| Patents for G01R 3 - Apparatus or processes specially adapted for the manufacture of measuring instruments (2,138) |
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| 05/23/2006 | US7047638 Method of making microelectronic spring contact array |
| 05/17/2006 | CN1256761C Contact component and its manufacture and probe contact assembly using the contact component |
| 05/11/2006 | US20060096371 Capacitive humidity sensor and method of manufacturing the same |
| 05/10/2006 | EP1255924B1 An engine management system |
| 05/04/2006 | WO2006014894A3 Method and apparatus for producing co-planar bonding pads on a substrate |
| 05/03/2006 | CN1254687C Probe substrate and method of mfg. probe substrate |
| 04/27/2006 | US20060086188 Vacuum sealed surface acoustic wave pressure sensor |
| 04/25/2006 | US7032307 Method for fabricating a probe pin for testing electrical characteristics of an apparatus |
| 04/19/2006 | CN1762050A Probe and method of making same |
| 04/18/2006 | US7028398 Contactor, a method of manufacturing the contactor and a device and method of testing electronic component using the contactor |
| 04/13/2006 | US20060075836 Pressure sensor and method of operation thereof |
| 04/11/2006 | US7024763 Methods for making plated through holes usable as interconnection wire or probe attachments |
| 04/05/2006 | CN1757139A Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 03/29/2006 | EP1640730A1 A method for providing alignment of a probe |
| 03/28/2006 | US7018857 Method of manufacturing a semiconductor device including defect inspection using a semiconductor testing probe |
| 03/22/2006 | CN1246893C Contact structure member and production method thereof, and probe contact assembly using said contact structure member |
| 03/16/2006 | US20060059056 Proximity sensor |
| 03/16/2006 | US20060053909 Physical quantity sensor, lead frame, and manufacturing method therefor |
| 03/14/2006 | US7012441 High conducting thin-film nanoprobe card and its fabrication method |
| 03/14/2006 | US7010854 Re-assembly process for MEMS structures |
| 03/09/2006 | WO2006026346A1 Stacked tip cantilever electrical connector |
| 03/08/2006 | CN1745308A Apparatus and method for limiting over travel in a probe card assembly |
| 03/08/2006 | CN1745307A Method of making a socket to perform testing on integrated circuits and such a socket |
| 03/08/2006 | CN1244815C Adapter for testing printed circuit boards and testing needle for such adapter |
| 03/07/2006 | US7007408 Method and apparatus for removing and/or preventing surface contamination of a probe |
| 03/02/2006 | WO2006023380A1 A HIGHLY RESILIENT CANTILEVER SPRING PROBE FOR TESTING ICs |
| 03/02/2006 | WO2004113933A3 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 03/02/2006 | US20060043983 Anisotropic conductivity connector, probe member, wafer inspecting device, and wafer inspecting method |
| 03/01/2006 | EP1629288A1 Board for probe card, inspection apparatus, photo-fabrication apparatus and photo-fabrication method |
| 03/01/2006 | EP1285408B1 Method and device for examining a pre-determined area of a printed circuit board |
| 03/01/2006 | CN1243983C Support body assembly for conductive contactor |
| 02/28/2006 | US7006046 Low cost electronic probe devices manufactured from conductive loaded resin-based materials |
| 02/28/2006 | US7005054 Method for manufacturing probes of a probe card |
| 02/23/2006 | US20060037194 Multipoint nanoprobe and method for fabrication |
| 02/21/2006 | US7000315 Method of making photolithographically-patterned out-of-plane coil structures |
| 02/16/2006 | US20060035404 Method for manufacturing an electronic device having an electronically determined physical test member |
| 02/16/2006 | US20060033521 A Highly Resilient Cantilever Spring Probe Having Curved Surfaces for Testing ICs |
| 02/16/2006 | US20060033520 A highly resilient cantilever spring probe for testing ics |
| 02/15/2006 | EP1626284A1 Contact probe, mask and fabrication method thereof |
| 02/14/2006 | US6996891 Method for the manufacture of a sensor element |
| 02/09/2006 | US20060030247 Cleaning sheet and method for a probe |
| 02/08/2006 | EP1624530A1 Anisotropic conductive sheet and its manufacturing method, adaptor device and its manufacturing method, and circuit device electric test instrument |
| 02/08/2006 | EP1624309A1 Sheet-like probe, process for producing the same and its application |
| 02/07/2006 | US6995577 Contact for semiconductor components |
| 02/01/2006 | EP1621893A1 Device for removing foreign matter adhering to a probe tip face |
| 01/26/2006 | US20060019027 Method for forming microelectronic spring structures on a substrate |
| 01/19/2006 | US20060011830 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus |
| 01/19/2006 | US20060011467 Method of manufacturing the multi-tip probe, a multi-tip probe, and surface characteristic analysis apparatus |
| 01/18/2006 | EP1616197A1 Alignment features in a probing device |
| 01/11/2006 | EP0839321B1 Contact tip structures for microelectronic interconnection elements and methods of making same |
| 01/10/2006 | US6983536 Method and apparatus for manufacturing known good semiconductor die |
| 01/05/2006 | WO2005057652A3 Connector for making electrical contact at semiconductor scales and method for forming same |
| 12/29/2005 | WO2005124371A1 A method for providing alignment of a probe |
| 12/29/2005 | US20050285609 Probe unit and its manufacturing method |
| 12/28/2005 | EP1610375A2 Contact carriers for populating substrates with spring contacts |
| 12/28/2005 | EP1610132A2 Fabricating interconnects using sacrificial substrates |
| 12/28/2005 | EP1444528A4 Electrical test probes and methods of making the same |
| 12/22/2005 | WO2005122240A1 Silicon wafer for probe bonding and probe bonding method using thereof |
| 12/22/2005 | WO2005043594B1 Method for forming photo-defined micro electrical contacts |
| 12/22/2005 | US20050279530 Compliant spring contacts, methods of making, and utilization as electrical contacts in probe card and flip-chip applications |
| 12/22/2005 | DE102004027886A1 Prüfeinrichtung zur elektrischen Prüfung eines Prüflings sowie Verfahren zur Herstellung einer Prüfeinrichtung Checking means for electrical testing of a test specimen as well as methods for preparing a test device |
| 12/20/2005 | US6977515 Method for forming photo-defined micro electrical contacts |
| 12/14/2005 | EP1604218A2 Method of mitigating effects of component deflection in a probe card analyzer |
| 12/14/2005 | EP1549962A4 Construction structures and manufacturing processes for probe card assemblies and packages having wafer level springs |
| 12/13/2005 | US6975124 Multipoint nanoprobe |
| 12/13/2005 | US6975030 Silicon carbide contact for semiconductor components |
| 12/13/2005 | US6973722 Release height adjustment of stressy metal devices by annealing before and after release |
| 12/08/2005 | WO2005065431A3 Microprobe tips and methods for making |
| 12/08/2005 | US20050270135 Method of making photolithographically-patterned out-of-plane coil structures |
| 12/08/2005 | US20050269509 Method for manufacturing single wall carbon nanotube tips |
| 12/01/2005 | US20050266690 Manufacture of probe unit having lead probes extending beyond edge of substrate |
| 12/01/2005 | US20050264312 Test device for electrical testing of a unit under test, as well as a method for production of a test drive |
| 11/30/2005 | EP1600782A1 Testing device for electronic testing of a sample and and method for producing a device |
| 11/30/2005 | CN1702461A Sampling electrical detection facility and method for manufacturing the same |
| 11/29/2005 | US6969262 IC socket |
| 11/24/2005 | WO2005055369A3 Methods for making vertical electrical feed through structures |
| 11/24/2005 | US20050258835 Method of measuring contact resistance of probe and method of testing semiconductor device |
| 11/23/2005 | CN1228641C Nickel alloy probe card frame laminate |
| 11/22/2005 | US6967498 Apparatus and method for inspecting electronic circuits |
| 11/17/2005 | US20050255796 Probe cleaning sheet and cleaning method |
| 11/17/2005 | US20050253620 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 11/17/2005 | US20050253619 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 11/10/2005 | WO2005065437A3 Probe arrays and method for making |
| 11/03/2005 | WO2005103735A1 Sheet-shaped probe, manufacturing method thereof and application thereof |
| 11/03/2005 | WO2005103734A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 11/03/2005 | WO2005103733A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 11/03/2005 | WO2005103732A1 Sheet-shaped probe, manufacturing method thereof and application thereof |
| 11/03/2005 | WO2005103731A1 Sheet-shaped probe, manufacturing method thereof and application thereof |
| 11/03/2005 | WO2005103730A1 Sheet-like probe, method of producing the probe, and application of the probe |
| 11/03/2005 | WO2005043594A3 Method for forming photo-defined micro electrical contacts |
| 11/03/2005 | US20050241175 Method and apparatus for removing and/or preventing surface contamination of a probe |
| 11/02/2005 | EP1592057A2 Method and apparatus for removing and/or preventing surface contamination of a probe |
| 11/01/2005 | US6961670 Probe testing method and apparatus for determining acceptable/defective end shape of contact probe through image analysis |
| 10/27/2005 | US20050237077 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 10/27/2005 | US20050237076 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 10/27/2005 | US20050237075 Method for testing using a universal wafer carrier for wafer level die burn-in |
| 10/19/2005 | CN1685493A A hollow microprobe using a mems technique and a method of manufacturing the same |
| 10/18/2005 | US6957405 Methods for manufacturing an electronic device having an electronically determined physical test member |
| 10/18/2005 | US6956389 Highly resilient cantilever spring probe for testing ICs |
| 10/18/2005 | US6956174 Tip structures |