Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
06/2003
06/18/2003EP1319238A2 Apparatus for magnetically scanning and/or switching a charged-particle beam
06/18/2003EP1319199A2 Pinhole defect repair by resist flow
06/18/2003EP1319197A2 Antireflective composition
06/18/2003EP1319193A1 Isolation device between optically conductive areas
06/18/2003EP1319191A2 Generation of a library of periodic grating diffraction signals
06/18/2003EP1282660A4 Rheology-controlled epoxy-based compositions
06/18/2003EP1226586B1 Flash memory wordline tracking across whole chip
06/18/2003EP1125008B1 Thermally annealed, low defect density single crystal silicon
06/18/2003EP1042789B1 Method for Treating Substrates
06/18/2003EP1012783B1 Data-conversion method for a multibeam laser writer for very complex microlithographic patterns
06/18/2003EP0930943B1 Curing polymer layers on semiconductor substrates using variable frequency microwave energy
06/18/2003EP0864170B1 Thermal processing apparatus and process
06/18/2003EP0813750B1 Process for making a z-axis adhesive and establishing electrical interconnection therewith
06/18/2003DE10206368C1 Integrated circuit chip for ROM, has active shield formed from arrangement of transistors, with material layer isolated from integrated circuit by dielectric layer
06/18/2003DE10159833C1 Verfahren zur Herstellung einer Vielzahl von Halbleiterscheiben A process for producing a plurality of semiconductor wafers
06/18/2003DE10135580C1 Self aligned contact formation method for CMOS integrated circuit device for DRAM, involves subjecting contact regions formed in substrate to silicide process by depositing refractory metal to form metal silicide regions
06/18/2003CN2556630Y Scanning measuring position regulating system for sample in liquid nitrogen Dewar flask
06/18/2003CN1425204A Inkjet-fabricated integrated circuits
06/18/2003CN1425203A Forming interconnects
06/18/2003CN1425202A 溶液加工 Solution processing
06/18/2003CN1425201A Solution processed devices
06/18/2003CN1425197A Personalized hardware
06/18/2003CN1425196A Conductive interconnections
06/18/2003CN1425195A Method for adjusting structures on semiconductor substrate
06/18/2003CN1425194A Method of depositing metal film and metal deposition cluster including supercritical drying/cleaning module
06/18/2003CN1425193A Nitridation barriers for nitridated tunnel oxide for circuitry for flash memory technology and for LOCOS/stiisolation
06/18/2003CN1425192A Adhesive for circuit connection, circuit connection method using the same, and circuit connection structure
06/18/2003CN1425191A Semiconductor device and fabrication method thereof
06/18/2003CN1425190A Monitor, method of monitoring, polishing device, and method of manufacturing semiconductor wafer
06/18/2003CN1425189A Method of manufacturing group-III nitride compound semiconductor
06/18/2003CN1425187A Method and apparatus for ionized physical vapor deposition
06/18/2003CN1425186A Method and device for separating ion mass, and ion doping device
06/18/2003CN1425172A Individual arrangement
06/18/2003CN1424953A Grinding pin for grinding machines comprising resin bonded selections of rough grit and fine grit
06/18/2003CN1424867A Ion beam radiation device and method for choking basis charge accumulation
06/18/2003CN1424776A Semiconductor luminating devices based on nitride and manufacture thereof
06/18/2003CN1424775A Mask for producing organic LED device by calibrating multiple madk sections for assembly
06/18/2003CN1424771A Semiconductor memory with multi-byte memory unit and manufacture thereof
06/18/2003CN1424767A Semiconductor device and manufacture thereof
06/18/2003CN1424766A Use of pressure sensitive adhesive in removing surplus indium layer in preparation of indium beads for focal plane device
06/18/2003CN1424764A Semiconductor memory
06/18/2003CN1424763A Programmable element for programming utilizing resistance value change by phase change
06/18/2003CN1424762A Multi-frequency band power amplifier
06/18/2003CN1424761A Semiconductor device and manufacture thereof
06/18/2003CN1424759A Electronic devices
06/18/2003CN1424758A Semiconductor devices and manufacture thereof
06/18/2003CN1424757A Semiconductor devices and manufacture thereof
06/18/2003CN1424756A Metal wiring substrate, semiconductor device and manufacture thereof
06/18/2003CN1424755A Grid matrix packed body for enhancing electric connected ground and packing method thereof
06/18/2003CN1424754A Preparation of silicon material on pattern dielectric body by dose-energy optimalized oxygen filling insulation
06/18/2003CN1424753A Design of digital image amplifying and shrinking integrated circuit
06/18/2003CN1424752A Signal test method for integrated circuit chips
06/18/2003CN1424751A Semiconductor element and system, wafers, its use and measuring method
06/18/2003CN1424750A Heat treating method for semiconductor crystal wafers
06/18/2003CN1424749A Etching process for silicide low dielectric material
06/18/2003CN1424748A Dry etching process for silicide low dielectric material
06/18/2003CN1424747A Process for silicon low dielectric material curing in furnace
06/18/2003CN1424746A Silicon semiconductor crystal wafers and manufacturing method for multiple semiconductor crystal wafers
06/18/2003CN1424745A Single-step clean method for diffuse and oxidation process
06/18/2003CN1424744A High dielectric grid laminating structure
06/18/2003CN1424743A Mask pattern forming method, computer programme product and optical mask production
06/18/2003CN1424742A Chemicals feeder
06/18/2003CN1424627A Exposure method and device
06/18/2003CN1424626A Forming method for photoresist design and its laminating products
06/18/2003CN1424625A Chemical amplitude increased positive corrosionproof agent composition
06/18/2003CN1424576A Surface testers
06/18/2003CN1424429A Method and system for preferential chemical vapor phase deposition
06/18/2003CN1424191A Compression moulding machines
06/18/2003CN1112088C Method for manufacture of certain equipment containing printed-circuit board
06/18/2003CN1112085C Method and device for positioning and retaining micro-building-blocks
06/18/2003CN1111911C Semiconductor memory device and fabrication method thereof
06/18/2003CN1111909C Circuit device and juction field transistor suitable for the circuit device
06/18/2003CN1111908C Semiconductor devices
06/18/2003CN1111907C Method for interconnecting on semiconductor device and interconnector thereof
06/18/2003CN1111906C Plastic-encapsulated semiconductor device and fabrication method thereof
06/18/2003CN1111905C Method of forming semiconductor device
06/18/2003CN1111904C Semiconductor device manufacturing method
06/18/2003CN1111903C Process for manufacture of highlyÔÇÿepsilonÔÇÖdielectric or ferroelectric coating
06/18/2003CN1111902C Semiconductor device with aluminum containing interconnected wires
06/18/2003CN1111901C Method for fabricating switching device by anodizaion, and anodizing interconnection
06/18/2003CN1111900C Wafer processing apparatus, wafer processing method, and semiconductor substrate fabrication method
06/18/2003CN1111899C Ultraviolet surface cleaning machine
06/18/2003CN1111898C Device for conveying substrates through substrate processing plant
06/18/2003CN1111866C Method and device for reducing bias current in reference voltage circuit
06/18/2003CN1111813C Improved transistor model and method and device of electric circuit model therewith
06/18/2003CN1111760C Antireflective coating for photoresist compositions
06/18/2003CN1111759C Liquid antireflective coating for photoresist compositions
06/18/2003CN1111742C Method of cleaning probe tips of probe cards and apparatus for impelementing method
06/18/2003CN1111615C Free floating shield and semiconductor processing system
06/18/2003CN1111547C Light-absorbing polymers and application thereof to antireflection film
06/17/2003US6581199 Engineering-change method of semiconductor circuit
06/17/2003US6581195 Method and apparatus for extracting parasitic element of semiconductor circuit
06/17/2003US6581193 Apparatus and methods for modeling process effects and imaging effects in scanning electron microscopy
06/17/2003US6581188 Semiconductor device and method of designing the same
06/17/2003US6581028 Profile extraction method and profile extraction apparatus
06/17/2003US6580967 Method for providing distributed material management and flow control in an integrated circuit factory
06/17/2003US6580960 System and method for finding an operation/tool combination that causes integrated failure in a semiconductor fabrication facility
06/17/2003US6580958 Semiconductor manufacturing apparatus and device manufacturing method
06/17/2003US6580957 Method of efficiently laser marking singulated semiconductor devices
06/17/2003US6580955 Apparatus, method and medium for enhancing the throughput of a wafer processing facility using a multi-slot cool down chamber and a priority transfer scheme
1 ... 4654 4655 4656 4657 4658 4659 4660 4661 4662 4663 4664 4665 4666 4667 4668 4669 4670 4671 4672 4673 4674 ... 6590