| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
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| 02/19/2009 | US20090045809 Magnetic sensor and manufacturing method of the same |
| 02/17/2009 | US7492164 Method for manufacturing a product sensor, and a product sensor |
| 02/12/2009 | US20090039905 Composite conductive sheet, method for producing the same, anisotropic conductive connector, adapter, and circuit device electric inspection device |
| 02/12/2009 | US20090039904 Probe card, production method thereof and repairing method of probe card |
| 02/10/2009 | US7489149 Shielded probe for testing a device under test |
| 02/05/2009 | US20090033349 Probe assembly |
| 02/05/2009 | US20090031552 Thin-film structure magnetizable bead detector |
| 02/04/2009 | CN100458450C Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 01/29/2009 | US20090027048 Three-Axis Magnetic Sensor and Method for Manufacturing the Same |
| 01/28/2009 | CN101354405A Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 01/27/2009 | US7482824 Polycrystalline contacting component and test tool having the contacting component |
| 01/27/2009 | US7482823 Shielded probe for testing a device under test |
| 01/27/2009 | US7482822 Apparatus and method for limiting over travel in a probe card assembly |
| 01/20/2009 | US7479792 Methods for making plated through holes usable as interconnection wire or probe attachments |
| 01/15/2009 | US20090015251 Magnetic sensor and production method thereof |
| 01/14/2009 | EP1610132B1 Fabricating interconnects using sacrificial substrates |
| 01/14/2009 | CN100451659C Sheetlike probe, its manufacturing method and its application |
| 01/08/2009 | US20090009200 Method for Providing Alignment of a Probe |
| 01/07/2009 | EP2012131A1 Contact probe and method of making the same |
| 01/01/2009 | US20090002005 Substrate Probe Card and Method for Regenerating Thereof |
| 01/01/2009 | US20090002004 Integrated compound nano probe card and method of making same |
| 12/30/2008 | US7469462 Method of assembling an electronic control pedal assembly |
| 12/25/2008 | US20080314117 Gas sensor with improved sealing structure and method of manufacturing the same |
| 12/25/2008 | US20080313882 Sensing unit and method of making same |
| 12/24/2008 | CN100446355C Micro contact-element and making method |
| 12/18/2008 | US20080309362 Probe assembly with probes for electrical testing |
| 12/11/2008 | US20080302184 Acceleration sensor and fabrication method thereof |
| 12/04/2008 | US20080297183 Probe card having columnar base portion and method of producing the same |
| 12/04/2008 | US20080297176 Capacitive Sensor and Method for Manufacturing the Same |
| 12/02/2008 | US7458123 Apparatuses and methods for cleaning test probes |
| 11/20/2008 | US20080284458 Method for Forming Connection Pin, Probe, Connection Pin, Probe Card and Method for Manufacturing Probe Card |
| 11/19/2008 | CN101308820A Manufacturing method of semiconductor integrated circuit device and probe card |
| 11/19/2008 | CN101308819A Manufacturing method of semiconductor integrated circuit device and probe card |
| 11/19/2008 | CN100435317C Manufacturing method of semiconductor integrated circuit device and probe card |
| 11/18/2008 | US7452438 Method of fixing a probe needle to a needle fixture of a probe card in semiconductor inspection equipment |
| 11/18/2008 | US7451537 Method for fabricating a microscale anemometer |
| 11/13/2008 | US20080280382 Wafer-level test module for testing image sensor chips, the related test method and fabrication |
| 11/06/2008 | US20080275332 Head Coil and Neurovascular Array for Parallel Imaging Capable Magnetic Resonance Systems |
| 11/06/2008 | DE19952183B4 Einrichtung zur Spitzenformung Means for forming top |
| 11/05/2008 | CN100431127C Silicon wafer for probe bonding and probe bonding method using thereof |
| 11/04/2008 | US7444733 Alignment precision enhancement of electronic component process on flexible substrate device and method thereof the same |
| 10/30/2008 | US20080265927 Tester on a probe card |
| 10/29/2008 | EP1200992B1 Resilient interconnect structure for electronic components and method for making the same |
| 10/28/2008 | US7441322 Method of manufacturing a magnetic detection apparatus |
| 10/23/2008 | WO2008127242A1 Dual arcuate blade probe tip |
| 10/23/2008 | WO2008127241A1 Pronged fork probe tip |
| 10/23/2008 | US20080258735 Non-Metallic Flow-Through Electrodeless Conductivity Sensor and Leak Detector |
| 10/16/2008 | US20080254651 Spring interconnect structures |
| 10/14/2008 | US7436194 Shielded probe with low contact resistance for testing a device under test |
| 10/08/2008 | CN100424513C Apparatus and method for limiting over travel in a probe card assembly |
| 10/02/2008 | US20080238467 Reinforced contact elements |
| 10/02/2008 | US20080238464 System and method of mitigating effects of component deflection in a probe card analyzer |
| 10/01/2008 | EP1188061B1 Segmented contactor |
| 10/01/2008 | CN101275972A Semiconductor element test structure |
| 10/01/2008 | CN100423221C Method for manufacturing electrical contact element for testing electro device and electrical contact element thereby |
| 09/17/2008 | CN100419435C Board for probe card,inspection apparatus,photo-fabrication apparatus and photo-fabrication method |
| 09/10/2008 | EP1489695B1 Anisotropic conductive film and method for producing the same |
| 09/04/2008 | US20080209721 Multipoint nanoprobe and method for fabrication |
| 09/03/2008 | EP1963869A1 Probe card assembly |
| 09/02/2008 | US7420380 Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method |
| 08/27/2008 | CN100414302C Method for manufacturing probe pin, and method for manufacturing of probe card |
| 08/21/2008 | US20080196499 Multiple axis transducer with multiple sensing range capability |
| 08/20/2008 | EP1959262A1 Test of electronic devices using boards without sockets |
| 08/20/2008 | CN100413045C Anisotropically conductive connector, probe material member, wafer inspection apparatus, and wafer inspection method |
| 08/13/2008 | EP1194784B1 Temperature compensated vertical pin probing device |
| 08/06/2008 | CN101238380A Method and apparatus for cleaning a probe card |
| 07/29/2008 | US7404248 Producing method of producing a solid pickup device |
| 07/29/2008 | US7404247 Method for making a pressure sensor |
| 07/24/2008 | US20080174332 Electrochemically fabricated microprobes |
| 07/24/2008 | US20080172870 Test device for electrical testing of a unit under test, as well as a method for production of a test drive |
| 07/22/2008 | US7401397 Method of producing an inertial sensor |
| 07/16/2008 | EP1944613A1 Probe card for test and manufacturing method thereof |
| 07/16/2008 | CN100403506C Probe positioning and bonding device and probe bonding method |
| 07/15/2008 | US7400159 Integrated complex nano probe card and method of making same |
| 07/15/2008 | US7398588 SOI component comprising margins for separation |
| 07/10/2008 | US20080164896 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 07/03/2008 | US20080160195 compound probe pins arranged in substrate layer; bundle of aligned parallel nanotubes/nanorods and a bonding material |
| 07/02/2008 | EP1939640A2 Inspection method, inspection apparatus and computer-readable storage medium storing program |
| 07/01/2008 | US7392563 Probe pin cleaning system |
| 06/26/2008 | US20080150566 Alignment features in a probing device |
| 06/26/2008 | US20080150563 Probe card for semiconductor IC test and method of manufacturing the same |
| 06/25/2008 | EP1444528B1 Electrical test probes and methods of making the same |
| 06/24/2008 | US7391227 Sheet-like probe, process for producing the same and its application |
| 06/24/2008 | US7390442 comprises a metal powder having the form of a lot of fine metal particles being linked in a chain shape as a conductive component formed of a metal having paramagnetism |
| 06/24/2008 | US7389576 Method of manufacturing micro flux gate sensor |
| 06/12/2008 | US20080138774 Braille display device using electrorheological fluid and manufacturing method thereof |
| 06/12/2008 | US20080136428 Contacting component, method of producing the same, and test tool having the contacting component |
| 06/12/2008 | US20080134793 Modular sensor assembly and methods of fabricating the same |
| 06/10/2008 | US7386816 Method for manufacturing an electronic device having an electronically determined physical test member |
| 06/10/2008 | US7385409 System and method of mitigating effects of component deflection in a probe card analyzer |
| 06/05/2008 | US20080132095 Method of making a socket to perform testing on integrated circuits and socket made |
| 06/05/2008 | US20080132094 High density integrated circuit apparatus, test probe and methods of use thereof |
| 06/05/2008 | US20080129320 High density integrated circuit apparatus, test probe and methods of use thereof |
| 06/05/2008 | US20080129319 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/29/2008 | US20080123310 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/29/2008 | US20080121879 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080117613 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080117612 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080117611 High density integrated circuit apparatus, test probe and methods of use thereof |
| 05/22/2008 | US20080116916 High density integrated circuit apparatus, test probe and methods of use thereof |