Patents
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
04/2004
04/22/2004US20040077140 Apparatus and method for forming uniformly thick anodized films on large substrates
04/22/2004US20040077138 Asymmetrical devices for short gate length performance with disposable sidewall
04/22/2004US20040077137 Capacitor of an integrated circuit device and method of manufacturing the same
04/22/2004US20040077136 Integrated circuit metal oxide semiconductor transistor
04/22/2004US20040077135 Light-emitting diode device geometry
04/22/2004US20040077134 Manufacturing method for a semiconductor device and heat treatment method therefor
04/22/2004US20040077133 Top gate thin-film transistor and method of producing the same
04/22/2004US20040077132 Method of fabricating a thin film transistor using dual or multiple gates
04/22/2004US20040077131 Mask rom structure and manufacturing method thereof
04/22/2004US20040077130 Apparatus and method for reducing substrate warpage
04/22/2004US20040077128 Semiconductor wafer, semiconductor chip and dicing method of a semiconductor wafer
04/22/2004US20040077125 Method of transferring semiconductor chips
04/22/2004US20040077124 High-frequency circuit block, its manufacturing method, high-frequency module device, and its manufacturing method
04/22/2004US20040077122 Process and device using self-organizable polymer
04/22/2004US20040077121 Solid-state imaging device and method of manufacturing said solid-state imaging device
04/22/2004US20040077119 Mems element manufacturing method
04/22/2004US20040077118 Sensor semiconductor package, provided with an insert, and method for making same
04/22/2004US20040077117 Feedthrough design and method for a hermetically sealed microdevice
04/22/2004US20040077116 Method for fabricating a monolithic chip including pH, temperature and photo-intensity multi-sensors and a readout circuit
04/22/2004US20040077115 Performance of electronic and optoelectronic devices using a surfactant during epitaxial growth
04/22/2004US20040077113 Production apparatus and method of producing a light-emitting device by using the same apparatus
04/22/2004US20040077109 Solder masks for use on carrier substrates, carrier substrates and semiconductor device assemblies including such solder masks, and methods
04/22/2004US20040077108 Semiconductor device and method of manufacturing the same
04/22/2004US20040077074 Multi-chambered analysis device
04/22/2004US20040076912 Method and apparatus for removing organic films
04/22/2004US20040076905 Triarylsulfonium salts in which at least one ring is t-alkoxy substituted as acid generators for high energy radiation-responsive materials containing t-butoxycarbonyl-protected polyvinylphenols
04/22/2004US20040076902 Resin soluble in acidified aqueous solution (e.g., 1-ethoxy-ethyl-protected polyvinylphenol or novolak); quaternary ammonium salt stabilizer; 2-(hydrocarbylsulfonyloxyimino)-5-(alpha-cyano-o -methylbenzylidene)dihydrothiophene
04/22/2004US20040076894 Exposing the silicon layer to a laser beam through a mask having a phase shift layer; stripes having a first width separated by slits, and an overlapping blocking layer having stripes having a narrower width and parallel to the first
04/22/2004US20040076893 Mask comprising: a transparent substrate; and a light shielding layer having at least two rectangular opening patterns arranged with a predetermined interval to define a single trench.
04/22/2004US20040076839 Structure and method for improved adhesion between two polymer films
04/22/2004US20040076767 Method of manufacturing silicon carbide film
04/22/2004US20040076764 For rapidly processing dielectric film coatings on substrates at low temperatures; product is thermally stable and insensitive to oxygen plasma; exposing dielectric material to electron beam radiation to cure the dielectric material
04/22/2004US20040076763 Apparatus capable of forming a thin film of high quality having a uniform thickness at a high deposition rate at an increased plasma density without increase of plasma potential
04/22/2004US20040076762 Plasma processor and plasma processing method
04/22/2004US20040076751 Sequential chemical vapor deposition
04/22/2004US20040076506 Semiconductor wafer transfer apparatus
04/22/2004US20040076505 Wafer transport apparatus
04/22/2004US20040076496 Methods and apparatus for using substrate carrier movement to actuate substrate carrier door opening/closing
04/22/2004US20040076495 Wafer handling for a reflow tool
04/22/2004US20040076411 Wafer processing method
04/22/2004US20040076321 Non-oriented optical character recognition of a wafer mark
04/22/2004US20040076072 Nonvolatile semiconductor memory device
04/22/2004US20040076071 SRAM cell design for soft error rate immunity
04/22/2004US20040076068 Method of producing semiconductor integrated circuit device and semiconductor integrated circuit device
04/22/2004US20040076062 Electronic apparatus and power supplying method
04/22/2004US20040076057 Method for reading out or in a status from or to a ferroelectrical transistor of a memory cell and memory matrix
04/22/2004US20040076056 Device and method for detecting alignment of deep trench capacitors and word lines in DRAM devices
04/22/2004US20040076050 Flash memory cell with high programming efficiency by coupling from floating gate to sidewall
04/22/2004US20040076035 Magnetic memory
04/22/2004US20040076032 Single electron memory device comprising quantum dots between gate electrode and single electron storage element and method for manufacturing the same
04/22/2004US20040075991 Vapor phase connection techniques
04/22/2004US20040075990 Packaging integrated circuits with adhesive posts
04/22/2004US20040075987 Heat spreaders, heat spreader packages, and fabrication methods for use with flip chip semiconductor devices
04/22/2004US20040075882 Continuous direct-write optical lithography
04/22/2004US20040075836 Apparatus for measuring film thickness formed on object, apparatus and method of measuring spectral reflectance of object, and apparatus and method of inspecting foreign material on object
04/22/2004US20040075825 Real-time evaluation of stress fields and properties in line features formed on substrates
04/22/2004US20040075822 Exposure apparatus and its making method, substrate carrying method, device manufacturing method and device
04/22/2004US20040075783 Liquid crystal display and fabricating method thereof
04/22/2004US20040075715 Inkjet printer having enclosed actuators
04/22/2004US20040075521 Multi-level symmetrical inductor
04/22/2004US20040075470 Semiconductor integrated circuit, method and program for designing the semiconductor integrated circuit
04/22/2004US20040075469 Regionally time multiplexed emulation system
04/22/2004US20040075464 Nanostructures and methods for manufacturing the same
04/22/2004US20040075460 Method and apparatus for determining defect and impurity concentration in semiconducting material of a semiconductor wafer
04/22/2004US20040075459 Predictive, adaptive power supply for an integrated circuit under test
04/22/2004US20040075436 Calculating method for inductance in a semiconductor integrated circuit
04/22/2004US20040075396 Plasma processing method and apparatus
04/22/2004US20040075379 Adjusting, spacing and bonding layers of cathodes comprising emitters, barriers having apertures and anodes receivers, to form electrical and electronic apparatus, used in radars, communication, weapons or controllers
04/22/2004US20040075201 Shock-absorber units for use in a vacuum chamber for braking runaway moving objects
04/22/2004US20040075191 Support substrate for integrated circuit chip adapted to be placed in a mould
04/22/2004US20040075177 Wiring board, method of manufacturing the same, semiconductor device, circuit board, and electronic equipment
04/22/2004US20040075176 Packaged semiconductor device
04/22/2004US20040075174 Semiconductor device and method of manufacturing the same utilizing permittivity of an insulating layer to provide a desired cross conductive layer capacitance property
04/22/2004US20040075173 Method of reducing oxidation of metal structures using ion implantation, and device formed by such method
04/22/2004US20040075168 Semiconductor device bonded on circuit board via coil spring
04/22/2004US20040075164 Module device of stacked semiconductor packages and method for fabricating the same
04/22/2004US20040075161 Curable compounds containing reactive groups: triazine/isocyanurates, cyanate esters and blocked isocyanates
04/22/2004US20040075157 Semiconductor integrated circuit device
04/22/2004US20040075156 Semiconductor devices having storage nodes and methods of manufacturing the same
04/22/2004US20040075155 Method of fabricating transistor device
04/22/2004US20040075153 Semiconductor device and method for manufacturing the same
04/22/2004US20040075151 Semiconductor device structure including multiple fets having different spacer widths
04/22/2004US20040075150 Reverse metal process for creating a metal silicide transistor gate structure
04/22/2004US20040075149 CMOS inverter and integrated circuits utilizing strained silicon surface channel MOSFETs
04/22/2004US20040075148 Semiconductor device
04/22/2004US20040075147 Semiconductor integrated device
04/22/2004US20040075146 SCR-ESD structures with shallow trench isolation
04/22/2004US20040075144 Integrated circuit; a resistive substrate of a first conductivity type, a power transistor, a digital logic array, a low resistivity ring, a buried layer of a second conductivity type and a low resistivity layer
04/22/2004US20040075143 CMOS integrated circuit devices and substrates having buried silicon germanium layers therein and methods of forming same
04/22/2004US20040075142 Semiconductor device
04/22/2004US20040075141 Semiconductor device and method of manufacturing same
04/22/2004US20040075139 Semiconductor device and fabrication method with etch stop film below active layer
04/22/2004US20040075138 Semiconductor integrated circuit device and method of manufacturing the same
04/22/2004US20040075137 Split gate flash memory device and method of fabricating the same
04/22/2004US20040075135 Monolithcally integrated semiconductor component
04/22/2004US20040075134 Stacked gate flash memory device and method of fabricating the same
04/22/2004US20040075133 Semiconductor device and its manufacturing method
04/22/2004US20040075132 Capacitor of an integrated circuit device and method of manufacturing the same
04/22/2004US20040075131 Integrated circuit capacitor structure
04/22/2004US20040075130 Methods of forming electronic devices including dielectric layers with different densities of titanium and related structures