Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2003
04/08/2003US6546543 Method of displaying, inspecting and modifying pattern for exposure
04/08/2003US6546542 Parameterized designing method of data driven information processor employing self-timed pipeline control
04/08/2003US6546540 Method of automatic layout design for LSI, mask set and semiconductor integrated circuit manufactured by automatic layout design method, and recording medium storing automatic layout design program
04/08/2003US6546537 Wiring data generation method and wiring data generation apparatus allowing inconsistency between block internal line and block external lines
04/08/2003US6546514 Integrated circuit analysis and design involving defective circuit element replacement on a netlist
04/08/2003US6546372 Assistance method and apparatus
04/08/2003US6546300 Production/manufacturing planning system
04/08/2003US6545927 Integrated semiconductor circuit, in particular a semiconductor memory configuration, and method for its operation
04/08/2003US6545926 Antifuse address detecting circuit programmable by applying a high voltage and semiconductor integrated circuit device provided with the same
04/08/2003US6545914 Method of erasing a flash memory cell
04/08/2003US6545905 Multi-port memory cell with refresh port
04/08/2003US6545904 6f2 dram array, a dram array formed on a semiconductive substrate, a method of forming memory cells in a 6f2 dram array and a method of isolating a single row of memory cells in a 6f2 dram array
04/08/2003US6545900 MRAM module configuration
04/08/2003US6545897 Dynamic RAM-and semiconductor device
04/08/2003US6545893 Non-volatile semiconductor memory
04/08/2003US6545892 Semiconductor integrated circuit having logic circuit comprising transistors with lower threshold voltage values and improved pattern layout
04/08/2003US6545869 Adjusting fillet geometry to couple a heat spreader to a chip carrier
04/08/2003US6545856 Method of fabrication of a ferro-electric capacitor and method of growing a PZT layer on a substrate
04/08/2003US6545764 Non-contact topographical analysis apparatus and method thereof
04/08/2003US6545755 Micro-Raman spectroscopy system for identifying foreign material on a semiconductor wafer
04/08/2003US6545753 Using scatterometry for etch end points for dual damascene process
04/08/2003US6545525 Semiconductor device including interface circuit, logic circuit, and static memory array having transistors of various threshold voltages and being supplied with various supply voltages
04/08/2003US6545515 Semiconductor switch having a voltage detection function
04/08/2003US6545493 High-speed probing apparatus
04/08/2003US6545458 Low-temperature test equipment
04/08/2003US6545420 Plasma reactor using inductive RF coupling, and processes
04/08/2003US6545386 Method for adjusting frequency of piezoelectric resonator
04/08/2003US6545371 Semiconductor device wherein detection of removal of wiring triggers impairing of normal operation of internal circuit
04/08/2003US6545370 Composite silicon nitride sidewall spacers for reduced nickel silicide bridging
04/08/2003US6545368 Use of an oxide surface to facilitate gate break on a carrier substrate for a semiconductor device
04/08/2003US6545364 Circuit device and method of manufacturing the same
04/08/2003US6545363 Contactor having conductive particles in a hole as a contact electrode
04/08/2003US6545362 Semiconductor device and method of manufacturing the same
04/08/2003US6545361 Semiconductor device having multilevel interconnection structure and method for fabricating the same
04/08/2003US6545360 Multilayer; semiconductor substrate, dielectric with apertures, plugging with electroconductive metal
04/08/2003US6545359 Wiring line and manufacture process thereof, and semiconductor device and manufacturing process thereof
04/08/2003US6545358 Integrated circuits having plugs in conductive layers therein and related methods
04/08/2003US6545357 Metal nitride barrier layer and electroplating seed layer with the same metal as the metal nitride layer
04/08/2003US6545356 Graded layer for use in semiconductor circuits and method for making same
04/08/2003US6545355 Semiconductor device and method of fabricating the same
04/08/2003US6545354 Semiconductor device having a barrier layer
04/08/2003US6545349 Semiconductor device
04/08/2003US6545348 Package for a semiconductor device comprising a plurality of interconnection patterns around a semiconductor chip
04/08/2003US6545346 Integrated circuit package with a capacitor
04/08/2003US6545340 Semiconductor device
04/08/2003US6545339 Semiconductor device incorporating elements formed of refractory metal-silicon-nitrogen and method for fabrication
04/08/2003US6545338 Methods for implementing co-axial interconnect lines in a CMOS process for high speed RF and microwave applications
04/08/2003US6545337 Semiconductor integrated circuit device
04/08/2003US6545336 Semiconductor device, and method of manufacturing the same
04/08/2003US6545332 Image sensor of a quad flat package
04/08/2003US6545330 Integrated circuits; detector emission particles
04/08/2003US6545328 Semiconductor device
04/08/2003US6545327 Semiconductor device having different gate insulating films with different amount of carbon
04/08/2003US6545326 Method of fabricating semiconductor device
04/08/2003US6545325 Semiconductor device and fabrication method thereof
04/08/2003US6545324 Dual metal gate transistors for CMOS process
04/08/2003US6545323 Multilayer; semiconductor substrate, overcoating with dielectric, transistors; barrier, intake, drain zones
04/08/2003US6545322 Semiconductor protection device
04/08/2003US6545321 ESD protection circuit for a semiconductor integrated circuit
04/08/2003US6545320 Electro-optical device and semiconductor device
04/08/2003US6545319 Thin film transistors
04/08/2003US6545318 Semiconductor device and manufacturing method thereof
04/08/2003US6545317 Semiconductor device having a gate electrode with a sidewall insulating film and manufacturing method thereof
04/08/2003US6545316 MOSFET devices having linear transfer characteristics when operating in velocity saturation mode and methods of forming and operating same
04/08/2003US6545315 Trench DMOS transistor having reduced punch-through
04/08/2003US6545313 Semiconductor substrate, tunnel diode, floating barrier electrode
04/08/2003US6545312 Nonvolatile semiconductor memory device and method for fabricating the same
04/08/2003US6545311 Semiconductor integrated circuit and nonvolatile memory element
04/08/2003US6545309 Nitride read-only memory with protective diode and operating method thereof
04/08/2003US6545308 Funnel shaped structure in polysilicon
04/08/2003US6545307 Structure of a DRAM and a manufacturing process therefor
04/08/2003US6545306 Semiconductor memory device with a connector for a lower electrode or a bit line
04/08/2003US6545305 Linear capacitor and process for making same
04/08/2003US6545304 Solid-state image pickup device
04/08/2003US6545302 Image sensor capable of decreasing leakage current between diodes and method for fabricating the same
04/08/2003US6545301 Solid-state image sensor and manufacturing method therefor
04/08/2003US6545300 Pendeoepitaxial methods of fabricating gallium nitride semiconductor layers on sapphire substrates, and gallium nitride semiconductor structures fabricated thereby
04/08/2003US6545299 Structures using chemo-mechanical polishing and chemically-selective endpoint detection
04/08/2003US6545295 Transistor having ammonia free nitride between its gate electrode and gate insulation layers
04/08/2003US6545294 Electronic apparatus having semiconductor device including plurality of transistors formed on a polycrystalline layered structure in which the number of crystal grains in each polycrystalline layer is gradually reduced from lower to upper layer
04/08/2003US6545293 Thin film transistor flat display
04/08/2003US6545292 Thin film transistor-liquid crystal display and manufacturing method thereof
04/08/2003US6545289 Wavelength-insensitive radiation coupling for multi-quantum well sensor based on intersubband absorption
04/08/2003US6545284 Face position detection method and apparatus, and exposure method and exposure apparatus, a production method for an exposure apparatus and a production method for a semiconductor device
04/08/2003US6545282 Apparatus and methods for reducing Coulombic blur in charged-particle-beam microlithography
04/08/2003US6545279 Surface state monitoring method and apparatus
04/08/2003US6545274 Methods and devices for determining times for maintenance activity performed on a charged-particle-beam microlithography apparatus, and microelectronic-device-manufacturing methods comprising same
04/08/2003US6545272 Apparatus and methods for monitoring contamination of an optical component in an optical system
04/08/2003US6545267 Wafer holder of ion implantation apparatus
04/08/2003US6545248 Laser irradiating apparatus
04/08/2003US6544908 Ammonia gas passivation on nitride encapsulated devices
04/08/2003US6544907 Method of forming a high quality gate oxide layer having a uniform thickness
04/08/2003US6544906 High dielectric constant (high-k) gate dielectric layer; ambient of hydrogen and an oxidizing gas prevents or reduces formation of lower dielectric constant (lower-k) material between the high-k gate dielectric and substrate
04/08/2003US6544905 Metal gate trim process by using self assembled monolayers
04/08/2003US6544904 Method of manufacturing semiconductor device
04/08/2003US6544903 Resist pattern forming method and semiconductor device manufacturing method
04/08/2003US6544902 Energy beam patterning of protective layers for semiconductor devices
04/08/2003US6544901 Plasma thin-film deposition method
04/08/2003US6544900 In situ dielectric stacks
04/08/2003US6544899 Process for manufacturing silicon epitaxial wafer
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