| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
|---|
| 10/13/2005 | WO2005065432A3 Pin-type probes for contacting electronic circuits and methods for making such probes |
| 10/13/2005 | WO2004070405A8 Probe card needle cleaning frequency optimization |
| 10/13/2005 | US20050227510 Small array contact with precision working range |
| 10/13/2005 | US20050227383 Manufacturing method of semiconductor integrated circuit device and probe card |
| 10/13/2005 | US20050225337 Contact system for wafer level testing |
| 10/12/2005 | CN1681106A Manufacturing method of semiconductor integrated circuit device and probe card |
| 10/12/2005 | CN1222776C Probe card and method of producing the same |
| 10/11/2005 | US6953519 making a cantilever using lithographic techniques and forming microscopic electrodes at a distal end of the cantilever by sputtering and gas-assisted etching processing using a focused charge particle beam |
| 10/05/2005 | CN2731455Y Gas generating simulator for coal layer |
| 10/05/2005 | CN1221926C Method and device for examining circuit board in pre-determined area of said circuit |
| 09/28/2005 | EP0886894B1 Contact carriers for populating substrates with spring contacts |
| 09/28/2005 | CN1675755A Anisotropically conductive connector, probe material member, wafer inspection apparatus, and wafer inspection method |
| 09/21/2005 | EP1576377A2 Apparatus and method for limiting over travel in a probe card assembly |
| 09/21/2005 | CN1672057A Method of making microelectronic spring contact array |
| 09/20/2005 | US6947291 Photolithographically-patterned out-of-plane coil structures and method of making |
| 09/20/2005 | US6946375 Manufacture of probe unit having lead probes extending beyond edge of substrate |
| 09/15/2005 | DE10393364T5 Lochmikrosonde unter Nutzung einer MEMS-Technik und ein Verfahren zur Herstellung derselben Hollow microprobe using an MEMS technique and a method of manufacturing the same |
| 09/13/2005 | US6943149 Thrombosis, restenosis, hypertension, heart failure, arrhy-thmia, inflammation, angina, stroke, atherosclerosis, cancer, ischemic conditions, angiogenesis related disorders, neuro-degenerative disorders |
| 09/09/2005 | WO2004092090A3 Temperature compensated vertical pin probing device |
| 09/08/2005 | US20050194986 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof |
| 09/07/2005 | EP1570277A2 Method of making a socket to perform testing on integrated circuits and such a socket |
| 09/07/2005 | EP1356307A4 Nickel alloy probe card frame laminate |
| 09/07/2005 | EP0995996B1 Conductive contact |
| 09/07/2005 | EP0925509B1 Probe structure having a plurality of discrete insulated probe tips |
| 09/06/2005 | US6939474 Method for forming microelectronic spring structures on a substrate |
| 09/06/2005 | US6938338 Method of making an electronic contact |
| 09/01/2005 | US20050189956 Electronic components with plurality of contoured microelectronic spring contacts |
| 08/31/2005 | CN1662820A Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 08/25/2005 | WO2005076832A2 Method for manufacturing single wall carbon nanotube tips |
| 08/25/2005 | US20050186690 Method for improving semiconductor wafer test accuracy |
| 08/23/2005 | US6933740 Electronic circuit inspection sensor and inspection system using same |
| 08/18/2005 | WO2005076024A1 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 08/18/2005 | US20050179456 High density cantilevered probe for electronic devices |
| 08/17/2005 | EP0859686B1 Fabricating interconnects and tips using sacrificial substrates |
| 08/11/2005 | WO2005074328A1 Organic el panel |
| 08/10/2005 | EP0839322B1 Microelectronic contact structure and method of making same |
| 08/10/2005 | CN1653340A High performance probe system for testing semiconductor wafers |
| 08/09/2005 | US6927586 Temperature compensated vertical pin probing device |
| 08/09/2005 | US6927078 Method of measuring contact resistance of probe and method of testing semiconductor device |
| 08/04/2005 | US20050167816 Method for making a socket to perform testing on integrated circuits |
| 08/02/2005 | US6924655 Probe card for use with microelectronic components, and methods for making same |
| 07/28/2005 | US20050162179 Probe with trapezoidal contactor and device based on application thereof, and method of producing them |
| 07/27/2005 | EP1556707A1 Contact probe with off-centered back-drilled aperture |
| 07/26/2005 | US6920689 Method for making a socket to perform testing on integrated circuits |
| 07/21/2005 | WO2005065437A2 Probe arrays and method for making |
| 07/21/2005 | WO2005065432A2 Pin-type probes for contacting electronic circuits and methods for making such probes |
| 07/21/2005 | WO2005065431A2 Microprobe tips and methods for making |
| 07/21/2005 | WO2004093252B1 Electrical connector and method for making |
| 07/21/2005 | US20050159027 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 07/21/2005 | US20050159025 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 07/21/2005 | US20050159002 Sputtered spring films with low stress anisotropy |
| 07/21/2005 | US20050156313 Inspection device and method for manufacturing the same, method for manufacturing electro-optic device and method for manufacturing semiconductor device |
| 07/20/2005 | CN1643065A Apparatus and method for cleaning test probes |
| 07/20/2005 | CN1641853A Inspection device and method for manufacturing the same, method for manufacturing electro-optic device and method for manufacturing semiconductor device |
| 07/14/2005 | WO2005064351A1 Conductive contact holder, conductive contact unit and process for producing conductive contact holder |
| 07/14/2005 | US20050150518 Apparatuses and methods for cleaning test probes |
| 07/13/2005 | EP1553623A1 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 07/13/2005 | EP1552905A2 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method |
| 07/13/2005 | CN1639918A Anisotropic conductive film and method for producing the same |
| 07/12/2005 | US6917525 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 07/12/2005 | US6917102 Contact structure and production method thereof and probe contact assembly using same |
| 07/07/2005 | US20050148214 Lithographic contact elements |
| 07/07/2005 | DE10392441T5 Eine miniaturisierte Kontaktfeder A miniaturized contact spring |
| 07/06/2005 | EP1549962A2 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 07/06/2005 | EP1210208A4 Membrane probing system |
| 07/05/2005 | US6913468 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods |
| 06/29/2005 | CN1633600A Contact structure having silicon finger contactor |
| 06/28/2005 | US6911835 High performance probe system |
| 06/23/2005 | WO2005057735A1 Small array contact with precision working range |
| 06/23/2005 | WO2005057652A2 Connector for making electrical contact at semiconductor scales and method for forming same |
| 06/21/2005 | US6909300 Method for fabricating microelectronic fabrication electrical test apparatus electrical probe tip having pointed tips |
| 06/16/2005 | WO2005055369A2 Methods for making vertical electrical feed through structures |
| 06/16/2005 | US20050127935 Semiconductor device tester |
| 06/16/2005 | US20050126590 Cleaning sheet for a probe |
| 06/15/2005 | CN1206719C Contactor, method of producing the same, and method of testing using the same |
| 06/14/2005 | US6906540 Method for chemically etching photo-defined micro electrical contacts |
| 06/09/2005 | US20050124181 Connector for making electrical contact at semiconductor scales |
| 06/01/2005 | EP1536241A2 Probe for measuring electrical characteristics and method of manufacturing the same |
| 05/31/2005 | US6900653 Needle fixture of a probe card in semiconductor inspection equipment and needle fixing method thereof |
| 05/31/2005 | US6900646 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof |
| 05/26/2005 | US20050110507 Electrical characteristic measuring probe and method of manufacturing the same |
| 05/26/2005 | US20050108876 Methods for making plated through holes usable as interconnection wire or probe attachments |
| 05/26/2005 | US20050108875 Methods for making vertical electric feed through structures usable to form removable substrate tiles in a wafer test system |
| 05/25/2005 | EP1532456A1 Method of making microelectronic spring contact array |
| 05/19/2005 | WO2002090054A3 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method |
| 05/19/2005 | US20050106382 comprises a metal powder having the form of a lot of fine metal particles being linked in a chain shape as a conductive component formed of a metal having paramagnetism |
| 05/19/2005 | US20050104609 Microprobe tips and methods for making |
| 05/19/2005 | US20050102833 Release height adjustment of stressy metal devices by annealing before and after release |
| 05/18/2005 | CN1618124A Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 05/17/2005 | US6894515 Inspection unit and method of manufacturing substrate |
| 05/17/2005 | US6892452 Securing positive electrical connection between wiring board and semiconductor device; pattern forming bumps having pointed tapering end in vertical cross section |
| 05/12/2005 | WO2005043594A2 Method for forming photo-defined micro electrical contacts |
| 05/12/2005 | DE10392306T5 Kontaktstruktur mit Siliziumtastkontaktgeber Contact structure with Siliziumtastkontaktgeber |
| 05/05/2005 | US20050095734 Reducing damage to test pads, wires, dielectrics; cutting grooves into reinforcement; thin film detector; electrical connecting to wires |
| 05/05/2005 | US20050093565 Fabrication method of semiconductor integrated circuit device |
| 05/05/2005 | US20050093558 Carrier for cleaning sockets for semiconductor components having contact balls |
| 05/05/2005 | US20050092709 Microprobe for testing electronic device and manufacturing method thereof |
| 05/04/2005 | CN1612322A Fabrication method of semiconductor integrated circuit device |
| 05/04/2005 | CN1612321A Fabrication method of semiconductor integrated circuit device |
| 05/04/2005 | CN1611950A Method of manufacturing protruding-volute contact, contact made by the method |