Patents
Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138)
04/2011
04/06/2011CN102004180A Current sensor and method for manufacturing sensor module for use in current sensor
04/05/2011US7918012 Method of making calibration-adjusted analyte sensors
03/2011
03/24/2011WO2011034280A2 Superconducting quantum interference device (squid) sensor, and method for manufacturing same
03/16/2011EP2295990A1 Contact probe pin for semiconductor test apparatus
03/08/2011US7901958 Fabrication method of semiconductor integrated circuit device
03/03/2011US20110049369 Device to detect thermal radiation with high resolution method to manufacture and use the device
03/01/2011US7897435 Re-assembly process for MEMS structures
03/01/2011US7895728 Method of making a rolled elastomer actiuator
02/2011
02/22/2011US7891078 Sensor-based feedback method for improved assembly of vacuum electronic devices
02/17/2011WO2011019160A2 Method for manufacturing a probe to be used in a semiconductor test or a flat panel display device test
02/16/2011CN101976723A Manufacture method of current isolator
02/16/2011CN101275972B Semiconductor element test structure
02/10/2011WO2011015659A1 Delivery device with sensor and one or more cannulas
02/10/2011CA2766961A1 Delivery device with sensor and one or more cannulas
02/08/2011US7885775 Processing of a signal representing radiation
02/03/2011US20110024711 Apparatus for reducing photodiode thermal gain coefficient and method of making same
02/03/2011US20110023630 Circuit compensation in strain gage based transducers
02/03/2011US20110023618 Low pressure sensor device with high accuracy and high sensitivity
02/02/2011CN101963631A High-current direct current sensor and manufacturing method thereof
01/2011
01/27/2011US20110017597 Method for fabricating hydrogen electrochemical sensor using tetramethylammonium hydroxide pentahydrate
01/25/2011US7876088 Contacting component, method of producing the same, and test tool having the contacting component
01/13/2011DE112009000415T5 Testsystem mit Hochfrequenzinterposer Test system with high frequency interposer
01/11/2011US7866026 Method for making calibration-adjusted sensors
01/06/2011US20110001396 Compact pressure-sensing device
01/04/2011US7864976 Speaker
01/04/2011US7861397 Method of making an electrochemical sensor
12/2010
12/23/2010US20100321046 Wipeable conductivity probe and method of making same
12/23/2010US20100319184 Method of Collective Fabrication of Calibration-Free Temperature and/or Strain Sensors by Matching of Resonators on the Basis of Resonant Frequency and Static Capacitance Criteria
12/02/2010US20100304510 Fabrication method of semiconductor integrated circuit device
11/2010
11/30/2010US7841863 Spring interconnect structures
11/23/2010US7836959 Providing a sensor array
11/16/2010US7834647 Alignment features in a probing device
11/11/2010US20100281978 Inertial sensor and producing method thereof
11/10/2010EP2248920A1 Iridium alloy excellent in hardness, processability and stain proofness
11/09/2010US7827671 Method for the manufacturing of balanced transducers
11/02/2010US7824098 Composite mechanical transducers and approaches therefor
11/02/2010US7823467 Requiring no power supply based on electroactive polymer(EAP)/metal composites; perfluorinated ion exchange resin membrane plated with gold electrodes; signals in response to applied mechanical force; senses direction of applied force; grafting; tissue engineering; microfluidics; artificial muscles
11/02/2010US7823268 Angular transducer unit and method for its manufacture, as well as angular switching device and device for the detection of objects
10/2010
10/26/2010US7822568 Method and apparatus for quantitating surface-binding optical resonance profiles
10/26/2010US7818871 Disc resonator gyroscope fabrication process requiring no bonding alignment
10/20/2010CN101865937A Multilayer probe set and manufacturing method thereof
10/12/2010US7813883 Remotely reconfigurable system for mapping subsurface geological anomalies
10/07/2010US20100251537 Through-Wafer Interconnections in Electrostatic Transducer and Array
10/06/2010CN1900725B Lithographic contact elements
09/2010
09/28/2010US7804312 Silicon wafer for probe bonding and probe bonding method using thereof
09/21/2010US7797814 Method of making an electrochemical sensor
09/15/2010CN101308819B Manufacturing method of semiconductor integrated circuit device and probe card
09/14/2010US7793394 Method of producing piezoelectric actuator
09/09/2010US20100223797 Nanowire magnetic sensor
09/08/2010CN101424706B Test anchor point making method and test anchor point and veneer
09/02/2010US20100219844 Foreign object detection sensor and method for manufacturing the same
08/2010
08/25/2010CN101813716A Manufacturing method of large generator stator bar electrical-heating aging test device
08/17/2010USRE41515 Contactor and production method for contactor
08/04/2010CN1762050B Probe and method of making same
07/2010
07/28/2010EP1729174B1 Photolithographically-patterned out-of-plane coil structures and method of making
07/13/2010US7755274 Organic EL panel
07/08/2010WO2010077744A1 Prober cleaning block assembly
06/2010
06/30/2010CN101762723A A probe card manufacturing method including sensing probe and the probe card, probe card inspection system
06/23/2010CN101750525A Manufacture method of test socket and elastic test probe used by same
06/23/2010CN101750523A Elastic test probe and manufacturing method thereof
06/17/2010US20100148779 Transverse gradient coil for mri systems and method for manufacturing the same
06/17/2010US20100146771 Method for producing a vacuum measuring cell of the membrane type
06/16/2010CN101738514A Method for manufacturing test carrier plate with metal mat of repairing layer
06/15/2010US7737707 Sheet-like probe, method of producing the probe, and application of the probe
06/10/2010US20100141955 Sensor probe for fiber-based current sensor
06/10/2010US20100139081 Method for assembling a high-dynamic and high-spatial resolution eddy current testing head
06/09/2010CN101726641A Manufacture method of conducting elastic body
06/08/2010US7730602 Production method for a magnetostrictive torque sensor
06/03/2010US20100132479 Magnetic-inductive flowmeter
06/02/2010CN101308820B Manufacturing method of semiconductor integrated circuit device and probe card
05/2010
05/27/2010US20100126002 Temperature probe and method of making the same
05/26/2010CN1821788B Embedded type micro contact element and its producing method
05/25/2010US7721412 Method of making an electrochemical sensor
05/11/2010US7712203 Method of manufacturing a sensor apparatus
04/2010
04/29/2010US20100101331 Electromagnetic flow meter
04/22/2010WO2010043196A1 Device for positioning and contacting test contacts
04/15/2010US20100088888 Lithographic contact elements
04/01/2010US20100077835 Particulate matter sensor
03/2010
03/30/2010US7685708 Multipoint nanoprobe method of making
03/30/2010US7685696 Method of manufacturing an electromechanical sensor element
03/25/2010US20100073019 Apparatus for obtaining planarity measurements with respect to a probe card analysis system
03/18/2010US20100066397 Alignment features in a probing device
03/16/2010US7676901 Producing method of solid state pickup device, and attaching method and device for the same
03/11/2010US20100058873 Sensor assemblage and method for manufacturing a sensor assemblage
03/09/2010US7675301 Electronic components with plurality of contoured microelectronic spring contacts
03/04/2010WO2010023344A1 Ultrasound device for the emission of acoustic waves in air in the ultrasonic range
03/04/2010US20100052715 High density integrated circuit apparatus, test probe and methods of use thereof
03/04/2010US20100052709 Wing-shaped support members for enhancing semiconductor probes and methods to form the same
03/04/2010US20100052672 Integrated circuit with magnetic material magnetically coupled to magneto-resistive sensing element
03/02/2010US7671612 Integrated compound nano probe card and method of making same
03/02/2010US7671609 Sheet-like probe, method of producing the probe, and application of the probe
02/2010
02/25/2010US20100045324 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045321 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045320 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045318 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045317 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100045266 High density integrated circuit apparatus, test probe and methods of use thereof
02/25/2010US20100043226 Segmented contactor
02/25/2010US20100043202 Method of producing variant-shaped laminated core and variant-shaped laminated core produced by same
02/17/2010EP1321978B1 Contact structure
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