Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
01/2003
01/15/2003CN1390986A Crystal film and its preparartion, and element, circuit and device therewith
01/15/2003CN1390985A Composition and method for tinplating
01/15/2003CN1390763A Method and apparatus for hot separating adhered articles
01/15/2003CN1099138C Superconducting field-effect transistors with inverted MISFET
01/15/2003CN1099135C Device for semiconductor
01/15/2003CN1099133C Gapfill and planarization process for shallow trench isolation
01/15/2003CN1099132C Method for forming isolation layer of semiconductor device
01/15/2003CN1099131C 栅阵列球半导体封装 Ball grid array semiconductor package
01/15/2003CN1099130C Semiconductor apparatus and its work method
01/15/2003CN1099129C Semiconductor device and method for mfg. same
01/15/2003CN1099128C Device of cleaning semiconductor material
01/15/2003CN1099127C Method of modifying exposed surface of semiconductor wafer
01/15/2003CN1099119C Semiconductor memory device having circuit array strcture for fast operation
01/15/2003CN1099117C Method for achieving high bandwidth semicondctor memory device and arranging signal lines thereof
01/15/2003CN1099085C Device analog method
01/15/2003CN1099052C Photoresist copolymer and its composition
01/15/2003CN1098938C Single crystal drawing device
01/15/2003CN1098902C Pressure sensitive adhesive composition and use thereof
01/15/2003CN1098746C Chemical mechanical polishing apparatus and method of chemical mechanical polishing
01/14/2003US6507936 Timing verifying method
01/14/2003US6507933 Evalution and testing integrated circuit wafer quality and process control
01/14/2003US6507931 Semiconductor integrated circuit designing method and system
01/14/2003US6507930 Method and system for improving yield of semiconductor integrated circuits
01/14/2003US6507800 Method for testing semiconductor wafers
01/14/2003US6507770 Substrate processing system and substrate processing method
01/14/2003US6507641 X-ray-generation devices, X-ray microlithography apparatus comprising same, and microelectronic-device fabrication methods utilizing same
01/14/2003US6507533 Semiconductor memory device having a word line activation block
01/14/2003US6507521 Semiconductor memory system
01/14/2003US6507516 EEPROM memory cell embedded on core CMOS for analog applications
01/14/2003US6507515 Semiconductor memory
01/14/2003US6507513 Using delayed electrical pulses with magneto-resistive devices
01/14/2003US6507512 Circuit configuration and method for accelerating aging in an MRAM
01/14/2003US6507510 Nonvolatile semiconductor memory device having ferroelectric capacitors
01/14/2003US6507509 Nonvolatile memory
01/14/2003US6507508 Pattern layout of transfer transistors employed in row decoder
01/14/2003US6507497 Interposer for semiconductor, method for manufacturing the same and semiconductor device using such interposer
01/14/2003US6507478 Device having a crystalline thin film of complex compound
01/14/2003US6507476 Tuneable ferroelectric decoupling capacitor
01/14/2003US6507473 Low voltage modular room ionization system
01/14/2003US6507471 ESD protection devices
01/14/2003US6507469 Electrostatic discharge protection circuit
01/14/2003US6507440 Components with an anamorphotic effect for reducing an aspect ratio of a raster element in an illumination system
01/14/2003US6507417 Method and apparatus for picking up 2D image of an object to be sensed
01/14/2003US6507388 Interferometric alignment system for use in vacuum-based lithographic apparatus
01/14/2003US6507232 Semiconductor device which can be set to predetermined capacitance value without increase of delay time
01/14/2003US6507217 Architecture and interconnect scheme for programmable logic circuits
01/14/2003US6507204 Semiconductor testing equipment with probe formed on a cantilever of a substrate
01/14/2003US6507186 Test and repair system, product manufacturing system, member test apparatus, data processing apparatus, member repair apparatus, and information storage medium
01/14/2003US6507124 Semiconductor memory device
01/14/2003US6507123 Nickel silicide process using UDOX to prevent silicide shorting
01/14/2003US6507122 Integrated circuit packaging comprising encapsulation of substrates using adhesive layers having uniformity at the solder joint interfaces; stress relieving
01/14/2003US6507121 Array structure of solder balls able to control collapse
01/14/2003US6507119 Embedding semiconductor chips into appertures on substrates and bonding them using solders, allowing efficient heat exchange, electroconductivity, miniaturization and heat resistance, and prevents short circuiting
01/14/2003US6507112 Electrical and electronic apparatus having adhesion interfaces comprising gold, aluminum and/or alloy foundations, barrier layers and titanium and titanium coverings connected to frames of printed circuit supports; bonding strength
01/14/2003US6507111 High-frequency circuit and its module for communication devices
01/14/2003US6507107 Semiconductor/printed circuit board assembly
01/14/2003US6507096 Tape having implantable conductive lands for semiconductor packaging process and method for manufacturing the same
01/14/2003US6507095 Wiring board, connected board and semiconductor device, method of manufacture thereof, circuit board, and electronic instrument
01/14/2003US6507094 Die paddle clamping for wire bond enhancement
01/14/2003US6507092 Semiconductor device having increased reliability and method of producing the same and semiconductor chip suitable for such a semiconductor device and method of producing the same
01/14/2003US6507091 Transistor with indium-implanted SiGe alloy and processes for fabricating the same
01/14/2003US6507089 Electrical and electronic apparatus having heterojunction bipolar transistors, emitter and terminal wire circuits in layouts so as to prevent surges; diodes; biasing
01/14/2003US6507088 Power semiconductor device including voltage drive type power MOS transistor
01/14/2003US6507086 Fuse area structure having guard ring surrounding fuse opening in semiconductor device and method of forming the same
01/14/2003US6507085 Semiconductor device comprising diode
01/14/2003US6507082 Flip-chip assembly of protected micromechanical devices
01/14/2003US6507081 In-situ silicon nitride and silicon based oxide deposition with graded interface for damascene application
01/14/2003US6507080 MOS transistor and fabrication method thereof
01/14/2003US6507079 Static semiconductor memory device
01/14/2003US6507078 Fabrication of a wide metal silicide on a narrow polysilicon gate structure
01/14/2003US6507076 Microwave transistor subjected to burn-in testing
01/14/2003US6507075 Method of forming a MOS transistor in a semiconductor device and a MOS transistor fabricated thereby
01/14/2003US6507073 MOS semiconductor device with breakdown voltage performance and method for manufacturing the same
01/14/2003US6507072 Insulated gate field effect semiconductor device and forming method thereof
01/14/2003US6507069 Semiconductor device and method of manufacture thereof
01/14/2003US6507068 Flash memory device and a fabrication process thereof
01/14/2003US6507066 Electrically erasable programmable memory (EEPROM) apparatus comprising silicon semiconductor dopes having P-N junctions, so that channel erasing is performed by applying bias voltage to the terminals
01/14/2003US6507065 Doped silicon structure with impression image on opposing roughened surfaces
01/14/2003US6507064 Double sided container capacitor for DRAM cell array and method of forming same
01/14/2003US6507063 Poly-poly/MOS capacitor having a gate encapsulating first electrode layer
01/14/2003US6507062 Capacitor for semiconductor memory device
01/14/2003US6507060 Integrated circuits having multilayers comprising silicon dioxide dielectrics, platinum and titanium conductor films, lead titanate and lead zirconate titanate ferroelectrics on semiconductor substrates; high speed capacitors
01/14/2003US6507058 Low threshold compact MOS device with channel region formed by outdiffusion of two regions and method of making same
01/14/2003US6507055 Solid state image pickup device and its manufacture
01/14/2003US6507054 Solid-state imaging device
01/14/2003US6507052 The number of reference cell blocks to be connected in series can be selected freely, allowing finer settings of a reference current value.
01/14/2003US6507051 Semiconductor integrated circuit device
01/14/2003US6507050 Thyristors having a novel arrangement of concentric perimeter zones
01/14/2003US6507046 High-resistivity silicon carbide substrate for semiconductor devices with high break down voltage
01/14/2003US6507045 Liquid crystal displays,
01/14/2003US6507042 Semiconductor device and method of manufacturing the same
01/14/2003US6507041 Gallium nitride-based III-V group compound semiconductor
01/14/2003US6507034 Charge beam exposure apparatus, charge beam exposure method, and charge beam exposure mask
01/14/2003US6507031 Liquid crystal display from semiconductor
01/14/2003US6507027 Apparatus and methods for charged-particle-beam microlithography exhibiting reduced four-fold aberrations
01/14/2003US6507010 Contact area sensor
01/14/2003US6507007 System of controlling the temperature of a processing chamber
01/14/2003US6507006 Ceramic substrate and process for producing the same
01/14/2003US6506994 Low profile thick film heaters in multi-slot bake chamber
01/14/2003US6506980 Semiconductor device and tape carrier, and method of manufacturing the same, circuit board, electronic instrument, and tape carrier manufacturing device