes of operation and method for performing programming and reading operations therein |
| 05/23/2000 | US6067246 Method for writing data to and reading multiple bit data words from a DNA optical storage device |
| 05/23/2000 | US6067245 High speed, high bandwidth, high density nonvolatile memory system |
| 05/23/2000 | US6067222 Substrate support apparatus and method for fabricating same |
| 05/23/2000 | US6067163 Automated substrate pattern recognition system |
| 05/23/2000 | US6067153 Pattern defect inspecting apparatus |
| 05/23/2000 | US6067146 Photolithographic apparatus |
| 05/23/2000 | US6067145 Light exposing device for manufacturing semiconductor device which further removes asymmetrical aberration |
| 05/23/2000 | US6067132 LCD having contact electrode coupling gate electrode of first pixel to region active layer of second pixel region |
| 05/23/2000 | US6066957 Floating spring probe wireless test fixture |
| 05/23/2000 | US6066956 Inspection method and wiring current observation method for semiconductor device |
| 05/23/2000 | US6066952 Method for polysilicon crystalline line width measurement post etch in undoped-poly process |
| 05/23/2000 | US6066896 Semiconductor integrated circuit device and its manufacturing method |
| 05/23/2000 | US6066895 Interconnecting structure for semiconductor integrated circuits and method |
| 05/23/2000 | US6066894 Semiconductor device and a method of manufacturing the same |
| 05/23/2000 | US6066893 Contaminant resistant barriers to prevent outgassing |
| 05/23/2000 | US6066892 Copper alloy seed layer for copper metallization in an integrated circuit |
| 05/23/2000 | US6066891 Electrode for semiconductor device including an alloy wiring layer for reducing defects in an aluminum layer and method for manufacturing the same |
| 05/23/2000 | US6066889 Methods of selectively filling apertures |
| 05/23/2000 | US6066888 Tape carrier and tape carrier device using the same |
| 05/23/2000 | US6066885 Subtrench conductor formed with large tilt angle implant |
| 05/23/2000 | US6066881 Integrated circuit having a memory cell transistor with a gate oxide layer which is thicker than the gate oxide layer of a peripheral circuit transistor |
| 05/23/2000 | US6066880 Semiconductor device |
| 05/23/2000 | US6066877 Vertical power MOSFET having thick metal layer to reduce distributed resistance |
| 05/23/2000 | US6066876 Integrated circuit arrangement having at least one MOS transistor manufactured by use of a planar transistor layout |
| 05/23/2000 | US6066874 Flash memory cell with vertical channels, and source/drain bus lines |
| 05/23/2000 | US6066873 Method and apparatus for preventing P1 punchthrough |
| 05/23/2000 | US6066872 Semiconductor device and its fabricating method |
| 05/23/2000 | US6066871 Semiconductor memory device having a memory cell capacitor and a fabrication process thereof |
| 05/23/2000 | US6066869 Circuit and method for a folded bit line memory cell with vertical transistor and trench capacitor |
| 05/23/2000 | US6066868 Ferroelectric based memory devices utilizing hydrogen barriers and getters |
| 05/23/2000 | US6066867 Current control functional device |
| 05/23/2000 | US6066865 Single layer integrated metal enhancement mode field-effect transistor apparatus |
| 05/23/2000 | US6066854 Method of writing cross pattern in adjacent areas of layer sensitive to charged particle beam for improving stitching accuracy without sacrifice of throughput |
| 05/23/2000 | US6066853 Electron-optical system exhibiting reduced aberration |
| 05/23/2000 | US6066849 Scanning electron beam microscope |
| 05/23/2000 | US6066609 Mixture containing crown compound |
| 05/23/2000 | US6066581 Sol-gel precursor and method for formation of ferroelectric materials for integrated circuits |
| 05/23/2000 | US6066579 Hydrogen heat treatment method of silicon wafers using a high-purity inert substitution gas |
| 05/23/2000 | US6066578 Method and system for providing inorganic vapor surface treatment for photoresist adhesion promotion |
| 05/23/2000 | US6066577 Prevent degradation of metal from exposure to fluorine |
| 05/23/2000 | US6066576 Method for forming oxide using high pressure |
| 05/23/2000 | US6066575 Semiconductor processing spray coating apparatus |
| 05/23/2000 | US6066574 Hot plate cure process for BCB low k interlevel dielectric |
| 05/23/2000 | US6066573 Method of producing dielectric film |