| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
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| 03/18/2004 | US20040051519 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment |
| 03/17/2004 | EP1218757B1 Method for making a probe card with multiple contact tips for testing integrated circuits with microsphere contacts |
| 03/11/2004 | US20040046582 Contacting component, method of producing the same, and test tool having the contacting component |
| 03/11/2004 | US20040046579 High performance probe system |
| 03/04/2004 | US20040041581 Method of measuring contact resistance of probe and method of testing semiconductor device |
| 03/04/2004 | US20040040149 Probe card , e.g., for testing microelectronic components, and methods for making same |
| 02/26/2004 | US20040038560 Methods of fabricating and using shaped springs |
| 02/26/2004 | US20040035706 Method for manufacturing probes of a probe card |
| 02/25/2004 | EP1391265A1 Contactor cleaning sheet, and contactor cleaning method |
| 02/19/2004 | WO2004015762A1 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 02/19/2004 | US20040034839 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 02/19/2004 | US20040032272 Contactor having contact electrodes formed by laser processing |
| 02/18/2004 | CN1476068A Contactor having contact electrode formed by laser |
| 02/12/2004 | US20040027146 Sensor probe for use in board inspection and manufacturing method thereof |
| 02/12/2004 | US20040027143 Apparatus and method for inspecting electronic circuits |
| 02/12/2004 | US20040027142 Apparatus and method for inspecting electronic circuits |
| 02/05/2004 | US20040022042 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 02/05/2004 | US20040020514 For cleaning the probes of a probe device (e.g., a probe card) used to electrical characteristics of electrical devices, such as integrated circuits on a semiconductor wafer |
| 02/03/2004 | US6685817 Controlling thickness of plating over a width of a substrate |
| 01/29/2004 | WO2004010153A2 Probe device cleaner and method |
| 01/29/2004 | WO2004010152A1 Method of making microelectronic spring contact array |
| 01/29/2004 | WO2003100445A3 Probe for testing a device under test |
| 01/29/2004 | US20040018752 Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 01/29/2004 | US20040017215 High input/output density optoelectronic probe card for wafer-level test of electrical and optical interconnect components, methods of fabrication, and methods of use |
| 01/29/2004 | US20040016119 Method of making microelectronic spring contact array |
| 01/22/2004 | WO2004008492A2 Mosaic decal probe |
| 01/22/2004 | US20040012405 Probe card with full wafer contact configuration |
| 01/20/2004 | US6680536 Probe unit having resilient metal leads |
| 01/15/2004 | US20040008045 Mosaic decal probe |
| 01/14/2004 | CN1467806A Contactor block and apparatus for electrical connection |
| 01/14/2004 | CN1134667C Microelectronic spring contact element |
| 01/13/2004 | US6677552 System and method for laser micro-machining |
| 01/13/2004 | US6677245 Contact structure production method |
| 01/13/2004 | US6676438 Contact structure and production method thereof and probe contact assembly using same |
| 01/08/2004 | US20040004491 Probe for testing a device under test |
| 01/08/2004 | US20040004489 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof |
| 01/07/2004 | CN1466182A Apparatus and method for cleaning probe card contacts |
| 01/06/2004 | US6674627 Needle-card adjusting device for planarizing needle sets on a needle card |
| 01/06/2004 | US6672877 Contactor block and apparatus for electrical connection |
| 01/06/2004 | US6672875 Spring interconnect structures |
| 01/02/2004 | EP1376140A2 Probe card contact block and apparatus for electrical connection |
| 01/01/2004 | US20040000325 Method and device to clean probes |
| 12/31/2003 | WO2004001807A2 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 12/30/2003 | US6669489 Interposer, socket and assembly for socketing an electronic component and method of making and using same |
| 12/25/2003 | US20030234657 Method for producing a probe, mask for producing the probe, and probe |
| 12/23/2003 | US6667629 Electrical test probes and methods of making the same |
| 12/18/2003 | WO2003081725A3 A miniaturized contact spring |
| 12/11/2003 | US20030226578 Removal residues from electrical contactors; silicon substrate with groove surfaces; pressurized contactors |
| 12/09/2003 | US6661244 Nickel alloy probe card frame laminate |
| 12/09/2003 | US6659847 Polishing surface of probe pin of probe card by moving cleaning wafer to contact surface of pin with first acceleration rate for plurality of times, smoothing surface by moving cleaning wafer with second, faster, acceleration rate |
| 12/09/2003 | US6658728 Method for fabricating a spring structure on a substrate |
| 12/04/2003 | WO2003101163A1 Wiring substrate, method for producing the same, and semiconductor chip inspection equipment utilizing it |
| 12/04/2003 | WO2003100446A2 High performance probe system for testing semiconductor wafers |
| 12/04/2003 | WO2003100445A2 Probe for testing a device under test |
| 12/04/2003 | US20030224635 Contactor block and apparatus for electrical connection |
| 12/04/2003 | US20030222668 Micro-fabrication forms a plurality of stiff vertical micro probes on the front surface of a ceramic substrate and a plurality of contacts on the back surface of the ceramic substrate. Photolithography, various etching technologies and |
| 11/27/2003 | US20030218244 Miniaturized contact spring |
| 11/26/2003 | EP1365250A1 Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 11/25/2003 | US6651325 Method for forming cantilever beam probe card and probe card formed |
| 11/20/2003 | US20030214045 Miniaturized contact spring |
| 11/19/2003 | EP1362005A2 Method for forming microelectronic spring structures on a substrate |
| 11/18/2003 | US6650131 Electrical test probe wedge tip |
| 11/13/2003 | US20030210065 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip |
| 11/13/2003 | US20030210063 Contact probe with guide unit and fabrication method thereof |
| 11/12/2003 | CN1455259A Method for producing probe, mask used therefor and probe therefrom |
| 11/11/2003 | US6647351 Method of detecting the position of an inner surface of a workpiece on a machine tool, and machine tool implementing such a method |
| 11/11/2003 | US6646455 Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter |
| 11/06/2003 | US20030206030 Universal wafer carrier for wafer level die burn-in |
| 11/04/2003 | US6642731 Probe structure and manufacturing method thereof |
| 11/04/2003 | US6642728 Holder of electroconductive contactor, and method for producing the same |
| 11/04/2003 | US6641430 Contact structure and production method thereof and probe contact assembly using same |
| 11/04/2003 | US6640432 Method of fabricating shaped springs |
| 11/04/2003 | US6640415 Segmented contactor |
| 10/30/2003 | WO2002068321A3 Forming tool for forming a contoured microelectronic spring mold |
| 10/30/2003 | US20030203683 Probe card |
| 10/30/2003 | US20030203521 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 10/29/2003 | EP1357385A1 Contact probe, mask and fabrication method thereof |
| 10/29/2003 | EP1356307A1 Nickel alloy probe card frame laminate |
| 10/28/2003 | US6639418 Microelectronic fabrication die electrical probe apparatus electrical test method providing enhanced microelectronic fabrication die electrical test accuracy and efficiency |
| 10/22/2003 | CN1451179A Shaped springs and methds of fabricating and using shaped springs |
| 10/21/2003 | US6636063 Probe card with contact apparatus and method of manufacture |
| 10/16/2003 | US20030192476 Sputtered spring films with low stress anisotropy |
| 10/16/2003 | US20030192183 Method for constructing a membrane probe using a depression |
| 10/16/2003 | US20030192181 Method of making an electronic contact |
| 10/16/2003 | US20030192176 Re-assembly process for MEMS structures |
| 10/15/2003 | EP1353443A2 Spring contact |
| 10/15/2003 | CN1449009A Contactor, method of producing the same, and method of testing using the same |
| 10/14/2003 | US6633175 Temperature compensated vertical pin probing device |
| 10/09/2003 | US20030189439 Semiconductor inspection apparatus |
| 10/09/2003 | US20030189438 Electrical test probe wedge tip |
| 10/08/2003 | EP1351060A2 Method of manufacturing a test probe for semiconductor devices |
| 10/07/2003 | US6630839 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor |
| 10/07/2003 | US6630451 Benzimidazolone peptidometics as thrombin receptor antagonist |
| 10/02/2003 | WO2003081725A2 A miniaturized contact spring |
| 10/02/2003 | US20030186566 Contactor, method for manufacturing such contactor, and testing method using such contactor |
| 10/02/2003 | US20030184330 Probe card and method for manufacturing probe card |
| 10/01/2003 | EP1010014B1 Magnet core |
| 09/30/2003 | US6628127 Probe card for testing semiconductor integrated circuit and method of manufacturing the same |
| 09/25/2003 | WO2003079110A1 Method for producing micro probe tips |
| 09/25/2003 | US20030179064 Method of making photolithographically-patterned out-of-plane coil structures |