| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
|---|
| 01/09/2007 | US7161373 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 01/09/2007 | US7161363 Probe for testing a device under test |
| 01/04/2007 | US20070000323 Method of manufacturing a capacitive acceleration sensor, and a capacitive acceleration sensor |
| 01/03/2007 | CN1890845A Small array contact with precision working range |
| 01/03/2007 | CN1890806A Connector for making electrical contact at semiconductor scales and method for forming same |
| 01/02/2007 | US7155803 Method of manufacturing a sensor element having integrated reference pressure |
| 12/27/2006 | CN1886821A Methods for making vertical electrical feed through structures |
| 12/21/2006 | US20060286828 Contact Structures Comprising A Core Structure And An Overcoat |
| 12/20/2006 | CN1290628C Probe cleaning device |
| 12/19/2006 | US7151386 Apparatus for testing integrated circuit chips |
| 12/19/2006 | US7151385 Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 12/13/2006 | CN1290169C Contactor having contact electrode formed by laser |
| 12/12/2006 | US7149342 Device and method for investigating predetermined areas of printed circuit boards |
| 12/06/2006 | EP1729174A1 Photolithographically-patterned out-of-plane coil structures and method of making |
| 12/05/2006 | US7145171 Probe unit and its manufacturing method |
| 11/29/2006 | CN1871522A Method for forming photo-defined micro electrical contacts |
| 11/28/2006 | US7141997 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 11/23/2006 | US20060261827 Apparatus And Method For Limiting Over Travel In A Probe Card Assembly |
| 11/22/2006 | EP1356307B1 Nickel alloy probe card frame laminate |
| 11/22/2006 | CN1285915C Conductive contact |
| 11/21/2006 | US7137830 Miniaturized contact spring |
| 11/16/2006 | US20060255815 Contact probe and method of manufacturing the same and test apparatus and test method |
| 11/15/2006 | EP0826152B1 Method and apparatus for testing semiconductor dice |
| 11/08/2006 | EP1720381A1 Organic el panel |
| 11/08/2006 | EP1720020A2 Contact probe and test apparatus and test method |
| 11/07/2006 | US7132979 Calibration apparatus for a switchable antenna array, and an associated operating method |
| 11/02/2006 | US20060246611 Method of and apparatus for controlling probe tip sanding in semiconductor device testing equipment |
| 11/02/2006 | US20060244469 Segmented Contactor |
| 11/02/2006 | US20060243483 Semiconductor device assemblies with compliant spring contact structures |
| 11/02/2006 | US20060242828 Fabrication of compliant spring contact structures and use thereof |
| 11/02/2006 | EP1717591A1 Needle-like member, conductive contact, and conductive contact unit |
| 10/31/2006 | US7127811 Methods of fabricating and using shaped springs |
| 10/25/2006 | CN1281966C Probe sheet, probe card, semiconductor detector device |
| 10/24/2006 | US7126358 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 10/24/2006 | US7126220 Miniaturized contact spring |
| 10/19/2006 | WO2006076522A3 Force or field balance device and method for measuring position |
| 10/10/2006 | US7119557 Hollow microprobe using a MEMS technique and a method of manufacturing the same |
| 10/10/2006 | US7119362 Method of manufacturing semiconductor apparatus |
| 10/05/2006 | US20060219726 Liquid detecting device, liquid container and method of manufacturing liquid detecting device |
| 09/26/2006 | US7112986 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 09/26/2006 | US7112985 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 09/21/2006 | US20060211234 Re-assembly process for mems structures |
| 09/20/2006 | CN1276259C Photoetching contact elements |
| 09/07/2006 | US20060197542 Material for probe pins |
| 09/06/2006 | EP1698905A2 Nano-drive for high resolution positioning and for positioning of a multi-point probe |
| 09/06/2006 | EP1698904A1 Conductive contact holder, conductive contact unit and process for producing conductive contact holder |
| 09/06/2006 | EP1697989A2 Connector for making electrical contact at semiconductor scales and method for forming same |
| 08/31/2006 | US20060192581 Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 08/31/2006 | US20060192575 Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 08/31/2006 | US20060191136 Method Of Making Microelectronic Spring Contact Array |
| 08/30/2006 | CN1272632C Wafer-level burn-in and test |
| 08/30/2006 | CN1272234C Method for forming microelectronic spring structures on a substrate |
| 08/24/2006 | US20060185164 Methods for making plated through holes usable as interconnection wire or probe attachments |
| 08/23/2006 | EP1692529A2 Die design with integrated assembly aid |
| 08/23/2006 | CN1821788A Embedded type micro contact element and its producing method |
| 08/22/2006 | US7095241 Anisotropic conductive connector, probe member, wafer inspecting device, and wafer inspecting method |
| 08/22/2006 | US7094615 Method of controlling probe tip sanding in semiconductor device testing equipment |
| 08/16/2006 | EP1691206A2 Method and apparatus for testing semiconductor dice |
| 08/16/2006 | EP1690283A2 Methods for making vertical electrical feed through structures |
| 08/16/2006 | EP1301827B1 Photolithographically-patterned out-of-plane coil structures and method of making |
| 08/10/2006 | US20060174690 Gas sensor and method of producing gas sensor |
| 08/09/2006 | CN1816748A Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 08/09/2006 | CN1815825A Micro contact-element and making method |
| 08/08/2006 | US7087501 Manufacture of probe unit having lead probes extending beyond edge of substrate |
| 08/03/2006 | US20060171425 Probe and method of making same |
| 08/03/2006 | US20060169678 Probe positioning and bonding device and probe bonding method |
| 08/02/2006 | EP1685415A2 Method for forming photo-defined micro electrical contacts |
| 08/02/2006 | CN2802510Y 探针装置 Probe device |
| 08/01/2006 | US7084650 Apparatus and method for limiting over travel in a probe card assembly |
| 08/01/2006 | US7082682 Contact structures and methods for making same |
| 08/01/2006 | US7082669 Method of manufacturing a substrate of a rotary encoder |
| 07/27/2006 | US20060162955 Test card assembly |
| 07/27/2006 | US20060162474 End face sensor and method of producing the same |
| 07/25/2006 | US7081767 Electroconductive contact unit |
| 07/20/2006 | US20060157839 Re-assembly process for MEMS structures |
| 07/18/2006 | US7079957 Method and system for active tip clearance control in turbines |
| 07/11/2006 | US7073246 Method of making a biosensor |
| 07/06/2006 | US20060144423 Probe card needle cleaning frequency optimization |
| 07/05/2006 | EP1629288A4 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
| 07/04/2006 | US7069638 Air socket for testing integrated circuits |
| 06/29/2006 | US20060139038 Hollow microprobe using a mems technique and a method of manufacturing the same |
| 06/29/2006 | US20060138076 Method for making a planar suspended microstructure, using a sacrificial layer of polymer material and resulting component |
| 06/29/2006 | DE69635227T2 Kontakträger zum bestücken von substraten mit federkontakten Contact carrier of fitting substrates with spring contacts |
| 06/27/2006 | US7065870 Segmented contactor |
| 06/22/2006 | US20060134378 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 06/20/2006 | US7063541 Composite microelectronic spring structure and method for making same |
| 06/14/2006 | CN1788203A Alignment features in a probing device |
| 06/14/2006 | CN1788202A Sheet-like probe, process for producing the same and its application |
| 06/13/2006 | US7061262 Highly resilient cantilever spring probe for testing ICs |
| 06/13/2006 | US7059865 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 06/08/2006 | US20060119523 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 06/08/2006 | US20060119522 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 06/08/2006 | DE10237283B4 Vorrichtung und Verfahren zum Reinigen von Sondennadeln einer Testsondenvorrichtung Apparatus and method for cleaning probe needles of a test probe device |
| 06/07/2006 | CN1784606A Board for probe card,inspection apparatus,photo-fabrication apparatus and photo-fabrication method |
| 05/31/2006 | EP1391265B1 Contactor cleaning sheet, and contactor cleaning method |
| 05/30/2006 | US7053646 Apparatus and method for use in testing a semiconductor wafer |
| 05/25/2006 | US20060109016 Microprobe tips and methods for making |
| 05/24/2006 | CN1257410C Conductive measuring probe |
| 05/23/2006 | US7049838 Semiconductor device tester with slanted contact ends |
| 05/23/2006 | US7049837 Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method |