Patents for H01L 21 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof (658,974) |
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09/16/2014 | US8835983 Nitride semiconductor device including a doped nitride semiconductor between upper and lower nitride semiconductor layers |
09/16/2014 | US8835976 Method and system for ultra miniaturized packages for transient voltage suppressors |
09/16/2014 | US8835966 Semiconductor light-emitting element, lamp, electronic device and machine |
09/16/2014 | US8835965 Application of semiconductor quantum dot phosphors in nanopillar light emitting diodes |
09/16/2014 | US8835955 IIIOxNy on single crystal SOI substrate and III n growth platform |
09/16/2014 | US8835938 Nitride semiconductor light-emitting element and method of manufacturing the same |
09/16/2014 | US8835933 Recessed gate-type silicon carbide field effect transistor and method of producing same |
09/16/2014 | US8835932 Normally-off compound semiconductor tunnel transistor with a plurality of charge carrier gases |
09/16/2014 | US8835927 Display substrate |
09/16/2014 | US8835923 Protection method for an electronic device and corresponding device |
09/16/2014 | US8835922 Monitoring pad and semiconductor device including the same |
09/16/2014 | US8835909 Hybrid dielectric material for thin film transistors |
09/16/2014 | US8835907 Memory device and semiconductor device |
09/16/2014 | US8835903 Light-emitting diode display and method of producing the same |
09/16/2014 | US8835900 Highly scaled ETSOI floating body memory and memory circuit |
09/16/2014 | US8835893 Resistive memory cell fabrication methods and devices |
09/16/2014 | US8835891 Integrated circuitry, methods of forming memory cells, and methods of patterning platinum-containing material |
09/16/2014 | US8835869 Ion sources and methods for generating an ion beam with controllable ion current density distribution |
09/16/2014 | US8835813 Heat treatment apparatus and method for heating substrate by light-irradiation |
09/16/2014 | US8835811 Thermal processing apparatus and method of controlling the same |
09/16/2014 | US8835801 Laser processing method |
09/16/2014 | US8835800 Laser irradiation apparatus and method for manufacturing semiconductor device |
09/16/2014 | US8835773 Wiring board and method of manufacturing the same |
09/16/2014 | US8835770 Electronic component and method for manufacturing the same |
09/16/2014 | US8835754 Method of manufacturing see-through thin film solar cells |
09/16/2014 | US8835752 Solar cells and method of making solar cells |
09/16/2014 | US8835333 Heat treatment method of semiconductor wafers, manufacturing method of solar battery, and heat treatment device |
09/16/2014 | US8835332 Film deposition method |
09/16/2014 | US8835331 Vapor-phase growing apparatus and vapor-phase growing method |
09/16/2014 | US8835330 Integrated circuit including DRAM and SRAM/logic |
09/16/2014 | US8835329 Reactor cell isolation using differential pressure in a combinatorial reactor |
09/16/2014 | US8835328 Methods for fabricating integrated circuits with improved semiconductor fin structures |
09/16/2014 | US8835327 Method of manufacturing semiconductor device |
09/16/2014 | US8835326 Titanium-nitride removal |
09/16/2014 | US8835325 Method for manufacturing a semiconductor device |
09/16/2014 | US8835324 Method for forming contact holes |
09/16/2014 | US8835323 Method for integrated circuit patterning |
09/16/2014 | US8835322 Method for reducing a minimum line width in a spacer-defined double patterning process |
09/16/2014 | US8835321 Method for forming fine patterns of a semiconductor device |
09/16/2014 | US8835320 Etching method and device |
09/16/2014 | US8835319 Protection layers for conductive pads and methods of formation thereof |
09/16/2014 | US8835318 HNO3 single wafer clean process to strip nickel and for MOL post etch |
09/16/2014 | US8835317 Depositing tungsten into high aspect ratio features |
09/16/2014 | US8835316 Transistor with primary and semiconductor spacer, method for manufacturing transistor, and semiconductor chip comprising the transistor |
09/16/2014 | US8835314 Method for fabricating semiconductor memory device |
09/16/2014 | US8835313 Interconnect barrier structure and method |
09/16/2014 | US8835312 Method of manufacturing semiconductor device |
09/16/2014 | US8835311 High temperature tungsten metallization process |
09/16/2014 | US8835310 Two step deposition of molybdenum dioxide electrode for high quality dielectric stacks |
09/16/2014 | US8835309 Forming nickel—platinum alloy self-aligned silicide contacts |
09/16/2014 | US8835308 Methods for depositing materials in high aspect ratio features |
09/16/2014 | US8835307 Method and structure for reworking antireflective coating over semiconductor substrate |
09/16/2014 | US8835306 Methods for fabricating integrated circuits having embedded electrical interconnects |
09/16/2014 | US8835305 Method of fabricating a profile control in interconnect structures |
09/16/2014 | US8835304 Method of semiconductor integrated circuit fabrication |
09/16/2014 | US8835303 Metallization system of a semiconductor device comprising extra-tapered transition vias |
09/16/2014 | US8835302 Method of fabricating a package substrate |
09/16/2014 | US8835300 Method for inhibiting growth of intermetallic compounds |
09/16/2014 | US8835299 Pre-sintered semiconductor die structure |
09/16/2014 | US8835298 NiSi rework procedure to remove platinum residuals |
09/16/2014 | US8835297 Fabricating method of non-volatile memory structure |
09/16/2014 | US8835296 Electronic component manufacturing method including step of embedding metal film |
09/16/2014 | US8835294 Method for improving thermal stability of metal gate |
09/16/2014 | US8835293 Methods for forming conductive elements and vias on substrates |
09/16/2014 | US8835292 Method of manufacturing semiconductor devices including replacement metal gate process incorporating a conductive dummy gate layer |
09/16/2014 | US8835291 Strained gate electrodes in semiconductor devices |
09/16/2014 | US8835290 Methods and compositions for doping silicon substrates with molecular monolayers |
09/16/2014 | US8835289 Wafer backside defectivity clean-up utilizing selective removal of substrate material |
09/16/2014 | US8835288 Method of manufacturing silicon carbide semiconductor device |
09/16/2014 | US8835287 Method of implanting a workpiece to improve growth of a compound semiconductor |
09/16/2014 | US8835286 Manufacturing method of graphene substrate and graphene substrate |
09/16/2014 | US8835285 Methods to fabricate vertically oriented anatase nanowire arrays on transparent conductive substrates and applications thereof |
09/16/2014 | US8835284 Method of manufacturing annealed wafer |
09/16/2014 | US8835283 Fabrication method for producing semiconductor chips with enhanced die strength |
09/16/2014 | US8835282 Controlled process and resulting device |
09/16/2014 | US8835281 Methods for the formation of a trap rich layer |
09/16/2014 | US8835280 Semiconductor device and method for manufacturing the same |
09/16/2014 | US8835279 Method of manufacturing semiconductor device |
09/16/2014 | US8835278 Method for forming a buried dielectric layer underneath a semiconductor fin |
09/16/2014 | US8835277 Method to improve charge trap flash memory core cell performance and reliability |
09/16/2014 | US8835276 Method for manufacturing semiconductor substrate |
09/16/2014 | US8835275 Semiconductor devices having nitrided gate insulating layer and methods of fabricating the same |
09/16/2014 | US8835274 Interconnects and semiconductor devices including at least two portions of a metal nitride material and methods of fabrication |
09/16/2014 | US8835273 High temperature ALD process of metal oxide for DRAM applications |
09/16/2014 | US8835272 Passive electrically switchable circuit element having improved tunability and method for its manufacture |
09/16/2014 | US8835271 Semiconductor display device |
09/16/2014 | US8835270 Dual NSD implants for reduced Rsd in an NMOS transistor |
09/16/2014 | US8835269 Method of manufacturing solid-state image sensor |
09/16/2014 | US8835268 Method for manufacturing semiconductor device |
09/16/2014 | US8835267 Semiconductor device and fabrication method thereof |
09/16/2014 | US8835266 Method and structure for compound semiconductor contact |
09/16/2014 | US8835265 High-k dielectric device and process |
09/16/2014 | US8835264 Method for fabricating power semiconductor device |
09/16/2014 | US8835263 Formation of a selective carbon-doped epitaxial cap layer on selective epitaxial SiGe |
09/16/2014 | US8835262 Methods of forming bulk FinFET devices by performing a recessing process on liner materials to define different fin heights and FinFET devices with such recessed liner materials |
09/16/2014 | US8835261 Field effect transistor structure and method of forming same |
09/16/2014 | US8835260 Control of threshold voltages in high-k metal gate stack and structures for CMOS devices |
09/16/2014 | US8835259 Transistor of semiconductor device and method for manufacturing the same |
09/16/2014 | US8835258 High voltage device and manufacturing method thereof |
09/16/2014 | US8835257 Method of fabricating semiconductor device including a recessed channel |