| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
|---|
| 12/22/1994 | WO1994029816A1 Integrated circuit probe card inspection system |
| 12/06/1994 | US5371654 Three dimensional high performance interconnection package |
| 11/22/1994 | US5367253 Clamped carrier for testing of semiconductor dies |
| 11/15/1994 | US5364472 Probemat cleaning system using CO2 pellets |
| 08/30/1994 | US5342807 Soft bond for semiconductor dies |
| 08/09/1994 | US5336649 Removable adhesives for attachment of semiconductor dies |
| 08/09/1994 | US5336369 Forming film on surface of substrate, forming resist thin film, and isotropically etching |
| 06/21/1994 | US5323035 Interconnection structure for integrated circuits and method for making same |
| 04/28/1994 | WO1994009513A1 Interconnection structure for integrated circuits and method for making same |
| 04/28/1994 | WO1994009374A1 Probe unit and method of manufacturing the same |
| 04/27/1994 | EP0593966A1 Three dimensional high performance interconnection package |
| 04/12/1994 | US5302891 For testing a semiconductor device in die form |
| 03/03/1994 | DE4229678A1 Prodn. method for current converter formed from Rogowski coil - involves bendable non-magnetic winding carrier for control of power switches |
| 12/23/1993 | DE4236086C1 Low-ohmic electrical measuring resistance - uses two symmetrical terminals with stepped facing edges providing seating for inserted resistance element |
| 09/16/1993 | DE4206012C1 Circuit board testing adaptor assembly system - uses eccentrically weighted motor to vibrate sleeve which supplies test pins for fitting in adaptor bores |
| 08/31/1993 | US5239863 Cantilever stylus for use in an atomic force microscope and method of making same |
| 12/22/1992 | US5173451 Soft bond for semiconductor dies |
| 07/21/1992 | US5132611 Automobile gauge repair |
| 06/03/1992 | CN1016901B Computerized pulse remote-detector for line failure |
| 01/09/1992 | DE4024082C1 Contact holder for plug and socket connection - has pressure plunger and spring ensuring contact for testing electrical circuits of motor vehicle |
| 11/21/1991 | EP0457253A2 Cantilever stylus for use in an atomic force microscope and method of making same |
| 11/12/1991 | CA1292082C Method of making a current sensor |
| 07/23/1991 | US5034749 Sliding contact test apparatus |
| 07/09/1991 | US5030318 Curing polymer layer on substrate, patterened metallization layer over central region which is subsequently removed |
| 04/24/1991 | EP0424105A2 Method of fabricating a contact device |
| 03/27/1991 | EP0418454A2 Sliding contact test apparatus |
| 03/21/1991 | CA2010532A1 Sliding contact test apparatus |
| 02/12/1991 | US4991283 Sensor elements in multilayer ceramic tape structures |
| 10/16/1990 | US4963225 Depositing conductive material in opening of dielectric layer, depositing second dielectric layer, removing first layer so conductive material projects beyond it |
| 06/27/1990 | CN1043394A Computerized pulse remote-detector for line failure |
| 05/23/1990 | EP0369554A2 Apparatus for automatically scrubbing a surface |
| 05/08/1990 | US4922606 Method of making a current sensor |
| 01/09/1990 | US4892122 Probe pin alignment tool |
| 05/10/1989 | EP0315358A2 Method of making a current sensor |
| 09/21/1988 | EP0283219A2 Apparatus for automatically scrubbing a surface |
| 05/02/1984 | EP0107327A1 Probe device for testing an integrated circuit and method of making same |
| 11/30/1982 | CA1136708A1 Pivot insert method and article |
| 10/28/1980 | US4229874 Method of mounting a pivot insert |