Patents
Sitemap › G01 - Measuring; Testing › G01R - Measuring electric variables; Measuring magnetic variables › G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments
Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138)
05/2008
05/22/2008US20080116915 High density integrated circuit apparatus, test probe and methods of use thereof
05/22/2008US20080116914 High density integrated circuit apparatus, test probe and methods of use thereof
05/22/2008US20080116913 High density integrated circuit apparatus, test probe and methods of use thereof
05/22/2008US20080116912 High density integrated circuit apparatus, test probe and methods of use thereof
05/22/2008US20080115354 Probe unit and its manufacturing method
05/22/2008US20080115353 Lithographic contact elements
05/15/2008US20080112149 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080112148 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080112147 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080112146 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080112145 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080112144 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080111570 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080111569 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080111568 High density integrated circuit apparatus, test probe and methods of use thereof
05/15/2008US20080111555 Security system controller with integrated tester
05/14/2008CN101178414A Probe card having cantilever probes, producing method and detecting probe needlepoint locating methods
05/13/2008US7372422 Low cost electronic probe devices manufactured from conductive loaded resin-based materials
05/13/2008US7371072 Spring interconnect structures
05/08/2008US20080106872 High density integrated circuit apparatus, test probe and methods of use thereof
05/08/2008US20080106291 High density integrated circuit apparatus, test probe and methods of use thereof
05/08/2008US20080106285 High density integrated circuit apparatus, test probe and methods of use thereof
05/08/2008US20080106284 High density integrated circuit apparatus, test probe and methods of use thereof
05/08/2008US20080106283 High density integrated circuit apparatus, test probe and methods of use thereof
05/08/2008US20080106282 High density integrated circuit apparatus, test probe and methods of use thereof
05/08/2008US20080106281 High density integrated circuit apparatus, test probe and methods of use thereof
05/06/2008US7368924 Probe structure having a plurality of discrete insulated probe tips projecting from a support surface, apparatus for use thereof and methods of fabrication thereof
05/01/2008US20080100324 High density integrated circuit apparatus, test probe and methods of use thereof
05/01/2008US20080100318 High density integrated circuit apparatus, test probe and methods of use thereof
05/01/2008US20080100317 High density integrated circuit apparatus, test probe and methods of use thereof
05/01/2008US20080100316 High density integrated circuit apparatus, test probe and methods of use thereof
05/01/2008US20080100315 Electrochemically fabricated microprobes
04/2008
04/30/2008CN101169454A Advanced sandwich sub card test general carrier plate and its production method
04/29/2008US7363695 Method of fabricating a temperature sensing tube
04/22/2008US7362113 Universal wafer carrier for wafer level die burn-in
04/22/2008US7360294 Method of assembling an inductive proximity sensor
04/22/2008US7360293 Method of manufacturing recognition sensor
04/17/2008WO2007100761A3 Quadrupole resonance using narrowband probes and continuous-wave excitation
04/17/2008US20080088332 High density cantilevered probe for electronic devices
04/16/2008EP1910849A1 Torsion spring probe contactor design
04/02/2008CN100379087C Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument
03/2008
03/26/2008EP1903340A1 Probe substrate for test and manufacturing method thereof
03/25/2008US7349223 Enhanced compliant probe card systems having improved planarity
03/20/2008US20080066305 Analyte sensors and methods
03/19/2008CN101144830A Nonlinear resistor valve sheet for leakage detector and its preparation method
03/12/2008EP1898223A1 Probe substrate for test and manufacturing method thereof
03/12/2008CN101140297A Apparatus and method for limiting over travel in a probe card assembly
03/11/2008US7342402 Method of probing a device using captured image of probe structure in which probe tips comprise alignment features
03/06/2008WO2008008232A3 Probes with self-cleaning blunt skates for contacting conductive pads
03/06/2008US20080054929 Probe for testing a device under test
03/06/2008US20080054923 Probe for testing a device under test
03/04/2008US7337656 Surface characteristic analysis apparatus
03/04/2008US7337536 Multipoint nanoprobe and method for fabrication
02/2008
02/28/2008US20080048697 High density integrated circuit apparatus, test probe and methods of use thereof
02/28/2008US20080048692 Probe for testing a device under test
02/28/2008US20080048691 High density integrated circuit apparatus, test probe and methods of use thereof
02/28/2008US20080048690 High density integrated circuit apparatus, test probe and methods of use thereof
02/28/2008US20080047741 High density integrated circuit apparatus, test probe and methods of use thereof
02/28/2008US20080047129 Method of making an electrochemical sensor
02/19/2008US7332922 Method for fabricating a structure for making contact with a device
02/14/2008US20080035487 Probe and method of making same
02/14/2008US20080034842 Gas sensor using carbon natotubes and method of manufacturing the same
02/12/2008US7330039 Method for making a socket to perform testing on integrated circuits
02/12/2008US7330037 Electrical characteristic measuring probe and method of manufacturing the same
02/07/2008US20080030215 High density cantilevered probe for electronic devices
01/2008
01/31/2008US20080024155 High density cantilevered probe for electronic devices
01/31/2008US20080024154 High density cantilevered probe for electronic devices
01/31/2008US20080024149 Probe for testing a device under test
01/24/2008US20080020498 Fabrication method of semiconductor integrated circuit device
01/17/2008WO2008008232A2 Probes with self-cleaning blunt skates for contacting conductive pads
01/17/2008WO2007098291A3 Beam assembly method for large area array multi-beam dut probe cards
01/17/2008US20080012588 Silicon Wafer for Probe Bonding and Probe Bonding Method Using Thereof
01/08/2008US7316065 Method for fabricating a plurality of elastic probes in a row
01/01/2008US7313854 Method of manufacturing a tactile sensor
12/2007
12/27/2007US20070295084 Humidity sensor capable of self-regulating temperature compensation and manufacturing method thereof
12/21/2007WO2007092592A3 Automated probe card planarization and alignment methods and tools
12/19/2007CN100356541C Apparatus and method for cleaning probe card contacts
12/11/2007US7306849 Automatic detection using camera; multilayer using gel and adhesive layers
12/06/2007US20070278405 Multi-tip surface cantilever probe
12/04/2007US7304488 Shielded probe for high-frequency testing of a device under test
11/2007
11/29/2007WO2007092593A3 Probe repair methods
11/29/2007US20070275572 Connector for making electrical contact at semiconductor scales
11/29/2007US20070271781 High density integrated circuit apparatus, test probe and methods of use thereof
11/29/2007DE10065965B4 Fertigungsverfahren für einen Stromsensor der Mikrosystemtechnik Manufacturing method for a current sensor microsystem technology
11/22/2007US20070269997 Electronic components with plurality of contoured microelectronic spring contacts
11/22/2007US20070267041 Apparatuses and methods for cleaning test probes
11/22/2007US20070266572 Calibrating body, gage or measuring device, preferably screw-thread measuring device and method of production thereof
11/21/2007CN100350254C Contact structure having silicon finger contactor
11/15/2007WO2007100713A3 Approach for fabricating cantilever probes
11/06/2007US7290323 Method for manufacturing sensing devices to image textured surfaces
11/01/2007WO2007098290A3 Approach for fabricating probe elements for probe card assemblies using a reusable substrate
11/01/2007US20070251339 Process Condition Measuring Device with Shielding
10/2007
10/31/2007CN100346200C Display assembly and assembling method thereof
10/30/2007US7288953 Method for testing using a universal wafer carrier for wafer level die burn-in
10/30/2007US7288950 Contacting component, method of producing the same, and test tool having the contacting component
10/30/2007US7287322 Lithographic contact elements
10/25/2007WO2007092594A3 Approach for fabricating cantilever probes for probe card assemblies
10/23/2007US7285966 Probe and method of making same
10/23/2007US7284324 Method of making photolithographically-patterned out-of-plane coil structures
10/17/2007EP1845382A1 Probe card and method for manufacturing same
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