| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
|---|
| 02/25/2003 | US6524115 Compliant interconnect assembly |
| 02/25/2003 | US6523255 Process and structure to repair damaged probes mounted on a space transformer |
| 02/20/2003 | WO2003015155A1 Method of manufacturing thin film sheet with bumps and thin film sheet with bumps |
| 02/19/2003 | CN1398448A Contact structure and prodn. method thereof and probe contact assembly using same |
| 02/19/2003 | CN1398351A Adapter for testing printed circuit boards and testing needle for such adapter |
| 02/13/2003 | US20030033111 Method of detecting the position of an inner surface of a workpiece on a machine tool, and machine tool implementing such a method |
| 02/11/2003 | US6518781 Probe structure and manufacturing method thereof |
| 02/11/2003 | US6518780 Electrical test probe wedge tip |
| 02/06/2003 | US20030027423 Contact structure and production method thereof and probe contact assembly using same |
| 02/06/2003 | US20030027081 Photolithographically-patterned out-of-plane coil structures and method of making |
| 01/30/2003 | US20030020502 Contact probe member and manufacturing method of the same |
| 01/28/2003 | US6511857 Process for manufacturing semiconductor device |
| 01/23/2003 | WO2003007430A1 Feed-through manufacturing method and feed-through |
| 01/23/2003 | US20030015013 Semi-automated probe bender |
| 01/22/2003 | EP1277696A2 Spring with conductive coating |
| 01/21/2003 | US6509208 Method for forming structures on a wafer |
| 01/16/2003 | WO2003005042A1 Conductive contact |
| 01/16/2003 | WO2002058137A3 Composite microelectronic spring structure and method for making same |
| 01/16/2003 | US20030010615 Microspring with conductive coating deposited on tip after release |
| 01/15/2003 | EP1275150A2 Shaped springs and methods of fabricating and using shaped springs |
| 01/14/2003 | US6507204 Semiconductor testing equipment with probe formed on a cantilever of a substrate |
| 01/09/2003 | WO2003003027A1 Support body assembly for conductive contactor |
| 01/09/2003 | US20030006788 Inspection apparatus and probe card |
| 01/09/2003 | US20030006755 Micro-tools |
| 01/07/2003 | US6504389 Test carrier for packaging semiconductor components having contact balls and calibration carrier for calibrating semiconductor test systems |
| 01/07/2003 | US6504223 Contact structure and production method thereof and probe contact assembly using same |
| 01/02/2003 | US20030003740 Contact structure production method |
| 01/01/2003 | CN1388900A Inspection unit and method of manufacturing substrate |
| 12/26/2002 | US20020195122 Test carrier for temporarily packaging bumped semiconductor components in which contact balls on the components are protected during test procedures; made of wear resistant material |
| 12/26/2002 | US20020194730 Process and structure to repair damaged probes mounted on a space transformer |
| 12/24/2002 | US6497805 Method for shorting pin grid array pins for plating |
| 12/19/2002 | WO2002101830A2 Electronic components with plurality of contoured microelectronic spring contacts |
| 12/19/2002 | US20020192939 Method of manufacturing a contract element and a multi-layered wiring substrate, and wafer batch contact board |
| 12/19/2002 | US20020190738 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |
| 12/19/2002 | US20020190737 Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus |
| 12/19/2002 | US20020190736 Substrate Testing apparatus and substrate testing method |
| 12/19/2002 | US20020189648 Method and apparatus for cleaning electrical probes |
| 12/18/2002 | CN1386198A Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 12/17/2002 | US6496001 System and method for probe mechanism planarization |
| 12/10/2002 | US6492599 Multilayer wiring board, manufacturing method thereof, and wafer block contact board |
| 12/10/2002 | US6491968 Methods for making spring interconnect structures |
| 12/05/2002 | WO2002097452A1 Method for manufacture of probe pin, and method for manufacture of probe card |
| 12/05/2002 | US20020182796 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 12/05/2002 | US20020180473 Single-sided compliant probe apparatus |
| 12/05/2002 | US20020180454 Inspection unit and method of manufacturing substrate |
| 12/05/2002 | US20020179904 Contact structure production method |
| 11/28/2002 | WO2002094508A1 Contactor cleaning sheet, and contactor cleaning method |
| 11/21/2002 | US20020171414 Method for optimizing probe card analysis and scrub mark analysis data |
| 11/20/2002 | CN1380979A Probe card and method of producing the same |
| 11/14/2002 | WO2002090054A2 Contactor cleaning sheet, contactor cleaning sheet manufacturing method, and contactor cleaning method |
| 11/07/2002 | US20020163349 Probe card and method of producing the same |
| 11/06/2002 | EP1254874A1 Carbon-containing aluminum nitride sintered compact, and ceramic substrate for use in apparatus for manufacturing and inspecting semiconductor |
| 11/05/2002 | US6476333 Raised contact structures (solder columns) |
| 11/05/2002 | US6474350 Cleaning device for probe needle of probe card and washing liquid used therefor |
| 10/29/2002 | US6472890 Method for producing a contact structure |
| 10/29/2002 | US6471538 Contact structure and production method thereof and probe contact assembly using same |
| 10/24/2002 | WO2002083364A1 Implement for cleaning tip and lateral surface of contactor |
| 10/24/2002 | US20020155735 Contact structure and production method thereof and probe contact assembly using same |
| 10/24/2002 | US20020153913 Probe for the probe card |
| 10/24/2002 | US20020153912 Compliant probe apparatus |
| 10/24/2002 | US20020153911 Probe structure for testing semiconductor devices and method for fabricating the same |
| 10/24/2002 | DE10113786A1 Sampling method for measuring frequency of an input signal with a base frequency uses Fourier transformation |
| 10/17/2002 | WO2002082104A1 Probe substrate and method of manufacturing the probe substrate |
| 10/17/2002 | US20020149386 Blade-like connecting needle |
| 10/16/2002 | EP0729652B1 Method for fabricating a contact structure for interconnections, interposer, semiconductor assembly |
| 10/15/2002 | US6466043 Contact structure for electrical communication with contact targets |
| 10/09/2002 | EP1248292A1 Inspection apparatus and probe card |
| 10/03/2002 | US20020142509 Having first interlayer film serving not only as layer to form contact or via hole but also etch stop layer in etching second interlayer film to form interconnect trench opened to contact hole |
| 09/26/2002 | US20020137316 Manufacture of probe unit having lead probes extending beyong edge of substrate |
| 09/26/2002 | US20020135387 Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof |
| 09/25/2002 | EP1243379A2 Method of detecting the position of an inner surface of a workpiece on a machine tool, and machine tool implementing such a method |
| 09/24/2002 | US6455335 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 09/23/2002 | CA2378092A1 Method of detecting the position of an inner surface of a workpiece on a machine tool, and machine tool implementing such a method |
| 09/18/2002 | EP1241481A2 Contact structure for interconnections, interposer, semiconductor assembly and method |
| 09/17/2002 | US6452406 Probe structure having a plurality of discrete insulated probe tips |
| 09/12/2002 | US20020127812 Probe pin for testing electrical characteristics of apparatus, probe card using probe pins |
| 09/12/2002 | US20020125124 Method for shorting pin grid array pins for plating |
| 09/06/2002 | WO2002068321A2 Forming tool for forming a contoured microelectronic spring mold |
| 09/05/2002 | US20020123252 Contact structure and production method thereof and probe contact assembly using same |
| 09/05/2002 | US20020121912 Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 08/27/2002 | US6440771 Method for constructing a wafer interposer by using conductive columns |
| 08/22/2002 | WO2002064496A2 Method for forming microelectronic spring structures on a substrate |
| 08/21/2002 | EP1233272A1 Manufacturing procedure for a probe adapter using a light sensitive photopolymer |
| 08/20/2002 | US6437591 Test interconnect for bumped semiconductor components and method of fabrication |
| 08/20/2002 | US6436802 Method of producing contact structure |
| 08/14/2002 | EP1231474A2 Method and apparatus for locating faulty pins in a test adapter and pin drawing tool |
| 08/14/2002 | DE10107794A1 Kontaktiereinrichtung für elektronische Bauteile The contacting of electronic components |
| 08/08/2002 | WO2002061443A1 Nickel alloy probe card frame laminate |
| 08/08/2002 | WO2002061439A1 Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 08/08/2002 | US20020107204 Protease-activated receptor-1 or 2 (PAR-1, PAR-2) |
| 08/01/2002 | WO2000075677A9 Segmented contactor |
| 08/01/2002 | US20020102746 Method of manufacturing probe unit and probe unit manufactured using this method |
| 07/31/2002 | CN1361725A Membrane probing system |
| 07/30/2002 | US6426638 Compliant probe apparatus |
| 07/25/2002 | WO2002058137A2 Composite microelectronic spring structure and method for making same |
| 07/25/2002 | US20020097060 Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter |
| 07/16/2002 | US6420891 Wafer prober for in-line cleaning probe card |
| 07/16/2002 | US6420884 Contact structure formed by photolithography process |
| 07/16/2002 | US6419500 Probe assembly having floatable buckling beam probes and apparatus for abrading the same |
| 07/11/2002 | US20020089344 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof |