| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
|---|
| 02/11/2010 | US20100033201 Mems probe fabrication on a reusable substrate for probe card application |
| 02/11/2010 | US20100031752 Pressure sensor with resistance strain gages |
| 02/11/2010 | US20100031504 Method of manufacturing probe card |
| 02/04/2010 | US20100026290 Microelectromechanical magnetometer with integrated electronics |
| 01/27/2010 | CN100585411C Method of making microelectronic spring contact array |
| 01/26/2010 | US7652492 Integrated compound nano probe card |
| 01/26/2010 | US7651267 Sensor arrangement and method for using same |
| 01/20/2010 | CN101629982A Alignment features in a probing device |
| 01/19/2010 | US7649145 Compliant spring contact structures |
| 01/14/2010 | US20100007344 MTJ based magnetic field sensor with ESD shunt trace |
| 01/13/2010 | CN100579891C Method for forming microelectronic spring structures on substrate |
| 01/07/2010 | WO2010000689A1 Sensor device for measuring an electric field and method for the manufacture thereof |
| 01/05/2010 | US7642798 Probe card needle cleaning frequency optimization |
| 01/05/2010 | US7640647 Method of assembling a packaged high frequency circuit module |
| 12/31/2009 | US20090322313 Power measurement apparatus |
| 12/31/2009 | US20090320610 Force sensor |
| 12/29/2009 | US7637831 Power transmission mechanism of model vehicle |
| 12/24/2009 | US20090315579 High density integrated circuit apparatus, test probe and methods of use thereof |
| 12/23/2009 | CN100573158C Advanced sandwich sub card test general carrier plate and its production method |
| 12/17/2009 | WO2009105222A3 Test system with high frequency interposer |
| 12/17/2009 | US20090308756 Probe structure coaxial elongated electrical conductor projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 12/10/2009 | US20090301210 Pressure measuring transducer |
| 12/10/2009 | US20090301205 Ultrasonic sensor |
| 12/01/2009 | US7624494 Method of fabricating a mesoscaled resonator |
| 11/24/2009 | US7621045 Method of producing a probe with a trapezoidal contactor |
| 11/24/2009 | US7621036 Method of manufacturing implantable wireless sensor for in vivo pressure measurement |
| 11/19/2009 | US20090284275 Conductive film structure, fabrication method thereof, and conductive film type probe device for ic |
| 11/17/2009 | US7619429 Integrated probe module for LCD panel light inspection |
| 11/12/2009 | US20090277274 Post assembly automatic adjustment of saw based pressure sensor preload |
| 11/11/2009 | CN101576608A Methods and systems to predict fatigue life in aluminum castings |
| 10/28/2009 | CN100555594C Contactor having contact electrodes formed by laser processing |
| 10/22/2009 | US20090263986 Spring interconnect structures |
| 09/30/2009 | CN100545660C Method for probing electronic element |
| 09/29/2009 | US7595636 Apparatus and method of using accelerometer measurements for casing evaluation |
| 09/22/2009 | US7592565 Probe positioning and bonding device and probe bonding method |
| 09/10/2009 | US20090224780 Wafer level test probe card |
| 09/09/2009 | CN101526555A Method for manufacturing probe |
| 09/09/2009 | CN100538369C Method of making a socket to perform testing on integrated circuits and such a socket |
| 09/08/2009 | US7585548 compound probe pins arranged in substrate layer; bundle of aligned parallel nanotubes/nanorods and a bonding material |
| 09/02/2009 | EP2096449A1 Testbed for testing electronic circuits and components |
| 08/27/2009 | WO2009105222A2 Test system with high frequency interposer |
| 08/27/2009 | US20090212798 Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device |
| 08/25/2009 | US7579855 Method for manufacturing electrical contact element for testing electronic device and electrical contact element manufactured thereby |
| 08/25/2009 | US7579853 Apparatus for obtaining planarity measurements with respect to a probe card analysis system |
| 08/25/2009 | US7579269 Microelectronic spring contact elements |
| 08/25/2009 | US7578057 Method of fabricating segmented contactor |
| 08/18/2009 | US7574895 Sensor for detecting particles in a gas stream and method for its manufacture |
| 08/12/2009 | EP1556707A4 Contact probe with off-centered back-drilled aperture |
| 08/11/2009 | US7571533 Method of manufacturing a micro flux gate sensor |
| 07/30/2009 | US20090189288 Angled flying lead wire bonding process |
| 07/30/2009 | US20090188321 Sensor and method for its manufacture |
| 07/23/2009 | US20090183558 Cam/crank sensor that allows for multiple orientations of a plastic over-molded bracket relative to a molded sensor terminal assembly |
| 07/16/2009 | US20090178277 Method of constructing a membrane probe using a depression |
| 07/14/2009 | US7560943 Alignment features in a probing device |
| 07/14/2009 | US7559139 Method for manufacturing a probe unit |
| 07/08/2009 | CN100511853C Small array contact with precision working range |
| 07/07/2009 | US7555836 Method of making lithographic contact elements |
| 06/30/2009 | US7554347 High input/output density optoelectronic probe card for wafer-level test of electrical and optical interconnect components, methods of fabrication, and methods of use |
| 06/30/2009 | US7553165 Spring interconnect structures |
| 06/30/2009 | US7552522 Method of making a sensing apparatus |
| 06/25/2009 | US20090160473 Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor |
| 06/25/2009 | US20090158586 Method and apparatus for adjusting a multi-substrate probe structure |
| 06/24/2009 | CN100505199C Contactor block and apparatus for electrical connection |
| 06/17/2009 | EP2069807A2 Attachment of an electrical element to an electronic device using a conductive material |
| 06/16/2009 | US7547850 Semiconductor device assemblies with compliant spring contact structures |
| 06/11/2009 | US20090146673 Manufacturing method of probe card and the probe card |
| 06/11/2009 | US20090145645 Interconnection element with posts formed by plating |
| 06/04/2009 | US20090139040 Apparatuses and methods for cleaning test probes |
| 06/03/2009 | CN100495824C Anisotropic conductive film and method for producing the same |
| 05/28/2009 | US20090134897 Apparatus and method for limiting over travel in a probe card assembly |
| 05/28/2009 | US20090134866 Rotation detecting device and method for manufacturing the same |
| 05/27/2009 | EP2063466A2 Interconnection element and method of fabrication thereof |
| 05/26/2009 | US7538565 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/21/2009 | US20090128176 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/20/2009 | EP2060921A1 Contact probe for testing head having vertical probes and related testing head for testing microstructure electric performance |
| 05/19/2009 | US7533462 Method of constructing a membrane probe |
| 05/14/2009 | US20090121734 Integrated compound nano probe card and method of making same |
| 05/14/2009 | US20090121710 Novel free layer design for TMR/CPP device |
| 05/13/2009 | EP2058667A2 Microelectronic spring contact element |
| 05/07/2009 | US20090116537 Combined temperature and pressure transducer incorporating connector keyway alignment and an alignment method |
| 05/07/2009 | US20090115439 Methods for making contact device for making connection to an electronic circuit device and methods of using the same |
| 05/06/2009 | CN101424706A Test anchor point making method and test anchor point and veneer |
| 04/30/2009 | US20090108852 Structure for capacitive balancing of integrated relative humidity sensor |
| 04/28/2009 | US7524194 Lithographic type microelectronic spring structures with improved contours |
| 04/28/2009 | US7523539 Method of manufacturing a probe |
| 04/16/2009 | US20090095077 Disc resonator gyroscope with improved frequency coincidence and method of manufacture |
| 04/16/2009 | US20090094826 Contacting component, method of producing the same, and test tool having the contacting component |
| 04/15/2009 | CN100479127C Micro-mechanical wafer chip test detecting card and its production |
| 04/14/2009 | US7518387 Shielded probe for testing a device under test |
| 04/14/2009 | US7517707 Manufacturing method of semiconductor integrated circuit device and probe card |
| 04/08/2009 | CN101403766A Novel fast neutron detector |
| 04/01/2009 | CN100474572C Connector for making electrical contact at semiconductor scales and method for forming the same |
| 03/26/2009 | US20090079458 Small pitch ball grid array of a package assembly for use with conventional burn-in sockets |
| 03/17/2009 | US7504840 Electrochemically fabricated microprobes |
| 03/12/2009 | US20090066351 Electrochemically fabricated microprobes |
| 03/12/2009 | US20090064498 Membrane spring fabrication process |
| 03/05/2009 | US20090058440 Probe assembly, method of producing it and electrical connecting apparatus |
| 02/24/2009 | US7495342 Angled flying lead wire bonding process |
| 02/19/2009 | US20090045828 Fine Pitch Testing Substrate Structure And Method Of Manufacturing The Same |
| 02/19/2009 | US20090045810 Magnetic detecting device and method for manufacturing the same |