Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2003
06/17/2003US6580649 Semiconductor memory device
06/17/2003US6580641 Method of forming and operating trench split gate non-volatile flash memory cell structure
06/17/2003US6580639 Method of reducing program disturbs in NAND type flash memory devices
06/17/2003US6580636 Magnetoresistive memory with a low current density
06/17/2003US6580633 Nonvolatile semiconductor memory device
06/17/2003US6580631 256 Meg dynamic random access memory
06/17/2003US6580630 Initialization method of P-type silicon nitride read only memory
06/17/2003US6580629 Semiconductor device array having dense memory cell array and hierarchical bit line scheme
06/17/2003US6580620 Matrix type printed circuit board for semiconductor packages
06/17/2003US6580613 Solder-free PCB assembly
06/17/2003US6580592 Semiconductor device
06/17/2003US6580570 Mounting apparatus for an optical element
06/17/2003US6580505 Overlay alignment mark design
06/17/2003US6580502 Appearance inspection method and apparatus
06/17/2003US6580492 Reticle system for measurement of effective coherence factors
06/17/2003US6580369 Electronic tag assembly and method therefor
06/17/2003US6580311 Circuit configuration for supplying voltage to an integrated circuit via a pad
06/17/2003US6580306 Switching circuit utilizing a high voltage transistor protection technique for integrated circuit devices incorporating dual supply voltage sources
06/17/2003US6580302 Semiconductor integrated circuit and layout design method thereof
06/17/2003US6580285 Output buffer circuit with switching speed control circuit
06/17/2003US6580270 Magnetoresistive sensor or memory elements with decreased magnetic switch field
06/17/2003US6580252 Boost circuit with normally off JFET
06/17/2003US6580184 Electrostatic discharge (ESD) protection circuit of silicon-controlled rectifier (SCR) structure operable at a low trigger voltage
06/17/2003US6580176 No grain boundary is contained in region of wiring between upper and lower plugs; difference in thermal expansion coefficient between material of wiring and material of upper and lower plugs is so small that no void is generated
06/17/2003US6580175 Semiconductor layout structure for a conductive layer and contact hole
06/17/2003US6580173 Semiconductor device and manufacturing method of semiconductor device
06/17/2003US6580171 Semiconductor wiring device
06/17/2003US6580170 Semiconductor device protective overcoat with enhanced adhesion to polymeric materials
06/17/2003US6580169 Method for forming bumps, semiconductor device, and solder paste
06/17/2003US6580168 Method for manufacturing a low-profile semiconductor device
06/17/2003US6580166 High frequency semiconductor device
06/17/2003US6580162 Ball grid array (BGA) semiconductor package improving solder joint reliability
06/17/2003US6580161 Semiconductor device and method of making the same
06/17/2003US6580156 Integrated fuse with regions of different doping within the fuse neck
06/17/2003US6580155 Semiconductor device
06/17/2003US6580154 Method and apparatus on (110) surfaces of silicon structures with conduction in the <110> direction
06/17/2003US6580153 Structure for protecting a micromachine with a cavity in a UV tape
06/17/2003US6580152 Semiconductor with plural side faces
06/17/2003US6580151 Mechanical resistance of a single-crystal silicon wafer
06/17/2003US6580150 Vertical junction field effect semiconductor diodes
06/17/2003US6580149 Double LDD devices for improved DRAM refresh
06/17/2003US6580146 Inductive structure integrated on a semiconductor substrate
06/17/2003US6580144 One time programmable fuse/anti-fuse combination based memory cell
06/17/2003US6580143 Thin-film circuit substrate and method of producing same
06/17/2003US6580142 Electrical control methods involving semiconductor components
06/17/2003US6580141 Trench schottky rectifier
06/17/2003US6580140 Metal oxide temperature monitor
06/17/2003US6580139 Monolithically integrated sensing device and method of manufacture
06/17/2003US6580137 Damascene double gated transistors and related manufacturing methods
06/17/2003US6580136 Method for delineation of eDRAM support device notched gate
06/17/2003US6580134 Field effect transistors having elevated source/drain regions
06/17/2003US6580133 Contact in an integrated circuit
06/17/2003US6580132 Damascene double-gate FET
06/17/2003US6580131 LDMOS device with double N-layering and process for its manufacture
06/17/2003US6580130 Process for producing a resistor in an integrated circuit and corresponding integrated static random access memory device having four transistors and two resistors
06/17/2003US6580129 Thin-film transistor and its manufacturing method
06/17/2003US6580128 Semiconductor substrate, semiconductor device, and processes of production of same
06/17/2003US6580127 High performance thin film transistor and active matrix process for flat panel displays
06/17/2003US6580125 Semiconductor device and method for fabricating the same
06/17/2003US6580124 Multigate semiconductor device with vertical channel current and method of fabrication
06/17/2003US6580123 Low voltage power MOSFET device and process for its manufacture
06/17/2003US6580121 Power semiconductor device containing at least one zener diode provided in chip periphery portion
06/17/2003US6580120 Two bit non-volatile electrically erasable and programmable memory structure, a process for producing said memory structure and methods for programming, reading and erasing said memory structure
06/17/2003US6580119 Stacked gate field effect transistor (FET) device
06/17/2003US6580118 Improved integration density and reduction in required control voltage
06/17/2003US6580117 Uniform insulating film thickness; preventing crystal defects
06/17/2003US6580116 Double sidewall short channel split gate flash memory
06/17/2003US6580115 Capacitor electrode for integrating high k materials
06/17/2003US6580114 Processing methods of forming a capacitor, and capacitor construction
06/17/2003US6580113 Semiconductor device and manufacturing method thereof
06/17/2003US6580112 Method for fabricating an open can-type stacked capacitor on an uneven surface
06/17/2003US6580111 Negligible leakage current, high capacitance; efficient, low cost
06/17/2003US6580110 Trench capacitor and method for fabricating a trench capacitor
06/17/2003US6580109 Integrated circuit device including two types of photodiodes
06/17/2003US6580108 Insulated gate bipolar transistor decreasing the gate resistance
06/17/2003US6580107 Compound semiconductor device with depletion layer stop region
06/17/2003US6580105 Solid-state imaging device
06/17/2003US6580104 Elimination of contaminants prior to epitaxy and related structure
06/17/2003US6580103 Single transistor for single cell improving chip integrity
06/17/2003US6580102 Four-terminal system for reading the state of a phase qubit
06/17/2003US6580101 GaN-based compound semiconductor device
06/17/2003US6580098 Method for manufacturing gallium nitride compound semiconductor
06/17/2003US6580092 Semiconductor chip, semiconductor device, and process for producing a semiconductor device
06/17/2003US6580091 Apparatus and method for optical evaluation, apparatus and method for manufacturing semiconductor device, method of controlling apparatus for manufacturing semiconductor device, and semiconductor device
06/17/2003US6580088 Semiconductor devices and methods for manufacturing the same
06/17/2003US6580087 Inspection apparatus
06/17/2003US6580082 System and method for delivering cooling gas from atmospheric pressure to a high vacuum through a rotating seal in a batch ion implanter
06/17/2003US6580075 Charged particle beam scanning type automatic inspecting apparatus
06/17/2003US6580072 Method for performing failure analysis on copper metallization
06/17/2003US6580059 Control apparatus for a light radiation-type rapid heating and processing device
06/17/2003US6580057 Enhanced cooling IMP coil support
06/17/2003US6580054 Scribing sapphire substrates with a solid state UV laser
06/17/2003US6580053 Apparatus to control the amount of oxygen incorporated into polycrystalline silicon film during excimer laser processing of silicon films
06/17/2003US6579812 Method for removing residual polymer after the dry etching process and reducing oxide loss
06/17/2003US6579811 Method and apparatus for modifying the profile of narrow, high-aspect-ratio gaps through wafer heating
06/17/2003US6579810 Method of removing a photoresist layer on a semiconductor wafer
06/17/2003US6579809 In-situ gate etch process for fabrication of a narrow gate transistor structure with a high-k gate dielectric
06/17/2003US6579808 Method of fabricating a semiconductor device
06/17/2003US6579807 Method for forming isolation regions on semiconductor device
06/17/2003US6579806 Method of etching tungsten or tungsten nitride in semiconductor structures
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