| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
|---|
| 05/04/2005 | CN1611949A Method of manufacturing contact, contact made by the method |
| 05/03/2005 | US6888362 Test head assembly for electronic components with plurality of contoured microelectronic spring contacts |
| 05/03/2005 | US6888344 Test probe for semiconductor devices, method of manufacturing of the same, and member for removing foreign matter |
| 04/28/2005 | WO2004093252A3 Electrical connector and method for making |
| 04/28/2005 | US20050088193 Method of manufacturing protruding-volute contact, contact made by the method, and inspection equipment or electronic equipment having the contact |
| 04/28/2005 | US20050088192 Method of manufacturing contact, contact made by the method, and inspection equipment or electronic equipment having the contact |
| 04/26/2005 | US6884300 Method of cleaning a probe |
| 04/21/2005 | US20050083074 Integrated probe module for LCD panel light inspection |
| 04/19/2005 | US6881974 Probe card for testing microelectronic components |
| 04/19/2005 | US6881274 Test carrier for temporarily packaging bumped semiconductor components in which contact balls on the components are protected during test procedures; made of wear resistant material |
| 04/19/2005 | US6880245 Method for fabricating a structure for making contact with an IC device |
| 04/14/2005 | DE10297653T5 Verfahren zum Herstellen eines elektrischen Kontaktbauteils zur Prüfung einer elektrischen Vorrichtung und ein elektrisches Kontaktbauteil A method of manufacturing an electrical contact member for testing an electrical device and an electrical contact member |
| 04/13/2005 | CN1196935C Needle-card adjusting device for planarizing needle sets on a needle card |
| 04/13/2005 | CN1196934C Holder of electro-conductive contactor and method for producing same |
| 04/07/2005 | WO2005031376A1 Electrochemically fabricated microprobes |
| 04/07/2005 | US20050074910 Manufacturing method of semiconductor device |
| 04/07/2005 | US20050073334 Contact For Semiconductor Components |
| 03/31/2005 | US20050068054 Standardized layout patterns and routing structures for integrated circuit wafer probe card assemblies |
| 03/30/2005 | EP1519200A1 Method for optimizing probe card analysis and scrub mark analysis data |
| 03/29/2005 | US6873145 Method for making a card with multiple contact tips for testing microsphere integrated circuits, and testing device using said card |
| 03/24/2005 | US20050062492 High density integrated circuit apparatus, test probe and methods of use thereof |
| 03/24/2005 | US20050062488 Multipoint nanoprobe and method for fabrication |
| 03/17/2005 | WO2004034068A3 Contact structure and production method thereof and probe contact assembly using same |
| 03/15/2005 | US6866255 Sputtered spring films with low stress anisotropy |
| 03/09/2005 | CN1591814A Wafer prober |
| 03/08/2005 | US6864695 Semiconductor device testing apparatus and semiconductor device manufacturing method using it |
| 03/03/2005 | US20050046431 Probe card for use with microelectronic components,and methods for making same |
| 03/02/2005 | EP1509776A2 Probe for testing a device under test |
| 03/01/2005 | US6861855 High density interconnection test connector especially for verification of integrated circuits |
| 02/24/2005 | US20050042932 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 02/22/2005 | US6859054 Probe contact system using flexible printed circuit board |
| 02/17/2005 | US20050035775 Probe contact system using flexible printed circuit board |
| 02/17/2005 | US20050034743 Apparatus and method for cleaning probe card contacts |
| 02/16/2005 | EP1506414A2 High peformance probe system for testing semiconductor wafers |
| 02/15/2005 | US6856225 Photolithographically-patterned out-of-plane coil structures and method of making |
| 02/15/2005 | US6854980 Probe card |
| 02/10/2005 | US20050028363 Contact structures and methods for making same |
| 02/09/2005 | EP1021822A4 Method and apparatus for cleaning electronic test contacts |
| 02/08/2005 | US6853210 Test interconnect having suspended contacts for bumped semiconductor components |
| 02/08/2005 | US6853208 Vertical probe card |
| 02/03/2005 | WO2004001807B1 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 01/27/2005 | US20050016251 Forming tool for forming a contoured microelectronic spring mold |
| 01/25/2005 | US6846735 Compliant test probe with jagged contact surface |
| 01/20/2005 | US20050012515 Apparatus for testing integrated circuit chips |
| 01/13/2005 | WO2005003793A1 Probe card and semiconductor testing device using probe sheet or probe card and semiconductor device producing method |
| 01/11/2005 | US6840374 A cleaning apparatus comprising a tacky gel layer polysiloxane, an endcapped homo- or copolymer; tip used to test semiconductors dies |
| 01/06/2005 | US20050001637 Support member assembly for conductive contactor |
| 12/29/2004 | WO2004113933A2 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 12/28/2004 | US6835577 Method for making a block for testing components |
| 12/23/2004 | WO2004001807A3 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 12/22/2004 | EP1489695A1 Anisotropic conductive film and method for producing the same |
| 12/22/2004 | CN1181354C Inspection unit and method of manufacturing substrate |
| 12/15/2004 | CN1180274C Grinding chip |
| 12/09/2004 | WO2004106949A1 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
| 12/09/2004 | US20040246010 Probe tip in single-sided compliant probe apparatus |
| 12/07/2004 | US6828812 Test apparatus for testing semiconductor dice including substrate with penetration limiting contacts for making electrical connections |
| 12/02/2004 | WO2004059331A3 Apparatus and method for limiting over travel in a probe card assembly |
| 12/02/2004 | US20040239921 Probe needle for testing semiconductor chips and method for producing said probe needle |
| 12/02/2004 | US20040239570 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 12/02/2004 | US20040239355 Conductive contact |
| 12/02/2004 | US20040239352 Probe card used for inspecting semiconductor devices |
| 12/01/2004 | EP1482314A1 Microelectronic spring contact element |
| 12/01/2004 | CN1550785A Probe device and its manufacturing method |
| 11/25/2004 | WO2004102208A1 Sheet-like probe, process for producing the same and its application |
| 11/25/2004 | US20040232927 Probe for testing a device under test |
| 11/18/2004 | US20040227533 System and method of mitigating effects of component deflection in a probe card analyzer |
| 11/18/2004 | US20040227532 Apparatus and method for use in testing a semiconductor wafer |
| 11/18/2004 | DE102004014185A1 Probenstift-Reinigungsvorrichtung Samples pen-cleaning device |
| 11/16/2004 | US6818840 Method for manufacturing raised electrical contact pattern of controlled geometry |
| 11/16/2004 | US6817052 Apparatuses and methods for cleaning test probes |
| 11/11/2004 | US20040223309 Enhanced compliant probe card systems having improved planarity |
| 11/11/2004 | US20040222211 Carbon-containing aluminum nitride sintered body, and ceramic substrate for a semiconductor producing/examining device |
| 11/10/2004 | CN1545139A 晶片探测器 Wafer probe |
| 11/10/2004 | CN1175483C Wafer detector and ceramic substrate used for wafer detector |
| 11/10/2004 | CN1174836C Membrane probing system |
| 11/09/2004 | US6815963 Probe for testing a device under test |
| 11/09/2004 | US6815961 Construction structures and manufacturing processes for integrated circuit wafer probe card assemblies |
| 11/09/2004 | US6813804 Apparatus and method for cleaning probe card contacts |
| 11/04/2004 | WO2004095646A1 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 11/04/2004 | WO2004083980A3 Method of mitigating effects of component deflection in a probe card analyzer |
| 11/04/2004 | US20040217350 Probe unit and its manufacturing method |
| 11/03/2004 | CN1542505A Display assembly and assembling method thereof |
| 11/03/2004 | CN1542455A Probe unit and its manufacturing method |
| 11/03/2004 | CN1174251C Method for making cards with multiple contact tips and cards obtained thereby |
| 10/28/2004 | WO2004093252A2 Electrical connector and method for making |
| 10/28/2004 | WO2004092750A1 Alignment features in a probing device |
| 10/28/2004 | WO2004092090A2 Temperature compensated vertical pin probing device |
| 10/28/2004 | US20040214409 Method and apparatus for manufacturing known good semiconductor die |
| 10/28/2004 | US20040212391 Method for universal wafer carrier for wafer level die burn-in |
| 10/28/2004 | US20040211589 High conducting thin-film nanoprobe card and its fabrication method |
| 10/26/2004 | US6809539 Probe card for testing an integrated circuit |
| 10/21/2004 | US20040207425 Inspection apparatus and probe card |
| 10/21/2004 | US20040207419 Inspecting device and probe card |
| 10/20/2004 | EP1468776A2 Microelectronics spring contact elements |
| 10/20/2004 | EP1468048A1 Apparatus and method for cleaning test probes |
| 10/20/2004 | CN1538515A Method for manufacturng semiconductor device |
| 10/19/2004 | US6806723 Contactor having contact electrodes formed by laser processing |
| 10/14/2004 | US20040201392 Alignment features in a probing device |
| 10/14/2004 | US20040200515 Probe pin cleaning device |
| 10/13/2004 | CN1535765A 探针洗净装置 Probe cleaning device |