| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
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| 10/02/2007 | US7276920 Packaging and interconnection of contact structure |
| 09/26/2007 | CN100339985C Shaped springs and methds of fabricating and using shaped springs |
| 09/25/2007 | US7274197 Contact system for interfacing a semiconductor wafer to an electrical tester |
| 09/20/2007 | WO2005076832A3 Method for manufacturing single wall carbon nanotube tips |
| 09/20/2007 | US20070214875 Cantilever and cantilever manufacturing method |
| 09/19/2007 | EP1624309B1 Sheet-like probe, process for producing the same and its application |
| 09/18/2007 | US7271015 Manufacturing method of semiconductor integrated circuit device and probe card |
| 09/12/2007 | EP1831703A1 Reinforced probes for testing semiconductor devices |
| 09/06/2007 | US20070207559 Fabrication method of semiconductor integrated circuit device |
| 09/06/2007 | US20070205783 Sheet-Like Probe, Method Of Producing The Probe, And Application Of The Probe |
| 09/05/2007 | CN101030548A Micro-mechanical wafer chip test detecting card and its production |
| 08/30/2007 | US20070200574 Sheet-like probe, method of producing the probe, and application of the probe |
| 08/29/2007 | CN101024480A Method for forming microelectronic spring structures on a substrate |
| 08/23/2007 | US20070193353 Silicon inertial sensors formed using MEMS |
| 08/22/2007 | CN1333452C A hollow microprobe using a mems technique and a method of manufacturing the same |
| 08/16/2007 | US20070190671 Manufacturing method of semiconductor integrated circuit device and probe card |
| 08/14/2007 | US7256592 Probe with trapezoidal contractor and device based on application thereof, and method of producing them |
| 08/14/2007 | US7254861 Device for cleaning tip and side surfaces of a probe |
| 08/09/2007 | US20070180916 Capacitive micromachined ultrasound transducer and methods of making the same |
| 08/08/2007 | CN101014865A A highly resilient cantilever spring probe for testing ics |
| 08/02/2007 | US20070178814 Method of cleaning a probe |
| 07/25/2007 | CN101006347A Stacked tip cantilever electrical connector |
| 07/18/2007 | EP1553623B1 Anisotropic conductivity probe |
| 07/18/2007 | CN1327502C Inspection device and method for manufacturing the same |
| 07/18/2007 | CN101002311A Method and apparatus for producing co-planar bonding pads on a substrate |
| 07/17/2007 | US7245137 Test head assembly having paired contact structures |
| 07/17/2007 | US7244125 Connector for making electrical contact at semiconductor scales |
| 07/17/2007 | US7243410 Method for manufacturing a probe card |
| 07/12/2007 | WO2007078493A1 Probe card assembly |
| 07/12/2007 | US20070161285 Electrically-conductive-contact holder, electrically-conductive-contact unit, and method for manufacturing electrically-conductive-contact holder |
| 07/03/2007 | US7239127 Apparatus and method for inspecting electronic circuits |
| 07/03/2007 | US7237316 Method for fabricating a three-dimensional acceleration sensor |
| 06/28/2007 | US20070145885 Organic el panel |
| 06/28/2007 | US20070144841 Miniaturized Contact Spring |
| 06/26/2007 | US7235413 Fabrication method of semiconductor integrated circuit device |
| 06/20/2007 | EP1798561A1 Treating method for probes positioned on a test card |
| 06/14/2007 | US20070134824 Probe card and method for manufacturing probe card |
| 06/14/2007 | DE19957326B4 Verfahren zur Herstellung von Kontaktstrukturen A method for producing contact structures |
| 06/07/2007 | US20070126444 Probe with trapezoidal contactor and device based on application thereof, and method of producing them |
| 06/07/2007 | US20070124932 Probe with trapezoidal contactor and device based on application thereof, and method of producing them |
| 05/31/2007 | US20070119233 Sensor for detecting particles in a gas stream and method for its manufacture |
| 05/30/2007 | CN1973208A A method for providing alignment of a probe |
| 05/30/2007 | CN1973207A Sheetlike probe, its manufacturing method and its application |
| 05/24/2007 | US20070117234 Sputtered Spring Films With Low Stress Anisotropy |
| 05/24/2007 | DE10393364B4 Lochmikrosonde unter Nutzung einer MEMS-Technik und ein Verfahren zur Herstellung derselben Hollow microprobe using an MEMS technique and a method of manufacturing the same |
| 05/22/2007 | US7219426 Method of manufacturing protruding-volute contact |
| 05/15/2007 | US7216417 Method for manufacturing an electromechanical sensor element |
| 05/10/2007 | US20070103181 System and method of mitigating effects of component deflection in a probe card analyzer |
| 05/10/2007 | US20070103180 Universal wafer carrier for wafer level die burn-in |
| 05/10/2007 | DE10003282B4 Kontaktstruktur Contact structure |
| 05/09/2007 | EP1782078A1 A method for providing alignment of a probe |
| 05/09/2007 | EP1782077A1 Stacked tip cantilever electrical connector |
| 05/09/2007 | EP1362005B1 Method for forming electrically conductive contact structures |
| 05/09/2007 | CN1314970C Probe unit and its manufacturing method |
| 05/08/2007 | US7215131 Segmented contactor |
| 05/08/2007 | US7213323 Method of forming an electronic pressure sensitive transducer on a printed circuit board |
| 05/02/2007 | CN1957454A Silicon wafer for probe bonding and probe bonding method using thereof |
| 05/02/2007 | CN1957259A Sheetlike probe, its manufacturing method and its application |
| 05/01/2007 | US7212019 Probe needle for testing semiconductor chips and method for producing said probe needle |
| 05/01/2007 | US7211795 Method for manufacturing single wall carbon nanotube tips |
| 05/01/2007 | US7211155 Apparatuses and methods for cleaning test probes |
| 04/25/2007 | EP1777194A2 Method for forming microelectronic spring structures on a substrate |
| 04/18/2007 | EP1774583A2 Method and apparatus for producing co-planar bonding pads on a substrate |
| 04/17/2007 | US7204010 Method of making a load sensor plate |
| 04/12/2007 | US20070080698 Contact System for Wafer Level Testing |
| 04/05/2007 | US20070075716 Probe for testing a device under test |
| 04/05/2007 | US20070074392 Membrane probing system |
| 04/04/2007 | CN1308693C Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 04/03/2007 | US7198962 Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step |
| 03/29/2007 | US20070069744 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
| 03/29/2007 | US20070069743 Sheet-like probe, process for producing the same and its application |
| 03/21/2007 | EP1365250B1 Method of manufacturing contact probe |
| 03/21/2007 | CN1933119A Contactor having contact electrodes formed by laser processing |
| 03/13/2007 | US7189078 See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 03/13/2007 | US7189077 Lithographic type microelectronic spring structures with improved contours |
| 03/08/2007 | US20070054513 Methods of fabricating and using shaped springs |
| 03/07/2007 | CN1926676A Probe positioning and bonding device and probe bonding method |
| 03/07/2007 | CN1926438A See-saw interconnect assembly with dielectric carrier grid providing spring suspension |
| 03/01/2007 | US20070045874 Lithographic Type Microelectronic Spring Structures with Improved Contours |
| 03/01/2007 | US20070044545 Oscillator and method of making for atomic force microscope and other applications |
| 02/22/2007 | US20070039387 Movement detector having six degrees of freedom with three position sensors and method for the production of a sensor |
| 02/20/2007 | US7180312 Probe card and method for manufacturing probe card |
| 02/20/2007 | US7178236 Method for constructing a membrane probe using a depression |
| 02/13/2007 | US7176702 Contact system for wafer level testing |
| 02/13/2007 | US7174629 Integrated circuit contactor, and method and apparatus for production of integrated circuit contactor |
| 02/08/2007 | WO2007016599A1 Method and apparatus for cleaning a probe card |
| 02/08/2007 | WO2007015713A1 Torsion spring probe contactor design |
| 02/08/2007 | US20070028667 Electronic nose sensor array, sensor system including the same, method of manufacturing the same, and analysis method using the sensor system |
| 02/07/2007 | CN1299344C Device for testing semiconductor device |
| 02/06/2007 | US7172707 Sputtered spring films with low stress anisotropy |
| 01/30/2007 | US7170307 System and method of mitigating effects of component deflection in a probe card analyzer |
| 01/24/2007 | CN1900725A Lithographic contact elements |
| 01/24/2007 | CN1296716C Probe device and its manufacturing method |
| 01/23/2007 | US7167014 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 01/23/2007 | US7167012 Universal wafer carrier for wafer level die burn-in |
| 01/18/2007 | US20070012108 Method for manufacturing a micromechanical motion sensor, and a micromechanical motion sensor |
| 01/18/2007 | US20070012087 Sensor |
| 01/17/2007 | EP1744167A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 01/17/2007 | EP1744166A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 01/17/2007 | CN1898572A Conductive contact holder, conductive contact unit and process for producing conductive contact holder |