Patents
Sitemap › H01 - Basic electric elements › H01L - Semiconductor devices; Electric solid state devices not otherwise provided for › H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974)
08/2008
08/20/2008CN100411959C Substrate containing case
08/20/2008CN100411829C Device for correcting reference position for transfer mechanism, and correction method
08/20/2008CN100411825C Scribing device and method for fragile material substrate
08/19/2008US7415362 Image defect inspection apparatus
08/19/2008US7415318 Method and apparatus for manufacturing semiconductor device
08/19/2008US7415149 Pattern inspection apparatus
08/19/2008US7414907 Semiconductor memory device
08/19/2008US7414894 Methods for identifying non-volatile memory elements with poor subthreshold slope or weak transconductance
08/19/2008US7414858 Method of manufacturing an electronic device
08/19/2008US7414824 Storage capacitor having a scattering effect and method of manufacturing the same
08/19/2008US7414823 Holder for use in semiconductor or liquid-crystal manufacturing device and semiconductor or liquid-crystal manufacturing device in which the holder is installed
08/19/2008US7414821 Semiconductor integrated circuit device
08/19/2008US7414759 Scanner linearity tester
08/19/2008US7414713 Method of measuring focal point, instrument used therefor, and method of fabricating semiconductor device
08/19/2008US7414600 Pixel current driver for organic light emitting diode displays
08/19/2008US7414506 Semiconductor integrated circuit and fabrication method thereof
08/19/2008US7414505 High frequency inductor having low inductance and low inductance variation and method of manufacturing the same
08/19/2008US7414454 Voltage switching circuit
08/19/2008US7414417 Contact sheet for testing electronic parts, apparatus for testing electronic parts, method for testing electronic parts, method for manufacturing electronic parts and electronic parts
08/19/2008US7414390 Signal detection contactor and signal calibration system
08/19/2008US7414314 Semiconductor device and manufacturing method thereof
08/19/2008US7414309 Encapsulated electronic part packaging structure
08/19/2008US7414304 Semiconductor device
08/19/2008US7414303 Lead on chip semiconductor package
08/19/2008US7414298 Super self-aligned collector device for mono-and hetero bipolar junction transistors, and method of making same
08/19/2008US7414297 Capacitor constructions
08/19/2008US7414296 Method of manufacturing a metal-insulator-metal capacitor
08/19/2008US7414293 Structure and method of applying localized stresses to the channels of PFET and NFET transistors for improved performance
08/19/2008US7414292 Semiconductor device and its manufacturing method
08/19/2008US7414291 Semiconductor device and method of manufacturing the same
08/19/2008US7414288 Semiconductor device having display device
08/19/2008US7414284 Nonvolatile semiconductor memory and manufacturing method thereof
08/19/2008US7414283 Semiconductor device
08/19/2008US7414279 Semiconductor device with improved overlay margin and method of manufacturing the same
08/19/2008US7414277 Memory cell having combination raised source and drain and method of fabricating same
08/19/2008US7414274 Selective oxidation of silicon in diode, TFT and monolithic three dimensional memory arrays
08/19/2008US7414269 Housing for a radiation-emitting component, method for the production thereof, and radiation-emitting component
08/19/2008US7414267 Semiconductor device and process for production thereof
08/19/2008US7414266 Semiconductor device and manufacturing method thereof
08/19/2008US7414264 Poly crystalline silicon semiconductor device and method of fabricating the same
08/19/2008US7414263 Highly efficient organic light-emitting device using substrate or electrode having nanosized half-spherical convex and method for preparing the same
08/19/2008US7414261 Ballistic semiconductor device
08/19/2008US7414259 Strained germanium-on-insulator device structures
08/19/2008US7414240 Particle remover, exposure apparatus having the same, and device manufacturing method
08/19/2008US7414232 Image sensor and method for fabricating the same
08/19/2008US7414224 Backside rapid thermal processing of patterned wafers
08/19/2008US7413998 Biased pulse DC reactive sputtering of oxide films
08/19/2008US7413997 Nanostructured electrode
08/19/2008US7413996 High k gate insulator removal
08/19/2008US7413995 Etched interposer for integrated circuit devices
08/19/2008US7413994 Hydrogen and oxygen based photoresist removal process
08/19/2008US7413993 Process for removing a residue from a metal structure on a semiconductor substrate
08/19/2008US7413992 Tungsten silicide etch process with reduced etch rate micro-loading
08/19/2008US7413991 Damascene process at semiconductor substrate level
08/19/2008US7413990 Method of fabricating a dual damascene interconnect structure
08/19/2008US7413989 Method of manufacturing semiconductor device
08/19/2008US7413988 Method and apparatus for detecting planarization of metal films prior to clearing
08/19/2008US7413987 Method for manufacturing a semiconductor device
08/19/2008US7413986 Feedforward and feedback control for conditioning of chemical mechanical polishing pad
08/19/2008US7413985 Method for forming a self-aligned nitrogen-containing copper silicide capping layer in a microstructure device
08/19/2008US7413984 Multi-step process for forming a barrier film for use in copper layer formation
08/19/2008US7413983 Plating method including pretreatment of a surface of a base metal
08/19/2008US7413982 Process for atomic layer deposition
08/19/2008US7413981 Pitch doubled circuit layout
08/19/2008US7413980 Semiconductor device with improved contact fuse
08/19/2008US7413979 Methods for forming vias in microelectronic devices, and methods for packaging microelectronic devices
08/19/2008US7413978 Substrate, electro-optical device, electronic apparatus, method of forming substrate, method of forming electro-optical device, and method of forming electronic apparatus
08/19/2008US7413977 Method of manufacturing semiconductor device suitable for forming wiring using damascene method
08/19/2008US7413976 Uniform passivation method for conductive features
08/19/2008US7413975 Interconnect substrate, semiconductor device, methods of manufacturing the same, circuit board, and electronic equipment
08/19/2008US7413974 Copper-metallized integrated circuits having electroless thick copper bond pads
08/19/2008US7413973 Method for manufacturing nano-gap electrode device
08/19/2008US7413972 Method of forming a metal interconnection line in a semiconductor device using an FSG layer
08/19/2008US7413971 introducing elongate, oriented pores into a dielectric in order thereby to reduce the effective k value of a dielectric
08/19/2008US7413970 Process of forming an electronic device including a semiconductor fin
08/19/2008US7413969 Method of manufacturing semiconductor device having recess gate structure with varying recess width for increased channel length
08/19/2008US7413968 Method of manufacturing semiconductor device having gate electrodes of polymetal gate and dual-gate structure
08/19/2008US7413967 Yield improvement in silicon-germanium epitaxial growth
08/19/2008US7413966 Method of fabricating polysilicon thin film transistor with catalyst
08/19/2008US7413965 Method of manufacturing a thin-film circuit substrate having penetrating structure, and protecting adhesive tape
08/19/2008US7413964 Method of revealing crystalline defects in a bulk substrate
08/19/2008US7413963 Method of edge bevel rinse
08/19/2008US7413962 Method for forming sublithographic features during the manufacture of a semiconductor device and a resulting in-process apparatus
08/19/2008US7413961 Method of fabricating a transistor structure
08/19/2008US7413960 Method of forming floating gate electrode in flash memory device
08/19/2008US7413959 Semiconductor device including a planarized surface and method thereof
08/19/2008US7413958 GaN-based permeable base transistor and method of fabrication
08/19/2008US7413957 Methods for forming a transistor
08/19/2008US7413956 Semiconductor device manufacturing method
08/19/2008US7413955 Transistor for memory device and method for manufacturing the same
08/19/2008US7413954 Insulated gate semiconductor device and manufacturing method of the same
08/19/2008US7413953 Method of forming floating gate array of flash memory device
08/19/2008US7413952 Methods of forming a plurality of circuit components and methods of forming a plurality of structures suspended elevationally above a substrate
08/19/2008US7413951 Stacked capacitor and method for producing stacked capacitors for dynamic memory cells
08/19/2008US7413950 Methods of forming capacitors having storage electrodes including cylindrical conductive patterns
08/19/2008US7413949 Capacitor and method for fabricating the same
08/19/2008US7413948 Semiconductor capacitor structure and method to form same
08/19/2008US7413947 Integrated high voltage capacitor having a top-level dielectric layer and a method of manufacture therefor
08/19/2008US7413946 Formation of standard voltage threshold and low voltage threshold MOSFET devices
08/19/2008US7413945 Electrically isolated pillars in active devices
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