| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
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| 10/07/2004 | US20040198081 Microelectronic spring contact elements |
| 10/07/2004 | US20040196058 Method for fabricating a probe pin for testing electrical characteristics of an apparatus |
| 10/05/2004 | US6799976 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 09/30/2004 | WO2004084296A1 Probe positioning and bonding device and probe bonding method |
| 09/30/2004 | WO2004084295A1 Probe and method of making same |
| 09/30/2004 | WO2004083980A2 Method of mitigating effects of component deflection in a probe card analyzer |
| 09/28/2004 | US6797528 Micro probing tip made by micro machine method |
| 09/21/2004 | US6794737 Spring structure with stress-balancing layer |
| 09/16/2004 | DE10308916A1 Appliance for electric contacting substrate, containing integrated circuit with exposed contacts and contacting assembly with counter contacts on contacting plate in spacing corresponding to circuit contacts |
| 09/15/2004 | CN1529818A Conductive contact |
| 09/15/2004 | CN1166957C Probe for testing semiconductor device and its manufacture method and probe device used thereof |
| 09/14/2004 | US6791176 Lithographic contact elements |
| 09/08/2004 | CN1527945A Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 09/08/2004 | CN1527793A Method for forming microelectronic spring structures on a substrate |
| 09/02/2004 | US20040171268 Feed-through manufacturing method and feed-through |
| 08/31/2004 | US6784680 Contact probe with guide unit and fabrication method thereof |
| 08/25/2004 | EP0839323B1 Microelectronic spring contact elements |
| 08/24/2004 | US6780001 Forming tool for forming a contoured microelectronic spring mold |
| 08/19/2004 | WO2004070405A1 Probe card needle cleaning frequency optimization |
| 08/18/2004 | CN1522372A Support body assembly for conductive contactor |
| 08/17/2004 | US6777319 Microelectronic spring contact repair |
| 08/12/2004 | US20040157350 Method for forming photo-defined micro electrical contacts |
| 08/12/2004 | US20040155009 Method for manufacturing a probe card |
| 08/12/2004 | US20040154165 Method for manufacturing a probe pin and a probe card |
| 08/11/2004 | EP1444528A1 Electrical test probes and methods of making the same |
| 08/10/2004 | US6773938 Probe card, e.g., for testing microelectronic components, and methods for making same |
| 08/05/2004 | WO2004053976A3 Method of making a socket to perform testing on integrated circuits and such a socket |
| 08/05/2004 | US20040148773 Angled flying lead wire bonding process |
| 08/03/2004 | US6771084 Single-sided compliant probe apparatus |
| 07/28/2004 | EP1441231A1 Probe pin cleaning system and method |
| 07/28/2004 | EP1440957A2 Ceramic heater |
| 07/27/2004 | US6767219 Contactor, method for manufacturing such contactor, and testing method using such contactor |
| 07/22/2004 | US20040142583 Spring interconnect structures |
| 07/22/2004 | DE10297011T5 Elektrisch leitende Kontakteinheit Electrically conductive contact unit |
| 07/21/2004 | CN1514938A Method for mfg. of probe pin, and method for mfg. of probe card |
| 07/21/2004 | CN1158531C Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 07/20/2004 | US6765400 Inspection apparatus and probe card |
| 07/20/2004 | US6763578 Method and apparatus for manufacturing known good semiconductor die |
| 07/15/2004 | WO2004059331A2 Apparatus and method for limiting over travel in a probe card assembly |
| 07/15/2004 | US20040134516 Probe pin cleaning system and method |
| 07/14/2004 | CN1512186A Probe sheet, probe card, semiconductor detector and method for producing semiconductor device |
| 07/08/2004 | US20040130343 High density cantilevered probe for electronic devices |
| 07/01/2004 | US20040124519 Contact structure and production method thereof and probe contact assembly using same |
| 07/01/2004 | US20040124507 Contact structure and production method thereof |
| 06/24/2004 | WO2004053976A2 Method of making a socket to perform testing on integrated circuits and such a socket |
| 06/24/2004 | US20040119485 Probe finger structure and method for making a probe finger structure |
| 06/23/2004 | EP1431241A2 Probe finger structure and method for making a probe finger structure |
| 06/23/2004 | CN1155070C Process for manufacturing semiconductor device |
| 06/17/2004 | US20040113644 Probe card, e.g., for testing microelectronic components, and methods for making same |
| 06/17/2004 | US20040113640 Apparatus and method for limiting over travel in a probe card assembly |
| 06/15/2004 | US6750667 Adapting apparatus with detecting and repairing functions and method thereof |
| 06/15/2004 | US6750136 Contact structure production method |
| 06/10/2004 | WO2004049429A1 Probe for testing flat panel display and manufacturing method thereof |
| 06/10/2004 | US20040107568 Method for making a socket to perform testing on integrated circuits and socket made |
| 06/08/2004 | US6747466 Substrate testing apparatus and substrate testing method |
| 06/03/2004 | WO2004010153A3 Probe device cleaner and method |
| 06/03/2004 | US20040106218 Integrated compound nano probe card and method of making same |
| 06/02/2004 | EP1424748A2 Microelectronic contacts and assemblies |
| 05/26/2004 | CN1500213A Probe substrate and method of mfg. probe substrate |
| 05/26/2004 | CN1151009C Fabricating interconnects and tips using sacrificial substrates |
| 05/25/2004 | US6741086 Member for removing foreign matter adhering to probe tip and method of manufacturing the probe tip, method of cleaning foreign matter adhering to probe tip, probe, and probing apparatus |
| 05/20/2004 | US20040096643 Cleaning sheet and method for a probe |
| 05/19/2004 | EP0764352B1 Microelectronic contacts and assemblies |
| 05/18/2004 | US6737882 Method for universal wafer carrier for wafer level die burn-in |
| 05/18/2004 | US6736665 Contact structure production method |
| 05/06/2004 | WO2004008492A3 Mosaic decal probe |
| 05/06/2004 | US20040083568 Device for cleaning tip and side surfaces of a probe |
| 05/04/2004 | US6732136 Differential, low voltage swing reducer |
| 04/29/2004 | US20040083073 Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis |
| 04/27/2004 | US6727720 Probe having a microstylet |
| 04/22/2004 | WO2004034068A2 Contact structure and production method thereof and probe contact assembly using same |
| 04/22/2004 | US20040075455 Mosaic decal probe |
| 04/22/2004 | US20040075454 Contact probe, method of manufacturing the contact probe, and device and method for inspection |
| 04/22/2004 | US20040074288 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus |
| 04/22/2004 | DE10196368T5 Kontaktstruktur und Verfahren zu dessen Herstellung und eine Prüfkontaktanordnung, die diese verwendet Contact structure and method for its preparation and a test contact, which uses this |
| 04/20/2004 | US6724208 Probe pin for testing electrical characteristics of apparatus, probe card using probe pins |
| 04/20/2004 | US6724204 Probe structure for testing semiconductor devices and method for fabricating the same |
| 04/20/2004 | US6722032 Method of forming a structure for electronic devices contact locations |
| 04/15/2004 | US20040072456 Methods of removably mounting electronic components to a circuit board, and sockets formed by the methods |
| 04/15/2004 | US20040070925 Method for making a block for testing components |
| 04/15/2004 | US20040070413 Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method |
| 04/15/2004 | US20040070010 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor |
| 04/14/2004 | EP1408338A2 Method for making a probe card with multiple contact tips for testing integrated circuit |
| 04/14/2004 | CN1489696A 镍合金探针卡框架层压件 Nickel alloy frame laminate probe card |
| 04/14/2004 | CN1145802C Microelectronic spring contact element and electronic element thereof |
| 04/13/2004 | US6720759 Micro-tools |
| 04/08/2004 | WO2004030080A1 A hollow microprobe using a mems technique and a method of manufacturing the same |
| 04/08/2004 | WO2003100446A3 High performance probe system for testing semiconductor wafers |
| 04/06/2004 | US6717426 Blade-like connecting needle |
| 04/01/2004 | US20040063642 Novel benzimidazolone peptidomimetics as thrombin receptor antagonists |
| 03/30/2004 | US6714030 For measuring electrical characteristics during semiconductor manufacture processes such as probing inspection and burn-in inspection |
| 03/30/2004 | US6713376 Method of manufacturing a contract element and a multi-layered wiring substrate, and wafer batch contact board |
| 03/25/2004 | WO2003081725B1 A miniaturized contact spring |
| 03/25/2004 | US20040058487 Segmented contactor |
| 03/24/2004 | EP1400811A1 Support body assembly for conductive contactor |
| 03/23/2004 | US6710798 Methods and apparatus for determining the relative positions of probe tips on a printed circuit board probe card |
| 03/23/2004 | US6710609 Mosaic decal probe |
| 03/23/2004 | US6708403 Angled flying lead wire bonding process |
| 03/23/2004 | US6708399 Method for fabricating a test interconnect for bumped semiconductor components |
| 03/18/2004 | US20040051546 Temperature compensated vertical pin probing device |